LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 26th DAY OF August, 2008
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
Na, Hyung-don: See--
Yun, Young-Nam; and Na, Hyung-don
07417699 Cl. 349-114.
Nadeau, Jean-Pierre; Cadiot, Dominique; Sebastian, Patrick; and Callede, David, to Centre National de la Recherche Scientific (CNRS) System for cooling a heated juice by partial low-pressure evaporation
07416642 Cl. 202-186.
Nagahashi, Yoshitomo: See--
Udagawa, Kenji; and Nagahashi, Yoshitomo
07416574 Cl. 55-356.
Nagai, Kazukiyo: See--
Yanagawa, Yoshiki; Ikuno, Hiroshi; Li, Hongguo; Nagai, Kazukiyo; Tamura, Hiroshi; Suzuki, Tetsuro; Toda, Naohiro; and Kawasaki, Yoshiaki
07416823 Cl. 430-58.7.
Nagai, Ryo: See--
Kujirai, Hiroshi; Okuyama, Kousuke; Hata, Kazuhiro; Oyu, Kiyonori; Nagai, Ryo; Uchiyama, Hiroyuki; Kumauchi, Takahiro; and Ichise, Teruhisa
07417291 Cl. 257-411.
Nagai, Yuji: See--
Ochiai, Osamu; Nagai, Yuji; Shibata, Masayuki; and Maejima, Hideo
07415776 Cl. 33-708.
Nagai, Yukie: See--
Mizutani, Takeo; Koge, Kenji; Nagai, Yukie; Murakami, Hiroshi; Kawai, Toshikazu; Kashimura, Jun; Shimizu, Takeo; Araki, Seiichi; and Suzuki, Mamoru
07416745 Cl. 424-725.
Nagami, Shuzo; to Dainippon Screen Mfg. Co., Ltd. Substrate cleaning and drying apparatus
07415985 Cl. 134-104.2.
Nagano, Masao: See--
Murakami, Takao; Yamawaki, Takanori; Nagano, Masao; Kobayashi, Hiroshi; and Minakata, Masato
07416425 Cl. 439-157.
Nagano, Yumi: See--
Contreras, John; Ikeda, Takashi; Nagano, Yumi; Nishiyama, Nobumasa; Ohsawa, Toyomi; and Suk, Mike
07417209 Cl. 219-606.
Nagaoka, Nobuharu: See--
Watanabe, Masahito; Tsuji, Takayuki; Hattori, Hiroshi; Nagaoka, Nobuharu; Takatsudo, Izumi; and Saka, Masakazu
07418127 Cl. 382-154.
Nagarah, John: See--
Heath, James R.; Bunimovich, Yuri; Ge, Guanglu; Beverly, Kristen; Nagarah, John; Roukes, Michael; and Willis, Peter
07416911 Cl. 438-49.
Nagasaka, Kohji; and Narasako, Seiichi, to Sharp Kabushiki Kaisha Multiple ranging apparatus
07417716 Cl. 356-4.01.
Nagasako, Shuuya: See--
Suzuki, Nobuyoshi; Yamada, Kenji; Saitoh, Hiromoto; Kikkawa, Naohiro; Iida, Junichi; Tokita, Junichi; Matsushita, Shingo; Tamura, Masahiro; and Nagasako, Shuuya
07416177 Cl. 270-37.
Nagashima, Kenji; to Funai Electric Co., Ltd. Optical pickup apparatus
07417937 Cl. 369-112.17.
Nagashima, Masayuki: See--
Uchimi, Tsutomu; Nagashima, Masayuki; Kobayashi, Masaru; and Shirogane, Hiroyuki
07416687 Cl. 252-512.
Nagata, Mikito: See--
Nakahara, Hiroshi; Nagata, Mikito; Skinlo, David M.; Tsukamoto, Hisashi; and Yumoto, Hiroyuki
07416811 Cl. 429-94.
Nagaya, Masanori: See--
Suzuki, Susumu; Nagaya, Masanori; and Sato, Takao
07418563 Cl. 711-161.
Nagel, Nicolas: See--
Willer, Josef; Haibach, Patrick; Kleint, Christoph Andreas; and Nagel, Nicolas
07416976 Cl. 438-666.
Nagpurkar, Arun: See--
Holub, Bruce J.; and Nagpurkar, Arun
07416752 Cl. 426-93.
Naidu, Srini: See--
Lakshmanan, Sridhar; Ma, Bing; Natarajan, Narasimhamurthi; and Naidu, Srini
07417536 Cl. 340-538.
Naiini, Ahmad A.; Hopla, Richard; Powell, David B.; Metivier, Jon; and Rushkin, Il'ya, to Fujifilm Electronic Materials U.S.A., Inc. Photosensitive resin compositions
07416830 Cl. 430-190.
Nair, Ajitkumar B.; and Sadaka, Alain F., to Boston Scientific Scimed, Inc. Medical device including actuator
07416534 Cl. 600-585.
Nair, Radhakrishnan Janardanan; and Sue, Shunketsu, to Procter & Gamble Company, The Diaper including ink-printed substrate web
07416777 Cl. 428-195.1.
Nait Distributing, Inc.: See--
Hankel, Nathaniel S.; and Jamison, Ken
07417403 Cl. 320-110.
Naito, Masashi; to Hitachi Kokusai Electric Inc. Signal generator
07418070 Cl. 375-373.
Naito, Toshiki; and Yamazaki, Hiroshi, to Nitto Denko Corporation Wired circuit forming board, wired circuit board, and thin metal layer forming method
07417316 Cl. 257-750.
Naitou, Taku: See--
Nakamura, Akira; and Naitou, Taku
07415926 Cl. 101-116.
Nakada, Katsuyuki: See--
Hattori, Kazuhiro; Okawa, Shuichi; and Nakada, Katsuyuki
07417826 Cl. 360-135.
Nakahara, Hiroshi; Nagata, Mikito; Skinlo, David M.; Tsukamoto, Hisashi; and Yumoto, Hiroyuki, to Quallion LLC Electric storage battery construction and method of manufacture
07416811 Cl. 429-94.
Nakahara, Ken; to Rohm Co., Ltd. Transparent electrode
07417263 Cl. 257-99.
Nakahata, Seiji: See--
Ishibashi, Keiji; Kaji, Tokiko; Nakahata, Seiji; and Nishiura, Takayuki
07416604 Cl. 117-89.
Nakai, Norio: See--
Kuboshima, Daisuke; Hamasaki, Kazunari; and Nakai, Norio
07416825 Cl. 430-96.
Nakai, Yasuo: See--
Tanaka, Akihiro; and Nakai, Yasuo
07416451 Cl. 439-630.
Nakajima, Hiroyoshi: See--
Nippa, Satoru; Nakajima, Hiroyoshi; and Atarashi, Kenji
07417087 Cl. 524-437.
Nakajima, Nobuyoshi; and Yoda, Akira, to Fujifilm Corporation Imaging device for imaging based upon a reference composition for a subject
07417672 Cl. 348-231.3.
Nakajima, Shigeo; and Shiraki, Toshinori, to Asahi Kasei Chemicals Corporation Asphalt composition
07417081 Cl. 524-68.
Nakajima, Takeshi: See--
Miyashita, Harumitsu; Nakajima, Takeshi; and Kimura, Naohiro
07417815 Cl. 360-31.
Nakajima, Tomohiro: See--
Fujii, Mitsumi; Satoh, Yukito; and Nakajima, Tomohiro
07417780 Cl. 359-224.
Nakajima, Yoshihumi: See--
Ban, Wataru; and Nakajima, Yoshihumi
07416495 Cl. 473-292.
Nakamura, Akinari; Ozeki, Masataka; Tanaka, Yoshikazu; and Nishikawa, Takashi, to Matsushita Electric Industrial Co., Ltd. Power generation system
07418315 Cl. 700-296.
Nakamura, Akio; and Arita, Takashi, to Fujitsu Component Limited Fuel cell device and case thereof
07416805 Cl. 429-34.
Nakamura, Akira; and Naitou, Taku, to Riso Kagaku Corporation Stencil printing machine with stencil clamping portion
07415926 Cl. 101-116.
Nakamura, Kentaro; Ooi, Hiroki; and Ishikawa, George, to Fujitsu Limited Wavelength division multiplexing transmission system
07418207 Cl. 398-83.
Nakamura, Kimio: See--
Kainuma, Norio; Kira, Hidehiko; Kobae, Kenji; Matsumura, Takayoshi; and Nakamura, Kimio
