We claim:
1. A scanning scattering microscope apparatus for providing two dimensional micrographs of the overall surface microtopography of a specimen in response to the quantitative measurement of off-specularly reflected light wherein the apparatus comprises:
a light source unit comprising a conventional light source;
a focusing unit comprising a focusing lens for producing a micro focused beam of light from said light source;
a sample holding unit comprising a movable sample holding member wherein the sample holding member is designed to accommodate a specimen and is movable in the x, y, and z planes relative to the longitudinal axis of said focused beam of light which can scan the entire surface area of said specimen;
a light beam scanning unit which can scan the focused beam on a point by point basis in an X-Y direction over the specimen surface to obtain a high lateral resolution image of surface features;
a mirror unit comprising an apertured hemispherical mirror having an aperture hole formed therein at a location that is slightly offset relative to the center of the external periphery of the mirror; and,
a detector unit comprising a conventional photodetector member which is mounted at a point which is symmetrically located with respect to the focal point of the focusing lens wherein the center of symmetry is the center of the hemispherical mirror; and, wherein the signal output of the photodetector member provides data that can be used to produce a quantitative measurement of off-specularly reflected light from the specimen to plot a two-dimensional micrograph of the surface microtopography of the specimen.
2. A method for producing two-dimensional micrographs of the overall surface microtopography of a specimen including the following steps:
(a) placing the specimen on a sample holding member that is movable in three mutually perpendicular x, y, and z directions;
(b) positioning the specimen proximate the center of a hemispherical mirror having an aperture hole disposed proximate to the periphery of the hemispherical mirror;
(c) positioning of a photodetector member in a symmetrical relationship with the specimen wherein the center of symmetry is the center of the hemispherical mirror;
(d) projecting a micro focused beam of light through the aperture hole on the hemispherical mirror to obtain a high lateral resolution image of surface features wherein the focused beam of light impinges on the specimen with specularly reflected light passing through the aperture hole and with virtually all of the non-specularly reflected light being sensed by the photodetector member;
(e) moving the sample holding member such that the surface of the specimen is scanned on a point by point basis.
3. The method of claim 2 further comprising the step of:
(f) using the output signals of the photodetector to produce data that can be plotted to produce a two-dimensional micrograph of the overall surface microtopography of a particular specimen.
4. The method of claim 2 wherein the following step is substituted for step e:
(g) moving the light beam such that the surface of the specimen is scanned on a point by point basis.