US 7,459,675 B1
	Mass spectrometer ionization source
John D. Kroska, 23960 Filmore St. NE., Betel, Minn. 55005 (US)
Filed on Apr. 07, 2005, as Appl. No. 11/101,292.
Application 11/101292 is a continuation of application No. 10/435312, filed on May 09, 2003, granted, now 6,878,932.
This patent is subject to a terminal disclaimer.
Int. Cl. H01J 49/04 (2006.01)

U.S. Cl. 250—288

18 Claims

1. An improved ionization source for a mass spectrometer, comprising, an ionization element with a surface that is chemically inert and has a finish resembling one selected from electropolished, chemical passivation polished, mechanical abrasive polished, cylindered, honed, and metal-to-metal polished finishes, wherein the ionization source is less prone to analyte contamination than those previously known.