07416921 Cl. 438-118.
Nakamura, Kiyokazu: See--
Mori, Hideyuki; Nakamura, Kiyokazu; and Itoh, Kenji
07418404 Cl. 705-26.
Nakamura, Masaru; to Ricoh Company, Ltd. Method and apparatus for ultra wideband communications system employing a spread spectrum technique transmitting a baseband signal over a wide frequency band
07418027 Cl. 375-141.
Nakamura, Teruyuki: See--
Uehara, Tatsuaki; Nakamura, Teruyuki; and Kato, Takashi
07416245 Cl. 296-214.
Nakamura, Tetsuya: See--
Kobayashi, Junichi; Nakamura, Tetsuya; Muranaka, Hideyuki; Ishikawa, Takehiro; Tamai, Tetsuro; and Akahane, Satoshi
07417169 Cl. 564-337.
Nakamura, Tomohiro: See--
Okumura, Tatsuya; and Nakamura, Tomohiro
07415877 Cl. 73-431.
Nakamura, Tomoki: See--
Tsukuda, Hideyuki; Nakamura, Tomoki; and Kojima, Ko
07418667 Cl. 715-780.
Nakamura, Tomoki; Noguchi, Kazunari; and Kaneko, Yoshiyuki, to Hitachi Displays, Ltd. Image display device having electrical lead connections fixed through a portion of an exhausting pipe body
07417365 Cl. 313-495.
Nakamura, Tooru: See--
Seki, Takashi; Nakamura, Tooru; and Mazaki, Hitoshi
07416765 Cl. 428-1.1.
Nakamura, Tsunehiko; to Kyocera Corporation Heater, wafer heating apparatus and method for manufacturing heater
07417206 Cl. 219-444.1.
Nakamura, Yasushige; and Tanaka, Tomoaki, to Fuji Xerox Co., Ltd. Color toner for electrophotography and color toner set for electrophotography using the same, color developer for electrophotography, method for forming color image, and apparatus for forming color image
07416826 Cl. 430-107.1.
Nakamura, Yasutaka: See--
Hiyama, Kunio; Okada, Masuhiro; Suzuki, deceased, Hideo; and Nakamura, Yasutaka
07416773 Cl. 428-117.
Nakamuta, Koji: See--
Koyama, Yoshito; and Nakamuta, Koji
07417477 Cl. 327-156.
Nakane, Naoki: See--
Ishihara, Toshiharu; Izumi, Takeshi; Tokumoto, Yoshitomo; Tsujimoto, Taisuke; and Nakane, Naoki
07415898 Cl. 73-862.331.
Tokumoto, Yoshitomo; Ishihara, Toshiharu; and Nakane, Naoki
07415899 Cl. 73-862.331.
Nakanishi, Naoya: See--
Fujihara, Toyoki; Takeda, Kazuhisa; Kitao, Hideki; Ikemachi, Takaaki; Nouma, Toshiyuki; and Nakanishi, Naoya
07416813 Cl. 429-231.1.
Nakano, Bradley Y.: See--
Nobel, Gary M; Nakano, Bradley Y.; Wee, Daniel; and Hulan, Gregory T
07418101 Cl. 380-243.
Nakano, Kuniaki: See--
Murakami, Susumu; Tomiyori, Minoru; Izumi, Hideshi; Narikiyo, Takahisa; Nakano, Kuniaki; and Iwakura, Yoshie
07418234 Cl. 399-401.
Nakao, Koichi: See--
Machi, Takato; Chikumoto, Noriko; Nakao, Koichi; Fuji, Hiroshi; Kitoh, Yutaka; Izumi, Teruo; and Shiohara, Yuh
07417425 Cl. 324-261.
Nakashiba, Yasutaka: See--
Ohkubo, Hiroaki; and Nakashiba, Yasutaka
07417277 Cl. 257-312.
Nakasuji, Mamoru; Noji, Nobuharu; Satake, Tohru; Kimba, Toshifumi; Sobukawa, Hirosi; Karimata, Tsutomu; Oowada, Shin; Yoshikawa, Shoji; and Saito, Mutsumi, to Ebara Corporation Sheet beam-type testing apparatus
07417236 Cl. 250-440.11.
Nakata, Tatsuo; and Oba, Masahiro, to Olympus Corporation Laser scanning microscope having a mechanism which prevents stimulation light from reaching a light detector
07417211 Cl. 250-201.3.
Nakata, Toshihiko: See--
Uto, Sachio; Noguchi, Minori; Nishiyama, Hidetoshi; Ohshima, Yoshimasa; Hamamatsu, Akira; Jingu, Takahiro; Nakata, Toshihiko; and Watanabe, Masahiro
07417721 Cl. 356-237.2.
Nakatani, Hironori: See--
Kojima, Kippei; Nakatani, Hironori; Watanabe, Yasuyuki; and Sakamoto, Akira
07417630 Cl. 345-204.
Nakatani, Takayuki: See--
Sano, Naoyuki; Nakatani, Takayuki; and Kamada, Yoshihiko
07416616 Cl. 148-320.
Nakatani, Toru; and Terada, Mamoru, to Konica Minolta Opto, Inc. Image pickup optical system and image pickup apparatus
07417801 Cl. 359-687.
Nakatsuji, Koji: See--
Asayama, Sanae; Nakatsuji, Koji; Suzuki, Masanori; and Terao, Atsuhito
07418247 Cl. 455-168.1.
Nakatsuka, Hiroshi: See--
Kamiyama, Tomohide; Onishi, Keiji; Nakatsuka, Hiroshi; Yamakawa, Takehiko; and Iwasaki, Tomohiro
07417360 Cl. 310-348.
Nakayama, Takeshi; Saito, Yoshiyuki; and Asahi, Toshiyuki, to Matsushita Electric Industrial Co., Ltd. Mobile terminal, circuit board, circuit board design aiding apparatus and method, design aiding program, and storage medium having stored therein design aiding program
07418603 Cl. 713-194.
Nakayama, Tatsushi; Matsuzaki, Takeshi; and Sasaki, Kenichiro, to Ube Industries Ltd. Process for production of 2,3,3′,4′-biphenyltetracarboxylic dianhydride
07417108 Cl. 528-353.
Nakazato, Katsuyoshi; to Nihon University Method of measuring protein solubility, process for producing crystal and apparatus therefor
07416708 Cl. 422-245.1.
Nakazawa, Akira: See--
Silverbrook, Kia; Berry, Norman Micheal; Jackson, Garry Raymond; and Nakazawa, Akira
07416274 Cl. 347-42.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; MacKey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond
07416287 Cl. 347-85.
Silverbrook, Kia; Psaila, David Charles; Jackson, Garry Raymond; Nakazawa, Akira; Bulman, Jonathan Mark; and Waszczuk, Jan
07416629 Cl. 156-249.
Nakazawa, Toru; to NEC Corporation Wireless communication system which improves reliability and throughput of communication and retransmission timeout determining method used for the same
07417956 Cl. 370-252.
Nakazawa, Yoshihiro; Saito, Toshikzau; and Yoshida, Mitsugu, to Honda Motor Co., Ltd. Transparent fuel tank for motorcycles
07416220 Cl. 280-835.
Nakua, Abdul M.: See--
Wu, Xingwei; and Nakua, Abdul M.
07417368 Cl. 313-503.
Nalco Company: See--
Shmakova-Lindeman, Olga E.
07417009 Cl. 507-90.
Treybig, Duane; and Chang, Kin-Tai
07417011 Cl. 507-244.
Nam, Hyeun Sik; Nam, Young Sok; Lee, Yong Soo; and Cho, Seong Ho, to LG Electronics Inc. Cooking apparatus and method for controlling the same
07417204 Cl. 219-413.
Nam, Young Sok: See--
Nam, Hyeun Sik; Nam, Young Sok; Lee, Yong Soo; and Cho, Seong Ho
07417204 Cl. 219-413.
Nambu, Hiromi: See--
Higashi, Takashi; Kito, Tetsuji; Sasaki, Yasushi; and Nambu, Hiromi
07416783 Cl. 428-403.
Namekawa, Shouji: See--
Yoshizumi, Hiroshi; Aoki, Yasumichi; Namekawa, Shouji; and Esaki, Minoru
07415973 Cl. 123-495.
Nanataki, Tsutomu; Kitagawa, Mutsumi; and Kashiwaya, Toshikatsu, to NGK Insulators, Ltd. Piezoelectric/electrostrictive body, piezoelectric/electrostrictive laminate, and piezoelectric/electrostrictive actuator
07417361 Cl. 310-358.
Nanduri, Venkata B.; Patel, Ramesh N.; Goldberg, Steven L.; and Johnston, Robert M., to Bristol-Meyers Squibb Company N-carbobenzyloxy (N-CBZ)-deprotecting enzyme
07416876 Cl. 435-196.
Nanjo, Takeshi; Katoh, Seiichi; and Ohtaka, Koichi, to Ricoh Company, Ltd. Light deflector, light deflection array, image forming apparatus, and image projection display apparatus
07417778 Cl. 359-223.
Nantero, Inc.: See--
Segal, Brent M.; Rueckes, Thomas; and Bertin, Claude L.
