Publications Since 1983
1. Bright, D.S., R. Myklebust, D. Newbury, "Stereo Representations of Monte
Carlo Electron Trajectories", Journal of Microscopy136:113-120 (1984)
2. Bright, D.S.,"Computer Matching Two Different Images of the Same Particle
Field", Microbeam Analysis (1984) p. 173-174
3. Bright, D.S., R.A. Fletcher and H.R. Baum, "Air Flows Induced bySparse
Clouds of Droplets", Aerosol Science and Technology3:187-193(1984)
4. Bright, D.S. and E. B. Steel, "STEM Calibration by Analysis of Hough Transformed
Images of Optical Grating Replicas", Microbeam Analysis (1985), pp. 155-158
5. Bright, D.S. and E. B. Steel, "Automated Method for Analyzing Images Containing
Electron Diffraction Spots", Microbeam Analysis (1985), pp. 163-165
6. R.B. Marinenko, R.L. Myklebust, D.S. Bright, and D.E. Newbury,"Wavelength-Dispersive
Techniques for Compositional Mapping inElectron-Probe Microanalysis" Microbeam
Analysis - 1985 (San Francisco Press),pp. 159-162
7. R.L. Myklebust, R.B. Marinenko, D.E. Newbury, and D.S. Bright, "Quantitative
Calculations for Compositional Mapping Techniques in Electron Probe Microanalysis"
Microbeam Analysis - 1985 (San Francisco Press),pp.101-103
8. R.L. Myklebust, R.B. Marinenko, D.E. Newbury, and D.S. Bright,"Quantitative
Compositional Mapping on an Electron Microprobe"Electron Microscopy and Analysis
78:219-222 (1985), Inst. of Physics, London (G. J. Tatlock, ed.)
9. Newbury, D.E., D. Bright, D. Williams, C.M Sung, T. Page, andJ. Ness "Application
of Digital SIMS Imaging to Light Elementand Trace Element Mapping", in Secondary
Ion Mass Spectrometry SIMS V, (ed. A. Benninghoven, R.J. Colton, D.S. Simons,
and H.W. Werner )Springer- Verlag, Berlin, 1986
10. Bright, D.S., and Steel, E.B., "Bright Field Image Correction Using Various
Image Processing Tools", Microbeam Analysis(1986), pp.517-520
11. Bright, D.S., and Newbury, D.E., "Distance Mapping for Shape Characterization
of Alloy Grain Boundaries", Microbeam Analysis - 1986 (San Francisco Press),
pp. 521-524
12. Myklebust, R.L., Newbury, D.E., Marinenko, R.B. and Bright,D.B., "Defocus
Modeling for Compositional Mapping withWavelength- dispersive X-ray Spectrometry",
Microbeam Analysis - 1986 (San Francisco Press), pp. 495-497
13. Marinenko, R.B., Myklebust, R.L., Bright,D.B. and Newbury, D.E.,"Digital
Quantitative Compositional Mapping with Corrections for Defocusing in Wavelength
Dispersive X-Ray Spectrometry",pp. 455-459 in PROC. OF THE 11TH INTERNATIONAL
CONGRESS ON X-RAY OPTICS AND MICROANALYSIS, London, Canada, Aug. 1986,J. D. Brown
and R. H. Packwood (eds.)
