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January 2006 EEEL Offers First Display Metrology Short Course |
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The first NIST Display Metrology Short Course, sponsored
by EEEL’s Optoelectronics Division, was held at
the NIST-Boulder campus, Nov. 15-17, 2005. The three-day
course consisted of an one-day lecture followed by
two days of hands-on activities. The instructors, Ed
Kelley and Paul Boynton, designed the course to assist metrologists, engineers, end users, and others who work
with and/or characterize electronic display devices.
Attendees included representatives from display-related
industries from the United States and Europe.
Many assume that the characterization of electronic
display quality is a straightforward process offering few complications. However, what the eye sees can be very
difficult to capture accurately and quickly in a quantitative
way. With the advent of many new display technologies,
there is a need to level the playing field so that different
display technologies can be evaluated on an equivalent
basis. Developing display metrology methods to
accomplish this goal is wrought with many difficulties.
The purpose of this course is to equip members of the
display industry with the measurement skills and understanding
necessary to accurately characterize many different
types of displays using quantitative methods. The
next course will be offered in February 28 - March 2, 2006.
Topics covered during the lectures included a review
of photometry and colorimetry, discussion of quantities
and units used in photometry, review of simple photometric
calculations, review of types of measurement
instrumentation, veiling glare and management of stray
light, display reflection characterization, reflection haze
and robustness, bidirectional reflectance distribution
function, projection measurements, diagnostics, and
measurement uncertainty. Hands-on activities explored
concepts such as reflection robustness, projection measurements,
reflection measurements, characterization of
white reflectance standard and black glass, bidirectional
reflectance distribution function measurements, diffuse
reflection measurements, colors and gamut measurement
and detector diagnostics, use of masks and frusta, color
gamut, and ambient performance of displays. |