07416993 Cl. 438-742.
Nanya Technology Corp.: See--
Naoi, Satoshi: See--
Fujimoto, Katsuhito; Ohara, Atsuko; and Naoi, Satoshi
07418126 Cl. 382-154.
Napoletano, Jr., Francis (Frank) M.: See--
Swinbanks, Malcolm A.; Simon, David E.; Holford, John M.; and Napoletano, Jr., Francis (Frank) M.
07418324 Cl. 701-37.
Naquin, Carey John; Hardin, Jr., John R.; Estep, James W.; Rios-Aleman, David; Song, Haoshi; and Maranuk, Christopher A., to Halliburton Energy Services, Inc. Apparatus for changing flowbore fluid temperature
07416026 Cl. 166-374.
Narasako, Seiichi: See--
Nagasaka, Kohji; and Narasako, Seiichi
07417716 Cl. 356-4.01.
Narayanan, Sekharipuram R.: See--
Haile, Sossina M.; Chisholm, Calum; Merle, Ryan B.; Boysen, Dane A.; and Narayanan, Sekharipuram R.
07416803 Cl. 429-33.
Narayanan, Sekharipuram R.; and Surampudi, Subbarao, to California Institute of Technology Catalyst materials for fuel cells
07416809 Cl. 429-40.
Nardone, Ralph L.: See--
McConville, Richard P.; Hollowell, James A.; Nardone, Ralph L.; Lariviere, Norman C.; Rich, Dean E.; and Kingsley, Robert
07415931 Cl. 102-489.
Narikiyo, Takahisa: See--
Murakami, Susumu; Tomiyori, Minoru; Izumi, Hideshi; Narikiyo, Takahisa; Nakano, Kuniaki; and Iwakura, Yoshie
07418234 Cl. 399-401.
Naro, Brian A.: See--
Tamm, Carl R.; Hay, Robert G.; Naro, Brian A.; and Bradford, Lawrence E.
07416454 Cl. 439-798.
Narui, Seiji: See--
Watanabe, Yuko; Arai, Koji; and Narui, Seiji
07418685 Cl. 716-11.
Naruoka, Yoshihiko: See--
Mitsuya, Yusuke; Naruoka, Yoshihiko; and Asari, Yukio
07416180 Cl. 271-122.
Naruse, Yutaka; to Bridgestone Corporation Wheel alignment angle measuring apparatus and wheel alignment angle measuring method
07415770 Cl. 33-203.13.
Narva, Kenneth Edwin: See--
Barbour, Eric; Bing, James Wayne; Cardineau, Guy A.; Cressman, Jr., Robert F.; Gupta, Manju; Hartnett Locke, Mary E.; Hondred, David; Keaschall, Joseph W.; Koziel, Michael G.; Meyer, Terry EuClaire; Moellenbeck, Daniel; Narva, Kenneth Edwin; Nirunsuksiri, Wilas; Ritchie, Steven W.; Rudert, Marjorie L.; Sanders, Craig D.; Shao, Aihua; Stelman, Steven Jeffrey; Stucker, David S.; Tagliani, Laura Ann; and Van Zante, William M.
07417132 Cl. 536-23.1.
Naslund, Lars Ake; Nilsson, Tommy; Poppi, Luca; Benedetti, Paolo; Eriksson, Anna; and Ferrarini, Filippo, to Tetra Laval Holdings & Finance S.A. Method and device for electron beam irradiation
07417239 Cl. 250-492.1.
Nataraj, Bindiganavale S.: See--
Srinivasan, Varadarajan; Khanna, Sandeep; and Nataraj, Bindiganavale S.
07417881 Cl. 365-45.
Natarajan, Lalquidi V.: See--
Sutherland, Richard L.; Natarajan, Lalquidi V.; Tondiglia, Vince P.; and Bunning, Timothy J.
07416818 Cl. 430-2.
Natarajan, Narasimhamurthi: See--
Lakshmanan, Sridhar; Ma, Bing; Natarajan, Narasimhamurthi; and Naidu, Srini
07417536 Cl. 340-538.
Natarajan, Udaya S.; to Intel Corporation Test interface, system, and method for testing communications devices with non-deterministic latency
07418639 Cl. 714-724.
Nathanson, Ben Jesse: See--
Barrett, Wayne Melvin; Chen, Dong; Coteus, Paul William; Gara, Alan Gene; Jackson, Rory; Kopcsay, Gerard Vincent; Nathanson, Ben Jesse; Vranas, Paylos Michael; and Takken, Todd E.
07418068 Cl. 375-355.
National Applied Research Laboratories National Center for High Center for High-Performance Computing: See--
Juan, Paul; and Huang, Kuen-Yu
07418198 Cl. 396-25.
National Cheng Kung University: See--
Wang, Jhing-Fa; Hsu, Han-Jen; and Liao, Shang-Chia
07418131 Cl. 382-165.
National Chiao Tung University: See--
Chi, Sien; Chen, Nan-Kuang; and Shy, Jow-Tsong
07417789 Cl. 359-333.
National Institute of Advanced Industrial Science and Technology: See--
Hirao, Kiyoshi; Sakaguchi, Shuji; Yamauchi, Yukihiko; Kanzaki, Shuzo; and Yamada, Suzuya
07417002 Cl. 501-87.
National Semiconductor Corporation: See--
National Tsing Hua University: See--
Liu, Ta-Jo; and Chang, E-Ron
07416608 Cl. 118-411.
Natsume, Gary Shigeru: See--
Scordato, Richard E.; Page, Lou Ann; Costello, Kevin; Schieffer, Sonya; and Natsume, Gary Shigeru
07416704 Cl. 422-100.
Nauber, Andre: See--
Bader, Raoul; Burrel, Luis; Dalitz, Werner; Moehring, Andreas; Kluge, Martin; Nauber, Andre; and Schaaf, Uwe
07415768 Cl. 30-34.2.
Naude, Johannes Jacobus; to Varibox (PTY) Limited Rotor controlled transmission
07416506 Cl. 475-218.
Naughton, Jeffrey F.: See--
Luo, Gang; Naughton, Jeffrey F.; Ellmann, Curt J.; and Watzke, Michael W.
07418706 Cl. 718-103.
Navarro, Julio A.; Hersey, Devin W.; Florian, Michael H.; Osterhues, Gordon D; and Yen, Percy, to Boeing Company, The Compact, low profile electronically scanned antenna
07417598 Cl. 343-853.
Navarro, Santiago: See--
Ruezinsky, Diane M.; Hawkins, Deborah J.; Navarro, Santiago; and Parnell, Laurence D.
07417177 Cl. 800-287.
Naviasky, Eric: See--
Williams, Stephen; Naviasky, Eric; and Evans, William
07417572 Cl. 341-136.
Navitime Japan Co., Ltd.: See--
Ohnishi, Keisuke; Kikuchi, Shin; and Suzuki, Yusuke
07418338 Cl. 701-117.
NBTY, Inc.: See--
Vrablic, Angelica; Schneider, Glenn; and Silverman, Robert
07416750 Cl. 424-736.
NCR Corporation: See--
Benson, Christopher M.
07418413 Cl. 705-27.
Inderrieden, Michael T.
07416119 Cl. 235-383.
NEC Corporatioin: See--
Sasaki, Tokuhito; and Sano, Masahiko
07417229 Cl. 250-338.1.
NEC Corporation: See--
Aino, Shigeyuki; and Yamazaki, Shigeo
07418626 Cl. 714-12.
Edahiro, Masato; Ito, Yoshiyuki; Sakai, Junji; Minakami, Tetsuya; and Inoue, Hiroaki
07418703 Cl. 718-100.
Iketsu, Yuichi; and Imura, Hironori
07417251 Cl. 257-72.
Minagawa, Hirotaka
07416871 Cl. 435-189.
Shibayama, Atsufumi; Matsushita, Satoshi; Torii, Sunao; and Nishi, Naoki
07418583 Cl. 712-228.
Takano, Nahoko; Hamabe, Kojiro; and Ushirokawa, Akihisa
07417975 Cl. 370-335.
NEC Electronics Corporation: See--
Hayashi, Toshiya; and Tezuka, Tatsurou
07417319 Cl. 257-774.
Izumino, Hitoshi
07417915 Cl. 365-230.05.
Ohkubo, Hiroaki; and Nakashiba, Yasutaka
07417277 Cl. 257-312.
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO: See--
Simons, Dirk Gozewinus
07417921 Cl. 367-88.
Neely, Frank: See--
Alvarez-Carrigan, Nayiby; Brown-Skrobot, Susan; Meyers, Ann-Marie Wong; Neely, Frank; Pall, Brian; and Rathore, Osman
07416737 Cl. 424-409.
Nees, Terry S.: See--
Brown, Katherine A.; and Nees, Terry S.
