Technical Highlights
- First Two-Photon Doppler-Free Measurement of the
He 11S - 21S Transition. As a
complement to our EVU and VUV efforts, we have just completed the first
2-photon Doppler-free measurement of the 1 1S -
2 1S transition in He at 120 nm. The 120 nm
radiation was generated by harmonic up-conversion of a well-characterized near
infrared laser. This measurement is the first Doppler-free laser measurement
in this wavelength range, representing a significant advance for high accuracy
(1 part in 108) VUV pulsed laser spectroscopy. This project is
continuing in collaboration with the University of Connecticut, under the
supervision of Prof. Edward Eyler. The upcoming second generation measurement
will be more accurate by nearly an order of magnitude. This measurement is of
fundamental importance to the atomic physics community, as it provides a
stringent test of QED calculations in the simplest 3-body, 2-electron system.
(S. Bergeson, T.B. Lucatorto, and J. Wen)
- In-situ Optical Constants. To broaden our EUV optics
calibration program, we have recently installed a thin-film deposition system
with a load-lock to the sample chamber of our beamline. This allows us to make
accurate measurements of the complex index of refraction of films that have not
incurred any contamination from exposure to air. These measurements allow
developers to improve the design and make more accurate predictions of the
performance of multilayers. We have begun our activity by making measurements
on the most important multilayer constituent materials. (C. Tarrio,
T.B. Lucatorto).
![Figure 1](Images/fig1.gif) |
Figure 1. Reflectance of a 92 nm thick Si film on float glass as
measured at 50 eV photon energy (squares) and the fit to the data (solid
line). |
- Infrared Spectromicroscopy Facility Established at SURF. A new
infrared (IR) beamline and spectromicroscope has been installed at SURF. The
NIST facility consists of a Fourier Transform IR (FTIR) spectrometer coupled to
an IR microscope, both housed in a clean room to provide freedom from sample
contamination. As has been demonstrated several years ago at the first
operational spectromicroscopy facility on the National Synchrotron Light Source
at Brookhaven, synchrotron sources can provide brightness in the IR region of
the spectrum that is several of orders greater than that obtained from
conventional thermal sources. The NIST facility will be available to both
internal and external user to provide microscopic chemical analysis on samples
of industrial, forensic, and scientific interest. The superior brightness
afforded by synchrotron radiation will allow a large increase in the
sensitivity of the analysis. (U. Arp, T. B. Lucatorto, and
J. Wen)
![Segment of magnet removed](Images/fig2.gif) |
Figure 2. A 5.4 × 103 kg (6 ton) segment
of the lower magnet yoke of SURF II is removed. R. Madden operates
the lifting crane as L. Hughey (left) prepares to guide the segment onto
an "aero-plank" load-moving system, which then transports it from the
SURF beam hall out of the Radiation Physics Building through the back loading
bay. During October and November 1997, the SURF operations team disassembled
and removed the 1.3 × 105 kg (140 ton) magnet
system by this technique. |
- SURF II Being Converted to SURF III. The present
SURF II facility, built in 1974, is undergoing a major overhaul which is
designed to improve its performance for radiometry and other scientific
applications. The light at SURF II was officially turned off on
September 5, 1997 to begin the dismantling of the vacuum systems and the
electromagnet. As of November 1, 1997,
1.3 × 105 kg (140 ton) electromagnet system
has been completely removed.
Pieces of the new magnet core iron are due to arrive in 1997. We hope to finish
assembly of the magnet core and make exacting magnetic field measurements in
March and April 1998. Commissioning of the SURF III storage ring is
scheduled to begin in May 1998.
The most important aspect of the SURF III concept is improved radiometric
accuracy. The magnitude and angular distribution of the flux radiated by
SURF III will be much more accurately characterized through a better
knowledge of the electron energy and trajectory in the storage ring and
improved methods of determining the electron current. The improved accuracy of
the electron orbit will be achieved by more stringent mechanical tolerances on
the magnet, better steel, and optimized magnet design. As a result of the
improved iron in the magnet, a significant gain in field strength will also be
realized, allowing the maximum achievable energy of the electrons in the
storage ring to be increased from the 300 MeV for SURF II to close to
400 MeV for SURF III. This will allow radiometry and scientific
applications to be carried out down through the water window to a wavelength of
about 2.5 nm (~500 eV). (M. Furst, A. Hamilton, L. Hughey,
R. Madden, A. Raptakes, and R. Vest)
- Activity in Transfer Standard Detector Calibrations. New
photodiodes utilizing materials not presently in wide use have been
investigated for possible use as transfer standard detectors. A new apparatus
for the SURF II detector calibration beamline has enabled the measurement
of detector spatial uniformity or the profile of the incident radiation. This
system will also allow the employment of a new calibration technique, which
will extend the calibration capabilities further into the soft x-ray region
with the advent of SURF III.
