Recent Publications by Leonard Hanssen

Hanssen, L.M., and Farrell, P.V.,

Optical Diagnostics,

SPIE, Bellingham, WA, 5880 (2005).

Hanssen, L.M., Prokhorov, A.V., Khromchenko, V.B., and Mekhontsev, S.N.,

Comparison of direct and indirect methods of spectral infrared emittance measurement,

in Proc. TEMPMEKO 2004, ed. by D. Zvizdic (LPM/FSB, Zagreb, Croatia, 2005), p. 539-544.

Choquette, S.J. , Duewer, D.L., Hanssen, L.M., and Early, E.,

Standard Reference Material 2036 Near-Infrared Reflection Wavelength Standard,

Appl. Spec. 59(4), 496-504 (2005).

Mekhontsev, S.N., Khromchenko, V.B., Prokhorov, A.V., and Hanssen, L.M.,

Emissivity evaluation of fixed point blackbodies,

in Proc. TEMPMEKO 2004, ed. by D. Zvizdic (LPM/FSB, Zagreb, Croatia, 2005), p. 581-586.

Rink, M., Khromchenko, V.B., Mekhontsev, S.N., and Hanssen, L.M.,

Near infrared indirect emissivity measurements and system employing a vacuum goniometer,

in Proc. TEMPMEKO 2004, ed. by D. Zvizdic (LPM/FSB, Zagreb, Croatia, 2005) p. 891-896.

Tsai, B.K., DeWitt, D.P., Early, E.A., Hanssen, L.M., Mekhontsev, S.N., Rink, M., Kreider, K.G., Lee, B.J., and Zhang, Z.,

Emittance standards for improved radiation thermometry during thermal processing of silicon materials,

in Proc. TEMPMEKO 2004, ed. by D. Zvizdic (LPM/FSB, Zagreb, Croatia, 2005), p. 1179-1184.

Hanssen, L.M. and Prokhorov, A.V.,

Effective Emissivity of a Cylindrical Cavity with an Inclined Bottom: I. Isothermal Cavity,

Metrologia 41, 421-431 (2004).

Hanssen, L.M., Khromchekno, V.B., and Mekhontsev, S.N.,

Infrared Spectral Emissivity Characterization Facility at NIST,

Proc. SPIE 5405, 1-12 (2004).

Hanssen, L.M., Mekhontsev, S.N., and Prokhorov, A.V.,

Emissivity Modeling of Thermal Radiation Sources With Concentric Grooves,

High Temp. High Pres. 35/36, 199-207 (2003/2004).

Gong, H., Hanssen, L.M., and Eppeldauer, G.P.,

Spatial and Angular Responsivity Measurements of Photoconductive HgCdTe LWIR Radiometers,

Metrologia 41, 161-166 (2004).

Hanssen, L.M. and Kaplan, S.G.,

Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales,

SPIE Proc. 4826, 21-26 (2003).

Hanssen, L.M. and Mekhontsev, S.N.,

Low Scatter Optical System For Emittance and Temperature Measurements,

in Temperature Measurement in Science and Industry Symposium, 7, AIP Conf. Proc., Melville, New York (2003), 729-734.

Hanssen, L.M. and Prokhorov, A.V.,

Algorithmic Model of Microfacet BRDF For Monte Carlo Calculation of Optical Radiation Transfer,

Proc. SPIE 5192, 141-157 (2003).

Hanssen, L.M., Kaplan, S.G., and Mekhontsev, S.N.,

Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials,

Proc. in Proc.

8th Int'l Symp. Temperature and Thermal Measurements in Industry and Science (TEMPMEKO '01, Berlin, Germany), ed. by B. Fellmuth, J. Seidel, and G. Scholz, 265-270 (2003).

Hanssen, L.M., Khromchenko, V.B., and Prokhorov, A.V.,

Specular Baffle For Improved Infrared Integrating Sphere Performance,

Proc. SPIE 5192, 101-110 (2003).

Hanssen, L.M., Mekhontsev, S.N., and Prokhorov, A.V.,

Evaluation of Performance of Integrating Spheres For Indirect Emittance Measurement,

in Proc. 8th Int'l Symp. Temperature and Thermal Measurements in Industry and Science (TEMPMEKO '01, Berlin, Germany), ed. by B. Fellmuth, J. Seidel, and G. Scholz, 277-282 (2003).

Hanssen, L.M., Mekhontsev, S.N., and Prokhorov, A.V.,

Monte Carlo Modeling of an Integrating Sphere Reflectometer,

Appl. Opt. 42, 3832-3842 (2003).

