Publication List

Automatic Testing

  1. B. A. Bell, T. M. Souders, B. C. Belanger, and R. A. Kamper, "Challenges in Achieving ATE Traceability to NBS," Proc. IEEE AUTOTESTCON, pp. 233-238 (Sep 1979).
  2. B. A. Bell, "Precision Electronic Test Equipment Calibration Standards at NBS," Proc. ATE Seminar and Test Instruments Conference, pp. 138-168 (Jan 1980).
  3. K. J. Lentner, C. B. Childers, and S. G. Tremaine, "A Semiautomatic System for AC/DC Difference Calibration," IEEE Trans. Instrum. Meas. IM-29, No. 4, pp. 400-405 (Dec 1980). Reprinted in Nat. Bur. Stand. (U.S.), Spec. Publ. 705, "Precision Measurement and Calibration: Electricity," A. O. McCoubrey, Ed., pp. 640-645 (Oct 1985).
  4. B. A. Bell and O. Petersons, "ATE Calibration by Means of Dynamic Transport Standards," IEEE AUTOTESTCON '81 Proceedings, pp. 280-287 (Oct 1981).
  5. K. J. Lentner and S. G. Tremaine, "A Semiautomatic AC/DC Thermal Voltage Converter Calibration System," Nat. Bur. Stand. (U.S.), NBSIR 82-2576, 62 pages (Sep 1982).
  6. W. G. Eicke, Jr., T. F. Leedy, B. R. Moore, and C. F. Brown, "Measurement Assurance Programs in a Field Environment," Proc. National Conference of Standards Laboratories, 1982 Workshop and Symposium, Gaithersburg, MD, Oct 4-7, 1982, pp. E-1-E-9. Reprinted in Nat. Bur. Stand. (U.S.), Spec. Publ. 705, "Precision Measurement and Calibration: Electricity," A. O. McCoubrey, Ed., pp. 312-320 (Oct 1985).
  7. T. F. Leedy and B. A. Bell, "Automatic Test Equipment Calibration/Performance Verification Evaluation and Research Program," Nat. Bur. Stand. (U.S.), NBSIR 84-2978, 21 pages (Dec 1984).
  8. K. J. Lentner, D. R. Flach, and B. A. Bell, "An Automatic AC/DC Thermal Voltage Converter and AC Voltage Calibration System," Nat. Bur. Stand. (U.S.), NBSIR 84-2973, 23 pages (Nov 1984).
  9. T. F. Leedy, "An Approach to ATE Calibration Via Performance Verification at the System Interface," Proceedings of the 1985 Measurement Science Conf., Santa Clara, CA, Jan. 17-18, 1985, pp. 198-201 (Jun 1985).
  10. G. N. Stenbakken, T. M. Souders, J. A. Lechner, and P. T. Boggs, "Efficient Calibration Strategies for Linear, Time Invariant Systems," Proceedings of 1985 IEEE AUTOTESTCON Conference, Uniondale, L.I., NY, Oct 22-24, 1985, IEEE Press, NY, pp. 361-366 (Oct 1985).
  11. B. A. Bell, Editor, "Proceedings of the Seminar on Digital Methods in Waveform Metrology," Nat. Bur. Stand. (U.S.) Spec. Publ. 707, 177 pages (Oct 1985).
  12. O. B. Laug, G. N. Stenbakken, and T. F. Leedy, "Electrical Performance Tests for Audio Distortion Analyzers," Nat. Bur. Stand. (U.S.), NBSIR 85-3269, 159 pages (Nov 1985). Republished as Nat. Bur. Stand. (U.S.), Tech. Note 1219, 159 pages (Jan 1986).
  13. H. K. Schoenwetter, D. R. Flach, T. M. Souders, and B. A. Bell, "A Precision Programmable Step Generator for Use in Automated Test Systems," Nat. Bur. Stand. (U.S.) Tech. Note 1230, 100 pages (Dec 1986).
  14. N. M. Oldham, "Techniques and Instruments for Automated Electrical Measurements," Proceedings of the Advanced Course on Precision Measurements, New Delhi, India, Jan 19-23, 1985, publ. in MAPAN, the Journal of the Metrology Society of India, 1, No. 1, pp. 25-27 (late 1986).
  15. G. N. Stenbakken, "Characterizing Square and Triangular Waveforms," IMTC/87 Conference Proceedings, IEEE Instrumentation/Measurement Technology Conference, Boston, MA, April 27-29, 1987, digest published by IEEE, pp. 9-11 (Apr 1987).
