LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 26th DAY OF August, 2008
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

Na, Hyung-don: See--
Yun, Young-Nam; and Na, Hyung-don 07417699 Cl. 349-114.
Nadeau, Jean-Pierre; Cadiot, Dominique; Sebastian, Patrick; and Callede, David, to Centre National de la Recherche Scientific (CNRS) System for cooling a heated juice by partial low-pressure evaporation 07416642 Cl. 202-186.
Nagahashi, Yoshitomo: See--
Udagawa, Kenji; and Nagahashi, Yoshitomo 07416574 Cl. 55-356.
Nagai, Kazukiyo: See--
Yanagawa, Yoshiki; Ikuno, Hiroshi; Li, Hongguo; Nagai, Kazukiyo; Tamura, Hiroshi; Suzuki, Tetsuro; Toda, Naohiro; and Kawasaki, Yoshiaki 07416823 Cl. 430-58.7.
Nagai, Ryo: See--
Kujirai, Hiroshi; Okuyama, Kousuke; Hata, Kazuhiro; Oyu, Kiyonori; Nagai, Ryo; Uchiyama, Hiroyuki; Kumauchi, Takahiro; and Ichise, Teruhisa 07417291 Cl. 257-411.
Nagai, Yuji: See--
Ochiai, Osamu; Nagai, Yuji; Shibata, Masayuki; and Maejima, Hideo 07415776 Cl. 33-708.
Nagai, Yukie: See--
Mizutani, Takeo; Koge, Kenji; Nagai, Yukie; Murakami, Hiroshi; Kawai, Toshikazu; Kashimura, Jun; Shimizu, Takeo; Araki, Seiichi; and Suzuki, Mamoru 07416745 Cl. 424-725.
Nagami, Shuzo; to Dainippon Screen Mfg. Co., Ltd. Substrate cleaning and drying apparatus 07415985 Cl. 134-104.2.
Nagano, Masao: See--
Murakami, Takao; Yamawaki, Takanori; Nagano, Masao; Kobayashi, Hiroshi; and Minakata, Masato 07416425 Cl. 439-157.
Nagano, Yumi: See--
Contreras, John; Ikeda, Takashi; Nagano, Yumi; Nishiyama, Nobumasa; Ohsawa, Toyomi; and Suk, Mike 07417209 Cl. 219-606.
Nagaoka, Nobuharu: See--
Watanabe, Masahito; Tsuji, Takayuki; Hattori, Hiroshi; Nagaoka, Nobuharu; Takatsudo, Izumi; and Saka, Masakazu 07418127 Cl. 382-154.
Nagarah, John: See--
Heath, James R.; Bunimovich, Yuri; Ge, Guanglu; Beverly, Kristen; Nagarah, John; Roukes, Michael; and Willis, Peter 07416911 Cl. 438-49.
Nagasaka, Kohji; and Narasako, Seiichi, to Sharp Kabushiki Kaisha Multiple ranging apparatus 07417716 Cl. 356-4.01.
Nagasako, Shuuya: See--
Suzuki, Nobuyoshi; Yamada, Kenji; Saitoh, Hiromoto; Kikkawa, Naohiro; Iida, Junichi; Tokita, Junichi; Matsushita, Shingo; Tamura, Masahiro; and Nagasako, Shuuya 07416177 Cl. 270-37.
Nagashima, Kenji; to Funai Electric Co., Ltd. Optical pickup apparatus 07417937 Cl. 369-112.17.
Nagashima, Masayuki: See--
Uchimi, Tsutomu; Nagashima, Masayuki; Kobayashi, Masaru; and Shirogane, Hiroyuki 07416687 Cl. 252-512.
Nagata, Mikito: See--
Nakahara, Hiroshi; Nagata, Mikito; Skinlo, David M.; Tsukamoto, Hisashi; and Yumoto, Hiroyuki 07416811 Cl. 429-94.
