Soft-x-ray absorption spectroscopy (XAS), soft-x-ray emission spectroscopy (XES), resonant inelastic soft-x-ray scattering (RIXS), in-situ photon-in and photon-out soft-x-ray spectroscopy in material sciences, chemical physics, and biosciences; Development of soft-x-ray spectroscopy instrumentation for investigating hydrogen bonding and molecular structure in liquids and in-situ monitoring the chemical processes in catalysis and electrochemistry.

X-Ray Raman Scattering Establishes HTSC Energy Scales
Why Don't Alcohol and Water Mix Very Well? (.pdf)
Berkeley Lab's Science Beat
ALS Science Highlight

Surface Structure of Nano-Structured Materials (in progress)

Advanced Light Source Users Meeting 2004
October 19th - 20th, 2004

Organizers: Jonathan Denlinger and Jinghua Guo

"Photon-in and Photon-out X-ray Spectroscopy in Material Sciences,
Environmental Energy and Chemical Analysis"

Study of local structure of liquid water by means of x-ray emission spectroscopy, S. Kashtanov, A. Augustsson, Y. Luo, J.-H. Guo, C. Sathe, J.-E. Rubensson, H. Siegbahn, J. Nordgren, and H. Agren, Phys. Rev. B 69, 24201 (2004).

The electronic structure and lithiation of electrodes based on vanadium–oxide nanotubes, A. Augustsson, T. Schmitt, L.-C. Duda, J. Nordgren, S. Nordlinder, K. Edstrom, T. Gustafsson, and J.-H. Guo, J. Appl. Phys. 94, 5083 (2003).

The molecular structure of alcohol-water mixtures, J.-H. Guo, Y. Luo, A. Augustsson, S. Kashtanov, J.-E. Rubensson, D. K. Shuh, H. Agren, and J. Nordgren, Phys. Rev. Lett. 91, 157401 (2003).

Lithium ion insertion in nanoporous anatase TiO2 studied with RIXS, A. Augustsson, A. Henningsson, S. M. Butorin, H. Siegbahn, J. Nordgren, and J.-H. Guo, J. Chem. Phys. 119, 3983 (2003).

X-ray Emission Spectroscopy of Hydrogen Bonding and Electronic Structure of Liquid Water, J.-H. Guo, Y. Luo, A. Augustsson, J.-E. Rubensson, C. Såthe, H. Ågren, H. Siegbahn, and J. Nordgren, Phys. Rev. Lett. 89, 137402 (2002).

Polarization-dependent soft-x-ray absorption of highly oriented ZnO microrod arrays, J.-H. Guo, L. Vayssieres, C. Persson, R. Ahuja, B. Johansson, and J. Nordgren, J. Phys.: Condens. Matter 14, 6969-6974 (2002).

Electronic structure investigation of CoO by means of soft x-ray scattering, M. Magnuson, S. M. Butorin, J.-H. Guo, and J. Nordgren, Phys. Rev. B 65, 205106 (2002).

Nitrogen Bonding Structure in Carbon Nitride Thin Films Studied by Soft X-ray Spectroscopy, N. Hellgren, J.-H. Guo, C. Såthe, A. Agui, J. Nordgren, Y. Luo, H. Ågren , and J.-E. Sundgren, Appl. Phys. Lett. 79, 4348-4350 (2001).

Electronic-structure investigation of CeB6 by means of soft-x-ray scattering, M. Magnuson, S. M. Butorin, J.-H. Guo, A. Agui, J. Nordgren, H. Ogasawara, A. Kotani, T. Takahashi and S. Kunii, Phys. Rev. B 63, 075101 (2001).

Bonding mechanism in the transition-metal fullerides studied by symmetry-selective resonant x-ray inelastic scattering, L. Qian, M. Nyberg, Y. Luo, J.-E. Rubensson, A. V. Talyzine, C. Såthe, D. Ding, J.-H. Guo, H. Högberg, T. Käämbre, U. Jansson, and J. Nordgren, Phys. Rev. B 63, 84518 (2001).

