| Authors in
order (Authors underlined are NIST Authors) |
Document type |
Available format |
Pub ID |
Date published |
|
Laser Tracker Testing at NIST Using the ASME B89.4.19 Standard |
|
Muralikrishnan, Bala ; Blackburn, Christopher J; Sawyer, Daniel S; Borchardt, Bruce Robert; Estler, William T; Phillips, Steven David; |
Journal
|
None |
824608 |
01-JAN-07 |
 |
|
Large-Scale Metrology Instrument Performance Evaluations at NIST |
|
Estler, William T; Sawyer, Daniel S; Borchardt, Bruce Robert; Phillips, Steven David; |
Journal
|
None |
824607 |
01-JAN-06 |
|
|
Recent Developments in the Standardization and Testing of Laser Trackers |
|
Sawyer, Daniel S; Phillips, Steven David; Borchardt, Bruce Robert; Estler, William T; |
Proceedings
|
None |
823203 |
01-JAN-06 |
|
|
Probing systems in Dimensional Metrology |
|
Weckenmann, A ;Estler, William T; Peggs, G ;McMurtry, D ; |
Journal
|
None |
824613 |
01-JAN-04 |
|
|
Uncertainty Due to Finite Resolution Measurements |
|
Phillips, Steven David; Tolman, B ;Estler, William T; |
Proceedings
|
None |
822244 |
01-JAN-04 |
|
|
Displacement Uncertainty in Interferometric Radius Measurements |
|
Schmitz, Tony L; Evans, Christopher J. ; Davies, Angela ; Estler, William T; |
Journal
|
None |
821743 |
01-JAN-03 |
|
|
Displacement Uncertainty in Interferometric Radius Measurements |
|
Estler, William T; Schmitz, Tony L; Davies, Angela ; Evans, Christopher J. ; |
Other
|
None |
821903 |
01-JAN-02 |
|
|
Large-Scale Metrology - An Update |
|
Estler, William T; Edmundson, K L;Peggs, G ;Parker, D H; |
Journal
|
None |
821742 |
01-JAN-02 |
|
|
A Laser Tracker Calibration System |
|
Sawyer, Daniel S; Borchardt, Bruce Robert; Phillips, Steven David; Fronczek, Charles ; Estler, William T; |
Proceedings
|
None |
821749 |
01-JAN-02 |
|
|
A Careful Consideration of the Calibration Concept |
|
Phillips, Steven David; Estler, William T; Doiron, Theodore D; Eberhardt, K ; Levenson, M ; |
Journal of Research (NIST JRES)
|
None |
823126 |
01-MAR-01 |
|
|
Rationale and Procedures for Development of a NASA Primary Metrology Lab. for Large Optics |
|
Vorburger, Theodore V; Evans, Christopher J. ; Estler, William T; |
NIST Interagency/Internal Report (NISTIR)
|
None |
823134 |
01-MAR-01 |
|
|
A Careful Consideration of the Calibration Concept |
|
Phillips, Steven David; Estler, William T; Doiron, Theodore D; Eberhardt, K ; Levenson, M ; |
Proceedings
|
None |
824612 |
01-JAN-01 |
|
|
Rationale and Procedures for Development of a NASA Primary Metrology Laboratory for Large Optics |
|
Vorburger, Theodore V; Evans, Christopher J. ; Estler, William T; |
NIST Interagency/Internal Report (NISTIR)
|
None |
821573 |
01-JAN-01 |
|
|
Angle Metrology of Dispersion Prisms |
|
Estler, William T; Queen, Y H; Evans, Christopher J. ; |
Journal
|
None |
820111 |
01-JAN-00 |
|
|
Measurement as Inference: Fundamental Ideas |
|
Estler, William T; |
Journal
|
None |
820928 |
01-AUG-99 |
|
|
Improving Kinematic Touch Trigger Probe Performance |
|
Phillips, Steven David; Estler, William T; |
Journal
|
None |
820943 |
01-APR-99 |
|
|
Measurement Uncertainty and Uncorrected Bias |
|
Phillips, Steven David; Eberhardt, K ; Estler, William T; |
Proceedings
|
None |
820942 |
01-JAN-99 |
|
|
A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty |
|
Phillips, Steven David; Borchardt, Bruce Robert; Sawyer, Daniel S; Estler, William T; Eberhardt, K ; Levenson, M ; McClain, Marjorie A; Hopp, Ted ; |
Journal
|
None |
820941 |
01-JAN-99 |
|
|
Calculation of Measurement Uncertainty Using Prior Information |