Studies have been conducted to understand the relationship between
photoemission and the proper use of semiconductor photodiodes, an important
consideration in far ultraviolet detector radiometry.
Filter radiometer photodiodes useful in solar physics and in plasma diagnostics
have been extensively characterized in collaboration with industry and
academia. Studies of special silicon photodiodes have led to the determination
of the internal yield of silicon in the 160 nm to 254 nm spectral
region, important in the development of absolute detectors for lithography and
medical applications in this region.
Twenty-eight calibrations of transfer standard detectors were performed during
the year for applications in astronomy, aeronomy, solar physics, and plasma
diagnostics. A number of special radiation optical filters were also
characterized in research collaborations. (L.R. Canfield and
R. Vest)
- Construction of Nanoscale Physics Facility. Laboratory renovations
in the Metrology building were completed this year for a new Nanoscale Physics
Facility in the Electron Physics Group. The new facility will allow a new level
of nanoscale measurements to be performed to elucidate the physics of electron
confinement and transport in nanoscale structures and devices. Our measurement
capability will be based on a cryogenic scanning tunneling microscope operating
at temperatures as low as 2 K. A vector superconducting magnet surrounding
the microscope will generate rotating magnetic fields up to 10 T.
Facilities for MBE (Molecular Beam Epitaxy) fabrication of metal and
semiconductor structures are incorporated in this system with in-vacuum
transfer of fabricated samples, as shown in Fig. 3.
|
![Nanoscale Physics Facility](Images/fig3.jpg)
Figure 3 |
This new measurement capability will allow very high energy-resolution
measurements together with atomic scale positional resolution that will be
exploited to study electron states and conduction on an atom-by-atom basis.
The new measurement capability together with new MBE fabrication facilities
will allow the study of a wide variety of systems, including 2-D electron
gases, quantum wires and dots, and magneto-transport devices The laboratory
renovation consisted of the construction of a four-office module laboratory in
the Metrology basement with new air and electrical services. The renovation
included the construction of a 1 m diameter pit for the superconducting
cryostat system and an acoustically and electrically shielded room for the
sensitive measurements. The laboratory renovations were completed this year
along with the initial assembly of the vacuum systems. The construction of the
cryogenic tunneling microscope will be undertaken in FY98. The facility is
expected to be fully operational by the end of 1998. (J.A. Stroscio,
D.T. Pierce, A.D. Davies, and R.J. Celotta)
![Comparison between measured and modeled exchange coupling strengths](Images/fig4.gif) |
Figure 4. Comparison between measured and modeled exchange
coupling strengths. The model uses measured roughness data along with ideal
coupling strengths that are very close to theoretical predictions. |
- Fe/Au/Fe(100) Magnetic Exchange Coupling. The magnetic coupling
between ultrathin magnetic films is an essential element in the latest
generation of magnetic sensors and magnetic storage devices. However, ever
since the discovery of indirect oscillatory exchange coupling between magnetic
films separated by nonmagnetic spacer layers, researchers have been puzzled by
the large, order of magnitude, discrepancy between measured exchange coupling
strengths and theoretically predicted values. We have found that there is
nothing wrong with the theory, but it requires growing nearly ideal, atomically
precise, multilayers in order to attain the large predicted coupling strengths.
To achieve this high quality of growth, lattice matched Fe/Au/Fe sandwich
structures were grown on nearly perfect Fe single crystal whiskers. The samples
were grown with a wedge shaped Au spacer layer of varying thickness so that the
thickness dependence of the exchange coupling could be captured in a single
image. Coupling strengths were measured by taking images of the magnetic
structure for various applied magnetic fields using a unique confocal
magneto-optic microscope developed in the Electron Physics Group specifically
for this project. The measured coupling strengths were an order of magnitude
larger than previously measured for Fe/Au/Fe, but the values were still
slightly less than predicted. This remaining difference was due to a small
amount of residual roughness. Reflection high energy electron diffraction
(RHEED) measurements of this roughness showed that the measured exchange
coupling was the average of the coupling strengths from the various Au film
thicknesses. The final result showed excellent agreement with theortical
prediction and should lead to a better understanding of how these values are
affected by the atomic scale roughness of the films. (J. Unguris,
R.J. Celotta and, D.T. Pierce)
- Polarized Light Emission from the Metal-Metal STM Junction.
