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Title: |
MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applications
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Author(s): |
Peters, Robert D.; Lay, Oliver P.; Dubovitsky, Serge; Burger, Johan P.; Jeganathan, Muthu
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Abstract: |
The MSTAR sensor is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with subnanometer accuracy.
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NASA Center: |
Jet Propulsion Laboratory
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Publication Date: |
March 1, 2004
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Document Source: |
Other Sources |
Online Source: |
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Document ID: |
20060043378
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Meeting Information: |
5th International Conference on Space Optics, March 30, 2004, Toulouse, France |
Keywords: |
AMBIGUITY; INTEGERS; INTERFEROMETERS; METROLOGY; RESOLUTION; distance measurement; absolute metrology;
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Accessibility: |
Unclassified; Copyright; Unlimited; Publicly available; |
Updated/Added to NTRS: |
2006-12-25 |
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