Hanssen, L.M., Mekhontsev, S.N., and Prokhorov, A.V.,

Reciprocity Principle and the Choice of Reflectance Model for Physically Correct Modeling of Effective Emissivity,

in Temperature Measurement in Science and Industry Symposium, 7, AIP Conf. Proc., Melville, New York (2003), 693-698.

Chunnilall, C.J., Clarke, F.J.J., Hanssen, L.M., Kaplan, S.G., and Smart, M.P.,

NIST-NPL Comparison of Mid-infrared Regular Transmittance and Reflectance,

Metrologia 40, S55-S59 (2003).

Eppeldauer, G.P. and Hanssen, L.M.,

Calibration of a Spectral Responsivity Transfer Standard,

Conf. Proc., NCSL International Annual Workshop and Symposium,Tampa, Florida (Published on CD, by NCSL International, Boulder CO, 2003).

Hanssen, L.M. and Kaplan, S.G.,

Si as a Standard Material for Infrared Reflectance and Transmittance from 2 µm to 5 µm,

Infrared Phys. Tech. 43, 389-396 (2002).

Hanssen, L.M. and Prokhorov, A.,

Numerical Modeling of an Integrating Sphere Radiation Source,

SPIE 4775, 106-118 (2002).

Allen, D., Early, E.A., Hanssen, L.M., Kaplan, S.G., and Nadal M.E.,

Comparison of Near-infrared Transmittance and Reflectance Measurements using Dispersive and Fourier Transform Spectrophotometers,

Metrologia 39, 157-164 (2002).

Eppeldauer, G.P., Hanssen, L.M., and Racz M.,

Spectral Responsivity Determination of a Transfer-Standard Pyroelectric Radiometer,

SPIE Proc. 4818, 118-126 (2002).

Kaplan, S.G., Hanssen, L.M., Early, E.A., Nadal, M.E., Allen, D.,

Intercomparison of Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers,

Metrologia 39, 157-164 (2002).

Hanssen, L.M. and Kaplan, S.G.,

Infrared Transmittance Standards - SRM’s 2053, 2054, 2055, and 2056,

NIST Spec. Publ. 260-123 (May 2001).

Hanssen, L.M. and Snail, K.A.,

Integrating Spheres for Mid- and Near-Infrared and Near-Infrared Reflection Spectroscopy,

in Handbook of Vibrational Spectroscopy, ed. J. Chalmers and P. Griffiths (2001), p. 1175-1191.

Hanssen, L.M. and Zhur, C.

Wavenumber standards for the mid-infrared,

in Handbook of Vibrational Spectroscopy, ed. by J. Chalmers and P. Griffiths (2001), p. 881-890.

Hanssen, L.M.,

Integrating Sphere Method for Absolute Transmittance, Reflectance and Absorptance of Specular Samples,

Appl. Opt. 40, 3196-3204 (2001).

Hanssen, L.M., Kawate, E., Kaplan, S.G., and Datla, R.U.,

Development of an Adiabatic Laser Calorimeter,

Proc. SPIE 4103, 133-144 (2001).

Germer, T.A., Gupta, R., Hanssen, L.M., and Shirley, E.L.,

Optical Properties of Materials,

Opt. Photon. News 12(2), 38-42 (2001).

Kaplan, S.G. and Hanssen, L.M.,

Angle-dependent absolute infrared reflectance and transmittance measurements,

Proc. SPIE 4103, 75-84 (2000).

Kaplan, S.G., Hanssen, L.M., Early, E.A., and Nadal, M.E.,

Intercomparison of regular spectral transmittance and reflectance measurements with monochromator and FTIR based spectrophotometers,

Proc. SPIE 4103, 53-61 (2000).

Zhu, C.J., Zhu, J., and Hanssen, L.M.,

Comparison and development of absorption peak determination algorithms for wavelength standards,

Proc. SPIE 4103, 62-68 (2000).

Hanssen, L.M. and Kaplan, S.G.,

Infrared diffuse reflectance instrumentation and standards at NIST,

Anal. Chim. Acta 380(2-3), 289-302 (1999).

Kaplan, S.G. and Hanssen, L.M.,

FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers,

Proc. SPIE Conference Polarization: Measurement, Analysis, and Remote Sensing II, SPIE 3754, (1999), pp. 285-293.

Lykke, K.R., Shaw, P.S., Hanssen, L.M., and Eppeldauer, G.O.,

Development of a Monochromatic Uniform Source Facility for Calibration of Radiance and Irradiance Detectors from 0.2 µm to 12 µm,

Metrologia 36, 141-146 (1999).

