LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 22th DAY OF July, 2008
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
QA Bearing Technologies Ltd.: See--
QC Solutions, Inc.: See--
Steeples, Kenneth; and Tsidilkovski, Edward
07403023 Cl. 324-752.
Qi, Yihong; Man, Ying Tong; and Jarmuszewski, Perry, to Research In Motion Limited Mobile wireless communications device comprising non-planar internal antenna without ground plane overlap
07403165 Cl. 343-702.
Qi, Yu: See--
Ong, Beng S.; Qi, Yu; Wu, Yiliang; and Li, Yuning
07402681 Cl. 548-417.
QIDI Electric Group: See--
Qimonda North America Corp.: See--
Miller, Christopher; and Drake, Charles
07403439 Cl. 365-203.
Qin, Haoliang: See--
Hu, Kewen; Wang, Ligang; Zeng, Qing; Ji, Yi; Qin, Haoliang; Ying, Jian; Zhao, Wenjun; and Yuan, Huailin
07403534 Cl. 370-401.
Qin, Shixin: See--
Gerard, Craig J.; Gerard, Norma P.; Mackay, Charles R.; Ponath, Paul D.; Post, Theodore W.; and Qin, Shixin
07402657 Cl. 530-350.
Qin, Zhishang; and Jiang, Jiawei, to Shinco Electronic Group Co., Ltd. Method and system for transmission and control of data stored in a USB master to and for utilization by a USB slave
07404022 Cl. 710-110.
Qinetiq Limited: See--
Lawrence, Christopher Robert; and Parker, Andrew Richard
07402195 Cl. 95-117.
Qisda Corporation: See--
Lee, Chih-Hsin; and Lin, Meng-Ju
07403543 Cl. 370-477.
Qiu, Yao-Ling: See--
Or, Yat Sun; Qiu, Yao-Ling; Wang, Guoqiang; Niu, Deqiang; and Phan, Ly Tam
07402568 Cl. 514-29.
Qiu, Yongxing: See--
Morris, Carol Ann; Gabriel, Manal M.; Qiu, Yongxing; Winterton, Lynn Cook; Lally, John Martin; Ash, Marcia Kay; Carney, Fiona Patricia; and Morgan, Courtney Flem
07402318 Cl. 424-422.
Qiu, Zhiming; and Ma, Lidan, to Beifa Group Co., Ltd. Highlighter
D0573639 Cl. D19-43.
Qiu, Zhiming; and Fei, Yong, to Beifa Group Co., Ltd. Pen
D0573640 Cl. D19-48.
QLOGIC, Corporation: See--
Dropps, Frank R.; Gustafson, William J.; and Haseman, Leonard W.
07404020 Cl. 710-71.
Matters, Todd; and Rimmer, Todd
07404012 Cl. 709-250.
Thompson, Michael I.
07403542 Cl. 370-474.
Qsida Corporation: See--
Qu, Jingran; Liu, Zhongding; and Lin, Chun-Fu, to Via Technologies, Inc. Delay apparatus and method thereof
07403056 Cl. 327-269.
Qu, Shimian: See--
Hallahan, Dennis E.; and Qu, Shimian
07402392 Cl. 435-7.1.
QUALCOMM Incorporated: See--
Abrol, Nischal; and Lioy, Marcello
07403498 Cl. 370-324.
Lane, Frank A.; Laroia, Rajiv; and Li, Junyi
07403470 Cl. 370-203.
Stempel, Brian Michael; Bridges, Jeffrey Todd; Smith, Rodney Wayne; and Sartorius, Thomas Andrew
07404042 Cl. 711-123.
Qualcomm Mems Technologies, Inc.: See--
Silverstein, Louis D.; Lewis, Alan G.; Gille, Jennifer Lee; and Xu, Gang
07403180 Cl. 345-84.
Qualls, Dean Evans: See--
Elliott, Jr., Ross Liles; Meyer, Todd M.; Qualls, Dean Evans; and Strougo, Rodrigo
07403998 Cl. 709-229.
Quanta Computer Inc.: See--
Lien, Chun-Yi; and Hsu, Sheng-Fu
07401756 Cl. 248-346.07.
Quanz, Martin: See--
Kossmann, Jens; Welsh, Thomas; Quanz, Martin; and Knuth, Karola
07402420 Cl. 435-193.
Quartarone, Frank A.: See--
Sanchez, Richard R.; Chen, Xiaojian; and Quartarone, Frank A.
D0573674 Cl. D21-752.
Sanchez, Richard R.; Chen, Xiaojian; and Quartarone, Frank A.
D0573675 Cl. D21-752.
Queen's University at Kingston: See--
Brown, R. Stephen; Tabash, Samir P.; Kozin, Igor S.; Marcotte, Eric J. P.; Ley, Arthur N.; Hall, Kevin R.; Hussain, Moe; Hodson, Peter V.; Akhtar, Parveen; Bowers, Raymond J.; Wynne-Edwards, Robin A.; and St. Marseille, John G.
07402426 Cl. 435-288.7.
Queheillalt, Douglas T.; Wadley, Haydn N. G.; and Katsumi, Yasushi, to University of Virginia Patent Foundation Heat exchange foam
07401643 Cl. 165-104.21.
Querleux, Bernard: See--
Leveque, Jean-Luc; Querleux, Bernard; and Giron, Franck
07402135 Cl. 600-306.
Quicksilver Technology, Inc.: See--
Master, Paul L.; and Uvacek, Bohumir
07403981 Cl. 709-220.
Quickturn Design Systems Inc.: See--
Piper, Lisa J.; Lemche, Carol; Jurchisin, Arthur; and Das, Purnima
07404160 Cl. 716-5.
Quintana, Luis: See--
Fanuel, Philippe; Lassoie, Jean-Pierre; Mageren, Olivier; Quintana, Luis; Moi, Erik Stein; and Dithmar, Erik
07401666 Cl. 175-285.