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DOI 10.1063/1.1379353
Title Voltage required to detach an adhered particle by Coulomb interaction for micromanipulation
Creator/Author Takahashi, Kunio ; Kajihara, Hideaki ; Urago, Masataka ; Saito, Shigeki ; Mochimaru, Yoshihiro ; Onzawa, Tadao
Publication Date2001 Jul 01
OSTI IdentifierOSTI ID: 40204389
Other Number(s)Journal ID: ISSN 0021-8979; TRN: IM200108%%66
Resource TypeJournal Article
Resource RelationJournal: Journal of Applied Physics; Journal Volume: 90; Journal Issue: 1; Other Information: DOI: 10.1063/1.1379353; Othernumber: JAPIAU000090000001000432000001; 048114JAP; PBD: 1 Jul 2001
Sponsoring Org(US)
Subject71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ADHESION; AXIAL SYMMETRY; BOUNDARY ELEMENT METHOD; EMPLOYMENT; MANIPULATORS; PHYSICS; SHAPE; SUBSTRATES
Description/Abstract An adhered particle can be detached by Coulomb interaction. The voltage required for detachment for micromanipulation is theoretically analyzed by employment of a boundary element method. The system consists of a manipulating probe, a spherical particle, and a substrate plate, all of these objects being conductive. The manipulator and the substrate are cylindrical, and axial symmetry is assumed. Although a numerical method is used to solve the equations, all parameters are normalized. The effect of the shape parameters on the Coulomb force is systematically calculated. The force is independent of system size and depends on the relative shape of the system. The force is proportional to the applied voltage raised to the second power. The force generated by the Coulomb interaction is compared with the adhesion force deduced from the Johnson{endash}Kendall{endash}Roberts theory, and the voltage required for detachment is clearly expressed. The possibilities and limitations of micromanipulation using both the adhesion phenomenon and Coulomb interaction are theoretically discussed. {copyright} 2001 American Institute of Physics.
PublisherThe American Physical Society
Country of PublicationUnited States
LanguageEnglish
FormatSize: page(s) 432-437
System Entry Date2004 Jul 13

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