07417550 Cl. 340-572.7.
Negru, Sorin L.: See--
Wu, Jean-Shin; and Negru, Sorin L.
07417491 Cl. 327-536.
Neitz, R. Jeffrey: See--
Tung, Jay S.; Garofalo, Albert W.; Pleiss, Michael A.; Wu, Jing; Wone, David W. G.; Guinn, Ashley C.; Dressen, Darren B.; Neitz, R. Jeffrey; Marugg, Jennifer; and Neitzel, Martin
07417152 Cl. 548-374.1.
Neitzel, Martin: See--
Tung, Jay S.; Garofalo, Albert W.; Pleiss, Michael A.; Wu, Jing; Wone, David W. G.; Guinn, Ashley C.; Dressen, Darren B.; Neitz, R. Jeffrey; Marugg, Jennifer; and Neitzel, Martin
07417152 Cl. 548-374.1.
Nellcor Puritan Bennett Inc.: See--
DeLonzor, Russ; Mannheimer, Paul D.; Fein, Michael E.; and Hannula, Don
07418284 Cl. 600-310.
Nelson, Loren Travis; Delaney, Michael; and Luciano, Jr., Robert Anthony, to Bally Gaming, Inc. Simulated bonus method in finite-pool award system
07416484 Cl. 463-25.
Nelson, Wade: See--
Edwards, Paul; Nelson, Wade; and Berthelot, Greg
07417395 Cl. 318-445.
Nelson, William M.: See--
Zimniewicz, Jeff A.; Raden, Gary P.; Helgeson, Ryan M.; and Nelson, William M.
07418700 Cl. 717-175.
Nemiroff, Daniel: See--
Corrado, Francis R.; and Nemiroff, Daniel
07418548 Cl. 711-114.
Nemoto, Yoshihiko: See--
Umemoto, Mitsuo; Okayama, Yoshio; Tanida, Kazumasa; Terao, Hiroshi; and Nemoto, Yoshihiko
07416963 Cl. 438-461.
Neose Technologies, Inc.: See--
DeFrees, Shawn; Zopf, David A.; Bayer, Robert J.; Bowe, Caryn; Hakes, David James; and Chen, Xi
07416858 Cl. 435-68.1.
Nerzak, Thomas: See--
Küppers, Klaus; Meyer, Meinert; and Nerzak, Thomas
07416622 Cl. 148-581.
Nestler, Gerhard: See--
Weiss, Frank; Oppelt, Reiner; and Nestler, Gerhard
07416443 Cl. 439-578.
Netlogic Microsystems, Inc.: See--
Srinivasan, Varadarajan; Khanna, Sandeep; and Nataraj, Bindiganavale S.
07417881 Cl. 365-45.
Netlogics Microsystems, Inc.: See--
Neto, José Batista Ferreira: See--
Bergmann, Herberto; Krieg, Eric; Malkowski, Jr., Chester; Omoto, Arnaldo Hiroyuki; Pereira, Luis Ricardo Luzardo; and Neto, José Batista Ferreira
07417848 Cl. 361-624.
Network Appliance, Inc.: See--
Bolinger, Don; Lent, Arthur; and Silberman, Jeffrey
07418500 Cl. 709-225.
Lee, Herman; Beaman, Rebecca; and Lent, Arthur F.
07418569 Cl. 711-200.
Lewis, Blake; Patel, Kayuri; and Chen, Ray
07418465 Cl. 707-205.
Neubacher, Werner: See--
Johann, Jürgen; Bissen, Monique; Neubacher, Werner; and Schrotshamer, Christian
07416664 Cl. 210-232.
Neubauer, Robert Anthony: See--
Yu, Jenny Zhaoxia; Frantz, David Mark; Reiter, Leonard James; and Neubauer, Robert Anthony
07416002 Cl. 152-197.
Neudorf, David: See--
Liu, Houyuan; Gillaspie, James D.; Lewis, Coralie Adele; Neudorf, David; and Barnett, Steven
07416711 Cl. 423-140.
Neumann, Matt: See--
Barsun, Stephan; Tam, Kin; Bolich, Bryan; Neumann, Matt; and Miner, Richard Augustus
07417864 Cl. 361-719.
Neunteufl, Klemens: See--
Chmela, Franz; Csato, Janos; Eichlseder, Helmut; Figer, Guenter; Fuchs, Christian; Glensvig, Michael; Herzog, Peter; Kammerdiener, Thomas; Neunteufl, Klemens; Pirker, Gerhard; Sams, Theodor; Weissbaeck, Michael; and Wimmer, Andreas
07415963 Cl. 123-299.
NeuroSearch Sweden AB: See--
Sonesson, Clas; Andersson, deceased, Bengt; Waters, Susanna; Waters, Nicholas; and Tedroff, Joakim
07417043 Cl. 514-247.
Neuveux, Frederic: See--
Kapur, Rohit; Sitchinava, Nodari; Samaranayake, Samitha; Gizdarski, Emil; Neuveux, Frederic; Duggirala, Suryanarayana; and Williams, Thomas W.
07418640 Cl. 714-726.
Newcomb, Mark D.: See--
van de Ligt, Christiaan P. A.; Newcomb, Mark D.; Craig, W. Michael; and Cook, David A.
07418303 Cl. 700-90.
Newisys, Inc.: See--
Zeitler, Carl; Glasco, David Brian; Record, Les; Oehler, Richard R.; Kulpa, William G.; Prasadh, Guru; and Kota, Rajesh
07418517 Cl. 709-238.
Newman, Daniel A.; to Tetra Holding (US), Inc. Filter apparatus with fluid bypass
07416659 Cl. 210-167.27.
Newton, Ernest: See--
Mackin, Stephen; and Newton, Ernest
07416197 Cl. 280-87.041.
NexJen Technologies Ltd.: See--
Kretchmar, Robert J.
07416657 Cl. 210-95.
Ney, Richard: See--
Testud, Jacques; Ney, Richard; and LeBouar, Erwan
07417577 Cl. 342-26R.
Ng, Gavin K F: See--
Campbell, David C.; Gibbons, Louis August; and Ng, Gavin K F
07415777 Cl. 33-755.
Ngai, Tony K.: See--
Hao, Eunice Y. D.; Ngai, Tony K.; Wong, Jennifer; and Ching, Alvin Y.
07417918 Cl. 365-233.12.
NGK Insulators, Ltd.: See--
Matsuda, Hiroto; Nobori, Kazuhiro; Imai, Yasuyoshi; and Kawajiri, Tetsuya
07416793 Cl. 428-701.
Nanataki, Tsutomu; Kitagawa, Mutsumi; and Kashiwaya, Toshikatsu
07417361 Cl. 310-358.
NGK Spark Plug Co., Ltd.: See--
Ieda, Norikazu; and Oi, Yuji
07416649 Cl. 204-401.
Ishikawa, Hideki; Kitanoya, Shoji; Morita, Takeshi; and Ishida, Noboru
07416651 Cl. 204-425.
Okumura, Tatsuya; and Nakamura, Tomohiro
07415877 Cl. 73-431.
Ngo, Van Huynh Portable article support structure
07415932 Cl. 108-44.
Nguyen, Duong Tuan: See--
Dinh, Chon Tam Le; Nguyen, Duong Tuan; and Nguyen, Thi Thanh Hien
07418149 Cl. 382-254.
Nguyen, Duy: See--
Buchmann, Bernd; Fritsch, Martin; Nguyen, Duy; Menzenbach, Bernd; and Boemer, Ulf
07417066 Cl. 514-443.
Nguyen, Hung; and Wichman, Shannon, to VeriSilicon Holdings (Cayman Islands) Co. Ltd. Simultaneously assigning corresponding entry in multiple queues of multi-stage entries for storing condition attributes for validating simultaneously executed conditional execution instruction groups
07418578 Cl. 712-218.
Nguyen, Khai Q.: See--
Wang, Xiaobao; Sung, Chiakang; Nguyen, Khai Q.; and Charagulla, Sanjay K.
07417452 Cl. 326-30.
Nguyen, Quang: See--
Sorrentino, Alan; Moskovich, Robert; and Nguyen, Quang
07416081 Cl. 206-362.2.
Nguyen, Thi Thanh Hien: See--
Dinh, Chon Tam Le; Nguyen, Duong Tuan; and Nguyen, Thi Thanh Hien
07418149 Cl. 382-254.
Nhep, Ponharith: See--
Zimmel, Steven C.; Smith, Trevor; and Nhep, Ponharith
07418181 Cl. 385-135.
Nicholls, Gareth John: See--
Carballo, Juan Antonio; Cranford, Jr., Hayden Clavie; Nicholls, Gareth John; Norman, Vernon Roberts; and Schuh, Brian Joel
07418032 Cl. 375-227.
Nichols, Charles E.: See--
Hetrick, William A.; and Nichols, Charles E.
