NIST Technicalendar August 6 to August 10, 2001 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal/.
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In this Issue: Meetings at NIST Meetings Elsewhere Announcements Talks by NIST Personnel NIST Web Site Announcements NIST Administrative Calendar (current)   NIST Vacancy Announcements (current)

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No Scheduled Events

1:00 PM - Forced Dissociation of Cell Adhesion Receptor-Ligand Bonds

10:30 AM - Heat Flux Sensor Calibration Issues

9:30 AM - 508 Standards and Contracting -- Informal Q&A for NIST Staff

No Scheduled Events

8/6 -- MONDAY

No Scheduled Events

8/7 -- TUESDAY

1:00 PM - CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY SEMINAR: Forced Dissociation of Cell Adhesion Receptor-Ligand Bonds
Cell adhesion mediated by biological macromolecules is an important factor in blood clotting, cancer metastasis and inflammation. Adhesive Dynamics simulations of cell adhesion in flow demonstrate that knowledge of the force dependence of dissociation of the non-covalent interactions that hold these molecules together is important for understanding bioadhesion under hydrodynamic shear forces (e.g. "rolling adhesion" of white blood cells in blood vessels). Cell adhesion molecules where absorbed to latex microspheres and to a thin glass fiber that acted as a force sensor. Repeated gentle apposition of sphere and fiber by micromanipulation resulted in the formation of a small number of bonds. A sphere-retraction protocol that combined hydrodynamic and Hookena forces allowed a range of force loading rates to be applied to single receptor-ligand bonds. Analysis of the distribution of forces at dissociation versus loading rate yielded the location of transition states in the intermolecular bonding potential as well as estimates of the reverse reaction rate under zero load. Simulations and calculations that are being used to explain these and other questions in quantitative adhesion biology will also be described. These simulations should ultimately yield information on how adhesion molecule dissociation properties are coded by molecular structure.
David Tees, Ph.D. , Research Associate, University of Pennsylvania, Philadelphia, PA.
Advanced Chemical Sciences Bld, Room A202. (NIST Contact: John Woodward, 301-975-5495, john.woodward@nist.gov)


8/8 -- WEDNESDAY

10:30 AM - OPTICAL TECHNOLOGY DIVISION SEMINAR: Heat Flux Sensor Calibration Issues
Ned Keltner , Ktech Corporation, Albuquerque, NM, keltner@ktech.com.
Administration Bldg, Lecture Rm. F. (NIST Contact: David DeWitt, 301-975-4199, dpd@nist.gov)


8/9 -- THURSDAY

9:30 AM - NIST SEMINAR: 508 Standards and Contracting -- Informal Q&A for NIST Staff
Are you in the process of contracting out for anything that is EIT-Electronic and Information Technology? Do you know all that is covered under the definition of EIT? Do you have questions concerning the 508 standards and how to apply them in your contracting efforts? For some answers, please consider attending one of the informal sessions that have been set up for the next several weeks. SESSIONS WILL BE HELD EVERY THURSDAY FROM 9:30 a.m. - 10:30 a.m. ON JULY 12, JULY 26, AUGUST 2, AUGUST 9, AUGUST 16, AUGUST 23, and AUGUST 30, THE SESSIONS WILL BE HELD IN THE SHOPS CONFERENCE ROOM, 304/B126; ON JULY 19, THE SESSION WILL BE HELD IN LECTURE ROOM B, ADMINISTRATION BUILDING. Topics covered will include: What is 508 and why do I care? I know what I want to buy. Now what? Market research--What's that have to do with 508? What are these "checklists for compliance" ? How do I find out if my widget is compliant? But what if....... Representatives from the Contracts Office and from the NIST 508 Coordinator's Team will be there to answer questions.
Kathy Fain , Contract Specialist, Acquisition and Logistics Division, NIST, kathy.fain@nist.gov. Daniel Benigni , Senior Analyst, Office of the CIO, NIST, dbenigni@nist.gov.
Shops Building, Shops Conference Room 304/B126. (NIST Contact: Daniel Benigni, 301-975-3279, dbenigni@nist.gov)


8/10 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

8/14/01 10:30 AM - OFFICE OF THE DIRECTOR, NIST SEMINAR: Growing Leadership in a Technical Organization
Mr. Donnelly will discuss GE's strategies for cultivating technical talent and leadership in their world-class Corporate Research and Development (CR&D) Center. How does GE recruit, develop, reward, and retain the best and brightest technical staff? How does GE identify and cultivate leaders? How does GE respond to "game changing" technologies? Scott Donnelly directs the CR&D, GE's centerpiece of technology and innovation and one of the world's most diversified industrial research organizations, with laboratories in New York, India, China and Mexico. Donnelly joined GE in 1989 and has served in a variety of technical leadership positions in Australia and the U.S. Donnelly earned a bachelor's degree in Electrical and Computer Engineering in 1984 from the University of Colorado at Boulder.
Scott Donnelly , Senior Vice President for Corporate Research and Development, General Electric.
Administration Bldg, Red Auditorium. (NIST Contact: Denise Herbert, 301-975-2667, dherbert@nist.gov)
An interpreter will be available for this meeting.