  16. T. Leedy, "A View of Metrology Support for ATE Systems," talk presented to the Boston Chapter of the IEEE Instrumentation and Measurement Society, May 13, 1987, The Reflector, p. 20, published by IEEE Central New England Council, 35, No. 9 (May 1, 1987).
  17. N. M. Oldham, M. E. Parker, A. Young, and A. G. Smith, "A High Accuracy, 10 Hz - 1 MHz Automatic AC Voltage Calibration System," IMTC/87 Conference Proceedings, IEEE Instrumentation/Measurement Technology Conference Proceedings, April 27-29, 1987, Boston, MA, digest published by IEEE, pp. 279-281 (Apr 1987).
  18. J. R. Sorrells, "Summary Report on A Survey of Electronic Measurement Needs Below 10 MHz," Nat. Bur. Stand. (U.S.), NBSIR 87-3549, 91 pages (Jun 1987).
  19. N. M. Oldham, "AC Voltage and Current Measurements," Proceedings of the Advanced Course on Precision Measurements, New Delhi, India, Jan. 19-23, 1985, publ. in MAPAN, the Journal of Metrology Society of India, 1, No. 3, pp. 17-18 (Jun 1987).
  20. N. M. Oldham, O. B. Laug, and B. C. Waltrip, "Digitally Synthesized Power Calibration Source," Conference on Precision Electromagnetic Measurements, Gaithersburg, MD, June 23-27, 1986, IEEE Trans. Instrum. Meas., special CPEM'86 Issue, IM-36, No. 2, pp. 341-346 (Jun 1987).
  21. G. N. Stenbakken and T. M. Souders, "Test Point Selection and Testability Measures Via QR Factorization of Linear Models," Conference on Precision Electromagnetic Measurements, Gaithersburg, MD, June 23-27, 1986, IEEE Trans. Instrum. Meas., special CPEM'86 Issue, IM-36, No. 2, pp. 406-410 (Jun 1987).
  22. H. K. Schoenwetter, "Design and Characterization of a Programmable Step Generator with Very Fast Settling Performance," Conference on Precision Electromagnetic Measurements, Gaithersburg, MD, June 23-27, 1986, IEEE Trans. Instrum. Meas., special CPEM'86 Issue, IM-36, No. 2, pp. 428-432 (Jun 1987).
  23. T. M. Souders and D. R. Flach, "Accurate Frequency Response Determinations from Discrete Step Response Data," Conference on Precision Electromagnetic Measurements, Gaithersburg, MD, June 23-27, 1986, IEEE Trans. Instrum. Meas., special CPEM'86 Issue, IM-36, No. 2, pp. 433-439 (Jun 1987).
  24. B. A. Bell, "A Report on the NBS/CEEE Surveys of Electronic Measurement Needs Below 10 MHz," Proceedings of the National Conference of Standards Laboratories, 1987 Workshop and Symposium, July 12-16, 1987, Denver, CO, publ. by the National Conference of Standards Laboratories, pp. 75-1 to 75-14 (Jul 1987).
  25. N. M. Oldham and M. E. Parker, "NBS Calibration System for AC Voltage," Proceedings of the National Conference of Standards Laboratories, 1987 Workshop and Symposium, Denver, CO, July 12-16, 1987, publ. by the National Conference of Standards Laboratories, pp. 47-1 to 47-6 (Jul 1987).
  26. N. M. Oldham, "AC Power and Energy Measurement," Proceedings of the Advanced Course on Precision Measurements, New Delhi, India, Jan. 19-23, 1985, publ. in MAPAN, Journal of Metrology Society of India, 1, No. 4, pp. 5-7 (Jul 1987).
  27. G. N. Stenbakken, "Characterizing Square and Triangular Waveforms," IEEE Instrumentation/Measurement Technology Conference, Boston, MA, April 27-29, 1987, IEEE Trans. Instrum. Meas., special IMTC-1987, IM-36, No. 4, pp. 961-963 (Dec 1987).
  28. T. F. Leedy and B. A. Bell, "Concepts for ATE Systems Calibration: Transport Standards to Achieve Traceability to National Standards," presented at the 1988 Measurement Science Conference, Long Beach, CA, Jan. 28-29, 1988, proc. publ. by General Dynamics, Pomona, CA, pp. 307-313 (Jan 1988).