07418550 Cl. 711-114.
Nickel, Dieter: See--
Weber, Henriette; Hoffmann, Sandra; Raehse, Wilfried; Jung, Dieter; Meier, Frank; Block, Christian; Bayersdoerfer, Rolf; Semrau, Markus; Faeser, Karl-Martin; Birnbrich, Paul; and Nickel, Dieter
07417019 Cl. 510-446.
Nickerson, David L. Wall system with masonry external surface and associated method
07415805 Cl. 52-426.
Nicolay, William: See--
Adamson, Hugh P.; Hesse, Scott; and Nicolay, William
07417384 Cl. 315-291.
Nicoli, Andrea: See--
Giovanetti, Roberto; Nicoli, Andrea; Verzini, Massimo; Soriato, Giorgio; and Cotarca, Livius
07417166 Cl. 562-507.
Nidec Sankyo Corporation: See--
Nidek Co., Ltd.: See--
Akita, Junichi; Mizuno, Katsuyasu; and Fujishiro, Akihiro
07416304 Cl. 351-215.
Hanebuchi, Masaaki; and Gono, Mitsuhiro
07416301 Cl. 351-205.
Nie, Junhong: See--
Jin, Xin; Bugnariu, Calin N.; Islam, M. Khaledul; Shah, Samir R.; Pomeroy, Stephen L.; Bouianovskaia, Reguina; and Nie, Junhong
07418356 Cl. 702-63.
Nie, Xiaochun; Pun, Thomas; Kumar, Roger; and Wu, Hsi-Jung, to Apple Inc. Method of performing rate control for a compression system
07418037 Cl. 375-240.03.
Nielsen, Evan; to Dalsgaard Nielsen ApS Method of determining the risk of ice deposition due to precipitation and apparatus for exercising the method
07418347 Cl. 702-3.
Nielsen, Henning; to Bang & Olufsen A/S Multiple switch selection device
07417199 Cl. 200-5E.
Nielsen, Jesper Pram: See--
Löfquist, Bo; and Nielsen, Jesper Pram
07417203 Cl. 209-576.
Nielsen, Søren; to Siemens Aktiengesellschaft Magnetic inductive flowmeter having a plug-type electrode connection
07415894 Cl. 73-861.52.
Niemeier, Manuela; Poppe, Andreas; Stübbe, Wilfried; Westhoff, Elke; and Fischer, Jens-Dieter, to BASF Coatings AG Coatings, methods for producing the same, and the use thereof
07416781 Cl. 428-323.
Nien, Ya-Fang; Chang, Kuo-An; and Chang, Chi-Hsiang, to ALi Corporation Automatic power conservation method for an optical media device
07418607 Cl. 713-320.
Nies, Craig A.; de Traversay, Jean; Deo, Arati S.; Pathria, Anu K.; and Biafore, Louis S., to Fair Isaac Corporation Webstation: configurable web-based workstation for reason driven data analysis
07418431 Cl. 706-21.
Niewalda, Gregor: See--
Holler, Wolfgang; Niewalda, Gregor; and Ramsauer, Martin
07418081 Cl. 378-98.8.
Nifco Inc.: See--
Araki, Minoru; and Tanaka, Masami
07416063 Cl. 188-296.
Nigrin, Uwe: See--
Knauth, Werner; Nigrin, Uwe; and Vu, Ngoc-Tam
07415920 Cl. 92-171.1.
Nihei, Mizuhisa: See--
Kawabata, Akio; Nihei, Mizuhisa; Horibe, Masahiro; Sato, Shintaro; Kondo, Daiyu; and Awano, Yuji
07417320 Cl. 257-774.
Nihei, Takao: See--
Sumasu, Atsushi; Miyamoto, Shoji; Futagi, Sadaki; Takakusaki, Keiji; and Nihei, Takao
07418242 Cl. 455-70.
Nihon Optical Co., Ltd.: See--
Kataoka, Hideharu; Osamura, Takashi; and Teraoka, Yoshiko
07416077 Cl. 206-5.1.
Nihon University: See--
Nakazato, Katsuyoshi
07416708 Cl. 422-245.1.
Niizeki, Yasushi: See--
Otomo, Naoki; Mizoguchi, Shuri; Niizeki, Yasushi; Maekawara, Minoru; and Miyata, Kyosei
07416074 Cl. 198-810.03.
Nikitin, Alexei V. Method and apparatus for adaptive real-time signal conditioning, processing, analysis, quantification, comparison, and control
07418469 Cl. 708-819.
Nikkel, Chris: See--
Reding, Gary; Beadle, Kent; Nikkel, Chris; Schulze, Mark; Humphries, Walker; Womeldorf, Dave; Clark, David; Cerreta, Scott; Ozkaynak, Carl; and Rodriguez, Julia A. Granada
07418423 Cl. 705-37.
Nikolich, Mikeljon; and Hoover, David, to United States of America as represented by the Secretary of the Army, The Immunogenic compositions including rough phenotype Brucella host strains and complementation DNA fragments
07416878 Cl. 435-252.3.
Nikon Corporation: See--
Binnard, Michael; Ma, Wen-Hou; Ueta, Toshio; Yang, Pai-Hsueh; Teng, Ting-Chien; and Yuan, Bausan
07417714 Cl. 355-72.
Murakami, Katsuhiko
07417708 Cl. 355-53.
Udagawa, Kenji; and Nagahashi, Yoshitomo
07416574 Cl. 55-356.
Niles, Andrew: See--
Riss, Terry L.; Niles, Andrew; and Moravec, Richard A.
07416854 Cl. 435-7.72.
Nilsson, Hakan: See--
Thunwall, Peter; Nilsson, Hakan; and Danielsson, Lennart
07416018 Cl. 165-67.
Nilsson, Malin: See--
Lidgren, Lars; and Nilsson, Malin
07417077 Cl. 523-115.
Nilsson, Tommy: See--
Naslund, Lars Ake; Nilsson, Tommy; Poppi, Luca; Benedetti, Paolo; Eriksson, Anna; and Ferrarini, Filippo
07417239 Cl. 250-492.1.
Ninjouji, Takashi: See--
Manabe, Hiroyuki; Hiraiwa, deceased, Akira; Hayashi, Kouki; Ninjouji, Takashi; and Sugimura, Toshiaki
07418385 Cl. 704-254.
Ninomiya, Takanori: See--
Hamamatsu, Akira; Noguchi, Minori; Ohshima, Yoshimasa; Nishiyama, Hidetoshi; Oka, Kenji; Ninomiya, Takanori; Tanaka, Maki; Watanabe, Kenji; Watanabe, Tetsuya; and Morishige, Yoshio
07417723 Cl. 356-237.2.
Nintendo Co., Ltd.: See--
Smith, Darren C.; Nishizawa, Kenji; McCarten, David J.; Ravanpey, Ramin; and Braun, Russell G.
07417600 Cl. 345-2.1.
Nippa, Satoru; Nakajima, Hiroyoshi; and Atarashi, Kenji, to Sumitomo Chemical Company, Limited Process for producing resin composition using powder of aluminum-containing inorganic compound having specific BET surface area and pore volume and resin composition obtained according to said process
07417087 Cl. 524-437.
Nippon Kayku Kabushiki Kaisha: See--
Fujisawa, Hideyoshi; and Tanaka, Kouichi
07416683 Cl. 252-299.1.
Nippon Oil Corporation: See--
Seki, Takashi; Nakamura, Tooru; and Mazaki, Hitoshi
07416765 Cl. 428-1.1.
Nippon Steel Corporation: See--
Ueda, Kohei; Kanai, Hiroshi; Inoue, Ikuya; and Komatu, Nobukatsu
07416774 Cl. 428-141.
Nipro Corporation: See--
Kai, Toshiya; Katayama, Naohisa; Azuma, Yuko; Yokoe, Junichi; Kida, Yoshinori; Hukutomi, Ippei; Sato, Makoto; Tsuchida, Eishun; Takeoka, Shinji; Komatsu, Teruyuki; Sakai, Hiromi; and So, Keitaro
07417118 Cl. 530-350.
Nirunsuksiri, Wilas: See--
Barbour, Eric; Bing, James Wayne; Cardineau, Guy A.; Cressman, Jr., Robert F.; Gupta, Manju; Hartnett Locke, Mary E.; Hondred, David; Keaschall, Joseph W.; Koziel, Michael G.; Meyer, Terry EuClaire; Moellenbeck, Daniel; Narva, Kenneth Edwin; Nirunsuksiri, Wilas; Ritchie, Steven W.; Rudert, Marjorie L.; Sanders, Craig D.; Shao, Aihua; Stelman, Steven Jeffrey; Stucker, David S.; Tagliani, Laura Ann; and Van Zante, William M.