14. Marinenko, R.B., Myklebust, R.L., Bright,D.B. and Newbury, D.E.,"Digital
X-ray Compositional Mapping with 'Standard Map' Corrections for Wavelength Dispersive
Spectrometer Defocussing", J. Microscopy 145:207-223 (1987)
15. Bright, D.S., and Steel, E.B., "Two Dimensional Top Hat Filter For Extracting
Spots and Spheres from Images", J. Microscopy146:191-200 (1987)
16. Bright, D.S., "A Lisp-based Image Analysis System With Applications to
Microscopy", J. Microscopy 148(pt.1):51-87(1987)
17. Bright, D.S., "An Object Finder Based on Multiple Thresholds,Connectivity
and Internal Structure", Microbeam Analysis (1987),pp. 290-292
18. Mylkebust, R. L., Newbury, D. E., Marinenko, R. B. and Bright,D. S., "Background
Correction in Electron MicroprobeCompositional Mapping with Wavelength-Dispersive
X-RaySpectrometry", Microbeam Analysis (1987), pp. 25-27
19. Marinenko, R. B., Newbury, D. E., Mylkebust, R. L., and Bright,D. S., "A
Statistical Evaluation of Wavelength-DispersiveDigital Compositional Mapping with
the Electron Microprobe",Microbeam Analysis (1987), pp. 40-42
20. Blendell,J.E. , C.K. Chiang, D.C. Cranmer, S.W. Freiman, E.R. Fuller, Jr.,
E. Drescher-Krasicka, Ward L. Johnson, H.M. Ledbetter, L.H. Bennett, L.J. Swartzendruber,
R.B. Marinenko, R.L. Myklebust, D.S. Bright, and D.E. Newbury, "The Relationship
of Electrical, Magnetic and Mechanical Properties to Processing in in High Tc
Superconductors", American Chemical Society Symposium Series 351, "Chemistry
of High Temperature Superconductors" (1987) 240-260.
21. Blendell, J. E., C.K. Chiang, D.C. Cranmer, S.W. Freiman, E.R. Fuller, Jr.,
E. Drescher-Krasicka, Ward L. Johnson, H.M. Ledbetter, L.H. Bennett, L.J. Swartzendruber,
R.B. Marinenko, R.L. Myklebust, D.S. Bright, and D.E. Newbury, "Processing
- Property Relations for Ba2YCu3O7-x High Tc Superconductors", Advanced CeramicMaterials
Vol. 2, NO. 3B, Special Issue, 1987, pp. 512-529
22. Newbury, D. E. , Marinenko, R. B. , Bright, D. S. and Myklebust, R. L. , "Computer-Aided
Imaging: Quantitative Compositional Mapping with the Electron Probe Microanalyzer",Scanning
10:213-225, 1988
23. Bright, D.S. and Steel,E.B., "Automated Extraction of RegularSpot Arrays
from Electron Diffraction Images", J. Microscopy150(3):167-180 (1988)
24. Bright, D.S., Newbury, D.E. and Marinenko, R.B.,"Concentration-Concentraion
Histograms: Scatter Diagrams Applied to Quantitative Compositional Maps",
Microbeam Analysis-1988 (San Francisco Press), pp. 18-24
25. Bright, D.S., "Usefulness of Various Computer Algorithms for Locating
Spots and Arrays in Electron Diffraction Patterns",Microbeam Analysis -1988
(San Francisco Press), pp.25-32
26. Newbury,D.E., and D.S. Bright "Compositional Mapping with a TV Camera-Based
Imaging System on an Ion Microscope", Microbeam Analysis-1988 (San Francisco
Press, 1988) 105-108.
27. Newbury,D.E., and D.S. Bright, "Quantitative Isotope and Elemental Ratio
Measurements with a Camera-Based Imaging System on an Ion Microscope", Secondary
Ion Mass Spectrometry VI (SIMS VI), ed. A. Benninghoven, A.M. Huber, and H.W.
Werner (Wiley, New York, 1988) 389-392.
28. D.E. Newbury, R.B. Marinenko, D.S. Bright, and R.L. Myklebust, "Computer-Aided
Imaging: Quantitative Compositional Mapping with the Electron Probe Microanalyzer"
(1988) SCANNING, v 10, 213-225.
29. Marinenko, R. B., D. E. Newbury, D. S. Bright, R. L. Myklebust and J. E. Blendell,
"Application of Wavelength-dispersive Digital Compositional Mapping to High-termperature
Superconductors", Microbeam Analysis -1988 (San Francisco Press), pp. 37-40
30. Newbury,D. E., R. B. Marinenko, R. L. Myklebust, and D. S. Bright, "New
Developments in Quantitative Compositional Mapping with the Electron Probe Microanalyzer",
Proceedings of the International Congress of X-ray Optics and Microanalysis, ed.
