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Publications by Simon Kaplan

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Burnett, J.H., Kaplan, S.G., Shirley, E.L., Horowitz, D., Clauss, W., Grenville, A., and Van Peski, C.,
High index optical materials for 193 nm immersion lithography,
Proc. SPIE 6154, 615418 (2006).

Kaplan, S.G. and Burnett, J.H.,
Optical properties of fluids for 248 nm and 193 nm immersion photolithography,
Appl. Opt., vol. 45, 1721-1724 (2006).

Harvey, A.H., Kaplan, S.G., and Burnett, J.H.,
Effect of dissolved air on the density and refractive index of water,
Intl. J. Thermophys. 26, 1495-1514 (2005).

Burnett, J.H., Kaplan, S.G., Shirley, E.L., Tompkins, P.J., and Webb, J.E.,
High-index materials for 193 nm immersion lithography,
Pro. SPIE 5754, 611-621 (2005).

Budhlall, B., Parris, G., Zhang, P., Gao, X., Zarkov, Z., Ross, B., Kaplan, S., and Burnett, J.,
High refractive index immersion fluids for 193 nm immersion lithography,
Proc. SPIE 5754, 622-629 (2005).

Burnett, J.H. and Kaplan, S.G.,
Measurement of the refractive index and thermo-optic coefficient of water near 193 nm,
J. Microlithog. Microfab, Microsystems 3(1), 68-72 (2004).

Thomas, M.E., Blodgett, D.W., Hahn, D.V., and Kaplan, S.G.,
Characterization and modeling of the infrared properties of GaP and GaAs,
Proc. Window and Dome Technologies VII. (Orlando, FL, 22-23 April 2003), SPIE 5078(1) 159-68 (2003).

Blodgett, D.W., Thomas, M.E., Hahn, D.V., and Kaplan, S.G.,
Longwave infrared absorption and scatter properties of ZnS and ZnSe,
Proc. Window and Dome Technologies VII. (Orlando, FL, 22-23 April 2003), SPIE 5078(1), 137-47 (2003).

Hahn, D.V., Thomas, M.E., Blodgett, D.W., and Kaplan, S.G.,
Characterization and modeling of the infrared properties of diamond and SiC.
Proc. Window and Dome Technologies VII. (Orlando, FL, 22-23 April 2003), SPIE 5078(1), 148-58 (2003).

Gupta. R. and Kaplan S.G.,
High accuracy ultraviolet index of refraction measurements using a Fourier transform spectrometer,
J. Res. NIST 108(6), 429-437 (2003).

Hanssen, L.M. and Kaplan, S.G.,
Linearity characterization of NIST's infrared spectral regular transmittance and reflectance scales,
Proc. SPIE 4826 21-6 (2003).

Chunnilall, C.J., Clarke, F.J.J., Smart, M.P., Hanssen, L.M., and Kaplan, S.G.,
NIST-NPL comparison of mid-infrared regular transmittance and reflectance,
Metrologia 40(1), S55-9,(2003).

S.G. Kaplan and L.M. Hanssen,
Silicon as a standard material for infrared reflectance and transmittance from 2 µm to 5 µm,
Inf. Phys. Tech. 43, 389 (2002).

S.G. Kaplan, L.M. Hanssen, E.A. Early, M.E. Nadal, and D. Allen,
Comparison of near-infrared transmittance and reflectance measurements using dispersive and Fourier transform spectrophotometers,
Metrologia 39, 157 (2002).

S.G. Kaplan and M.E. Thomas,
Measurement of the o-ray and e-ray infrared refractive index and absorption coefficient of sapphire from 10 K to 295 K,
Proc. SPIE 4822 (2002).

Yang, D., Thomas, M.E., and Kaplan, S.G.,
Measurement of the infrared refractive index of sapphire as a function of temperature,
Proc. SPIE Meeting on Windows and Domes, Orlando, FL, May 2001 (2001).

S.G. Kaplan and L.M. Hanssen,
Standard Reference Materials: Infrared Transmittance Standards - SRM’s 2053, 2054, 2055, and 2056,
NIST Spec. Publ. 260-123, U.S. Govt Printing Office, Washington (2001).

Kaplan, S.G., Hanssen, L.M., Early, E.A., and Nadal, M.E.,
Intercomparison of regular spectral transmittance and reflectance measurements with FTIR-and monochromator-based spectrophotometers,
Proc. SPIE 4103 53-61 (2000).

Di Yang; Thomas, M.E., Tropf, W.J., Kaplan, S.G.,
Infrared refractive index measurements using a new method,
Proc. SPIE 4103 42-52 (2000).

S.G. Kaplan and L.M. Hanssen,
FT-IR-based ellipsometer using high-quality Brewster-angle polarizers,
Proc. SPIE 3754, 285 (1999).

L.M. Hanssen and S.G. Kaplan,
Infrared diffuse reflectance instrumentation and standards at NIST,
Anal. Ch. Acta 380, 289 (1999).

S.G. Kaplan and L.M. Hanssen,
Infrared regular reflectance and transmittance instrumentation and standards at NIST,
Anal. Ch. Acta 380, 303 (1999).

Kawate, E., Hanssen, L.M., Kaplan, S.G., and Datla, R.V.,
Design and operation of a highly sensitive and accurate laser calorimeter for low absorption materials,
Proc. SPIE 3425, 134-45 (1998).

Dummer, D.J., Kaplan, S.G., Hanssen, L.M., Pine, A.S., and Zong, Y.G.,
High-quality Brewster's angle polarizer for broadband infrared application,
Appl. OPT. 37(7), 1194-1204 (1998).

S.G. Kaplan and L.M. Hanssen,
Emittance of coated sapphire windows,
Proc. of 7th DoD Symposium on Electromagnetic Windows (1998).