Electronic structure of ultrathin Ge layers buried in Si(100), P.O. Nilsson, S. Mankefors, J.-H. Guo, J. Nordgren, D. Debowska-Nilsson, W.-X. Ni and G. V. Hansson, Phys. Rev. B 64, 115306 (2001).

A theoretical investigation of the thickness dependence of soft X-ray emission from thin AlAs(100) layers buried in GaAs, S. Mankefors, P. O. Nilsson, J. Kanski, T. Andersson, K. Karlsson, A. Agui, C. Såthe, J.-H. Guo, and J. Nordgren, Phys. Rev. B 61, 5540-5545 (2000).

Probing the local electronic structure in the H induced metal-insulator transition of Y, B. Hjörvarsson, J.-H. Guo, G. Andersson, R. C. C. Ward, R. Ahuja, C. Såthe, A. Agui, S. M. Butorin, and J. Nordgren, J. Phys.: Condens. Matter 11, L119 (1999).

The Characterization of Undulator Beam at MAXII Using Soft X-ray Fluorescence Spectrometer, J.-H. Guo, S. M. Butorin, C. Såthe, J. Nordgren, M. Bässler, R. Feifel, S. Werin, M. Georgsson, Å. Andersson, M. Jurvansuu, R. Nyholm, and M. Eriksson, Nucl. Instr. and Meth. in Phys. Res. A 431, 285-293 (1999).

The electronic structure of polyaniline and doped phases studied by soft X-ray absorption and emission spectroscopies, M. Magnuson, J.-H. Guo, S. M. Butorin, A. Agui, C. Såthe, J. Nordgren, and A. P. Monkman, J. Chem. Phys. 111, 4756-4761 (1999).

Resonant and Non-Resonant X-ray Scattering Spectra of Some Poly(phenylene-vinylene)s, J.-H. Guo, M. Magnusson, C. Såthe, J. Nordgren, L. Yang, Y. Luo, H. Ågren, K. Z. Xing, N. Johansson, W. R. Salaneck, and W. J. Feast, J. Chem. Phys. 108, 5990 (1998).

X-ray Resonant Raman Spectra of Cu dd Excitations in Sr2CuOCl2, P. Kuiper, J.-H. Guo, C. Såthe, L.-C. Duda, J. Nordgren, J. J. M. Pothuizen, F. M. F. de Groot, and G. A. Sawatzky, Phys. Rev. Lett. 80, 5204 (1998).

X-ray Spectroscopic Studies of Low Dielectric Constant Parylene and Fluorinated Amorphous Carbon Films, Y. Ma, H. Yang, J.-H. Guo, C. Sathe, A Agui, and J. Nordgren, Appl. Phys. Lett. 72, 3353 (1998).

Resonant Inelastic Soft X-ray Scattering from Valence-band Excitations in 3d0 Compounds, S.M. Butorin, J.-H. Guo, M. Magnuson, and J. Nordgren, Phys. Rev. B 55, 4242 (1997).

Hydrogen-Induced Changes of the Electronic States in Ultrathin Single-Crystal Vanadium Layers, L.-C. Duda, P. Isberg, P. H. Andersson, P. Skytt, B. Hjörvarsson, J.-H. Guo, C. Såthe, and J. Nordgren, Phys. Rev. B 55, 12914 (1997).

Resonant X-ray Emission Spectroscopy of Molecular Oxygen, P. Glans, K. Gunnelin, P. Skytt, J.-H. Guo, N. Wassdahl, J. Nordgren, H. Ågren, F. Kh. Gel'mukhanov, and T. Warwick, Phys. Rev. Lett. 76, 2448 (1996).

Low-energy d-d Excitations in MnO Studied by Resonant X-ray Fluorescence Spectroscopy, S. M. Butorin, J.-H. Guo, P. Kuiper, M. Magnuson, and J. Nordgren, Phys. Rev. B 54, 4405 (1996).