Macroscopic magnetic properties that one can measure are controlled by
microscopic properties for which there are insufficient direct measurement
techniques. Technological advances in higher density magnetic information
storage and smaller magnetic devices are driving magnetic measurement
requirements further toward nanometer resolution. The addition of magnetic
contrast to scanning tunneling microscopy is a widely recognized challenge
that would not only allow high spatial resolution magnetic imaging, but would
also allow correlation of magnetic microstructure with topographic and
spectroscopic properties measured by the STM (Scanning Tunneling Microscope).
A few years ago, it was reported that STM induced luminescence was emitted from
a tunnel junction, formed by a W tip and a ferromagnetic Co thin film. Further,
the radiation had a circularly polarized component the sign of which was
related to the direction of magnetization. The promise of this intriguing
result for magnetic imaging on the nanometer scale led us to make further
measurements of this type. Our goals were 1) to test the generality of
this effect by measuring a different ferromagnetic material, 2) to
eliminate surface roughness as a possible source of changes in circular
polarization, and 3) to fully characterize the polarization of the STM
induced luminescence to try to understand the underlying mechanism.
To accomplish the first two of these goals we use an Fe(001) whisker which we
have shown with RHEED and STM to be a high quality single crystal that has a
very flat surface with terrace widths of approximately 1 µm. The
polarization was fully characterized by measuring the Stokes parameters of the
luminescent radiation. The results for Fe(001) showed that the luminescence
light was fully polarized within experimental uncertainty. It was primarily
linearly polarized in the plane defined by the tip axis and light emission
axis. There was a small, circular polarization component, but there was no
change in the circular polarization that could be associated with a change in
magnetization within an experimental uncertainty of approximately 2 %. We
attribute the small circular polarization of the luminescence to tip
asymmetries.
Our result is in direct contrast to previous measurements of Co. Assuming the
validity of the measurements on Co, the absence of an effect on Fe does not
make this a useful means to obtain magnetic contrast in general. Further, a
number of factors make the measurement of the circular polarization of the
luminescence vs. sample magnetization very difficult: 1) low count rates,
2) circular polarization from tip dependent asymmetries, and
3) necessity of protecting the tip during sample magnetization reversal.
Other means will have to be found to obtain high resolution images in scanning
tunneling microscopy. (D.T. Pierce, A.D. Davies, and J.A. Stroscio).
- Fabrication of Nanowires and Nano-Trenches by Reactive-Ion Etching of
Laser-Focused Chromium. In a nanostructure fabrication technique recently
developed in the Electron Physics Group, chromium atoms are focused in the
nodes of a laser standing wave as they deposit onto a substrate. The result is
a large, highly coherent array of lines or dots with a spacing of 213 nm
and width as small as 30 nm. As part of our ongoing research in this
field, we have been exploring ways to refine the nanostructures created in this
process, and also broaden their applicability. One potential drawback to the
structures as deposited is that there is some degree of background chromium
deposition between the features. We have recently shown that this background
can be removed through a relatively simple reactive-ion etch process. Once the
background is removed, further etching transfers the pattern into the silicon
substrate. By carefully controlling the etching process and the contrast of the
chromium lines, we have found that some very striking structures can be made.
These range from narrow (~80 nm) trenches in the silicon, to well-defined
chromium nanowires with diameter ~68 nm atop sharp silicon ridges. This
extension to our basic process demonstrates the possibility of making more
interesting and useful structures, and also extending the process to other
materials. (J.J. McClelland)
![Figure 5. Nanowires and nanotrenches](Images/fig5.gif)
Figure 5. Nanowires and nanotrenches created by reactive-ion etching
of laser focused chromium. (a) Cr wires ~68 nm wide on narrow Si
ridges; (b) highly regular array of Cr ribbons on Si;
(c) nanotrenches ~80 nm wide cut into Si.
- Atomic-Scale Electronic Structure Measurements of Magnetic Surfaces.
Tunneling spectroscopy measurements with the scanning tunneling microscope
yield information about the electronic structure of surfaces on the atomic
scale. We have taken advantage of unique tunneling spectroscopy characteristics
of transition metal bcc(001) surfaces to study local electronic properties of
magnetic systems. These surfaces support a surface state near the Fermi energy
that gives rise to a sharp tunneling conductance peak. The state originates
from a nearly unperturbed d orbital that extends into the vacuum region
and is exchange split on magnetic surfaces, leading to two spin-polarized
states at different energies. The energy position of the spin-polarized states
reflects the strength of the local exchange splitting and thus provides some
information about the local magnetic properties. We have investigated this
state on Fe(001), Cr(001), and FeCr(001) alloy surfaces.