S. Jaslenska and L.J. Maksymowicz (Crakow, 1989) 529-534.
31. Bright, D.S., Steel, E.B., and Newbury, D.E., “The Problem of Visibility
in Noisy Images”, Microbeam Analysis -1989 (San Franscisco Press), pp. 37-40.
32. Bright, D.S., "An Object Finder for Digital Images Based On Multiple
Thresholds, Connectivity and Internal Structure", Journal of Computer-Assisted
Microscopy 1(4): 307-329 (1989).
33. Marinenko, R. B., Myklebust, R. L., Bright, D. S., and Newbury, D. E., "Defocus
Modelling Correction for Wavelength Dispersive Digital Compositional Mapping with
the Electron Microprobe", J. Microscopy, v 155 (1989) 183-198
34. Russ, John C., D.S.Bright, J. Christian Russ, and Thomas M. Hare, (1989) "Application
of the Hough transform to electron diffraction patterns", J. Computer assisted
Microscopy 1(1):3-37(1989).
35. D.S.Bright, “SOFTWARE TOOLS FOR EXAMINATION OF MICROANALYTICAL IMAGES”,
Proceedings of the 12th International Congress for Electron Microscopy, 1990,
San Fancisco Press, pp. 116-117
36. R. B. Marinenko, D.S. Bright, C.A. Handwerker and J. J. Mecholsky, “A
study of diffusion zones with electron microprobe compositional mapping”,
Proceedings of the 12th International Congress for Electron Microscopy, 1990,
San Fancisco Press, pp. 242-243
37. D.S. Bright, “Selection of EM Analysis Points Using the Euclidian Distance
Map” , (abstract) Proceedings of the 12th International Congress for Electron
Microscopy, 1990, San Fancisco Press, pp. 534-535
38. D.E. Newbury and D.S.Bright, (1990), "Concentration Histogram Images:
A Digital Imaging Method for Analysis of SIMS Compositional Maps", in Sims
VII, A. Benninghoven, C.A.Evans, K.D. McKeegan, H.A.Storms, H.W.Werner (eds).
John Wiley, 1990, pp. 929-933.
39. D.E. Newbury, C.E.Fiori, R.B. Marinenko, R.L. Myklebust, C.R.Swyt, and D.S.Bright,
(1990) "Compositional Mapping with the Electron Probe Microanalyzer: Part
1", Analytical Chemistry 62(22):1159A-1166A, (Nov. 15) 1990.
40. Newbury,D.E., C.E.Fiori, R.B. Marinenko, R.L. Myklebust, C.R.Swyt, and D.S.Bright,
(1990) "Compositional Mapping with the Electron Probe Microanalyzer: Part
II", Analytical Chemistry 62(24):1245A-1254A, (Dec. 15) 1990.
41. D.S.Bright (1990),“SOFTWARE TOOLS FOR EXAMINATION OF MICROANALYTICAL
IMAGES”, Microbeam Analysis 1990:73-78.
42. Marinenko, R.B., Bright, D.S., Handwerker, C.A., Mecholsky, J.J. (1990) “A
Study of diffusion zones with electron microprobe compositional mapping”,
Microbeam Analysis 1990: 190-192.
43. Newbury, D.E., Marinenko, R.B., Myklebust, R.L. and Bright,D.S., "Quantitative
Compositional Mapping with the Electron Probe Microanalyzer" pp. 335-369
in: ELECTRON PROBE QUANTITATION, Heinrich, K,F.J., and Newbury, D.E., eds, Plenum
Press, NY 1991.
44. Bright, D.S., Newbury, D.E., Marinenko, R.B., Steel, E.B., and Myklebust,
R.L. "Processing Images and Selecting Regions of Interest" in Images
of Materials eds. D.B. Williams, A.R. Pelton, and R. Gronsky (Oxford University
Press, Oxford, 1991). 309-337.
45. Newbury, D. E., Marinenko, R.B., Myklebust, R.L., and Bright, D. S., "Compositional
Mapping of the Microstructure of Materials", in Images of Materials eds.
