NIST Quick Technicalendar
March 19 to March 23, 2007 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal/. |
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No Scheduled EventsTUESDAY - 3/20
10:30 AM - 3D Scanning at the Yale Graphics GroupWEDNESDAY - 3/21
10:30 AM - Ultrafine Indoor Airborne Particulate Matter: Identification, Classification and Correlation with Outdoor Values
2:00 PM - Standardizing Voodoo: Advanced Method for the Measurement of Distillation CurvesTHURSDAY - 3/22
10:00 AM - The Design of Mechanically Robust Interconnect Structures for Advanced MicroelectronicsFRIDAY - 3/23
10:30 AM - High-resolution atomic force microscopy: Where are we, and where will the future take us?
11:00 AM - Designing Biological Functions in Complex Supramolecular Materials
10:30 AM - If Archimedes Had a Computer: Why Ships, Icebergs and Buildings Tilt and Capsize
3/29/07 1:30 PM - NIST’s New Patent Policy: An Enabler for Technology Transfer - Myths, Misconceptions and Facts
4/10/07 1:00 PM - The Economics of Information Security
No Scheduled EventsTUESDAY - 3/20
No Scheduled EventsWEDNESDAY - 3/21
No Scheduled EventsTHURSDAY - 3/22
No Scheduled EventsFRIDAY - 3/23
No Scheduled Events
No Scheduled Events
2/21 - Method to Determine Collection Efficiency of Particles by Swipe Sampling
3/19 - Computational Nanosciences at NIST
3/19 - EUV Spectra from Highly-Charged Ions of Tungsten in the 12-20 nm Region
3/19 - NIST Numerical Databases for Atomic and Plasma Physics
3/19 - Atomic Transition Probabilities for Cl I - Cl III
3/19 - Measurements of spectral line shapes for studying the particle density and motion in an imploding z-pinch plasma
3/19 - Total Ionization Cross Sections of Silicon Chlorides by Electron Impact
3/19 - Diagnostic Spectrometers for Tomorrow's X-Ray Sources.
3/19 - FLYCHK At NIST : The Population Kinetics Modeling Capability
3/19 - Spectra of Ne II, Ne III, and Ne IV with a Penning Discharge in the Vacuum Ultraviolet
3/19 - Photoionization from 4s4p levels to 4p2 resonances in neutral zinc
3/19 - NIST’s Bibliographic Databases on Atomic Spectra
3/19 - New Critical Compilations of Atomic Transition Probabilities for Neutral and Singly Ionized Carbon, Nitrogen and Iron
3/19 - He-Like Satellites to H-Like Resonance Lines of Light Elements
3/19 - Spectral Data for Tungsten Atoms and Ions, W I through W LXXIV
3/19 - Compilation of Energy Levels and Observed Spectral Lines of Krypton: Kr I – Kr XXXVI
3/19 - Infrared Spectrum and Improved Energy Levels of Neutral Krypton
3/19 - Ionization Of Silicon, Germanium, Tin and Lead By Electron Impact
3/19 - Revised and Extended Analysis of Mo V
3/19 - Kim Memorial Lecture
3/19 - X-Ray Measurements Using a Microcalorimeter on an Electron Beam Ion Trap
3/20 - Nano-Optics for Chemical and Materials Characterization
3/20 - "Si Stress Imaging and Toughness Measurements by Raman Scattering"
3/21 - The Role of Theory and Computation in Nanoscience
3/25 - Behavior and removal of multiwalled carbon nanotubes during simulated drinking water treatment processes
3/26 - Self-Assembled Monolayers of Alkyl Tethered Moieties
3/29 - An In-Situ Spectroscopic Ellipsometry Study of the Effects of Potential on Fibrinogen/Thrombin
Sequential Resource Allocation in Wireless Communication Networks
SEQUENTIAL OPPORTUNISTIC DECODING FOR WIRELESS NETWORKS
NIST Research Library 2007 Customer Survey
March Book Giveaway at the NIST Research Library
No Web Site announcements this week.