Reference list
- W. Bambynek et al., X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition Probabilities.
- R. Browning et al., Journal of Vacuum Science & Technology B (Microelectronics Processing and Phenomena) 9, 3578 (1991).
- R. Browning et al., Scanning 17, 250 (1995).
- E. Casnati, A. Tartari, and C. Baraldi, J. Phys. B, At Mol. Phys. 15, 155 (1982).
- D.R. Cousens and D.C. Joy, Scanning 19, 547 (1997).
- Z. Czyzewski and D.C. Joy, Journal of Microscopy 156, 285 (1989).
- Z. Czyzewski and D.C. Joy, Scanning 12, 5 (1990).
- Z. Czyzewski, D. O'Neill Maccallum, A. Romig, and D.C. Joy, Journal of Applied Physics 68, 3066 (1990).
- Z.J. Ding and R. Shimizu, Scanning 18, 92 (1996).
- Z.J. Ding, R. Shimzu, and K. Obori, Journal of Applied Physics 76, 7180 (1994).
- Z. J. Ding, X. D. Tang, and H. M. Li, International Journal of Modern Physics B 6, 4405 (2002).
- D. Drouin, R. Gauvin, and D.C. Joy., Scanning 16, 67 (1994).
- D. Drouin, P. Hovington, and R. Gauvin, Scanning 19, 20 (1997).
- R. P. Gardner and W. Guo, Denver X-Ray Conference, Steamboat Springs, CO.
- R. Gauvin, Scanning 17, 348 (1995).
- R. Gauvin and D. Drouin, Scanning 15, 140 (1993).
- R. Gauvin, P. Hovington, and D. Drouin, Scanning 17, 202 (1995).
- R. Gauvin, G. L'esperance, and S. St-Laurent, Scanning 14, 37 (1992).
- P. Hovington, D. Drouin, and R. Gauvin, CASINO: a New Monte Carlo Code in C Language for Electron Beam Interaction. I. Description of the Program.
- P. Hovington et al., CASINO: a New Monte Carlo Code in C Language for Electron Beam Interactions. III. Stopping Power at Low Energies.
- D. C. Joy, Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford University Press, New York, 1995).
- Ko Y.U., Hwu J.j., and Joy D.c., Proceedings of the Spie - the International Society for Optical Engineering 3998, 694 (2000).
- M. Kotera, T. Kishida, and H. Suga, Scanning Microscopy Supplement 4, 111 (1990).
- J.C. Kuhr and H.-J. Fitting, Physica Status Solidi A 172, 433 (1999).
- W. H. McCrea and F. J. W. Whipple, Proc. Roy. Soc. Edinburgh 60, 281 (1940).
- N. F. Mott and H.S.W. Massey, The Theory of Atomic Collisions, 3rd ed. ed. (Oxford Univ. Press, 1965).
- K. Murata, S. Cvikevich, and J. D. Kuptsis, Journal De Physique Colloque 45, 13 (1984).
- C. J. Powell , Ultramicroscopy 28, 24 (1989).
- C. J. Powell , NBS Spec. Pub. 460, Editors Heinrich, Newbury, and Yakowitz (US Govt. Printing Office , Wash. DC 20402, 1976)
- E. L. H. D. P. H. a. H. C. Raynald Gauvin, Microscopy and Microanalysis 12 , 1 (2006).
- L. Reimer and D. Stelter, Scanning 8, (1986).
- P. Rez, National Institute of Standards and Technology, (NIST, Gaithersburg, MD, 2002).
- Suichu Luo and Joy D.c., Scanning Microscopy 2, 1901 (1988).
- J. Trincavelli, G. Castellano, and A. Riveros, X-Ray Spectrometry 27, pp 81 (1998).
- D. B. Williams, D. E. Newbury, J. I. Goldstein, and C. E. Fiori, Journal of Microscopy Vol. 136, Pt 2, pp. 209 (1984).
- H. Yoshikawa and R. Shimizu, Journal of Vacuum Science & Technology A (Vacuum, Surfaces, and Films) 10, 2931 (1992).