TITLE: Effect of index of refraction on radiation characteristics in a heated absorbing, emitting, and scattering layer
Document ID: 19920070407 A (92A53031) File Series: Open Literature
Report Number: None
Sales Agency & Price: Issuing Activity - Copyright
Authors: Siegel, R. (NASA Lewis Research Center), Spuckler, C. M. (NASA Lewis Research Center)
Journal Title: ASME, Transactions, Journal of Heat Transfer
Volume: 114 Issue: 3, Au
Published: Aug 01, 1992
Corporate Source: NASA Lewis Research Center (Cleveland, OH, United States)
Pages: 4
Contract Number: None
NASA Subject Category: FLUID MECHANICS AND HEAT TRANSFER
Abstract:
The effect of the index of refraction on the temperature distribution and radiative heat flux in semitransparent materials, such as some ceramics, is investigated analytically. In the case considered here, a plane layer of a ceramic material is subjected to external radiative heating incident on each of its surfaces; the material emits, absorbs, and isotropically scatters radiation. It is shown that, for radiative equilibrium in a gray layer with diffuse interfaces, the temperature distribution and radiative heat flux for any index of refraction can be obtained in a simple manner from the results for an index of refraction of unity.
Major Subject Terms:
CERAMICS RADIATION ABSORPTION
RADIATIVE HEAT TRANSFER
REFRACTIVITY THERMAL EMISSION
TRANSPARENCE
Minor Subject Terms:
CONVECTIVE HEAT TRANSFER HEAT FLUX
MELTING OPTICAL THICKNESS
PRANDTL NUMBER TEMPERATURE
DISTRIBUTION
Language Note: English
Notes: ASME, Transactions, Journal of Heat Transfer (ISSN 0022-1481), vol. 114, no. 3, Aug. 1992, p. 781-784.
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