D.B. Williams, A.R. Pelton, and R. Gronsky (Oxford University Press, Oxford, 1991).
290-308.
46. Bright, D.S. and Newbury, D.E. (1991) “Concentration Histogram Imaging”,
Analytical Chemistry 63(4):243A-250A, (Feb. 15) 1991.(invited).
47. Bright, D.S. (1991) “Scaling and Enhancement of Micrographs and X-Ray
Maps”, (abstract),Scanning 13, Suppl 1: I-90 - I-91, 1991.
48. Handwerker, C.A., Heather Lechtman, Ryna Marinenko, David Bright and Dale
Newbury, (1991) "Fabrication of Pt-Au Alloys in Pre-hispanic South America:
issues of temperature and microstructure control", Mat. Res. Soc. Symp. Proc.
Vol. 185: 649-664. {cited in introduction of volume as one of five papers of special
interest}.
49. Bright, D.S., Steel, E.B. and Newbury, D.E. (1991), "Visibility of Objects
in Noisy Images as a Function of Contrast, Noise Level, and Object Size",
Microbeam Analysis -1991: 185-188.
50. Small, J.A., Bright, D.S., Mylkebust, R.L. and Newbury, D.E. (1991), "Electron
Probe Compositional Mapping of Particles and Samples with Irregular Surfaces",
Microbeam Analysis -1991:329-331.
51. Michiels, Frank P.L., Adams, F.C.V., Bright, D.S. and Simons, D.S., (1991)
"Characterization of Sample Heterogeneity in Secondary Ion Mass Spectrometry
by the Use of a Sampling Constant Model", Anal. Chem. 63: 2727-2734.
52. D.S.Bright (1991), “Selection of EM Analysis Points Using the Euclidian
Distance Map”, J. Computer Assisted Microscopy 3(1):1-5.
53. K. K. Soni, J. M. Chabala, R. Levi-Setti, D. B. Williams, D. E. Newbury, D.
S. Bright, (1991) “Phase Equilibria in the Al-Li-Cu System Determined by
Secondary Ion Mass Spectrometry”, Microbeam Analysis 2, 13-21.
54. D.S. Bright and R. B. Marinenko (1992), "Concentration histogram imaging:
a quantitative view of related images", Microscopy: The Key Research Tool
22(1): 21-28 (March 1992, Electron Microscopy Society of America, special publication).
55. K. K. Soni, D. B. Williams, D. E. Newbury, G. Gillen, P. Chi, D. S. Bright,
(1993) “Compositional Changes in Aluminum-lithium Base Alloys Caused by
Oxidation”. Metallurgical Transactions (A),24A:2279-2288
56. Soni, K. K., Chabala, J. M., Levi-Setti, R., Williams, D. B., Newbury, D.
E., and Bright, D. S., "Phase Equilibria in the Al-Li-Cu System Determined
by Secondary Ion Mass Spectrometry", Microbeam Analysis 2 (1993) 13 -21.
57. D. S. Bright, R. B. Marinenko, S. Bernik “Identification of Multiphase
Systems Using Compositional X-ray Maps”, pp. 203-4 in MICROBEAM ANALYSIS,
Proceedings of the 28th Annual MAS Meeting, John J. Friel ed., VCH NY, NY. 1994.
58. Bright, D.S. “Visualization of compositional data in microscopy: Representation
schemes and software tools”, pp. 269-70 in MICROBEAM ANALYSIS, Proceedings
of the 28th Annual MAS Meeting, John J. Friel ed., VCH NY, NY. 1994.
58.5 Bright, D.S. Measurement of Chemical Components Using Scatter Diagrams with
Principal Component Analysis, Microbeam Analysis - 1995 (Proceedings of 29th Annual
Conference of the MAS, Breckenridge, CO.) 389-390.
59. Bright, D.S. "MacLispix: A Special Purpose Public Domain Image Analysis
Program for the Macintosh.", Microbeam Analysis 4 (1995) 151-163.