07417132 Cl. 536-23.1.
Nishi, Hidefumi; to Fujitsu Limited Drawing device and information processing apparatus
07417639 Cl. 345-552.
Nishi, Naoki: See--
Shibayama, Atsufumi; Matsushita, Satoshi; Torii, Sunao; and Nishi, Naoki
07418583 Cl. 712-228.
Nishida, Hiroto; and Hasegawa, Kazunori, to Matsushita Electric Industrial Co., Ltd. Optical pickup device and optical disk record/playback device for reducing the size of the record/playback device
07418723 Cl. 720-662.
Nishida, Katsutoshi: See--
Jo, Manhee; Isobe, Shinichi; Nishida, Katsutoshi; and Okagawa, Takatoshi
07417969 Cl. 370-331.
Nishida, Mitsutaka; Minamishin, Hayato; and Hyodo, Taisuke, to Fujitsu Limited Paper skew correcting device and bill depositing/dispensing apparatus
07416182 Cl. 271-228.
Nishida, Tetsuya: See--
Miyamoto, Makoto; Toda, Tsuyoshi; Ohtake, Masatoshi; Terao, Motoyasu; Ushiyama, Junko; Andoo, Keikichi; Anzai, Yumiko; Hirotsune, Akemi; Nishida, Tetsuya; and Saga, Hideki
07417933 Cl. 369-59.11.
Nishihara, Hidetoshi: See--
Ishida, Tsuyoshi; Takahashi, Yasuhisa; and Nishihara, Hidetoshi
07415756 Cl. 29-598.
Nishihara, Kazunari: See--
Noda, Toshinari; and Nishihara, Kazunari
07417808 Cl. 359-819.
Nishikawa, Koichiro; to Canon Kabushiki Kaisha Optical pickup apparatus including collimator lens with first lens group having negative power and being fixed and second lens group having positive power and being movable
07417938 Cl. 369-112.24.
Nishikawa, Robert M.: See--
Giger, Maryellen L.; Bonta, Ioana; Heimann, Ruth; Nishikawa, Robert M.; and Vyborny, Carl J.
07418123 Cl. 382-132.
Nishikawa, Takashi: See--
Nakamura, Akinari; Ozeki, Masataka; Tanaka, Yoshikazu; and Nishikawa, Takashi
07418315 Cl. 700-296.
Nishikawa, Yasushi: See--
Kaneshiro, Hisayasu; Nishikawa, Yasushi; and Akahori, Kiyokazu
07416695 Cl. 264-494.
Nishimura, Asuka: See--
Ashikari, Motoyuki; Matsuoka, Makoto; Lin, Shaoyang; Yamamoto, Toshio; Nishimura, Asuka; and Takashi, Tomonori
07417180 Cl. 800-295.
Nishimura, Kazuya: See--
Kawamura, Kazuteru; and Nishimura, Kazuya
07418199 Cl. 396-72.
Nishimura, Manabu; Kuroda, Takahiko; Abe, Shuya; Tanaka, Makoto; Irinoda, Mitsugu; and Hashimoto, Kenichiroh, to Ricoh Company, Ltd. Electrostatic actuator formed by a semiconductor manufacturing process
07416281 Cl. 347-54.
Nishimura, Yoshiteru; and Tanjo, Toru, to Seiko Epson Corporation Image forming apparatus
07418233 Cl. 399-381.
Nishina, Mitsuhiro; Suzuki, Yuji; and Gouda, Hideaki, to Nissan Diesel Motor Co., Ltd. Gear shift control system of hybrid vehicle
07416511 Cl. 477-5.
Nishioka, Takeshi: See--
Matsui, Yukiteru; Hirasawa, Shinichi; Shigeta, Atsushi; Miyano, Kiyotaka; Nishioka, Takeshi; and Yano, Hiroyuki
07416942 Cl. 438-257.
Nishira, Hikaru; and Kawabe, Taketoshi, to Nissan Motor Co., Ltd. Model predictive control apparatus
07418372 Cl. 703-2.
Nishiura, Takayuki: See--
Ishibashi, Keiji; Kaji, Tokiko; Nakahata, Seiji; and Nishiura, Takayuki
07416604 Cl. 117-89.
Nishiyama, Eiji: See--
Enoki, Tatsui; Sagawa, Hiroaki; Tominaga, Takanari; Nishiyama, Eiji; Koyama, Nobuto; Sakai, Takeshi; Yu, Fu-Gong; Ikai, Katsushige; and Kato, Ikunoshin
07417031 Cl. 514-23.
Nishiyama, Hidetoshi: See--
Hamamatsu, Akira; Noguchi, Minori; Ohshima, Yoshimasa; Nishiyama, Hidetoshi; Oka, Kenji; Ninomiya, Takanori; Tanaka, Maki; Watanabe, Kenji; Watanabe, Tetsuya; and Morishige, Yoshio
07417723 Cl. 356-237.2.
Uto, Sachio; Noguchi, Minori; Nishiyama, Hidetoshi; Ohshima, Yoshimasa; Hamamatsu, Akira; Jingu, Takahiro; Nakata, Toshihiko; and Watanabe, Masahiro
07417721 Cl. 356-237.2.
Nishiyama, Nobumasa: See--
Contreras, John; Ikeda, Takashi; Nagano, Yumi; Nishiyama, Nobumasa; Ohsawa, Toyomi; and Suk, Mike
07417209 Cl. 219-606.
Nishiyama, Shigeki; to Kabushiki Kaisha Toshiba Electronic apparatus
07416441 Cl. 439-529.
Nishizawa, Gouichi: See--
Chou, Tsutomu; Nishizawa, Gouichi; Hatakeyama, Masatoshi; and Ishizaka, Chikara
07416613 Cl. 148-103.
Nishizawa, Hirotaka; Higuchi, Akira; Osawa, Kenji; Osako, Junichiro; and Wada, Tamaki, to Renesas Technology Corp. IC card
07416133 Cl. 235-492.
Nishizawa, Kenji: See--
Smith, Darren C.; Nishizawa, Kenji; McCarten, David J.; Ravanpey, Ramin; and Braun, Russell G.
07417600 Cl. 345-2.1.
Nishizawa, Makoto: See--
Koike, Jun; Miyauchi, Takaki; Nishizawa, Makoto; and Muroi, Nobuyuki
07416403 Cl. 425-589.
Nishizawa, Mikio: See--
Matsuzaki, Koichi; Seki, Toshihito; Matsushita, Masanori; Tahashi, Yoshiya; Furukawa, Fukiko; Sugano, Yasushi; Mori, Shigeo; Yamagata, Hideo; Yoshida, Katsunori; Nishizawa, Mikio; Fujisawa, Junichi; and Inoue, deceased, Kyoichi
07417124 Cl. 530-387.1.
Nishu, Keisuke: See--
Kanda, Yuichi; Abe, Takashi; Tanaka, Atsushi; and Nishu, Keisuke
07416763 Cl. 427-402.
Nissan Diesel Motor Co., Ltd.: See--
Nishina, Mitsuhiro; Suzuki, Yuji; and Gouda, Hideaki
07416511 Cl. 477-5.
Nissan Motor Co., Ltd.: See--
Iriyama, Masahiro; and Maekawa, Takuya
07416515 Cl. 477-107.
Matsuki, Yoshitaka; Osada, Naoki; Fujita, Hidehiro; Yuuya, Masahiko; Mitsuhori, Atsushi; Yanai, Tadanori; Katayama, Takatsugu; and Hamane, Shouta
07415955 Cl. 123-179.5.
Nishira, Hikaru; and Kawabe, Taketoshi
07418372 Cl. 703-2.
Nissan Technical Center North America, Inc.: See--
Tier, Matthew C.; and Thorson, Jason S.
07416232 Cl. 293-117.
Nisshinbo Industries, Inc: See--
Yokoyama, Kozo; and Sakaguchi, Ryoichi
07416476 Cl. 451-58.
Nitta Moore Company: See--
Nitto Denko Corporation: See--
Naito, Toshiki; and Yamazaki, Hiroshi
07417316 Cl. 257-750.
Nitz, Larry T.: See--
Holmes, Alan G.; Schmidt, Michael R.; Klemen, Donald; and Nitz, Larry T.