  29. O. Petersons, "NBS Initiatives in TMDE/ATE Diagnostics," Proc. of the National Security Industrial Assn. Diagnostics/Prognostics Symposium, Alexandria, VA, Oct 20-21, 1987, publ. by NSIA, pp. 190-198 (Mar 1988).
  30. R. S. Turgel, O. B. Laug, and T. F. Leedy, "Electrical Performance Tests for True-RMS Voltmeters," Nat. Bur. Stand. (U.S.), NBSIR 88-3736, 129 pgs. (Mar 1988).
  31. T. F. Leedy, K. J. Lentner, O. B. Laug, and B. A. Bell, "Electrical Performance Tests for Hand-Held Digital Multimeters," Nat. Inst. Stand. and Tech. (U.S.), NISTIR 88-4021, 299 pgs. (Jan 1989).
  32. N. M. Oldham, P. S. Hetrick, and X. Zeng, "A Calculable, Transportable Audio-Frequency AC Reference Standard," Conference on Precision Electromagnetic Measurements (CPEM'88), June 7-10, 1988, Tsukuba Science City, Japan, special issue CPEM'88 IEEE Trans. Instrum. Meas., 38, No. 2, pp. 368-371 (Apr 1989).
  33. G. N. Stenbakken, T. M. Souders, and G. W. Stewart, "Ambiguity Groups and Testability," IEEE Trans. Instrum. Meas., 38, No. 4, pp. 941-947 (Oct 1989).
  34. H. K. Schoenwetter, T. F. Leedy, and O. B. Laug, "Electrical Performance Tests for Storage Oscilloscopes," Nat. Inst. Stand. and Tech., (U.S.), NISTIR 89-4220 (Dec 1989).
  35. N. M. Oldham, W. F. Bruce, C. M. Fu, and A. G. Smith, "An Intercomparison of AC Voltage Using a Digitally Synthesized Source," Proc. IEEE Instrumentation/Measurement Technology Conference (IMTC'89), April 25-27, 1989, Washington, DC, IEEE Trans. Instrum. Meas., 39, No. 1, pp. 6-9 (Feb 1990).
  36. N. M. Oldham, O. B. Laug, B. C. Waltrip, and R. H. Palm, "The NIST Digitally Synthesized Power Calibration Source," Nat. Inst. Stand. and Tech. (U.S.), NIST TN 1281, 62 pages (Aug 1990).
  37. T. M. Souders and G. N. Stenbakken, "A Comprehensive Approach for Testing Analog and Mixed-Signal Devices," Proc. 1990 Intl. Test Conference, Washington, DC, Sep 10-12, 1990, publ. by ITC, Mount Freedom, NJ, pp. 169-176 (Sep 1990).
  38. T. Souders and G. N. Stenbakken, "Cutting the High Cost of Testing," publ. in Spectrum, by IEEE, New York City, NY, pp. 48-51 (Mar 1991).
  39. N. M. Oldham and R. M. Henderson, "New Low-Voltage Standards in the DC to 1 MHz Frequency Range," Conference on Precision Electromagnetic Measurements (CPEM'90), June 11-14, 1990, Ottawa, Canada, special issue CPEM'90 IEEE Trans. Instrum. Meas., 40, No. 2, pp. 368-372 (Apr 1991).
  40. N. M. Oldham and P. S. Hetrick, "High Frequency, High Speed Phase Angle Measurements and Standards," Proc. of 1991 Workshop and Symposium of the National Conference of Standards Laboratories, Aug. 18-22, 1991, Albuquerque, NM, publ. by National Conference of Standards Laboratories, Boulder, CO, pp. 251-256 (Aug 1991).
  41. G. N. Stenbakken and T. M. Souders, "Linear Error Modeling of Analog and Mixed-Signal Devices," Proc. of 1991 Intl. Test Conference, Oct 28-Nov. 1, 1991, Nashville, TN, publ. by IEEE, New York City, NY, pp. 573-581 (Oct 1991).
  42. N. Oldham, P. Hetrick, J. Kramar, W. Penzes, T. Wheatley, and C. Teague, "Electronic Limitations in Phase Meters for Heterodyne Interferometry," Proc. of 6th Annual Meeting of the American Society for Precision Engineering, Oct 16, 1991, Santa Fe, NM, pp. 47-49 (Oct 1991).