60. Rasband, W.S. and Bright, D.S. "NIH Image: A Public Domain Image Processing
Program for the Macintosh", Microbeam Analysis 4 (1995) 137-149.
61. Levenson, M.S., Bright, D.S., and Sethuraman, J. “Adaptive Smoothing
of Images with Local Weighted Regression”, p. 85-99 in Statistical and Stochastic
Methods for Image Processing, Proceedings of the SPIE Conference, 4 August, Denver
Colorado (1996).
62. Marinenko, R.B., Bright, D.S. and Bernik, S. (1996) “Multiphase Analysis
of Bi-Sr-Ca-Cu-O High Tc Superconductors with X-Ray Compositional Mapping”,
SCANNING (18): 395-400.
63. Bright, D.S., "Richardson Plots for Fractal Dimension Characterization
of Boundaries of Digitized Grains and Particles", Microcopy and Microanalysis
3(suppl 2), 1997, 897-898.
64. Bright, D.S., Myers, A.F., Turner, S. and Steel, E.B., (1998) " Spot
Measurement Tool for Diffraction Pattern Analysis”, Microscopy and Microanalysis
4 (suppl 2) 60-61.
65. Newbury, D.E. and Bright, D.S.: “Compositional Mapping by Scanning Electron
Microscopy with Energy Dispersive X-Ray Spectrometry: Recognizing Facts and Artifacts”,
Springer - Microscopy Society of America 1998
66. Gillen, G. Wight, S. Bright, D. and Herne, T.: “Quantitative SIMS Imaging
of Self-Assembled Monolayers for Electron Beam Dose mapping in the ESEM, Scanning
1998
67. D.S. Bright, D.E. Newbury, E.B. Steel (1998), “Visibility of Objects
in Computer Simulations of Noisy Micrographs”, Journal of Microscopy 189:25-42
68. Newbury, D.E. and Bright, D.S., "Logarithmic 3-Band Color Encoding: Robust
Method for Display and Comparison of Compositional Maps in Electron Probe X-ray
Microanalysis", Microscopy and Microanalysis 5(5):333-343 (1999).
69. Newbury, D.E., and Bright, D.S.: “X-Ray Mapping with Energy-Dispersive
and Wavelength-Dispersive X-Ray Spectrometery in the Scanning Electron Microscope:
A Tutorial”, M&M Journal, 1999
70. Fletcher, R.A., Verkouteren, F.R., Windsor, W.S., Bright, D.S., Steel, E.B.,
Small, J. A., Liggett, W. S., (1999) “SRM2086 (ISO Medium Test Dust in hydraulic
Oil): A Particle-Contamination standard reference Material for the Fluid Power
Industry”, Fluid/Particle Separation Journal 12(2):1-16.
71. Bright, D. S. (1999), “Fractal Dimension of Particle Outlines: Meaning,
Utility, Limitations, Standard Images and Examples”, Machine, Plant and
Systems Monitoring, August, 1999.
72. Fletcher, R.A. and D.S. Bright "Shape Factors of ISO 12103-A3 (Medium
Test Dust)" Filteration +Separation (submitted to Werb)
73. Fletcher, R.A., Verkouteren, J.R., Windsor, E.S., Small, J.A., Steel, E.B,
Bright, D.S., and Liggett, W.S. (1999) " SRM 2806 (ISO Medium Test Dust in
Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid
Power Industry " Fluid/Particle Separation Journal 12(2):80-95.
74. Bright, D.S. “Fractal Dimension of Particle Outlines: Meaning, Utility,
Limitations, Standard Images and Examples” pp. 565-575 in Condition Monitoring
’99 - Proceedings of the International Conference on Condition Monitoring
Held at University of Wales, Swansea, UK. 12 - 15 April 1999, Mervin H. Jones
and David G. Sleeman Eds, Coxmoor Pub Co., London. Reprinted by invitation in
Machine, Plant and Systems Monitor, Aug. 1999 (Coxmoor Pub. Co).
