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There are a total of 31 record(s) matching your query.
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Investigation of the detectivity of radiation- produced defect levels in n- and p-type silicon and germanium Final report
Author(s): Mattauch, R. J.
Abstract: Spectral results of p- and n-type silicon and germanium
NASA Center: NASA (non Center Specific) Publication Year: 1969
Added to NTRS: 2008-07-24
Accession Number: 70N15784; Document ID: 19700006480; Report Number: EE-4031-103-69U, NASA-CR-66884
Controlled in situ etch-back
Author(s): Mattauch, R. J.
Abstract: A controlled in situ etch-back technique is disclosed in which an etch melt and a growth melt are first saturated by a source-seed crystal and thereafter etch-back of a substrate takes place by the slightly undersaturated ...
NASA Center: Jet Propulsion Laboratory Publication Year: 1981
Added to NTRS: 2008-01-25
Accession Number: 83N20789; Document ID: 19830012518
Investigation of the detectivity of radiation- produced defect levels in n and p type silicon and germanium Semiannual progress report
Author(s): Mattauch, R. J.
Abstract: Black body responsivity data of n-type and p-type silicon
NASA Center: NASA (non Center Specific) Publication Year: 1969
Added to NTRS: 2007-10-23
Accession Number: 70N20465; Document ID: 19700011160; Report Number: EE-4031-102-69U, NASA-CR-66884
The effects of Co super 60 gamma radiation on MOS diodes.
Author(s): Lade, R. W.; Mattauch, R. J.
Abstract: Cobalt 60 gamma radiation effect on MOS diodes fabricated on silicon substrates, noting surface state and oxide charge densities
NASA Center: NASA (non Center Specific) Publication Year: 1967
Added to NTRS: 2006-11-06
Accession Number: 67A36961; Document ID: 19670058232
A study on the effect of C060 gamma-radiation on steam-grown SiO2 MOS structures
Author(s): Lade, R. W.; Mattauch, R. J.
Abstract: Cobalt 60 gamma radiation effects on Metal Oxide Semiconductors /MOS/ with p-type and n-type silicon substrates
NASA Center: NASA (non Center Specific) Publication Year: 1966
Added to NTRS: 2006-11-06
Accession Number: 66N39707; Document ID: 19660030417; Report Number: NASA-CR-78941, SDL-5-588-1
Tables of f/us, ub/ and g/us, ub/ functions for semiconductor surface calculations
Author(s): Hoadley, G. B.; Lade, R. W.; Mattauch, R. J.
Abstract: Derivation of mathematical functions for calculating changes in semiconductor surfaces due to applied surface charge
NASA Center: NASA (non Center Specific) Publication Year: 1963
Added to NTRS: 2006-11-06
Accession Number: 65N34697; Document ID: 19650025096; Report Number: NASA-CR-67169
Surface state density variations on MOS STRUCTURES due to gamma radiation.
Author(s): Lade, R. W.; Mattauch, R. J.
Abstract: Surface state density variations on metal oxide semiconductor capacitors due to gamma radiation
NASA Center: NASA (non Center Specific) Publication Year: 1965
Added to NTRS: 2006-11-06
Accession Number: 66A16646; Document ID: 19660037356
Frequency shifting with a solid-state switching capacitor
Author(s): Mattauch, R. J.; Viola, T. J., Jr.
Abstract: Frequency shifting, commonly used in electronic signal processing, is applied in tuning, automatic frequency control, antenna element switching, phase shifting, etc. Frequency shifting can be accomplished economically and ...
NASA Center: NASA (non Center Specific) Publication Year: 1973
Added to NTRS: 2005-09-30
Accession Number: 73B10259; Document ID: 19730000259; Report Number: HQN-10812
Low-Noise Submillimeter-Wave Diode
Author(s): Mattauch, R. J.
Abstract: Low noise achieved without usual high resistance. Barrier of p-type material placed between metal anode and heavily-doped gallium arsenide. Ntype epitaxial layer eliminated. Barrier prevents quantum tunneling of electrons ...
NASA Center: Jet Propulsion Laboratory Publication Year: 1984
Added to NTRS: 2005-09-30
Accession Number: 83B10498; Document ID: 19830000498; Report Number: NPO-15935
Electrolytic Sharpening of Diode-Contact Whiskers
Author(s): Green, G.; Mattauch, R. J.
Abstract: Phosphor bronze wire pointed without highly-toxic chemical reagents. Phosphor bronze wire to be pointed affixed to metal post held by fixture, such as pin vise. Fixture moved axially by micrometer allows precise control of ...
NASA Center: Jet Propulsion Laboratory Publication Year: 1983
Added to NTRS: 2005-09-30
Accession Number: 83B10222; Document ID: 19830000222; Report Number: NPO-15789
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