8/15/01 10:00 AM - OFFICE OF THE DIRECTOR, NIST SEMINAR: The Electronic Kilogram and the Weakest Link
In the early 1900s, measuring an ampere current standard was a fundamental but difficult job for NBS in determining electrical standards. The advent of quantum standards in recent decades, especially Josephson effect voltage and quantum Hall effect resistance, changed this field of metrology. The ampere balance became the watt balance, which now measures the ratio of mechanical power (force times velocity in units of mass, length, and time) to electrical power (voltage squared divided by resistance). Using the quantum physics of modern standards as well as their reproducibility, this experiment now measures the Planck constant, h, in SI units. The last determination of h was completed in 1998 at NIST with a 0.08 ppm uncertainty. In the next generation experiment, all the applicable reference units will be quantum standards, except for mass. As the last artifact defined as its own standard, the kilogram has become the weakest link in the SI. A change in its mass alters the value of many physical constants. With a new focus on monitoring the mass of the kilogram artifact, a new watt balance with an order of magnitude lower uncertainty will become the electronic kilogram experiment. This should bring long-term stability to mass measurements relevant to modern metrology and lead to a redefinition of the kilogram.
Richard Steiner , Electronics and Electrical Engineering Laboratory.
Administration Building, Green Auditorium. (NIST Contact: Eric Vogel, 301-975-4723, eric.vogel@nist.gov)
Special Assistance Available

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MEETINGS ELSEWHERE


8/6 -- MONDAY

No Scheduled Events

8/7 -- TUESDAY

No Scheduled Events

8/8 -- WEDNESDAY

No Scheduled Events

8/9 -- THURSDAY

No Scheduled Events

8/10 -- FRIDAY

No Scheduled Events

ADVANCE NOTICE

No Scheduled Events

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TALKS BY NIST PERSONNEL

PRATT, J. (Co-Authors: D. B.Newell , Gaithersburg, MD, david.newell@nist.gov J. A.Kramar , Gaithersburg, MD, john.kramar@nist.gov) Douglas T. Smith; Edwin Williams; Gaithersburg, MD, L. A. Feeney former NIST student. : SI TRACEABILITY OF FORCE AT THE NANONEWTON LEVEL.
NCSL International 2001 Annual Workshop and Symposium, The Washington Hilton & Tower, Washington, DC, 7/30.

CHESNUTWOOD, K. : EVALUATION OF LOAD CELLS FOR LEGAL METROLOGY AT NIST.
NCSL International 2001 Annual Workshop and Symposium, The Washington Hilton & Tower, Washington, DC., 7/30.

BARTEL, T. : INTERCOMPARISONS OF THE MEASUREMENT OF FORCE AMONG NATIONAL METROLOGY INSTITUTES.
NCSL International 2001 Annual Workshop and Symposium, The Washington Hilton & Tower, Washington, DC, 7/30.

SEIFARTH, R. (Co-Author: S.HO , Mechanical Engineer, Gaithersburg, MD, samuel.ho@nist.gov) : BASIC PROCEDURES IN FORCE CALIBRATION AT NIST.
NCSL International 2001 Annual Workshop and Symposium, The Washington Hilton & Tower, Washington, DC, 7/31.

JOHNSON, T. : INTEGRATION OF PASSIVE ELEMENTS.
Gordon Research Conf., Physics and Chemistry of Microfluidics, Queen's College, Oxford, U.K., 8/1.

READER, J. : ATOMIC SPECTROSCOPY AT NIST:2001.
Annual SPIE Meeting, San Diego, CA, 8/1.

LOCASCIO, L. : SURFACE MODIFICATION IN PLASTIC MICROFLUID SYSTEMS.
Gordon Research Conf., Physics and Chemistry of Microfluidics Systems, Queen's College, Oxford, U.K., 8/2.

JABBOUR, Z. (Co-Author: A.Reichmuth , Mettler-Toledo, Inc., Switzerland) : INTRODUCTION TO WEIGHING AND MASS CALIBRATION.
NCSL International 2001 Annual Workshop and Symposium, The Washington Hilton & Tower, Washington DC, 8/3.

ETZ, E. : CHROMIUM-DOPED LUMINESCENT GLASSES FOR RAMAN INTENSITY CALIBRATION WITH 785 NM LASER EXCITATION..
Microscopy & Microanalysis 2001 Meeting/Annual Meeting of the Microscopy Society of America and the Microbeam Analysis Society., Long Beach, CA, USA, 8/6.

READER, J. (Co-Author: M. D.Lindsay ) : EXTENDED ANALYSIS OF THE SPECTRUM OF FIVE-TIMES-IONIZED ZIRCONIUM, ZR VI.
7th International Colloquium on Atomic Spectra and Oscillator Strengths, Queen's University, Belfast, Ireland, 8/6.

DOUGLAS, J. : NON-EQUILIBRIUM PATTERN FORMATION IN THIN BLEND FILMS-MORPHOLOGY AND DYNAMICS OF GROWTH.
2001 Telluride Workshop on Polymer Theory vs. Polymer Experiments, Telluride, CO, 8/6.

