|
JEOL 6500F SEM
This instrument can be downloaded and is provided here in Adobe PDF formats.
|
|
 |
Techniques/Capabilities:
- High current, 30kV FE gun
- Secondary/BS electron imaging down to 0.5 and 1kV, respectively
- Si drift and microcalorimeter EDS X-ray detectors (Z>3)
- High speed / high spectral resolution EDS spectrum imaging
- Dry pumping system/in-situ plasma cleaning of specimens
- High speed beam blanking and insertable Faraday cup
|
Current Research Activities:
- Structural characterization of high temperature alloys, composites, ceramics, nano-structured materials, environmental effects (oxidation, transformation)
- Low voltage operation to provide higher spatial resolution EDS analysis/mapping
- Elemental/phase distribution via EDS analysis/mapping, BSE imaging (above
|
|
|
|
|
