Searched:  Author Contains ("Xin, Y.") Sorted By:  Relevance, Descending Results:  1–7 of exactly 7 matches. in 0.09 seconds. Sort Results By: Relevance Publication Date System Entry Date Resource/Doc Type Title Research Org Sponsoring Org OSTI Identifier Creator/Author(s) Ascending Descending Return to Original Search Page Page 1 of 1     Show only (√) Items Clear all (√) Items Printer Friendly Refine Search   Size Identifier Title Creator/Author (s) Pub Date 362 K CONF-970834--17 Interfaces and defects in opto-electronic semiconductor films studies by atomic resolution stem Xin, Y. ; Wallis, D.J. ; Browning, N.D. 1997 Apr 01 503 K SAND99-1303C Atomic Resolution Microscopy of Semiconductor Defects and Interfaces Baca, A.G. ; Browning, N.D. ; James, E.M ; et.al. 1999 Jun 17 509 K ORNL/CP-100161 Direct Observations of Defect Structures in Optoelectronic Materials by Z-Contrast STEM Beaumont, B. ; Browning, N.D. ; Chen, Y.P. ; et.al. 1998 Aug 31 641 K ORNL/CP--95489; CONF-970911-- Direct structure determination by atomic-resolution incoherent STEM imaging Nellist, P.D. ; Xin, Y. ; Pennycook, S.J. 1997 Nov 01 346 K ORNL/CP--97026; CONF-980713-- Direct observations of defect structures in optoelectronic materials by Z-contrast STEM Xin, Y. ; Browning, N.D. ; Pennycook, S.J. 1998 Feb 01 786 K ORNL/CP--95879; CONF-971201-- Direct observations of atomic structures of defects in GaN by high-resolution Z-contrast STEM Xin, Y. ; Pennycook, S.J. ; Browning, N.D. ; et.al. 1997 Dec 01 344 K ORNL/CP--97022; CONF-980713-- Direct observation of threading dislocations in GaN by high-resolution Z-contrast imaging Xin, Y. ; Browning, N.D. ; Sivananthan, S. ; et.al. 1998 Feb 01 Top Return to Original Search Page Page 1 of 1