Nagaya, Masanori: See--
Suzuki, Susumu; Nagaya, Masanori; and Sato, Takao 07418563 Cl. 711-161.
Nagel, Nicolas: See--
Willer, Josef; Haibach, Patrick; Kleint, Christoph Andreas; and Nagel, Nicolas 07416976 Cl. 438-666.
Nagpurkar, Arun: See--
Holub, Bruce J.; and Nagpurkar, Arun 07416752 Cl. 426-93.
Naidu, Srini: See--
Lakshmanan, Sridhar; Ma, Bing; Natarajan, Narasimhamurthi; and Naidu, Srini 07417536 Cl. 340-538.
Naiini, Ahmad A.; Hopla, Richard; Powell, David B.; Metivier, Jon; and Rushkin, Il'ya, to Fujifilm Electronic Materials U.S.A., Inc. Photosensitive resin compositions 07416830 Cl. 430-190.
Nair, Ajitkumar B.; and Sadaka, Alain F., to Boston Scientific Scimed, Inc. Medical device including actuator 07416534 Cl. 600-585.
Nair, Radhakrishnan Janardanan; and Sue, Shunketsu, to Procter & Gamble Company, The Diaper including ink-printed substrate web 07416777 Cl. 428-195.1.
Nait Distributing, Inc.: See--
Hankel, Nathaniel S.; and Jamison, Ken 07417403 Cl. 320-110.
Naito, Masashi; to Hitachi Kokusai Electric Inc. Signal generator 07418070 Cl. 375-373.
Naito, Toshiki; and Yamazaki, Hiroshi, to Nitto Denko Corporation Wired circuit forming board, wired circuit board, and thin metal layer forming method 07417316 Cl. 257-750.
Naitou, Taku: See--
Nakamura, Akira; and Naitou, Taku 07415926 Cl. 101-116.
Nakada, Katsuyuki: See--
Hattori, Kazuhiro; Okawa, Shuichi; and Nakada, Katsuyuki 07417826 Cl. 360-135.
Nakahara, Hiroshi; Nagata, Mikito; Skinlo, David M.; Tsukamoto, Hisashi; and Yumoto, Hiroyuki, to Quallion LLC Electric storage battery construction and method of manufacture 07416811 Cl. 429-94.
Nakahara, Ken; to Rohm Co., Ltd. Transparent electrode 07417263 Cl. 257-99.
Nakahata, Seiji: See--
Ishibashi, Keiji; Kaji, Tokiko; Nakahata, Seiji; and Nishiura, Takayuki 07416604 Cl. 117-89.
Nakai, Norio: See--
Kuboshima, Daisuke; Hamasaki, Kazunari; and Nakai, Norio 07416825 Cl. 430-96.
Nakai, Yasuo: See--
Tanaka, Akihiro; and Nakai, Yasuo 07416451 Cl. 439-630.
Nakajima, Hiroyoshi: See--
Nippa, Satoru; Nakajima, Hiroyoshi; and Atarashi, Kenji 07417087 Cl. 524-437.
Nakajima, Nobuyoshi; and Yoda, Akira, to Fujifilm Corporation Imaging device for imaging based upon a reference composition for a subject 07417672 Cl. 348-231.3.
Nakajima, Shigeo; and Shiraki, Toshinori, to Asahi Kasei Chemicals Corporation Asphalt composition 07417081 Cl. 524-68.
Nakajima, Takeshi: See--
Miyashita, Harumitsu; Nakajima, Takeshi; and Kimura, Naohiro 07417815 Cl. 360-31.
Nakajima, Tomohiro: See--
Fujii, Mitsumi; Satoh, Yukito; and Nakajima, Tomohiro 07417780 Cl. 359-224.
Nakajima, Yoshihumi: See--
Ban, Wataru; and Nakajima, Yoshihumi 07416495 Cl. 473-292.
Nakamura, Akinari; Ozeki, Masataka; Tanaka, Yoshikazu; and Nishikawa, Takashi, to Matsushita Electric Industrial Co., Ltd. Power generation system 07418315 Cl. 700-296.