NEWBURY, D. : LOW VOLTAGE SCANNING ELECTRON MICROSCOPY AND MICROANALYSIS.
M & M Conference, Long Beach Convention Center, Long Beach, CA, 8/6.

ZARR, R. (Co-Author: J. J.Filliben ) : COLLABORATIVE THERMAL CONDUCTIVITY MEASUREMENTS OF FIBROUS GLASS AND EXPANDED POLYSTYRENE REFERENCE MATERIALS.
26th International Thermal Conductivity Conf. & 14th International Thermal Expansion Symposium, Cambridge, MA, 8/6.

MARINENKO, R. : EVALUATION OF A LEAD LANTHANUM ZIRCONIUM TITANATE (PLZT) SPECIMEN FOR USE AS AN ELECTRON MICROPROBE REFERENCE MATERIAL..
Microscopy and Microanalysis 2001 Meeting, Long Beach, CA, USA, 8/7.

ARMSTRONG, J. : PROPAGATION OF ERRORS IN THE PRECISION AND ACCURACY OF QUANTITATIVE ELECTRON MICROBEAM ANALYSIS.
Microscopy and Microanalysis 2001 Meeting, Long Beach, CA, USA, 8/7.

WINDSOR, E. : SRM 482: REVISITED AFTER 30 YEARS..
2001 Microscopy and Microanalysis Conference, Long Beach, CA, USA, 8/7.

SANSONETTI, C. (Co-Authors: M.Blackwell E.Saloman ) : INFRARED SPECTRA OF THE NOBLE GASES.
7th International Colloquium on Atomic Spectra and Oscillator Strengths for Astrophysical and Laboratory Plasmas, Belfast, Northern Ireland, 8/7.

NEWBURY, D. : DIAGNOSTICS FOR ASSESSING SPECTRAL QUALITY FOR X-RAY MICROANALYSIS IN LOW VOLTAGE AND VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPY.
M & M Conference, Long Beach Convention Center, Long Beach, CA, 8/8.

SMALL, J. : ELECTRON BACKSCATTER DIFFRACTION (EBSD) OF SUB 500 NM PARTICLES..
Microscopy and Microanalysis 2001 Conference, Long Beach, CA, USA, 8/9.

LYON, G. : THE INTERNET MARKETPLACE AND DIGITAL RIGHTS MANAGEMENT.
Int. Conf.--Advances in Infrastructure for Electronic Business, Science and Education on the Internet, L'Aquila, Italy, 8/11.

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ANNOUNCEMENTS

2001 U.S. WORLD STANDARDS DAY PAPER COMPETITION
This year, the U.S. standards community will celebrate World Standards Day on October 10, 2001. To highlight the importance of standards to industry and government, the sponsors of World Standards Day, including NIST, are again holding a paper competition. The theme for the 2001 World Standards Day paper contest will be "Standards and the Environment." PRIZES: The author(s) of the winning submission will receive $2,500 and a commemorative plaque. Prizes of $1000 for 2nd place and $500 for third place may also be awarded. Winning papers will be published by the Standards Engineering Society, ANSI, and others. ELIGIBILITY: The competition is open to individuals in private sector or government facilities. The paper may be co-authored. RULES: The paper must be original and not previously published. NIST papers should be processed through WERB or BERB in the usual way. Entries must be received by August 31, 2001. Contest rules and application forms may be obtained through the Standards Engineering Society home page at http://www.ses-standards.org or call Glenn Ziegenfuss, Executive Director, SES, 305-971-4798.
NIST Contact: Ellen Trager, 301-975-4038, ellen.trager@nist.gov

DIVERSITY THEATER
Date: August 9, 2001 Time: 1pm-3pm Place: Red Auditorium Description: "Diversity Theater" is an interactive training modality. Diversity Theater- real work scenarios acted out by the presentors. "Diversity Theater" combines acting with audience involvement and participation to help reinforce training and apply learnings to real life situations. The scenarios are designed to engage the audience by making them witnesses to a workplace situation. Each scenario is acted out, the audience is allowed to ask the actors questions. The audience gets involved, confronting sometimes sensitive issues in a safe learning environment.
NIST Contact: Tim Kring, 301-975-8728, timothy.kring@nist.gov

NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (NIST) TECHNOLOGY EXPO 2001
More that twenty-five industry leading manufacturers, developers, and systems integrators will exhibit their latest products. The Expo will take place in the Employee Lounge, Wednesday, August 22, 2001, from 10:00 a.m. - 2:00 p.m. Hosted by: Information Technology Laboratory.
NIST Contact: Megan Joy, 301-596-8899, joy@ncsievents.com

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NIST WEB SITE ANNOUNCEMENTS

No Web Site announcements this week.

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For more information, contact Ms. Sharon Mingo, Editor, Stop 2500, National Institute of Standards and Technology, Gaithersburg MD 20899-2500; Telephone: 301-975-TCAL (8225); Fax: 301-926-4431; or Email: tcal@nist.gov.

All lectures and meetings are open unless otherwise stated.

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