This is not a solicitation, but a Notice of Contract Action. The AFDW/A7KM, Ft. Detrick MD, intends to award a sole-source Firm-Fixed Price (FFP) contract to the JEOL USA for JEOL Scanning Electron Microscope (SEM) Model JSM-6610LV. Description:(a) The SEM shall be capable of achieving a resolution of at least 3.0 nm at high accelerating voltage in the Secondary Electron Image (SEI) mode and 4.0 nm by Backscatter Electron Image (BEI) in the differentially pumped mode. In the high vacuum mode it should be possible to attain a resolution of 15 nm at 1 kV, 8 nm at 3 kV, and 3.5 at 25 kV at the analytical working distance. Low kV imaging is the only way to see surface topology and textures. Higher kV imaging means the electron beam goes further into the sample and those emitted secondaries are from those deeper areas. (b) The SEM must have a hinged door to allow direct placement of our samples under the final lens. This removes the possibility of damaging the final lens causing extensive repair when the drawer pull out stage type is used. The stage must be fully movable after sample placement, before the door is closed to allow direct observation of exact positioning under the final lens. Must allow operator to adjust/secure uniquely shaped samples as needed before closing the chamber door. (c) Accommodation of samples 12 inches in diameter by 3 inches high and weighing up to 3 kg. A 15 lb sample weight must be achievable under limited conditions. It should be possible to tilt an 8 inch sample up to 35 degrees at a working distance as short as 10 mm and up to 50 degrees at 20 mm. (d) Stage navigation system using camera at atmosphere or vacuum to take top down color image of sample which allows point and click navigation during SEM use shall be standard. (e) SEM up-time shall be guaranteed at least 90% averaged of a twelve month period. (f) SEM must have an in-line Probe Current Detector (PCD). For quantitative analysis, a PCD must be used to guarantee probe current.(g) Must have has a zoom condenser (two-stage) to eliminate shifting of the focus stigmation when adjusting probe current between imaging and analysis conditions. (h) Must have top down Charged Coupled Device (CCD) to take color images to be used for navigation of the sample. (i) Must have dedicated rotary pump for the chamber to allow low vacuum operat ion. This dedicated pump only pumps the specimen chamber to allow cleaner operation with more efficient sample throughput. (j) The SEM must be compatible with Department of Energy (DOE) systems in order to allow direct validation of results. This requires that data files be consistent between the two systems. Under the authority of USC 2304(c)(1) pursuant to FAR 6.302-1(2)(i), supplies or services needed by the agency are available from only one responsible source and no other type of supplies or services will satisfy the needs of the agency. A determination not to compete this requirement is based on market research and is solely within the discretion of the Government. This announcement is not a request for competitive quotations. Inquiries should be directed no later than 12:00 p.m., 19 January 2009, via email, referencing FA7014-09-R-0015, to Mr. Keith Hunter, Contract Specialist, keith.hunter.ctr@detrick.af.mil. The Government will review all responses, without prejudice, whether or not the Government initially determines that another firm is fully qualified to fulfill the U.S. Air Force requirement. Note: If documents are sent via email, the contractor will be responsible for validating Government receipt by call the Contract Specialist at (301) 619-8924. No solicitation is available and telephone requests for information will not be honored.