Hanssen, L.M. and Kaplan, S.G.,

Methods for absolute reflectance measurement of transmissive materials in the infrared,

Proc. SPIE 3425, 16 27 (1998).

Hanssen, L.M. and Kaplan, S.G.,

Problems posed by scattering transmissive materials for accurate transmittance and reflectance measurements,

Proc. SPIE 3425, 28 (1998).

Datla, R.U. and Hanssen, L.M., Editors,

Optical Diagnostic Methods for Inorganic Transmissive Materials,

Proc. SPIE, 3425, Bellingham, WA (1998).

Dummer, D.J., Kaplan, S.G., Hanssen, L.M., Pine, A.S., and Zong, Y.,

High Quality Broadband Brewster's Angle Reflective Polarizer for Infrared Applications,

Appl. Opt. 37, 1197 (1998).

Dunmore, F.J. and Hanssen, L.M.,

Miniature Fourier Transform Spectrometer for Radiometric Temperature Measurement,

in Proc. 11th International Conference of Fourier Transform Spectroscopy, ed. by J.A. de Haseth (AIP, Woodbury, NY, 1998), pp. 415-418.

Eppeldauer, G.P., Migdall, A.L., and Hanssen, L.M.,

InSb Working Standard Radiometers,

J. Res. Natl. Inst. Stand. Tech. 103(2) 153-162 (1998).

Eppeldauer, G.P., Migdall, A.L., and Hanssen, L.M.,

InSb Working Standard Radiometers,

in Proc. NEWRAD97 Conference, Tucson, AZ, Metrologia 35, 485-490 (1998).

Kaplan, S.G. and Hanssen, L.M,

Normal infrared spectral emittance of A1203,

Proc. SPIE 3425, 120-125 (1998).

Kaplan, S.G. and Hanssen, L.M.,

Characterization of narrowband infrared interference filters,

Proc. SPIE 3425, 48-55 (1998).

Kaplan, S.G. and Hanssen, L.M.,

Emittance of coated sapphire windows,

in Proc. 7th DoD Electromagnetic Windows Symposium, Laurel, MD (1998), p. 46-52.

Kaplan, S.G. and Hanssen, L.M.,

FT-IR based polarimeter with high-quality Brewster-angle polarizers,

Proc. SPIE 3425, 239-247 (1998).

Kaplan, S.G. and Hanssen, L.M.,

Infrared regular reflectance and transmittance instrumentation and standards at NIST,

Anal. Chim. Acta 380(2-3), 303-310 (1998).

Kaplan, S.G., Hanssen, L.M., Griesmann, U., and Gupta, R.,

Fourier transform refractometry,

Proc. SPIE 3425, 203-212 (1998).

Kaplan, S.G., Hanssen, L.M., Migdall, A.L., and Lefever-Button, G.,

Characterization of high-OD ultrathin infrared neutral density filters,

Proc. SPIE 3425, 56-63 (1998).

Kawate, E., Hanssen, L.M., Kaplan, S.G., and Datla, R.U.,

Design and operation of a highly sensitive laser calorimeter for low-absorbing materials,

Proc. SPIE 3425, 134-145 (1998).

Lykke, K.R., Shaw, P.S., Hanssen, L.M., and Eppeldauer, G.P.,

Development of a monochromatic uniform source facility for calibration of radiance and irradiance detectors from 0.2 µm to 12 µm,

Poster presentation at the NEWRAD97 Conference, Tucson, AZ (Oct. 27-29, 1997) Metrologia 35, 479-484 (1998).

Snail, K.A. and Hanssen, L.M.,

Reflectance Measurements of Diffusely Scattering Surfaces using Conic Mirror Reflectometers,

in The Academic Press Guide to Molecular Spectroscopy: Theory and Practice, ed. by J. Workman and A. Springsteen (Academic Press, NY, 1998), pp. 269-298.

Snail, K.A. and Hanssen, L.M.,

The magnification of conic mirror reflectometers,

Appl. Opt. 37(19), 4143-4149 (1998).

Zhu, C. and Hanssen, L.M.,

Absorption line evaluation methods for wavelength standards,

Proc. SPIE 3425, 111-118 (1998).

Zhu, C.J. and Hanssen, L.M.,

Studies of a Polystyrene Wavenumber Standard for Infrared Spectrophotometry,

Proc. 11th Intl. Conf. Fourier Transform Spectroscopy, ed. by J.A. de Haseth (AIP, Woodbury, NY, 1998), pp. 491-497.

