IDE database - Info on Origin Description
Information on Origin Description
The main activity of the archival process was to process all the available
SIMS data gathered during the years 1990 through 1994 using software
developed during the archival process (idedit).
SIMS analyses were classified, notebook entries, operations and procedures
reviewed in order to compile the final report on the chemistry classification
of the impactor residue.
Impactor or origin classification is based on residue signals present (or
not) in or near the impact feature (the latter already
pointing to the problem of pre-, in-, and/or postflight contamination).
The list below should familiarize you with the assumptions and general
approach that was used for impact residue classification:
- The images were corrected for CCD and/or target shifts
- The SIMS data acquisition process is classified using instrument settings,
notebook entries and other information not always archivable in an
electronic format. Each of the almost 3500 SIMS images was then
classified using values 1, 2 and 3 with:
- 1 meaning species either positively identified using element
standards, EDS spectra or the species being a substrate constituent,
- 2 meaning that all procedures, settings and conditions indicate
that the mass image may be tagged as a certain species, with the
only information missing being the explicit use of an element
standard,
- 3 meaning that procedures, settings and conditions of the analyses
do not allow a species classification. Other possible reasons for
this classification as "unknown species" include a mass resolution
not high enough to resolve an interferent being present most likely,
explicit notes towards interference influences not explicitly
stored in this archive, and other information.
- In addition, black images are not displayed and classified. With
no surface material of this particular species present; it is
impossible to resolve a nonexisting signal from the signal of an
interfering species.
- The next step involved a selection of the analysed feature by drawing
a box either
- around the central crater part of a MOS discharge feature, if
distiguishable, since impactor residue is expected to be present
there, even though the crater formation process for the MOS
detectors is driven by a
capacitor discharge
process,
- around the discharge zone where the aluminum deposit had been
vaporized, if residue seemed to be present in this zone,
- around the crater lips for impacts into aluminum and gold,
- in the crater bottom for elliptic impacts in aluminum in order to
avoid shadowing signal effects,
- around what appeared to be impactor debris sprays including or
excluding the crater, depending on the debris pattern,
- around the spall zone for impacts on the germanium witness plates,
trying to avoid contamination spots present on these surfaces,
- usually not around isolated signals rather distant from
the impact features or, in case of the MOS detectors, right at the
edge of the vaporization zone, because:
- isolated features may well be paint flakes or other flakes
that probably contaminated many of the surfaces during the LDEF
mission,
- impactor residue should also be present near the center of the
impact site, not just in one isolated spot,
- signals well away from the feature have a higher probability of
being a contamination of any sort, bleed-in signals from
mass signals adjacent to the signal being imageg or being caused by any
SIMS anomaly, such as channel plate asymmetry and others,
depending on the shape of the signal.
-
Klaus G. Paul, 4-30-1994