Minutes Run IIB Silicon Meeting,
These minutes can be found at:
http://d0server1.fnal.gov/projects/run2b/Silicon/www/smt2b/Documentation/minutes/minutes_Mar27_03.html
Agenda
ü Evaluation of Inner Layer Sensors
ü Prep for Inner Layer Production Readiness Review
ü Database Issues
Previous Meeting Note:
o Bob
McCarthy’s presentation from last meeting is available and can be accessed at
http://d0server1.fnal.gov/projects/run2b/Silicon/www/smt2b/Documentation/minutes/Silicon
Testing at Stony Brook032003.pdf
Evaluation of Inner Layer Sensors
o
Bad channel
checks and interstrip capacitance check for irradiated L1 sensors have been
completed. No additional pinholes
were found in either HPK or ELMA irradiated sensors. A very small number of additional new shorts and opens
were reported, but these may be attributable to handling? All sensors were reported to pass
the interstrip capacitance check.
o Regina
has compiled the comparisons between the ELMA and Hamamatsu L1 sensors, and Jim
updated the document to incorporate the mechanical measurements (but mechanical
grades still need to be updated to reflect that fact that the flatness
tolerances are unsigned quantities). The latest version of the document can be found at http://d0server1.fnal.gov/projects/run2b/Silicon/Sensors/L1_QA_V1.5.doc
o It was not clear whether the irradiated ELMA
L1 sensor number 12 was oxygenated or not.
o
Frank expressed
concern regarding about the IV results for the HPK L1 sensors (particularly HPK
L1 sensor 11), and suggested that the sensor should be remeasured and behavior
monitored for stability over at least a 24 hour time period. The sensor in question appeared to
exhibit slow but early breakdown. There were suggestions that perhaps the
behavior was attributable either to contact problems or to humidity conditions
during the testing.
o
Sergey reported
that HPK L1 sensor 11 may no longer be viable due to an incident (after
previous measurements).
o It was agreed that a sensor would be
remeasured at KSU with larger voltage steps and larger settling times (increase
from 1 sec to 5 sec settling times) between measurements, and HPK L1 sensor 12
appears to be the prime candidate.
o The results of the grading of the ELMA and Hamamatsu sensors are
unambiguous. Hamamatsu is
selected as the vendor of choice for the inner sensors.
Preparation for Inner Layer Sensor
Production Readiness Review
o L1 Test structures will be measured next week
o Copper foils have been irradiated but results are not yet analyzed. After the meeting there was a suggestion by Bill Freeman to have an independent cross check of the foils at Fermilab, since that is a standard procedure at the Lab.
o A note describing the improved understanding of the flux will be generated.
o A module will be built using layer 1 sensors from HPK, but this is not viewed as something that must be done prior to the PRR
o The Layer 1 sensor drawing was last revised about a year ago. No changes are foreseen to this drawing (except for the addition of a note describing the scratch pad convention we would like HPK to follow).
o The layer 0 sensor drawing still needs to be checked.
o There was a suggestion that it might be prudent to begin processing of the purchase order for the inner layer sensors and hold the production until after the PRR
o Expect to have internal review of documentation for the inner layer PRR in early April.
Database Issues
o Sergey inquired regarding the status of the database (with an interest in how the test result data that he generates will be stored)
o Marcel reported that there has been an official request for a letter from our spokespersons outlining our intentions to use the database purely for our scientific purposes. The letter has been drafted and should soon be on the way.
o The question of whether the database should include tables for the test data or links to that data was deferred until Frank could participate in the discussion.
Link to the Run IIb silicon page
http://d0server1.fnal.gov/projects/run2b/Silicon/www/smt2b/smt2b.html
Links to minutes archive
http://d0server1.fnal.gov/projects/run2b/Silicon/www/smt2b/Documentation/Minutes/minutes_silicon.htm