  43. G. N. Stenbakken and J. A. Starzyk, "Diakoptic and Large Change Sensitivity Analysis," IEE Proceedings, Part G: Circuits, Devices and Systems, publ. by Institution of Electrical Engineers (London, England), 139, No. 1, pp. 114-118 (Feb 1992).
  44. O. B. Laug, T. M. Souders, and D. R. Flach, "A Custom Integrated Circuit Comparator for High Performance Sampling Applications," Proc. IEEE Instrumentation/Technology Conference (IMTC'92), May 12-14, 1992, Secaucus, NJ, pp. 437-441 (May 1992).
  45. S. Avramov, N. M. Oldham, D. G. Jarrett, and B. C. Waltrip, "Automatic Inductive Voltage Divider Bridge for Operation from 10 Hz to 100 kHz," Conf. Record of Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, pp. 67-68 (Jun 1992).
  46. N. M. Oldham and P. S. Hetrick, "Characterized Generator Extends Phase Meter Calibrations from 50 kHz to 20 MHz," Conf. Record of Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, pp. 352-353 (Jun 1992).
  47. N. M. Oldham, O. Petersons, and B. C. Waltrip, "Automatic Impedance Bridge for Calibrating Standard Inductors," Conf. Record of Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, pp. 419-420 (Jun 1992).
  48. B. C. Waltrip, M. E. Parker, N. M. Oldham, and B. A. Bell, "A Sampling Technique for Calibrating Phase Angle Generators from 1 Hz to 100 kHz," Conf. Record of Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, pp. 421-422 (Jun 1992).
  49. E. S. Lagergren, F. D. Martzloff, M. E. Parker, and S. B. Schiller, "The Effect of Repetitive Swells on Metal-Oxide Varistors," Conf. Proc. 2nd Intl. Conference on Power Quality: End Use Applications and Perspectives--PQA'92, Atlanta, GA, Sep 28-30, 1992, pp. C-13:01-10 (Sep 1992).
  50. B. A. Bell, N. M. Oldham, and P. S. Hetrick, "Assessment of Proposed Calibration Support for the Analog Instrumentation Functions in the Integrated Family of Test Equipment (IFTE) Systems," Nat. Inst. Stand. and Tech. (U.S.), NISTIR 4955, special report prepared for the U.S. Army TMDE Support Activity, Redstone Arsenal, AL, 99 pages (Nov 1992). [For Official Use Only - available directly from the authors.]
  51. S. Avramov, N. M. Oldham, D. J. Jarrett, and B. C. Waltrip, "Automatic Inductive Voltage Divider Bridge Operates from 10 Hz to 100 kHz," Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, publ. in IEEE Trans. Instrum. Meas., 42, No. 2, pp. 131-135 (Apr 1993).
  52. N. M. Oldham and P. S. Hetrick, "Characterized Generator Extends Phase Meter Calibration from 50 kHz to 20 MHz," Proc. Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, publ. in IEEE Trans. Instrum. Meas., 42, No. 2, pp. 311-313 (Apr 1993).
  53. G. N. Stenbakken and T. M. Souders, "Developing Linear Error Models for Analog Devices," Proc. Instrum. & Meas. Tech. Conf. '93, May 17-20, 1993, Irvine, CA, publ. by IEEE, New York City, NY, pp. 280-285 (Jun 1993).
  54. A. D. Koffman and H. L. Stott, "Modeling and Test Point Selection for a Thermal Transfer Standard," Proc. National Conference of Standards Laboratories (NCSL), July 25-29, 1993, Albuquerque, NM, pp. 299-310 (Jul 1993).
  55. S. Avramov, N. M. Oldham, and R. W. Gammon, "Inductive Voltage Divider Calibration for the NASA Flight Experiment," Proc. National Conference of Standards Laboratories (NCSL), July 25-29, 1993, Albuquerque, NM, pp. 299-310 (Jul 1993).
  56. S. Avramov and N. M. Oldham, "Automatic Calibration of Inductive Voltage Dividers for the NASA Zeno Experiment," publ. in Rev. of Scientific Instruments, 64, No. 9, pp. 2676-2678 (Sep 1993).
  57. G. N. Stenbakken and T. M. Souders, "Developing Linear Error Models for Analog Devices," Instrum. and Meas. Tech. Conf. '93, May 18-20, 1993, Irvine, CA, publ. by IEEE, New York City, NY, pp. 280-285 (Jun 1993); special issue IEEE Trans. Instrum. Meas., 43, No. 2, pp. 157-163 (Apr 1994).
