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Author Contains ("Heising, J.")
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20014081
Structure of restacked MoS{sub 2} and WS{sub 2} elucidated by electron crystallography
Heising, J.
,
Kanatzidis, M.G.
1999 Feb 03
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520 K
ANL/UPD/CP-100686
High real-space resolution structure of materials by high-energy x-ray diffraction
Petkov, V.
,
Billinge, S. J. L.
,
Heising, J.
, et.al.
1999 Dec 10
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