Igor V. Veryovkin

Assistant Chemist

Materials Science Division; Bldg. 200
Argonne National Laboratory
9700 South Cass Ave.
Argonne, IL 60439

phone: 630-252-4647
fax: 630-252-9555
email: verigo@anl.gov

Research Interests

Ion-Surface interactions; Formation and Time Evolution (fragmentation, ionization) of clusters and molecules produced by ion bombardment of solids; Physics and chemistry of clusters and molecules;

• Instrumentation development for Secondary Neutral Mass Spectrometry (SNMS) and Secondary Ion Mass Spectrometry (SIMS); Ion/Electron Optics development; Development and application of SNMS with laser post-ionization to surface trace analysis (including micro- and nanometer-scale objects)
• Experimental data processing (noise filtering and resolution enhancement, solution of ill-posed problems);
• Scientific database development and management.

Work Experience

• 1998 - present
  Materials Science and Chemistry Divisions of Argonne National Laboratory, Argonne, U.S.A. (assistant scientist, visiting scientist, visiting scholar)
• 1997 - 1998
  Department of Chemistry, University of Antwerp (UIA), Antwerp, Belgium (visiting scientist)
• 1990 - 1997
  Arifov Institute of Electronics of Academy of Sciences of the Republic of Uzbekistan, Tashkent, U.S.S.R. / Uzbekistan (senior scientist, scientist, assistant scientist)
• 1985 - 1990
  Special Design and Technology Bureau of Arifov Institute of Electronics of the Academy of Sciences of Uzbek Soviet Socialist Republic, Tashkent, U.S.S.R. (engineer-technologist of the 3rd grade, engineer)

Education

• 1985 -1989
  Correspondence Graduate School of Arifov Institute of Electronics of the Academy of Sciences of Uzbek Soviet Socialist Republic, Tashkent, USSR.
  Ph. D. in Physics and Mathematics, 1993
  Arifov Institute of Electronics of the Academy of Sciences of Uzbekistan, Tashkent, Uzbekistan
  Ph. D. Thesis: Studies of energetic and time parameters of fragmentation of secondary cluster ions of tantalum.
• 1980 - 1985
  Department of Physical Engineering (renamed Department of Radio Electronics and Automatics in 1984),
  Tashkent Polytechnic Institute, Tashkent, USSR.
  M. Sc. in Physical Engineering (Physical Electronics) with honors, 1985
  Tashkent Polytechnic Institute, Tashkent, USSR
  M. Sc. Diploma Thesis: Unimolecular decays of secondary cluster ions of heavy metals.

Recent Publications (1996-2001)