75. Jach, Terrence, Bright, D.S., Durbin, S. M., Bakulin, A. S., Stagarescu, C.
B., Pedully, J., Srajer, G. Haskel, D.(2001) “Wide-Field X-ray Microscopy
with Kirkpatrick-Baez Optics”, Proc. SPIE 4499: 38-44.
76. Verkouteren, Jennnifer, Bright, D.S., Marinenko, R.B., “Phase Identification
in Heated Thermal Barrier Coatings using Microbeam X-ray Diffraction Combined
with Quantitative X-ray Mapping”, Proposed for MRS.
77. Ryna B. Marinenko, Jennifer R. Verkouteren, and David S. Bright, (2000) Microstructural
Characterization of Yttria-Doped Zirconia Coatings with Electron Microprobe Wavelength
Dispersive Compositional Mapping 7 pp., Proc. of Matls. Res. Soc. Fall 2000 Meeting,
Boston, MA, Nov. 2000, and MRS web site at http://www.mrs.org/publications/epubs/proceedings/fall2000/m/
78. Carasso, A.A., Bright, D.S., Vladar, A.E. (2001) “The APEX Method and
Real-Time Blind Deconvolution of Scanning Electron Microscope Imagery”,
NISTIR 6835
79. Carasso, A.A., Bright, D.S., Vladar, A.E. (2002) “APEX Method and Real-Time
Blind Deconvolution of Scanning Electron Microscope Imagery”, Optical Engineering
41(10):2499-2514 (2002).
80. Small, JA., Bright, D.S., Michael, M.R. (2002) “Improving the Quality
of Electron Backscatter Diffraction (EBSD) Patterns from Nanoparticles”,
J. of Microscopy 206(2):170-178.
81: Turner, S., and Bright, D.S., “Characterization of the Morphology of
Faceted Particles by Transmission Electron Microscopy”, abstract for Proceedings
MRS, v703 (2002).
82. Scott, JH, Bright, D.S., “Application of the hough transform to electron
energy-loss spectrum-line acquisition (WERB)
80. Jach, TJ, Kim, S., Durbin, S.M., Gopalan, V., Bright, D.S., “Real-time
studies of strains at ferroelectric domain walls under an applied field”
(pre WERB)
84. Gillen, J.G., Wight, S.A., Roberson, S.V., Bright, D.S., Lareau, R., “Imaging
of high explosive particles using cluster secondary ion mass spectrometry and
the environmental scanning electron microscope. (Not for WERB??)
85. Turner,S., Bright, D.S., “Charcterization of the morphology of faceted
particles by transmission electron mocriscopy (WERB).
86. Jach, T., Durbin, S. M., Bakulin, Bright, D.S., A.S., Stagarescu, C.B., Pedulla,
J., Srajer, G., Hasket, D., “Wide-field X-ray microscopy with Krikpatrick-Baez
optics”, Proc. SPIE 4499. p. 38-44 (2001)
87. Small, J., Michael, J.R., Bright, D.S., (2002). “Improving the quality
of electron backscatter diffraction patterns from sub 500 nm particles”,
J. of Microscopy 206: 170-178.
88. Windsor, E.S., Carlton, R., Gillen, J.G., Wight, S.A., Bright, D.S., “Copper
Oxide Precipitates in Standard Reference Material 482”, (WERB for NIST J.
Res. 10/10/2002)
89. Gillen, J.G., Bright, D.S. (2003), “Tools and procedures for quantitative
Microbeam isotope ratio imaging by secondary ion mass spectrometry.”, Scanning
25:165-174.
90. B. Foran and B. Kastenmeier, and D. S. Bright, "Determination of Pore-Size
Distributions in Low-k Dielectric Films by Transmission Electron Microscopy"
In CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY: 2003[March 24-28 Austin,
TX], D. G. Seiler, A. C. Diebold, T. J. Shaffner, R. McDonald, S. Zollner, R.
P. Khosla, E. M. Secula, Eds., AIP Press, College Park Maryland. AIP Conference
Proceedings # 683, pg 556-561.