S.G. Kaplan and L.M. Hanssen,
FTIR-based polarimeter with high-quality Brewster’s angle polarizers,
Proc. SPIE 3425, 239 (1998).

S.G. Kaplan, L.M. Hanssen, U. Griesmann, and R. Gupta,
Fourier transform refractometry,
Proc. SPIE 3425, 203 (1998).

S.G. Kaplan and L.M. Hanssen,
Normal infrared emittance of Al2O3,
Proc. SPIE 3425, 120 (1998).

S.G. Kaplan, L.M. Hanssen, and A.L. Migdall,
Characterization of high-OD infrared neutral density filters,
Proc. SPIE 3425, 56 (1998).

S.G. Kaplan and L.M. Hanssen,
Characterization of narrowband infrared interference filters,
Proc. SPIE 3425, 48 (1998).

D.J. Dummer, S.G. Kaplan, L.M. Hanssen, A.S. Pine, and Y. Zong,
Reflective Brewster’s Angle Chevron Polarizer,
Appl. Opt. 37, 1194 (1998).

S.G. Kaplan, L.M. Hanssen, and R.V. Datla,
Testing the Radiometric Accuracy of FT-IR Transmittance Measurements,
Appl. Opt. 36, 8896 (1997).

S.G. Kaplan, M. Quijada, H.D. Drew, D.B. Tanner, G.C. Xiong, R. Ramesh, C. Kwon, and T. Venkatesan,
Optical Evidence for the dynamic Jahn-Teller effect in Nd0.7Sr0.3MnO3,
Phys. Rev. Lett. 77, 2081 (1996).

Kaplan, S.G., Wu, S., Lihn, T.S., and Drew, H.D.,
Normal state ac hall effect in YBa2Cu3O7 thin films,
Phys. Rev. Lett. 76(4), 696 (1996).

Lihn, T.S., Choi, E.J., Kaplan, S.G., and Drew, H.D.,
Grain-boundary-induced magneto-far-infrared resonances in superconducting YBa2Cu3O7 thin films,
Phys. Rev. B 53(2), 927 (1996).

Lihn, T.S., Wu, S., Drew, H.D., Kaplan, S.G., Li, Q., and Fenner, D.B.,
Measurement of the Far-infrared magnetoconductivity tensor of superconducting YBa2Cu3O7 thin films,
Phys. Rev. Lett. 76(20), 3810 (1996).

Wu, S., Kaplan, S.G., Lihn, T.S., Drew, H.D., and Hou, S.Y.,
Temperature dependance of the far-infrared magnetotransmission of YBa2 Cu3 O7 films,
Phys. Rev. B 54(18), 1343 (1996).

Wu, S., Kaplan, S.G., Quijada, M., Sengupta, K., and Drew, H.D.,
Improved circular polarizer for far-infared lightpipe systems,
Rev. Sci. Instrum. 66(12), 5559 (1995).

Kaplan, S.G., Chen, M., Drew H.D., Rajeswari M., Liu R., Venkatesan T., Kanjilal, D., Senapati, L., Mehta, G.K.,
Far-Infrared Transmission of YBa2Cu3O7-Δ Thin-Films with Columnar Defects,
Phys. C 232(1-2), 174-180 (1994).

Kaplan, S.G., Noh, T.W., Sievers, A.J., Cheong S.W., Fisk Z.,
Far-Infrared Antiferromagnetic-Resonance In Gd2CuO4,
Phys. Rev. B 47(9), 5300-5314 (1993).

Fitzgerald, S.A., Kaplan, S.G., Rosenberg, A., Sievers, A.J., Mcmordie, R.A.S.,
Far-Infrared Transmission of Superconducting KxC60 Films,
Phys. Rev. B 45(17), 10165-10168 (1992).

Park, W.K., Noh, T.W., Khim, Z.G., Kaplan, S.G., Sievers, A.J.,
Far-infrared properties of small Ba0.6K0.4BiO3 particles
J. Korean Phys. Soc. 23(4), 325-30 (1990).

Noh, T.W., Kaplan, S.G., Sievers, A.J.,
Far-Infrared Sphere Resonance in Isolated Superconducting Particles,
Phys. Rev. B 41(1), 307-326 (1990).

Kaplan, S.G., Noh, T.W., Sievers, A.J., Cheong SW, Fisk Z.,
Antiferromagnetic-Resonance in La2CuO4+Y,
Phys. Rev. B 40(7), 5190-5193 (1989).

Noh, T.W., Kaplan, S.G., Sievers AJ,
Observation of a Far-Infrared Sphere Resonance in Superconducting La2-XSrXCuO4-Y Particles [Reply],
Phys. Rev. Lett. 62(23), 2764-2764 (1989).

Noh, T.W., Kaplan, S.G., Sievers, A.J.,
Observation of a Far-Infrared Sphere Resonance in Superconducting La2-XSrXCuO4-Y Particles,
Phys. Rev. Lett. 62(5), 599-602 (1989).

Noh, T.W., Sulewski, P.E., Kaplan, S.G., Sievers, A.J., Lathrop, D.K., Buhrman, R.A., Brodsky, M.B., Dynes, R.C., Kitawa, K., Tuller, H.L.,
Far infrared measurements on single crystals, films and bulk sintered high temperature superconductors,
High-Temperature Superconductors Symposium 435-8 (1988).

Kaplan, S.G., Noh, T.W., Sulewski, P.E., Xia, H., Sievers, A.J., Wang, J., Raj, R.,
Optical Reflectivity Studies of Polycrystalline La4BaCu5O13 and La2SrCu2O6+Δ,
Phys. Rev. B 38(7), 5006-5009(1988).

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