• M. P. McCann, W. F. Calaway, M. J. Pellin, I. V. Veryovkin, I. Constantinides, A. Adriaens, and F. Adams " Resonance Enhanced Multiphoton Ionization/Secondary Neutral Mass Spectrometry and Cesium Attachment Secondary Ion Mass Spectrometry of Bronze: A Comparison", 2001, submitted to Surf. and Interf. Anal.
• B. V. King, M. J. Pellin, I.V. Veryovkin, J. F. Moore, and W. F. Calaway, "SPIRIT - Surface Analysis with a Free Electron Laser", Proceedings of 15th International Conference on Ion Beam Analysis (IBA 2001), Cairns, Australia, Jul. 15-20, 2001 (to be published in Nucl.Instr.and Meth.B)
• M. J. Pellin, W. F. Calaway, and I. V. Veryovkin , "Quantitative Elemental Analysis Using Laser Post-ionization Secondary Neutral Mass Spectrometry", book chapter in: "ToFSIMS: Surface Analysis by Mass Spectrometry", J. Vickerman, ed., Surface Spectra Ltd. and IM Publications (in press)
• S. F. Belykh, B. Habets, U. Kh. Rasulev, A. V. Samartsev, L. V. Stroev, and I. V. Veryovkin , “Relative yields, mass distributions and energy spectra of cluster ions sputtered from niobium under keV atomic and polyatomic gold ion bombardment”, Nucl.Instr.and Meth.B, 2000, V.164, P.809-819
• I. V. Veryovkin, W. F. Calaway, and M. J. Pellin “Three-dimensional modeling of a time-of-flight mass spectrometer: optimization of SNMS/SIMS transmission using SIMION”, in: "Secondary Ion Mass Spectrometry. SIMS XII. Proceedings of the 12-th International Conference”, 2000, Elsevier, P.337-340
• I. V. Veryovkin, I. Constantinides, A. Adriaens, and F. Adams “The combined Wiener Filtering / Maximum Entropy deconvolution in data processing of SIMS measurements: mass resolution enhancement”, in: "Secondary Ion Mass Spectrometry. SIMS XII. Proceedings of the 12-th International Conference”, 2000, Elsevier, P.359-362 .
• I. V. Veryovkin, E. Cuynen , and P. Van Espen, “On the influence of cesium implantation on the emission of positive secondary ions: dual beam experiments with CAMECA ION-TOF SIMS”, in: "Secondary Ion Mass Spectrometry. SIMS XII. Proceedings of the 12-th International Conference”, 2000, Elsevier, P.389-392
• S. F. Belykh, V. I. Matveev, I. V. Veryovkin, A. Adriaens, and F. Adams, “Model for large cluster emission in ion sputtering of metals applied to atomic and polyatomic ion bombardments”, Nucl.Instr.and Meth.B, 1999, V.155, ‡‚4, P.409-415
• A. Wucher, N. Kh. Dzhemilev, I. V. Veryovkin, and S. V. Verkhoturov, “Fragmentation lifetimes and the internal energy of sputtered clusters”, Nucl.Instr.and Meth.B, 1999, V.149, ‡‚3, P.285-293
• V. I. Matveev, S. F. Belykh, and I. V. Veryovkin, “Ion-induced sputtering of a metal in the form of large clusters”, Zh.Tekh.Fiz. 1999, V.69, ‡‚3, P. 64-68 (In Russian) and Tech.Phys., 1999, V.44, ‡‚3, tranP.323-327 (Englishslation)
• S. F. Belykh, I. V. Veryovkin, and V. I. Matveev, “The model of sputtering of metals in form of large clusters under ion bombardment”, Izv.Akad.Nauk ser.fiz., 1998, V.62, No 10, P.1963-1969 (in Russian) and Bull.Russ.Acad.Sci.-Phys., 1998, V.62, No 10 (English translation)
• N. Kh. Dzhemilev, I. V. Veryovkin , S. V. Verkhoturov, S. E. Maksimov, and V. V. Solomko “The study of homogeneous and heterogeneous negative cluster ions sputtered from carbon by ions of intermediate energies”,. Izv.Akad.Nauk ser.fiz., 1998, V.62, No 10, P.1922-1927 (In Russian) and Bull.Russ.Acad.Sci.-Phys., 1998, V.62, No 10 (English translation)
• Wucher A., Bekkerman A.D., Dzhemilev U.Kh., S. V. Verkhoturov, I. V. Veryovkin, “Internal energy of sputtered clusters: The influence of bombarding conditions”, Nucl.Instr.and Meth.B, 1998, V.140, ‡‚3-4, P.311-318