Nakamura, Akio; and Arita, Takashi, to Fujitsu Component Limited Fuel cell device and case thereof 07416805 Cl. 429-34.
Nakamura, Akira; and Naitou, Taku, to Riso Kagaku Corporation Stencil printing machine with stencil clamping portion 07415926 Cl. 101-116.
Nakamura, Kentaro; Ooi, Hiroki; and Ishikawa, George, to Fujitsu Limited Wavelength division multiplexing transmission system 07418207 Cl. 398-83.
Nakamura, Kimio: See--
Kainuma, Norio; Kira, Hidehiko; Kobae, Kenji; Matsumura, Takayoshi; and Nakamura, Kimio 07416921 Cl. 438-118.
Nakamura, Kiyokazu: See--
Mori, Hideyuki; Nakamura, Kiyokazu; and Itoh, Kenji 07418404 Cl. 705-26.
Nakamura, Masaru; to Ricoh Company, Ltd. Method and apparatus for ultra wideband communications system employing a spread spectrum technique transmitting a baseband signal over a wide frequency band 07418027 Cl. 375-141.
Nakamura, Teruyuki: See--
Uehara, Tatsuaki; Nakamura, Teruyuki; and Kato, Takashi 07416245 Cl. 296-214.
Nakamura, Tetsuya: See--
Kobayashi, Junichi; Nakamura, Tetsuya; Muranaka, Hideyuki; Ishikawa, Takehiro; Tamai, Tetsuro; and Akahane, Satoshi 07417169 Cl. 564-337.
Nakamura, Tomohiro: See--
Okumura, Tatsuya; and Nakamura, Tomohiro 07415877 Cl. 73-431.
Nakamura, Tomoki: See--
Tsukuda, Hideyuki; Nakamura, Tomoki; and Kojima, Ko 07418667 Cl. 715-780.
Nakamura, Tomoki; Noguchi, Kazunari; and Kaneko, Yoshiyuki, to Hitachi Displays, Ltd. Image display device having electrical lead connections fixed through a portion of an exhausting pipe body 07417365 Cl. 313-495.
Nakamura, Tooru: See--
Seki, Takashi; Nakamura, Tooru; and Mazaki, Hitoshi 07416765 Cl. 428-1.1.
Nakamura, Tsunehiko; to Kyocera Corporation Heater, wafer heating apparatus and method for manufacturing heater 07417206 Cl. 219-444.1.
Nakamura, Yasushige; and Tanaka, Tomoaki, to Fuji Xerox Co., Ltd. Color toner for electrophotography and color toner set for electrophotography using the same, color developer for electrophotography, method for forming color image, and apparatus for forming color image 07416826 Cl. 430-107.1.
Nakamura, Yasutaka: See--
Hiyama, Kunio; Okada, Masuhiro; Suzuki, deceased, Hideo; and Nakamura, Yasutaka 07416773 Cl. 428-117.
Nakamuta, Koji: See--
Koyama, Yoshito; and Nakamuta, Koji 07417477 Cl. 327-156.
Nakane, Naoki: See--
Ishihara, Toshiharu; Izumi, Takeshi; Tokumoto, Yoshitomo; Tsujimoto, Taisuke; and Nakane, Naoki 07415898 Cl. 73-862.331.
Tokumoto, Yoshitomo; Ishihara, Toshiharu; and Nakane, Naoki 07415899 Cl. 73-862.331.
Nakanishi, Naoya: See--
Fujihara, Toyoki; Takeda, Kazuhisa; Kitao, Hideki; Ikemachi, Takaaki; Nouma, Toshiyuki; and Nakanishi, Naoya 07416813 Cl. 429-231.1.
Nakano, Bradley Y.: See--
Nobel, Gary M; Nakano, Bradley Y.; Wee, Daniel; and Hulan, Gregory T 07418101 Cl. 380-243.