  58. N. M. Oldham and S. R. Booker, "Programmable Impedance Transfer Standard to Support LCR Meters," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/94), May 10-12, 1994, Hamamatsu, Japan, pp. 929-930 (May 1994).
  59. S. Avramov, G. N. Stenbakken, A. D. Koffman, N. M. Oldham, and R. W. Gammon, "Binary vs Decade Inductive Voltage Divider Comparison and Error Decomposition," Proc. IEEE Instrumentation Measurement Technology Conference (IMTC/94), May 10-12, 1994, Hamamatsu, Japan, pp. 917-920 (May 1994).
  60. J. P. Deyst and T. M. Souders, "Phase Plane Compensation of the NIST Sampling Comparator System," Proceedings IEEE Instrumentation and Measurement Technology Conference (IMTC/94), May 10-12, 1994, Hamamatsu, Japan, pp. 914-916 (May 1994).
  61. J. P. Deyst, T. M. Souders, and O. M. Solomon, "Bounds on Least-Squares Four-Parameter Sine-Fit Errors Due to Harmonic Distortion and Noise," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/94), May 10-12, 1994, Hamamatsu, Japan, pp. 700-703 (May 1994).
  62. A. D. Koffman and T. M. Souders, "Application of the NIST Testing Strategies to a Multirange Instrument," Proc. Measurement Science Conference, January 27-28, 1994, Pasadena, CA, 8 pages (Jun 1994).
  63. N. M. Oldham, P. S. Hetrick, and M. E. Parker, "Programmable Digitally Synthesized Source for Low-Frequency Calibrations," Proc./Digest of the Conference on Precision Electromagnetic Measurements (CPEM'94), June 27-July 1, 1994, Boulder, CO, pp. 419-420 (Jul 1994).
  64. B. C. Waltrip and N. M. Oldham, "Design and Performance Evaluation of the NIST Digital Impedance Bridge," Proc./Digest of the Conference on Precision Electromagnetic Measurement (CPEM'94), June 27-July 1, 1994, Boulder, CO, pp. 512-513 (Jul 1994).
  65. S. Avramov, N. M. Oldham, A. D. Koffman, and R. W. Gammon, "Audio-Frequency Analysis of Inductive Voltage Dividers Based on Structural Models," Proc./Digest of the Conference on Precision Electromagnetic Measurements (CPEM'94), June 27-July 1, 1994, Boulder, CO, pp. 488-489 (Jul 1994).
  66. N. G. Paulter, Jr., "A Causal Regularizing Deconvolution Filter for Optimal Waveform Reconstruction," IEEE Transactions on Instrumentation and Measurement, 43, Issue 5, pp. 740-747 (Oct 1994).
  67. A. D. Koffman, T. M. Souders, and G. N. Stenbakken, "NIST Strategies for Reducing Testing Requirements" Conference Proceedings Test and Calibration Symposium, sponsored by American Society of Naval Engineers & Society of Logistics Engineers, Nov. 30-Dec. 2, 1994, Sheraton National Hotel, Arlington, VA (Dec 1994).
  68. J. P. Deyst and T. M. Souders, "Bounds on Frequency Response Estimates Derived From Uncertain Step Response Data," Proc. of IEEE Instrumentation and Measurement Technology Conference (IMTC/95), Apr 24-26, 1995, Waltham, MA, pp 252-257 (Apr 1995).
  69. G. N. Stenbakken, "Effects of Nonmodel Errors on Model-Based Testing," IEEE Instrumentation and Measurement Technology Conference (IMTC/95), Apr 24-26, 1995, Waltham, MA, pp. 38-42 (Apr 1995).
  70. B. C. Waltrip and N. M. Oldham, "Digital Impedance Bridge," IEEE Trans. Instrum. Meas., 44, No. 2, pp. 436-439 (Apr 1995).
  71. J. P. Deyst, T. M. Souders, and O. M. Solomon, Jr., "Bounds on Least-Squares Four-Parameter Sine-Fit Errors," IEEE Trans. Instrum. Meas., 44, No. 3, pp. 637-642 (Jun 1995).
  72. S. Avramov-Zamurovic, G. N. Stenbakken, A. D. Koffman, and N. M. Oldham, "Binary Versus Decade Inductive Voltage Divider Comparison and Error Decomposition," IEEE Trans. Instrum. Meas., 44, No. 4, pp. 904-908 (Aug 1995).
