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Advanced Photon Source
X-Ray Microscopy and Imaging

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X-Ray Microscopy and Imaging: X-ray Topography

X-ray topography is an x-ray diffraction technique to image the crystalline defects. The experimental setup at 2-BM consists of collimated monochromatic beam (Si (111) double-crystal monochromator) or pink beam (reflected from Cr or Pt x-ray mirror), four-circle diffractometer equipped with high-precision sample translation stages, and optically-coupled high-resolution CCD system. The optically-coupled CCD system (1k x 1k, 13 micron pixel size) allows different magnification by changing the objective lens. A motorized linear track mounted on the two theta arm is used for each adjustment of the sample to detector position.

Schematic view of x-ray topography setup at 2-BM and “phase-enhanced” topography image of chicken egg white Lysozime crystal (PRL 87 , 148101,

 

SPEC-based CCD data acquisition software allows fully automated data collection with great flexibility and image processing software provides on-line analysis. Several different sample holders allow easy sample mounting for different size of samples in either reflection or transmission diffraction geometry.

 

 

Recent Publications

•  J. M. Yi , Y. S. Chu, Y. Zhong, J. H. Je, Y. Hwu and G. Margaritondo, “X-ray bright-field imaging analyzes crystalline quality and defects of SiC wafers”, J. Appl. Cryst. 40 , 376-378 (2007).

•  J. M. Yi , J. H. Je , Y. S. Chu , Y. Zhong , Y. Hwu , and G. Margaritondo , “ Bright-field imaging of lattice distortions using x-rays”  Appl. Phys. Lett. 89 , 074103 (2006) .

•  J. M. Yi, Y. S. Chu, T.S. Argunova, J.H. Je, "Analytic determination of the three-dimensional distribution of dislocations using synchrotron X-ray topography," J . Appl. Cryst. 39 , 106-108 (2006).

•  Albert T. Macrander, Szczeny Krasnicki, Yuncheng Zhong, Josef Maj, Yong S. Chu, “Strain Mapping with Parts-Per-Million Resolution in Synthetic type Ib Diamond Plates”, Appl. Phys. Lett. 87 , 194113 (2005).

•  Y. Zhong, S. Krasnicki, A. Macrander, Y. S. Chu, J. Maj, “Bragg-case limited-projection-topography study of surface-damage removal by chemical etching in diamond-crystal plates,” J. Phys. D: Appl. Phys. 38 , A39-A43 (2005).

•  Z. W. Hu, Y. S. Chu , B. Lai, B. R. Thomas, and A. A. Chernov, “Diffraction Imaging Study of Imperfections of Crystallized Lysozyme with Coherent X-rays,” Acta Cryst . D60 , 621-629 (2004).

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