|
Phillips, Steven David; Estler, William T; |
Journal
|
 (119 K) |
820904 |
01-NOV-98 |
|
|
The Estimation of Measurement Uncertainty of Small Circular Features Measured by Coordinate Measuring Machines |
|
Phillips, Steven David; Borchardt, Bruce Robert; Estler, William T; Buttress, J ; |
Journal
|
None |
820903 |
01-APR-98 |
|
|
Uncertainty Analysis for Angle Calibrations Using Circle Closure |
|
Estler, William T; |
Journal
|
(147 K) |
820892 |
01-MAR-98 |
|
|
Uncertainty Analysis for Angle Calibrations Using Circle Closure |
|
Estler, William T; |
Journal of Research (NIST JRES)
|
None |
823098 |
01-MAR-98 |
|
|
In memoriam R.V. Jones (1911-1917) |
|
Evans, Christopher J. ; Estler, William T; |
Journal
|
None |
820112 |
01-JAN-98 |
|
|
Uncertainty Estimation for Multiposition Form Error Metrology |
|
Estler, William T; Evans, Christopher J. ; Shao, Lianzhen ; |
Journal
|
None |
820842 |
01-SEP-97 |
|
|
A Distribution-Independent Bound on the Level of Confidence in the Result of a Measurement |
|
Estler, William T; |
Journal
|
(30 K) |
820841 |
01-SEP-97 |
|
|
Practical Aspects of Touch Trigger Probe Error Compensation |
|
Estler, William T; Phillips, Steven David; Borchardt, Bruce Robert; Hopp, Ted ; Levenson, M ; Eberhardt, K ; McClain, Marjorie A; |
Journal
|
None |
820843 |
01-JUL-97 |
|
|
The Calculation of CMM Measurement Uncertainty via The Method of Simulation by Constraints |
|
Phillips, Steven David; Borchardt, Bruce Robert; Sawyer, Daniel S; Estler, William T; Ward, David E; Eberhardt, K ; Levenson, M ;McClain, Marjorie A; Melvin, B ;Hopp, Ted ; Shen, Y ; |
Proceedings
|
None |
820857 |
01-JAN-97 |
|
|
Error Compensation for CMM Touch Trigger Probes |
|
Estler, William T; Phillips, Steven David; Borchardt, Bruce Robert; Hopp, Ted ; Witzgall, G ; Levenson, M ; Eberhardt, K ; McClain, Marjorie A; Shen, Y ;Zhang, X ; |
Journal
|
None |
822130 |
01-OCT-96 |
|
|
Self-Calibration: Reversal, Redundancy, Error Separation, and "Absolute Testing" |
|
Evans, Christopher J. ; Hocken, R ;Estler, William T; |
Journal
|
None |
820791 |
01-JAN-96 |
|
|
The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs |
|
Phillips, Steven David; Borchardt, Bruce Robert; Estler, William T; |
NIST Interagency/Internal Report (NISTIR)
|
None |
820754 |
01-FEB-95 |
|
|
Error Compensation for CMM Touch Trigger Probes |
|
Estler, William T; Phillips, Steven David; Borchardt, Bruce Robert; Hopp, Ted ; Witzgall, Christoph J.; Levenson, M ; al, et ; |
Proceedings
|
None |
820736 |
01-JAN-95 |
|
|
XUV Optics Characterization at the National Institute of Standards and Technology |
|
Watts, R N. ; Tarrio, Charles S; Lucatorto, Thomas B; Madden, R P. ; Deslattes, R ; Caticha, Ariel ; Estler, William T; Evans, Christopher J. ; McWade, T. ;Fu, Joseph N; Vorburger, Theodore V; |
Journal
|
None |
901965 |
01-JAN-93 |
|
|
Surface Metrology of Soft X-ray Optics |
|
Vorburger, Theodore V; McWade, T. ;Fu, Joseph N; Evans, Christopher J. ; Estler, William T; Parks, R ; |
Proceedings
|
None |
901970 |
01-JAN-93 |
|
|
Upgraded Facility for Multilayer Mirror Characterization at NIST, ed. by N.M. Ceglio |
|
Watts, R N. ; Ederer, D L;Deslattes, R ; Lucatorto, Thomas B; Estler, W T;Evans, C J;Vorburger, Theodore V; |
Journal
|
None |
100211 |
01-JAN-91 |
|
|
Upgraded Facility for Multilayer Mirror Characterization at NIST, ed. by N.M. Seglio |
|
Watts, R N. ; Ederer, D L;Deslattes, R ; Lucatorto, Thomas B; Estler, W T;Evans, C J;Vorburger, T V; |
Proceedings
|
None |
102936 |
01-JAN-91 |
|