07416501 Cl. 475-5.
Niwa, Motohiro: See--
Kanada, Takayuki; Kataoka, Yasuhiro; and Niwa, Motohiro
07416822 Cl. 430-18.
Niyogi, Shanku Shivabrata: See--
Kariv, Shai; Kizer, Geoffrey M.; Kruglick, Emily; Olson, Lance E.; Christensen, Erik B.; Wolf, Kenneth D.; Robsman, Dmitry; and Niyogi, Shanku Shivabrata
07418719 Cl. 719-330.
Kruglick, Emily; Kizer, Geoffrey M.; Kariv, Shai; Olson, Lance E.; Christensen, Erik B.; Wolf, Kenneth D.; Robsman, Dmitry; and Niyogi, Shanku Shivabrata
07418709 Cl. 719-313.
Kruglick, Emily; Kizer, Geoffrey M.; Kariv, Shai; Olson, Lance E.; Christensen, Erik B.; Wolf, Kenneth D.; Robsman, Dmitry; and Niyogi, Shanku Shivabrata
07418712 Cl. 719-314.
Noatak Software LLC: See--
Nobel, Gary M; Nakano, Bradley Y.; Wee, Daniel; and Hulan, Gregory T, to Hewlett-Packard Development Company, L.P. Securely transferring user data using first and second communication media
07418101 Cl. 380-243.
Noble, Mark D. Float fishing apparatus
07415792 Cl. 43-42.31.
Nobori, Kazuhiro: See--
Matsuda, Hiroto; Nobori, Kazuhiro; Imai, Yasuyoshi; and Kawajiri, Tetsuya
07416793 Cl. 428-701.
Noda, Junzoh: See--
Aratani, Masanori; Iihara, Yasuhiro; Kudoh, Masaki; Noda, Junzoh; and Shimizu, Masahiro
07417816 Cl. 360-53.
Noda, Kouta: See--
Hirose, Naohiro; Noda, Kouta; Segawa, Hiroshi; En, Honjin; Tsukada, Kiyotaka; Ishida, Naoto; Asano, Kouji; and Shouda, Atsushi
07415761 Cl. 29-852.
Noda, Toshinari; and Nishihara, Kazunari, to Matsushita Electric Industrial Co., Ltd. Lens unit
07417808 Cl. 359-819.
Noel, Matt: See--
Sandoval, John; Noel, Matt; and Wang, Eugene
07417986 Cl. 370-381.
Noeske, Ingo; Weckbecker, Alfons; and Beckmann, Axel, to Terex Demag GmbH Hoisting-cable drive comprising a single bottom-hook block and two winches
07416169 Cl. 254-275.
Nogami, Shingo: See--
Banju, Kazuo; Kudo, Masahiro; Nogami, Shingo; Kogasaka, Takahiro; Morita, Kazuo; and Irie, Masayuki
07417665 Cl. 348-58.
Noguchi, Junichi: See--
Motoyama, Hajime; Kaji, Hajime; Yamada, Naoto; Yamazaki, Yoshitaka; Noguchi, Junichi; Kawakami, Takayuki; Ogawara, Satoshi; Oka, Yushi; and Mori, Akihito
07417660 Cl. 347-252.
Noguchi, Kazunari: See--
Nakamura, Tomoki; Noguchi, Kazunari; and Kaneko, Yoshiyuki
07417365 Cl. 313-495.
Noguchi, Minori: See--
Hamamatsu, Akira; Noguchi, Minori; Ohshima, Yoshimasa; Nishiyama, Hidetoshi; Oka, Kenji; Ninomiya, Takanori; Tanaka, Maki; Watanabe, Kenji; Watanabe, Tetsuya; and Morishige, Yoshio
07417723 Cl. 356-237.2.
Ishimaru, Ichiro; Noguchi, Minori; Moriyama, Ichiro; Tanabe, Yoshikazu; Yatsugake, Yasuo; Kenbou, Yukio; Watanabe, Kenji; and Tsuchiyama, Hirofumi
07417244 Cl. 250-559.46.
Uto, Sachio; Noguchi, Minori; Nishiyama, Hidetoshi; Ohshima, Yoshimasa; Hamamatsu, Akira; Jingu, Takahiro; Nakata, Toshihiko; and Watanabe, Masahiro
07417721 Cl. 356-237.2.
Noguchi, Takashi; Xianyu, Wenxu; and Yin, Huaxiang, to Samsung Electronics Co., Ltd. Organic light emitting display with single crystalline silicon TFT and method of fabricating the same
07416924 Cl. 438-149.
Noji, Nobuharu: See--
Nakasuji, Mamoru; Noji, Nobuharu; Satake, Tohru; Kimba, Toshifumi; Sobukawa, Hirosi; Karimata, Tsutomu; Oowada, Shin; Yoshikawa, Shoji; and Saito, Mutsumi
07417236 Cl. 250-440.11.
Nojiri, Masayoshi: See--
Koide, Teruhiko; Nojiri, Masayoshi; and Muto, Koji
07416149 Cl. 242-374.
Nokia Corporation: See--
Eriksson, Timo; and Hashizume, Kenichi
07418278 Cl. 455-575.1.
Greuet, Jean-Baptiste; Shen, Haoye; Sobczak, Peter; and Khatam, Bahman
07418106 Cl. 381-331.
Kåll, Jan; Muhonen, Ahti; and Mulligan, Michael
07418256 Cl. 455-411.
Koskelainen, Petri; and Vainikainen, Mikko
07418509 Cl. 709-229.
Paatero, Lauri; and Kiiveri, Antti
07418593 Cl. 713-166.
Ryynänen, Matti Kullervo
07417620 Cl. 345-156.
Tolonen, Pertti; and Koli, Kimmo
07417564 Cl. 341-22.
Wright, Antti; Juvonen, Anne; and Kalevo, Ossi
07417673 Cl. 348-240.1.
Nokia Siemens Networks GmbH & Co. KG: See--
Dillinger, Markus; Schindler, Juergen; and Schulz, Egon
07417972 Cl. 370-332.
Nokia Siemens Networks Oy: See--
Eronen, Pasi; Haverinen, Henry; and Nyberg, Kaisa
07418595 Cl. 713-168.
Noma, Takashi; Kobayashi, Toyoko; Motoi, Taiko; Takase, Hiromitsu; Miura, Naoko; and Kobayashi, Shin, to Canon Kabushiki Kaisha Glass substrate processing method and material removal process using x-ray fluorescence
07416462 Cl. 445-2.
Noma, Takashi; and Takemura, Hiroshi, to Murata Manufacturing Co., Ltd. Ripple converter
07417413 Cl. 323-285.
Nomura, Fumihiko: See--
Miyoshi, Keisuke; Tomonou, Kazunori; Murayama, Takeshi; Nomura, Fumihiko; Utsumi, Hiroyuki; Hiura, Tetsuo; and Yamamoto, Katsuhiko
07415909 Cl. 74-560.
Nomura, Ryoji: See--
Takasu, Takako; Seo, Satoshi; and Nomura, Ryoji
07416465 Cl. 445-24.
Nomura, Tohru; Shimoide, Yoshihiro; Shiraishi, Yoshihiko; Kamimura, Rikiya; and Kasugai, Hiroshi, to Denso Corporation Thick film circuit board, method of producing the same and integrated circuit device
07417318 Cl. 257-774.
Nomura, Yujiro: See--
Kawada, Kunihiro; Nomura, Yujiro; and Ikuma, Ken
07417651 Cl. 347-116.
Nonaka, Manabu; and Dohki, Yohzoh, to Ricoh Company, Ltd. Method and apparatus for image forming
07418235 Cl. 399-401.
Nonnenmacher, Klaus; and Rohrbach, Guido, to Anseros Klaus Nonnenmacher GmbH Deozonating device with integrated heat exchanger
07416713 Cl. 423-219.
Noor, Halim Md: See--
Chou, Chih-Hsiang; Reddy, Janardhana; Tam, Wee Sin; Lai, Poh Yoke; Noor, Halim Md; and Ow, Sin Ming
07417978 Cl. 370-352.
Norair, John P.: See--
Lerch, John W.; Girvin, Joshua M.; and Norair, John P.
07417541 Cl. 340-539.31.
Nordby, David: See--
Johnson, Noel R.; Titel, Luke A.; Cable, Nicholas; Holl, Wendell J.; Endres, Donald J.; Nordby, David; and Mikelsons, Andi J.
07416479 Cl. 452-51.
Noritake Co., Limited: See--
Ooshima, Hidenori; Sato, Fuyutoshi; and Kubota, Shunichi
07416685 Cl. 252-301.4F.
Norman, Vernon R.: See--
Schmatz, Martin; Cranford, Hayden C.; and Norman, Vernon R.
07418069 Cl. 375-355.
Norman, Vernon Roberts: See--
Carballo, Juan Antonio; Cranford, Jr., Hayden Clavie; Nicholls, Gareth John; Norman, Vernon Roberts; and Schuh, Brian Joel
07418032 Cl. 375-227.
Norris, Derek J.: See--
Fink, Brian E.; Gavai, Ashvinikumar V.; Vite, Gregory D.; Han, Wen-Ching; Misra, Raj N.; Xiao, Hai-Yun; Norris, Derek J.; and Tokarski, John S.