![Tunneling conductance spectra](Images/fig6.gif) |
Figure 6.
The top two tunneling conductance spectra in Fig. 6 (on the left)
are representative of spectra from Cr(001) and Fe(001) surfaces. The sharp
conductance peak in these spectra is due to the surface state. We identified
the surface-state origin through a collaboration with M. Weinert at
Brookhaven National Laboratory. The surface state is spin-polarized for both
Cr and Fe, however in both systems only one of the states is close enough to
the Fermi energy to be observed in tunneling spectroscopy measurements. Because
of the unique energy positions of the states, we can use these conductance
signatures has a means of chemical identification. |
Tunneling spectroscopy measurements of a Fe/Cr alloy surface allow us to
measure the electronic structure around a single isolated magnetic impurity.
Deposition of Cr on Fe at elevated temperatures leads to a surface alloy.
Submonolayer Cr coverages results in embedded single Cr impurities decorating
the Fe surface. The bottom two spectra in Fig. 6 compare the tunneling
conductance characteristics on top of and away from an embedded Cr impurity.
When the tip is over the Fe region of the surface and away from a Cr impurity,
a conductance peak is observed characteristic of the Fe(001) surface, as
expected. The tunneling conductance spectra over a Cr impurity show an
attenuated Fe(001) peak and an additional peak at a negative sample voltage.
The energy position of this peak is shifted to lower energies compared to the
peak position on the pure Cr(001) surface, reflecting the presence of
neighboring Fe rather than Cr atoms. Experiments are underway to measure the
atomic-scale lateral variation of these spectroscopy features at impurity
sites. (A.D. Davies, D.T. Pierce, and J.A. Stroscio)
- Magnetic Nanowire Arrays. We have fabricated and characterized
arrays of nanoscale magnetic wires of iron. Using our previously created arrays
of chromium lines as a self-shadowing mask, we deposited about 20 nm to
40 nm of iron. Because the iron beam was incident at a glancing angle,
only one side of each 50 nm high chromium line was coated with iron. The
other side remained bare. The glancing angle was chosen so that the deposited
iron wires were about half as wide as the chromium line spacing. The resulting
iron wires are about 100 nm wide, 20 nm to 40 nm thick, and
150 µm in length. We observed the magnetic domain structure of these
wires with SEMPA (see Fig. 7) and found the wires in single
domains magnetized along the length of the wires. From the observed transitions
between the two possible magnetization directions, we estimate the mean domain
length to be about 140 µm. Because the width of the wires is small
compared to the width of a magnetic domain wall in bulk iron, these nanowires
are effectively one-dimensional objects and provide an excellent opportunity to
study magnetization in systems with reduced dimensionality. (J.J. McClelland,
M.H. Kelley, J. Unguris, D.A. Tulchinsky, and R.J. Celotta)
![SEMPA image of iron nanowire array](Images/fig7.gif) |
Figure 7. SEMPA image of iron nanowire array. Black/white regions are
domains magnetized down/up in the figure. The bare chromium regions between the
iron wires is not magnetized and appears gray. |
- Quantitative SEMPA/MFM Comparison. In collaboration with the
Electromagnetic Technology Division of EEEL we have begun an effort that
ultimately will allow quantitative comparisons between various magnetic imaging
techniques. To facilitate such quantitative comparisons, the Electromagnetic
Technology Division has developed a magnetic imaging reference sample. The
sample is fabricated from thin-film high density magnetic recording media onto
which a test pattern is written and onto which navigation marks are
lithographically patterned. The navigation marks allow repeated measurements of
the same precise area of the sample, for example to check the long-term
stability of a given magnetic imaging system or to make detailed comparisons
between different magnetic imaging techniques. The accompanying figure shows a
comparison between magnetic images of the sample obtained by both SEMPA and
MFM. As a result of this work, one can use the quantitative magnetization
information obtained from the SEMPA image to work toward a quantitative
understanding of the magnetic contrast observed in the MFM. (M.H. Kelley, D.A.
Tulchinsky, and J. Unguris)
Figure 8. SEMPA and MFM images of the magnetic imaging reference sample.
Most Recent Technical Activities
|
Archive of Technical Activities
|