Resonant X-ray Fluorescence Spectroscopy of Correlated Systems - a Probe of Charge-Transfer Excitations, S. M. Butorin, D. C. Mancini, J.-H. Guo, N. Wassdahl, J. Nordgren, M. Nakazawa, S. Tanaka, T. Uozumi, A. Kotani, Y. Ma, K. E. Myano, B. A. Karlin, and D. K. Shuh, Phys. Rev. Lett. 77, 574-577 (1996).

Quenching of Symmetry Breaking in Resonant Inelastic X-ray Scattering by DetunedExcitation, P. Skytt, P. Glans, J.-H. Guo, K. Gunnelin, C. Såthe, J. Nordgren, F. Kh. Gel'mukhanov, A. Cesar, and H. Ågren, Phys. Rev. Lett. 77, 5035-5038 (1996).

Resonant and Non-resonant X-ray Scattering from C70, J.-H. Guo, P. Skytt, N.Wassdahl, J . Nordgren, Y. Luo, O. Vahtras, and H. Ågren, Chem. Phys. Lett. 235, 152 (1995).

An End Station for Polarization and Excitation Energy Selective Soft X-ray Fluorescence Spectroscopy, J.-H. Guo, N. Wassdahl, P. Skytt, S. M. Butorin, L.-C. Duda, C. J. Englund, and J . Nordgren, Rev. Sci. Instr. 66, 1561 (1995).

On the Electronic Structure of Bi2Sr2CaCu2O8+? and Tl2Ba2CaCu2O8, S. M. Butorin, J.-H. Guo, N. Wassdahl, P. Skytt, J. Nordgren, Y. Ma, C. Ström, G. Johansson, and M. Qvarford, Phys. Rev. B 51, 11915 (1995).

Resonant X-ray Fluorescence from C60, J.-H. Guo, P. Glans, P. Skytt, N. Wassdahl, J . Nordgren, Y. Luo, H. Ågren, Y. Ma, T. Warwick, P. Heimenn, E. Rotenberger, and J. Denlinger, Phys. Rev. B 52, 10681 (1995).

Sub-eV Chemical Shifts and Strong Interference Effects Measured in Resonance X-ray Scattering Spectra of Aniline, Y. Luo, H. Ågren, J.-H. Guo, P. Skytt, N. Wassdahl, and J. Nordgren, Phys. Rev. A 52, 3730 (1995).

Electronic Structure of La2-xSrxCuO4 Studied by Soft X-ray Fluorescence Spectroscopy with Tunable Excitation, J.-H Guo, S. M. Butorin, N. Wassdahl, P. Skytt, J. Nordgren, and Y. Ma, Phys. Rev. B 49, 1376 (1994).

Ab initio Calculations of X-ray Emission from C60, J.-H. Guo, Y. Luo, O. Vahtras, P. Skytt, N. Wassdahl, H. Ågren, and J. Nordgren, Chem. Phys. Lett. 227, 98 (1994).

Core Excitons and Vibronic Coupling in Diamond and Graphite, Y. Ma, P. Skytt, N. Wassdahl, P. Glans, D. C. Mancini, J.-H. Guo, and J. Nordgren, Phys. Rev. Lett. 71, 3725 (1993).

Soft X-ray Emission Studies of Adsorbates, N. Wassdahl, A. Nilsson, H. Tillborg, T. Wiell, L.-C. Duda, J.-H. Guo, N. Mårtensson, J. Nordgren, J. N. Andersen, and R. Nyholm, Phys. Rev. Lett. 69, 812-815 (1992).

Soft X-ray Resonant Inelastic Scattering at the C K Edge of Diamond, Y. Ma, N. Wassdahl, P. Skytt, J.-H. Guo, J. Nordgren, P. D. Johnson, J.-E. Rubensson, T. Böske, W. Eberhardt, and S. D. Kevan, Phys. Rev. Lett. 69, 2598 (1992).