Kaplan, S.G., Hanssen, L.M., and Datla, R.U.,

Testing and Improving the Radiometric Accuracy of FT-IR Transmittance Measurements,

in Proc. OSA Winter Topical Meeting on Fourier Transform Spectroscopy, Tech. Digest Series 3, 107-109 (1997).

Kaplan, S.G., Hanssen, L.M., and Datla, R.U.,

Testing the Radiometric Accuracy of FT-IR Transmittance Measurements,

Appl. Opt. 36, 8896-8908 (1997).

Zhang, Z.M. and Hanssen, L.M.,

A Computer Simulation of the Nonlinearity Effect on FT-IR Measurements,

Mikrochimica Acta [Suppl.] 14, 317-319 (1997).

Zhang, Z.M., Hanssen, L.M., Hsia, J.J., and Datla, R.U.,

A Procedure for Testing the Radiometric Accuracy of Fourier Transform Infrared Spectrometers,

Mikrochimica Acta [Suppl.] 14, 315-316 (1997).

Zhang, Z.M., Zhu, C.J., and Hanssen, L.M.,

Absolute Detector Calibration Applied to Nonlinearity Correction in FTIR Measurements,

Appl. Spectrosc. 51(4), 576-579 (1997).

Hanssen, L.M.,

Effects of Non-Lambertian Surfaces on Integrating Sphere Measurements,

Appl. Opt. 35(19), 3597-3606 (1996).

Zhang, Z.M., Hanssen, L.M., Datla, R.U., and Drew, H.D.,

An Apparatus for Transmittance and Reflectance Measurements at Cryogenic Temperatures,

Int. J. Thermophys. 17(6) 1441-1454 (1996).

Zhang, Z.M., Hanssen, L.M., and Datla, R.U.,

Polarization-Dependent Angular Reflectance of Silicon and Germanium in the Infrared,

Infrared Phys. Tech. 37, 539-546 (1996).

Hanssen, L.M.,

New Instrumentation Development at National Institute of Standards and Technology for Spectral Diffuse Reflectance and Transmittance Measurement,

in Spectrophotometry, Luminescence and Colour: Science and Compliance, ed. by C. Burgess and D.G. Jones (Elsevier, New York, 1995), p. 115-128.

Chenault, D., Snail, K.A., and Hanssen, L.M.,

Improved Integrating Sphere Throughput with a Lens and Nonimaging Concentrator,

Appl. Opt. 34(34), 7959-7964 (1995).

Gupta, D., Wang, L., Hanssen, L.M., Hsia, J.J., and Datla, R.U.,

Standard Reference Materials: Polystyrene Films for Calibrating the Wavelength Scale of Infrared Spectrophotometers - SRM #1921,

NIST Spec. Publ. 260-122 (1995).

Zhang, Z.M., Hanssen, L.M., and Datla, R.U.,

High-optical-density Out-of-band Spectral Transmittance Measurements of Bandpass Filters,

Opt. Lett. 20(9), 103 (1995).

Zhang, Z.M., Datla, R.U., and Hanssen, L.M.,

Development of Neutral-Density Infrared Filters Using Metallic Thin Films,

Mat. Res. Soc. Symp. Proc. 374, 117-122 (1995).

Hanssen, L.M.,

New Instrumentation Development at National Institute of Standards and Technology,

in Proc. 2nd Oxford Conf. on Spect. (Rindge, NH; June 1994) (1994).

Zhang, Z.M., Hanssen, L.M., and Datla, R.U.,

High-Optical-Density out-of-band Spectral Transmittance Measurements of Bandpass Filters,

Opt. Lett. (1994).

Zhang, Z.M., Hsia, J.J., Datla, R.U., and Hanssen, L.M.,

Radiometric Characterization of FT-IR Spectrophotometers,

SPIE Proc. 289, (1994).

Snail, K.A., Lu, Z.P., Weimer, R., Heberlein, J., Pfender, E., and Hanssen, L.M.,

Confirmation of {113} Facets on CVD-Grown Diamond,

J. Crystal Growth 137, 676 (1994).

Hanssen, L.,

Parameters for an Infrared Diffuse Reflectance Standard,

Opt. Eng. 32(4), 877 (1993).

Zhang, Z.M., Hsia, J.J., Datla, R.U., and Hanssen, L.M.,

Radiometric Characterization of FT-IR Spectrophotometers,

in Proc. 9th Int'l Conf. Fourier Transform Spectroscopy, 2089, 226-227 (1993).

Hanssen, L.M. and Snail, K.A.,

Nonimaging Optics and the Measurement of Diffuse Reflectance,

SPIE Proc., Nonimaging Optics: Maximum Efficiency Light Transfer 1528, 142 (1991).