Nakano, Kuniaki: See--
Murakami, Susumu; Tomiyori, Minoru; Izumi, Hideshi; Narikiyo, Takahisa; Nakano, Kuniaki; and Iwakura, Yoshie 07418234 Cl. 399-401.
Nakao, Koichi: See--
Machi, Takato; Chikumoto, Noriko; Nakao, Koichi; Fuji, Hiroshi; Kitoh, Yutaka; Izumi, Teruo; and Shiohara, Yuh 07417425 Cl. 324-261.
Nakashiba, Yasutaka: See--
Ohkubo, Hiroaki; and Nakashiba, Yasutaka 07417277 Cl. 257-312.
Nakasuji, Mamoru; Noji, Nobuharu; Satake, Tohru; Kimba, Toshifumi; Sobukawa, Hirosi; Karimata, Tsutomu; Oowada, Shin; Yoshikawa, Shoji; and Saito, Mutsumi, to Ebara Corporation Sheet beam-type testing apparatus 07417236 Cl. 250-440.11.
Nakata, Tatsuo; and Oba, Masahiro, to Olympus Corporation Laser scanning microscope having a mechanism which prevents stimulation light from reaching a light detector 07417211 Cl. 250-201.3.
Nakata, Toshihiko: See--
Uto, Sachio; Noguchi, Minori; Nishiyama, Hidetoshi; Ohshima, Yoshimasa; Hamamatsu, Akira; Jingu, Takahiro; Nakata, Toshihiko; and Watanabe, Masahiro 07417721 Cl. 356-237.2.
Nakatani, Hironori: See--
Kojima, Kippei; Nakatani, Hironori; Watanabe, Yasuyuki; and Sakamoto, Akira 07417630 Cl. 345-204.
Nakatani, Takayuki: See--
Sano, Naoyuki; Nakatani, Takayuki; and Kamada, Yoshihiko 07416616 Cl. 148-320.
Nakatani, Toru; and Terada, Mamoru, to Konica Minolta Opto, Inc. Image pickup optical system and image pickup apparatus 07417801 Cl. 359-687.
Nakatsuji, Koji: See--
Asayama, Sanae; Nakatsuji, Koji; Suzuki, Masanori; and Terao, Atsuhito 07418247 Cl. 455-168.1.
Nakatsuka, Hiroshi: See--
Kamiyama, Tomohide; Onishi, Keiji; Nakatsuka, Hiroshi; Yamakawa, Takehiko; and Iwasaki, Tomohiro 07417360 Cl. 310-348.
Nakayama, Takeshi; Saito, Yoshiyuki; and Asahi, Toshiyuki, to Matsushita Electric Industrial Co., Ltd. Mobile terminal, circuit board, circuit board design aiding apparatus and method, design aiding program, and storage medium having stored therein design aiding program 07418603 Cl. 713-194.
Nakayama, Tatsushi; Matsuzaki, Takeshi; and Sasaki, Kenichiro, to Ube Industries Ltd. Process for production of 2,3,3′,4′-biphenyltetracarboxylic dianhydride 07417108 Cl. 528-353.
Nakazato, Katsuyoshi; to Nihon University Method of measuring protein solubility, process for producing crystal and apparatus therefor 07416708 Cl. 422-245.1.
Nakazawa, Akira: See--
Silverbrook, Kia; Berry, Norman Micheal; Jackson, Garry Raymond; and Nakazawa, Akira 07416274 Cl. 347-42.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; MacKey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond 07416287 Cl. 347-85.
Silverbrook, Kia; Psaila, David Charles; Jackson, Garry Raymond; Nakazawa, Akira; Bulman, Jonathan Mark; and Waszczuk, Jan 07416629 Cl. 156-249.
Nakazawa, Toru; to NEC Corporation Wireless communication system which improves reliability and throughput of communication and retransmission timeout determining method used for the same 07417956 Cl. 370-252.