• S. F. Belykh, U. Kh. Rasulev, A. V. Samartsev, and I. V. Veryovkin ,“Comparative study of kinetic energy spectra and mass distributions of Tan+ ions sputtered from tantalum by atomic and molecular ion bombardment”, Nucl.Instr. and Meth., 1998, V.136-138, ‡‚1-4, P.773-778
• A. D. Bekkerman, N. Kh. Dzhemilev, S. V. Verkhoturov, I. V. Veryovkin , and A. Adriaens, “Fragmentation of sputtered cluster ions of transition metals: distributions in lifetimes and internal energies”. Mikrochim.Acta [Suppl.] V.15, 1998, P.371-377
• S. F. Belykh, U. Kh. Rasulev, A. V. Samartsev, S. V. Verkhoturov, and I. V. Veryovkin, “Sputtering of tantalum by atomic and molecular gold ions: comparative study of yields and kinetic energy distributions of atomic and cluster ions”. Mikrochim.Acta [Suppl.] V.15, 1998, P.379-385
• S. F. Belykh, V. I. Matveev, U. Kh. Rasulev, A. V. Samartsev, and I. V. Veryovkin, “Effect of anomalously high non-additivity in sputtering of polyatomic cluster ions from metal under bombardment with molecular particles”. Izv.Akad.Nauk ser.fiz., 1998, V. 62, No 4, P. 813-820 (In Russian) and Bull.Russ.Acad.Sci.-Physics, 1998 V. 62, No 4 (English translation)
• I. V. Veryovkin, A. Adriaens, and F. Adams, “Cluster ion emission from copper under alkaline metal ion bombardment: mass distributions of sputtered clusters”, in: "Secondary Ion Mass Spectrometry. SIMS XI. Proceedings of the 11-th International Conference”, 1998, John Wiley & Sons, P.965-968
• S. V. Verkhoturov, N. Kh. Dzhemilev, S. E. Maksimov, V. V. Solomko, and I. V. Veryovkin, “The SIMS study of cluster ion emission from fullerite and graphite under cesium ion bombardment”, in: "Secondary Ion Mass Spectrometry. SIMS XI. Proceedings of the 11-th International Conference”, 1998, John Wiley & Sons, P.961-964
• S. F. Belykh, V. I. Matveev, U. Kh. Rasulev, A. V. Samartsev, and I. V. Veryovkin, “Anomalous high sputtering non-additivity of large cluster ions under molecular bombardment of metal”, in: "Secondary Ion Mass Spectrometry. SIMS XI. Proceedings of the 11-th International Conference”, 1998, John Wiley & Sons, P.957-960
• A. D. Bekkerman, N. Kh. Dzhemilev, S. E. Maksimov, V. V. Solomko, S. V. Verkhoturov, and I.V. Veryovkin, "The sputtered clusters Cs nCm: magic number sequence and fullerenes", in: "Secondary Ion Mass Spectrometry. SIMS X. Proceedings of the 10-th International Conference”, 1997, John Wiley & Sons, - P.279-282
• A. D. Bekkerman, N. Kh. Dzhemilev, S. V. Verkhoturov, and I. V. Veryovkin , "The fragmentation of excited sputtered clusters: the kinetic energy release distributions of Al and Cu cluster ions sputtered by Xe + and Cs+ ions", in: "Secondary Ion Mass Spectrometry. SIMS X. Proceedings of the 10-th International Conference”, 1997, John Wiley & Sons, - P.403-406
• N. Kh. Dzhemilev, A. M. Goldenberg, I. V. Veriovkin, and S. V. Verkhoturov, "Fragmentation of Cluster Ions in SIMS: Cluster distributions over Lifetime, Excitation Energy and Kinetic Energy Release". Nucl.Instr.and Meth.B, 1996, V.114. P.245-251
• A. D. Bekkerman, N. Kh. Dzhemilev, S. E. Maksimov, V. V. Solomko, S. V. Verkhoturov, and I. V. Veryovkin, "Cn and Cs mCn Clusters Sputtered from Fullerite Compared With Those for Graphite", Vacuum, 1996, V.47, ‡‚9, P.1073-1075
• A. D. Bekkerman, N. Kh. Dzhemilev, S. V. Verkhoturov, and I. V. Veryovkin , "The Unimolecular Decays of Aln+ and Cu n+ Sputtered Clusters: a Comparison Between Competitive Decay Modes", Vacuum, 1996, V.47, ‡‚5, P.405-407
• A. D. Bekkerman, I. V. Veryovkin, S. V. Verkhoturov, O. V. Guliamova, N. Kh. Dzhemilev, S. E. Maksimov, and V. V. Solomko, "Fullerite Sputtering by Cesium Ions: Experiment and Model Concepts". Izv.Akad.Nauk ser.fiz., 1996, V.60, ‡‚7, P.121-127. (In Russian) and Bull.Russ.Acad.Sci.-Physics, 1996, V.60, ‡‚7, P.1112-1116 (English translation)