Hanssen, L.M., Snail, K.A., Carrington, W.A., Kellogg, S., Butler, J.E., and Oakes, D.B.,

Diamond and Non-Diamond Carbon Synthesis in An Oxygen-Acetylene Flame,

Thin Solid Films 196(2), 271 (1991).

Oakes, D., Butler, J., Snail, K., Carrington, W., and Hanssen, L.,

Diamond Synthesis in Oxygen-Acetylene Flames: Inhomogeneities and the Effects of Hydrogen Addition,

J. Appl. Phys. 69(4), 2602 (1991).

Snail, K.A. and Hanssen, L.M.,

High Temperature, High Rate Homoepitaxial Growth of Diamond in An Atmospheric Pressure Flame,

J. Crystal Growth 112, 651 (1991).

Snail, K.A., Oakes, D.B., Butler, J.E., and Hanssen, L.M.,

Studies of Diamond Deposition With 1-D and 2-D Combustion Flames,

in Proc. 2nd Int'l Conf. New Diamond Science and Technology, ed. by Messier, Glass, Butler and Roy (Materials Research Society, 1991), p. 503.

Hanssen, L.M., Snail, K., Carrington, W., Butler, J., Kellog, S., and Oakes, D.,

Diamond and Non-Diamond Carbon Synthesis in an Oxygen-Acetylene Flame,

Thin Solid Films ( Elsevier Sequoia, The Netherlands), 196 (1991).

Thorpe, T., Morrish, A., Hanssen, L., Butler, J., and Snail, K.,

Growth, Polishing, and Optical Scatter of Diamond Thin Films,

Proc. SPIE 1325, 230 (1990).

Carrington, W., Hanssen, L.M., Snail, K., Oakes, D., and Butler, J.,

Diamond Growth in O₂ + C₂H₄ Flames,

Metallurgical Trans. A 20A, 1282 (1989).

Hanssen, L.M.,

Effects of Restricting the Detector Field of View When Using Integrating Spheres,

Appl. Opt. 28(10), 2097 (1989).

Snail, K. and Hanssen, L.M.,

Integrating Sphere Designs with Isotropic Throughput,

Appl. Opt. 28(10), 1793 (1989).

Snail, K., Hanssen, L.M., and Morrish, A.,

Hemispherical Transmittance of Several Free Standing Diamond Films,

Proc. SPIE Cnf. on Diamond Optics II 1146, 85 (1989).

Hanssen, L.M. and Snail, K.,

IR Diffuse Reflectometry: Standards and New Instrumentation Development,

Naval Metrology Res. Develop. Program Conf. Rpt., Metrolog (1988).

Hanssen, L.M., Carrington, W., Butler, J., and Snail, K,

Diamond Synthesis Using an Oxygen-Acetylene Torch,

Mat. Lett. 7(7), 289 (1988).

Hanssen, L.M., Carrington, W., Butler, J., and Snail, K.,

New Instrumentation for Measuring Emittance,

Proc. HAVE Forum 88 (LO Symp., Atlanta, GA ) (1988).

Cheng, S., Cebe, P., Hanssen, L.M., Riffe, D., and Sievers, A.,

Hemispherical Emissivity of V, Nb, Ta, Mo, and W from 300 to 1000K,

J. Opt. Soc. Am. B4, 351 (1987).

Hanssen, L.M. and Snail, K.,

Infrared Diffuse Reflectometer for Spectral, Angular and Temperature Resolved Measurements,

Proc. Soc. Photo-Opt. Instrum. Eng. 807, 148 (1987).

Hanssen, L.M., Riffe, D., and Sievers, A.,

Infrared Surface-wave Interferometry on W(100),

Opt. Lett. 11, 782 (1986).

Riffe, D., Hanssen, L.M., and Sievers, A.,

Surface-reconstruction-induced changes in Free-Carrier Scattering from the W(100) Surface: An Infrared Surface-Electromagnetic-Wave Study,

Phys. Rev. B34(2), 692 (1986).

Riffe,D., Hanssen, L.M., and Sievers, A.,

Infrared Observation of Absorbate Induced Changes in Free Carrier Surface Scattering,

Surface Sci. 176, 679 (1986).

Snail, K., Morrish, A., and Hanssen, L.M.,

Absolute Specular Reflectance Measurements in the Infrared,

Proc. SPIE 692, 143 (1986).

Riffe, D., Hanssen, L.M., Sievers, A., Chabal, Y., and Christman, S.,

Linewidth of H Chemisorbed on W(100): An Infrared Study,

Surface Sci. L559, 161 (1985).