Nakazawa, Yoshihiro; Saito, Toshikzau; and Yoshida, Mitsugu, to Honda Motor Co., Ltd. Transparent fuel tank for motorcycles 07416220 Cl. 280-835.
Nakua, Abdul M.: See--
Wu, Xingwei; and Nakua, Abdul M. 07417368 Cl. 313-503.
Nalco Company: See--
Shmakova-Lindeman, Olga E. 07417009 Cl. 507-90.
Treybig, Duane; and Chang, Kin-Tai 07417011 Cl. 507-244.
Nam, Hyeun Sik; Nam, Young Sok; Lee, Yong Soo; and Cho, Seong Ho, to LG Electronics Inc. Cooking apparatus and method for controlling the same 07417204 Cl. 219-413.
Nam, Young Sok: See--
Nam, Hyeun Sik; Nam, Young Sok; Lee, Yong Soo; and Cho, Seong Ho 07417204 Cl. 219-413.
Nambu, Hiromi: See--
Higashi, Takashi; Kito, Tetsuji; Sasaki, Yasushi; and Nambu, Hiromi 07416783 Cl. 428-403.
Namekawa, Shouji: See--
Yoshizumi, Hiroshi; Aoki, Yasumichi; Namekawa, Shouji; and Esaki, Minoru 07415973 Cl. 123-495.
Nanataki, Tsutomu; Kitagawa, Mutsumi; and Kashiwaya, Toshikatsu, to NGK Insulators, Ltd. Piezoelectric/electrostrictive body, piezoelectric/electrostrictive laminate, and piezoelectric/electrostrictive actuator 07417361 Cl. 310-358.
Nanduri, Venkata B.; Patel, Ramesh N.; Goldberg, Steven L.; and Johnston, Robert M., to Bristol-Meyers Squibb Company N-carbobenzyloxy (N-CBZ)-deprotecting enzyme 07416876 Cl. 435-196.
Nanjo, Takeshi; Katoh, Seiichi; and Ohtaka, Koichi, to Ricoh Company, Ltd. Light deflector, light deflection array, image forming apparatus, and image projection display apparatus 07417778 Cl. 359-223.
Nantero, Inc.: See--
Segal, Brent M.; Rueckes, Thomas; and Bertin, Claude L. 07416993 Cl. 438-742.
Nanya Technology Corp.: See--
Cheng, Wen-Chang 07417905 Cl. 365-191.
Cheng, Wen-Chang 07417906 Cl. 365-191.
Naoi, Satoshi: See--
Fujimoto, Katsuhito; Ohara, Atsuko; and Naoi, Satoshi 07418126 Cl. 382-154.
Napoletano, Jr., Francis (Frank) M.: See--
Swinbanks, Malcolm A.; Simon, David E.; Holford, John M.; and Napoletano, Jr., Francis (Frank) M. 07418324 Cl. 701-37.
Naquin, Carey John; Hardin, Jr., John R.; Estep, James W.; Rios-Aleman, David; Song, Haoshi; and Maranuk, Christopher A., to Halliburton Energy Services, Inc. Apparatus for changing flowbore fluid temperature 07416026 Cl. 166-374.
Narasako, Seiichi: See--
Nagasaka, Kohji; and Narasako, Seiichi 07417716 Cl. 356-4.01.
Narayanan, Sekharipuram R.: See--
Haile, Sossina M.; Chisholm, Calum; Merle, Ryan B.; Boysen, Dane A.; and Narayanan, Sekharipuram R. 07416803 Cl. 429-33.
Narayanan, Sekharipuram R.; and Surampudi, Subbarao, to California Institute of Technology Catalyst materials for fuel cells 07416809 Cl. 429-40.
Nardone, Ralph L.: See--
McConville, Richard P.; Hollowell, James A.; Nardone, Ralph L.; Lariviere, Norman C.; Rich, Dean E.; and Kingsley, Robert 07415931 Cl. 102-489.