07417040 Cl. 514-183.
Norris, James R.: See--
Braun, John F.; Rojas, John W.; Norris, James R.; Coffy, Jean-Hiram; Parkos, Arthur; Leung, Alan; and Leung, Wendy Chui Fen
07417773 Cl. 358-403.
Norris, Larry: See--
Downes, Stuart D.; Liang, Jin; and Norris, Larry
07416106 Cl. 228-180.21.
Nortel Networks Limited: See--
Edwards, Keith Russell
07418269 Cl. 455-522.
Rabie, Sameh; Magd, Osama Aboul; Abdullah, Bashar; and Barka, Baghdad
07417995 Cl. 370-401.
North, Angus John: See--
Silverbrook, Kia; and North, Angus John
07416284 Cl. 347-54.
North, David D.; to Siemens Power Generation, Inc. Multidirectionally compliant fastening system
07416362 Cl. 403-30.
Northcott, Malcolm J.; and Graves, J. Elon, to AOptix Technologies, Inc. Iris imaging using reflection from the eye
07418115 Cl. 382-117.
Northrop Grumman Corporation: See--
Ax, Jr., George R.; and Sherman, Neil Z.
07417210 Cl. 250-201.1.
Goutzoulis, Akis; Goodell, John B.; and Willis, Gervase J.
07416352 Cl. 385-89.
Jacobson, Rena Y.; Gupta, Tapan K.; Fisher, III, John S.; and Curbean, Andrea
07416630 Cl. 156-253.
Northstar Industries, Inc.: See--
Haustein, Mark; and Schaecher, Ryan
07416075 Cl. 198-812.
NorthTech Workholding: See--
Luschei, Shawn; Hastert, Spencer; Winard, Tim; and Wang, Peter
07415766 Cl. 29-894.3.
Norton, Philip: See--
Bell, David R.; and Norton, Philip
07418342 Cl. 701-213.
Nose, Atsushi; Aoyama, Koji; Kurata, Tohru; and Wada, Kimitaka, to Sony Corporation Image processing method, image processing apparatus and image pickup apparatus and display apparatus suitable for the application of image processing method
07418155 Cl. 382-275.
Nouma, Toshiyuki: See--
Fujihara, Toyoki; Takeda, Kazuhisa; Kitao, Hideki; Ikemachi, Takaaki; Nouma, Toshiyuki; and Nakanishi, Naoya
07416813 Cl. 429-231.1.
Nova R&D, Inc.: See--
Tümer, Tümay O.; and Visser, Gerard
07417472 Cl. 327-70.
Novartis AG: See--
Murray, Lesley J; and Young, Judy C
07416887 Cl. 435-325.
Novartis Vaccines and Diagnostics, Inc.: See--
Fraser, Claire; Galeotti, Cesira; Grandi, Guido; Hickey, Erin; Masignani, Vega; Mora, Marirosa; Petersen, Jeremy; Pizza, Mariagrazia; Rappuoli, Rino; Ratti, Giulio; Scarlato, Vincenzo; Scarselli, Maria; Tettelin, Herve; and Venter, J. Craig
07417114 Cl. 530-350.
Novatek Microelectronics Corp.: See--
Yen, Chih-Jen; and Cheng, Chiu-Hung
07417415 Cl. 323-316.
Novellus Systems, Inc.: See--
Liu, Xinye; Collins, Joshua; and Ashtiani, Kaihan A.
07416989 Cl. 438-706.
Uzoh, Cyprian E.; Basol, Bulent M.; Wang, Hung-Ming; and Talieh, Homayoun
07416975 Cl. 438-652.
Novik, Lev: See--
Sanghvi, Ashvinkumar J.; Hance, Howard M.; Novik, Lev; and Kagalwala, Raxit A.
07418489 Cl. 709-223.
Novo Nordisk Healthcare A/G: See--
Persson, Egon; and Olsen, Ole Hvilsted
07416861 Cl. 435-69.1.
Novo Nordisk HelathCare A/G: See--
Persson, Egon; and Olsen, Ole Hvilsted
07416860 Cl. 435-69.1.
Nowak, Edward J.: See--
Anderson, Brent A.; Clark, Jr., William F.; and Nowak, Edward J.
07416941 Cl. 438-257.
Nowak, Edward Zbygniew: See--
Brown, Malcolm David; Mulroy, Louise; and Nowak, Edward Zbygniew
07416543 Cl. 604-332.
Nozaki, Koji; and Kozawa, Miwa, to Fujitsu Limited Resist pattern-improving material and a method for preparing a resist pattern by using the same
07416837 Cl. 430-314.
Nozawa, Toshihide: See--
Watanabe, Masahito; Miyajima, Toru; Mihara, Shinichi; Miyauchi, Yuji; Nozawa, Toshihide; and Goto, Hisashi
07417684 Cl. 348-363.
Nozawa, Yutaka: See--
Mabuchi, Tomoki; Nozawa, Yutaka; and Asai, Eiji
07416052 Cl. 181-272.
Nozoe, Mari: See--
Shinada, Hiroyuki; Nozoe, Mari; Yoda, Haruo; Ando, Kimiaki; Kuroda, Katsuhiro; Kaneko, Yutaka; Tanaka, Maki; Maeda, Shunji; Kubota, Hitoshi; Sugimoto, Aritoshi; Sugiyama, Katsuya; Takafuji, Atsuko; Yajima, Yusuke; Tooyama, Hiroshi; Ino, Tadao; Hiroi, Takashi; Yoshimura, Kazushi; and Usami, Yasutsugu
07417444 Cl. 324-751.
Nozu, Ryutaro: See--
Higashi, Yoji; and Nozu, Ryutaro
07417845 Cl. 361-502.
NPL Associates: See--
Luo, Nie; and Miley, George
07417356 Cl. 310-301.
NSK Ltd.: See--
Ohata, Toshihisa; and Ishiguro, Hiroshi
07416343 Cl. 384-484.
Shoda, Akihiro; and Yamada, Yasuhisa
07416216 Cl. 280-775.
Takemura, Hiromichi; and Sato, Masanao
07416346 Cl. 384-564.
Yamada, Yasuhisa
07416199 Cl. 280-93.502.
NTT DoCoMo, Inc.: See--
Chen, Lan; Kayama, Hidetoshi; and Umeda, Narumi
07417963 Cl. 370-311.
Jeong, Moo Ryong; Watanabe, Fujio; and Kawahara, Toshiro
07417971 Cl. 370-331.
Jo, Manhee; Isobe, Shinichi; Nishida, Katsutoshi; and Okagawa, Takatoshi
07417969 Cl. 370-331.
Maeda, Koji; Fukumoto, Satoru; and Yoshino, Hitoshi
07418248 Cl. 455-203.
Manabe, Hiroyuki; Hiraiwa, deceased, Akira; Hayashi, Kouki; Ninjouji, Takashi; and Sugimura, Toshiaki
07418385 Cl. 704-254.
Suzuki, Yasunori; Mizuta, Shinji; and Yamao, Yasushi
07418056 Cl. 375-296.
Nuovo, Frank; and Hutchison, Mark, to Vertu Limited Casing for portable communication device
07418282 Cl. 455-575.8.
Nutech 03, Inc.: See--
van Leeuwen, Johannes; Jennings, Michael D.; Mueller, Richard A.; and Robinson, Jack H.
07416660 Cl. 210-192.
Nuutinen, Esa: See--
Itkonen, Ismo; Korhonen, Tapio; Laukkanen, Risto; Nuutinen, Esa; Pitkänen, Juha; Rasimus, Heikki; Rasimus, Seppo; Silvennoinen, Timo; and Ulvinen, Veli
07415814 Cl. 53-465.
NVIDIA Corporation: See--
Donham, Christopher D. S.; and Montrym, John S.
07417637 Cl. 345-506.
Lindholm, John E.; and Coon, Brett W.
07418576 Cl. 712-214.
NXP B.V.: See--
Halberstadt, Johan Christiaan
07417876 Cl. 363-21.12.
Hendriks, Antonius Maria Petrus Johannes; Guelen, Josephus Franciscus Antonius Maria; and Dormans, Guido Jozef Maria
07416939 Cl. 438-257.
Ungermann, Jörn; Fuhrmann, Peter; and Zinke, Manfred
07418650 Cl. 714-798.
Wendt, Matthias
07417421 Cl. 324-207.25.
Nyberg, Kaisa: See--
Eronen, Pasi; Haverinen, Henry; and Nyberg, Kaisa
07418595 Cl. 713-168.
Nyman, William; Bourget, Randy; Linnersten, Staffan; and White, Donald H., to Donaldsom Company, Inc. Filter assemblies and systems for intake air for fuel cells
07416580 Cl. 95-90.