00/07/27;17:13;baroiant;http://ncdf17.fnal.gov/cgi-bin/lgbk?user=baroiant&ent=9229
Tested as part of P10405
EOE
00/05/03;11:33;joelg;
Pinhole created on 2nd silicon during testing. Clear evidence of physical damage,
although impossible to tell when scratch occurred. I blame David.
EOE
99/10/29;12:02;chill;http://ncdf17.fnal.gov/cgi-bin/lgbk?user=chill&ent=1365
XTL tests of P05 after pinhole removal
EOE
99/10/29;11:22;joelg;
Last n side candidate pulled. Both sides run OK at 100V individually, ladder fine at  /-70V.
EOE
99/10/29;11:21;joelg;
p side OK at 100V. n side pinhole seems to disappear if ladder is left unconnected
for a while and reappears at 75-80V. Able to find by fully depleting ladder from
p side.
EOE
99/10/29;11:19;joelg;
n side raised to 80V and p to 50V. New pinhole on both. Can't determine n side
candidate without depleting, so pull p side.
EOE
99/10/28;17:12;joelg;
On raising voltage to 40V on n side, the same pinhole reappeared and was pulled
at fanout. Currents now symmetric and small at  /-50V.
EOE
99/10/28;16:11;joelg;
Pinhole pulled at 1st-2nd silicon. Current now symmetric and 13uA at  /-25V,
although visible defect on 1st silicon.
EOE
99/10/28;15:55;joelg;
New pinhole observed on n side, without voltages being raised over 20V since the creation
of the last one.
EOE
99/10/28;15:54;joelg;
Visible defect on 3rd silicon at location of new pinhole, so 2nd-3rd bond only pulled.
z-side pinhole and one neighbour pulled also.
EOE
99/10/28;10:47;joelg;
While looking at effect of pinhole on other side, raised voltage to 30V and
blew pinhole on n side.
EOE
99/10/28;10:46;joelg;
Pulled 1st silicon candidate at fanout, and two candidates neighbouring previous
candidates at 1st-2nd silicon.  /-25V gives  8/-58uA. One pulled z side still
a candidate - will pull at fanout.  
EOE
99/10/28;10:43;joelg;
n side candidate was pulled at fanout. Three z side candidates pulled between 1st 
and 2nd silicon.  15/-25V now gives  11/-90uA so n side is OK and probably got 
at least one p side. From XTL, one candidate p side still there so it must be
on the first silicon. Other two look OK but each now have a neighbouring strip 
that looks like a pinhole.
EOE
99/10/27;18:32;joelg;
Currents about 100uA at  /-15V or so. One n side and three z side pinhole candidates
identified.
EOE
99/10/27;17:39;joelg;
Assembly and bonding finished. In addition to all of phi side, all channels on
chip 6 and chip 7 0-107 were bonded using K S 1478. All other p side channels
were done with Hughes 2470. Error means all of chip 4 and chip 5 0-63 were 
bonded 5 bonds too the right (i.e. chip 5 0-4 are not connected, chip 5 5 
goes to D256 etc.)
EOE
99/10/20;08:11;joelg
Ladder  entered in database.
EOE