  73. J. P. Deyst and T. M. Souders, "Bounds on Frequency Response Estimates Derived from Uncertain Step Response Data," IEEE Trans. Instrum. Meas., 45, No. 2, pp. 378-383 (Apr 1996).
  74. G. N. Stenbakken, "Effects of Nonmodel Errors on Model-Based Testing," IEEE Trans. Instrum. Meas., 45, No. 2, pp. 372-377 (Apr 1996).
  75. J. P. Deyst, T. M. Souders, and J. J. Blair, "Uncertainties of Frequency Response Estimates Derived from Responses to Uncertain Step-Like Inputs," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/96), Jun 4-6, 1996, Brussels, Belgium, 1, pp. 151-154 (Jun 1996).
  76. N. G. Paulter, "A Fast and Accurate Method for Measuring the Dielectric Constant of Printed Wiring Board Materials," IEEE Transactions on Components, Packaging, and Manufacturing Technology-Part C, 19, No. 3, pp. 214-225 (Jul 1996).
  77. A. D. Koffman, T. M. Souders, G. N. Stenbakken, T. E. Lipe, and J. R. Kinard, "Empirical Linear Prediction Applied to a NIST Calibration Service," Proc. 1996 Natl. Conf. of Standards Laboratories (NCSL) Workshop and Symposium, Aug 25-29, 1996, Monterey, CA, pp. 207-212 (Aug 1996).
  78. G. N. Stenbakken and J. P. Deyst, "Timebase Distortion Measurements Using Multiphase Sinewaves," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/97), May 19-21, 1997, Ottawa, Canada, 2, IEEE #97CH36022, pp. 1003-1008 (May 1997).
  79. T. M. Souders, B. C. Waltrip, O. B. Laug, and J. P. Deyst, "A Wideband Sampling Voltmeter," IEEE Trans. Instrum. Meas., 46, No. 4, pp. 947-953 (Aug 1997).
  80. H. Engler, M. Souders, and G. N. Stenbakken, "Efficient Testing of Electronic Devices," Proc. of INTERFACE 97 - Computing Science and Statistics, May 14-17, 1997, Houston, TX, 29, No. 1, pp. 592-596 (1998).
  81. G. N. Stenbakken and J. P. Deyst, "Comparison of Time Base Nonlinearity Measurements Techniques," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers IMTC/97, 47, No. 1, pp. 34-38 (Feb 1998).
  82. J. P. Deyst, N. G. Paulter, Jr., T. Daboczi, G. N. Stenbakken, and T. M. Souders, "A Fast Pulse Oscilloscope Calibration System," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/98), May 18-20, 1998, St. Paul, MN, 1, IEEE No. 98CH36222, pp. 166-171 (May 1998).
  83. M. Souders, J. Andrews, A. Caravone, J. Deyst, C. Duff, and S. Naboicheck, "A Pulse Measurement Intercomparison," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/98), May 18-20, 1998, St. Paul, MN, 1, IEEE No. 98CH36222, pp. 178-183 (May 1998).
  84. N. G. Paulter, "Low-Jitter Trigger System for Pulse Calibration and Intercomparison of High-Speed Samplers," IEEE Trans. Instrum. Meas., 47, No. 3, pp. 606-608 (Jun 1998).
  85. N. G. Paulter, "The Effect of Histogram Size on Histogram-Derived Pulse Parameters," IEEE Trans. Instrum. Meas., 47, No. 3, pp. 609-612 (Jun 1998).
  86. J. P. Deyst, N. G. Paulter, Jr., T. Daboczi, G. N. Stenbakken, and T. M. Souders, "A Fast Pulse Oscilloscope Calibration System," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers IMTC/98, 47, No. 5, pp. 1037-1041 (Oct 1998).
  87. T. M. Souders, J. Andrews, A. Caravone, J. P. Deyst, C. Duff, and S. Naboicheck, "A Pulse Measurement Intercomparison," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers IMTC/98, 47, No. 5, pp. 1031-1036 (Oct 1998).
  88. N. G. Paulter, "Long-term Repeatability of a TDR-based Printed Wiring Board Dielectric Constant Measurement System," IEEE Trans. Instrum. Meas., 47, No. 6, pp. 1469-1473 (Dec 1998).
  89. N. G. Paulter, "An Accurate Method for Measuring the Dielectric Constant of Printed Wiring Board Materials," Proc. IPC Printed Circuits Expo 1999 Technical Symp., Mar 14-18, 1999, Long Beach, CA, publ. IPC/Assn. Connecting Electronics Industries, Northbrook, IL, pp. S14-4-1 to S14-4-7 (Mar 1999).
  90. N. G. Paulter and R. H. Palm, "A Wide Bandwidth Printed Wiring Board Transmission Line Probe," Proc. IPC Printed Circuits Expo 1999 Technical Symp., Mar 14-18, 1999, Long Beach, CA, publ. IPC/Assn. Connecting Electronics Industries, Northbrook, IL, pp. S19-4-1 to S19-4-4 (Mar 1999).
  91. S. Avramov-Zamurovic, A. D. Koffman, N. M. Oldham, and B. C. Waltrip, "The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic," Proc. 16th IEEE Instrumentation and Measurement Technology Conference (IMTC/99), May 24-26, 1999, Venice, Italy, 3, IEEE No. 99CH36309, IEEE Service Center, Piscataway, NJ, pp. 1829-1833 (May 1999).
  92. A. D. Koffman, S. Avramov-Zamurovic, B. C. Waltrip, and N. M. Oldham, "Uncertainty Analysis for Four Terminal-Pair Capacitance and Dissipation Factor Characterization at 1 MHz and 10 MHz," Proc. 16th IEEE Instrumentation and Measurement Technology Conference (IMTC/99), May 24-26, 1999, Venice, Italy, 3, IEEE No. 99CH36309, IEEE Service Center, Piscataway, NJ, pp. 1459-1462 (May 1999).
  93. N. Oldham and M. Parker, "Internet-Based Test Service for Multifunction Calibrators," Proc. 16th IEEE Instrumentation and Measurement Technology Conference (IMTC/99), May 24-26, 1999, Venice, Italy, 3, IEEE No. 99CH36309, IEEE Service Center, Piscataway, NJ, pp. 1485-1487 (May 1999).
  94. P. S. Filipski and N. M. Oldham, "SIMnet - a Collaborative Tool for Metrology in the Americas," Proc. 16th IEEE Instrumentation and Measurement Technology Conference (IMTC/99), May 24-26, 1999, Venice, Italy, 2, IEEE No. 99CH36309, IEEE Service Center, Piscataway, NJ, pp. 623-625 (May 1999).
  95. A. D. Koffman, T. M. Souders, G. N. Stenbakken, and H. Engler, "High-Dimensional Empirical Linear Prediction (HELP) Toolbox User's Guide, Version 2.2," NIST TN 1428, Natl. Inst. Stand. Technol. (U.S.), 28 pages (May 1999).
  96. G. Stenbakken, A. D. Koffman, and T. M. Souders, "Software to Optimize the Testing of Mixed-Signal Devices," Proc. 5th IEEE Intl. Mixed Signal Testing Workshop, Jun 15-18, 1999, Whistler, British Columbia, Canada, spons. IEEE/TTTC, 1474 Freeman Dr., Amissville, VA, pp. 29-33 (Jun 1999).
  97. N. G. Paulter, "An Accurate Method for Measuring the Dielectric Constant of Printed Wiring Board Materials," Circuit World, MCB University Press, 26, No. 1, pp. 27-32 (Oct 1999).
  98. X. Han, G. N. Stenbakken, F. J. Von Zuben, H. Engler, "Application of Neural Networks in the Development of Nonlinear Error Modeling and Test Point Prediction," Proc. of 17th Instrumentation and Measurement Technology Conference (IMTC/2000), 2, May 1-4, 2000, Baltimore, MD, pp. 641-646 (May 2000).
  99. D. R. Larson and N. G. Paulter, "The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method," Proc. 17th IEEE Instrumentation and Measurement Technology Conference (IMTC/2000), 3, May 1-4, 2000, Baltimore, MD, pp. 1425-1428 (May 2000).
  100. D. R. Larson and N. G. Paulter, Jr., "Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes," Proc. 2000 Natl. Conf. of Standards Laboratories Intl. Workshop and Symp. (NCSL), Jul 16-20, 2000, Toronto, ON, Canada, (Jul 2000).
  101. N. G. Paulter and D. R. Larson, "Time-Base Setting Dependence of Pulse Parameters Using High-bandwidth Digital Sampling Oscilloscopes," Proc. 2000 Natl. Conf. of Standards Laboratories Intl. Workshop and Symp. (NCSL), Jul 16-20, 2000, Toronto, ON, Canada (Jul 2000).
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