Narikiyo, Takahisa: See--
Murakami, Susumu; Tomiyori, Minoru; Izumi, Hideshi; Narikiyo, Takahisa; Nakano, Kuniaki; and Iwakura, Yoshie 07418234 Cl. 399-401.
Naro, Brian A.: See--
Tamm, Carl R.; Hay, Robert G.; Naro, Brian A.; and Bradford, Lawrence E. 07416454 Cl. 439-798.
Narui, Seiji: See--
Watanabe, Yuko; Arai, Koji; and Narui, Seiji 07418685 Cl. 716-11.
Naruoka, Yoshihiko: See--
Mitsuya, Yusuke; Naruoka, Yoshihiko; and Asari, Yukio 07416180 Cl. 271-122.
Naruse, Yutaka; to Bridgestone Corporation Wheel alignment angle measuring apparatus and wheel alignment angle measuring method 07415770 Cl. 33-203.13.
Narva, Kenneth Edwin: See--
Barbour, Eric; Bing, James Wayne; Cardineau, Guy A.; Cressman, Jr., Robert F.; Gupta, Manju; Hartnett Locke, Mary E.; Hondred, David; Keaschall, Joseph W.; Koziel, Michael G.; Meyer, Terry EuClaire; Moellenbeck, Daniel; Narva, Kenneth Edwin; Nirunsuksiri, Wilas; Ritchie, Steven W.; Rudert, Marjorie L.; Sanders, Craig D.; Shao, Aihua; Stelman, Steven Jeffrey; Stucker, David S.; Tagliani, Laura Ann; and Van Zante, William M. 07417132 Cl. 536-23.1.
Naslund, Lars Ake; Nilsson, Tommy; Poppi, Luca; Benedetti, Paolo; Eriksson, Anna; and Ferrarini, Filippo, to Tetra Laval Holdings & Finance S.A. Method and device for electron beam irradiation 07417239 Cl. 250-492.1.
Nataraj, Bindiganavale S.: See--
Srinivasan, Varadarajan; Khanna, Sandeep; and Nataraj, Bindiganavale S. 07417881 Cl. 365-45.
Natarajan, Lalquidi V.: See--
Sutherland, Richard L.; Natarajan, Lalquidi V.; Tondiglia, Vince P.; and Bunning, Timothy J. 07416818 Cl. 430-2.
Natarajan, Narasimhamurthi: See--
Lakshmanan, Sridhar; Ma, Bing; Natarajan, Narasimhamurthi; and Naidu, Srini 07417536 Cl. 340-538.
Natarajan, Udaya S.; to Intel Corporation Test interface, system, and method for testing communications devices with non-deterministic latency 07418639 Cl. 714-724.
Nathanson, Ben Jesse: See--
Barrett, Wayne Melvin; Chen, Dong; Coteus, Paul William; Gara, Alan Gene; Jackson, Rory; Kopcsay, Gerard Vincent; Nathanson, Ben Jesse; Vranas, Paylos Michael; and Takken, Todd E. 07418068 Cl. 375-355.
National Applied Research Laboratories National Center for High Center for High-Performance Computing: See--
Juan, Paul; and Huang, Kuen-Yu 07418198 Cl. 396-25.
National Cheng Kung University: See--
Wang, Jhing-Fa; Hsu, Han-Jen; and Liao, Shang-Chia 07418131 Cl. 382-165.
National Chiao Tung University: See--
Chi, Sien; Chen, Nan-Kuang; and Shy, Jow-Tsong 07417789 Cl. 359-333.
National Institute of Advanced Industrial Science and Technology: See--
Hirao, Kiyoshi; Sakaguchi, Shuji; Yamauchi, Yukihiko; Kanzaki, Shuzo; and Yamada, Suzuya 07417002 Cl. 501-87.
National Semiconductor Corporation: See--
Chen, Dongwei 07417687 Cl. 348-525.
National Tsing Hua University: See--
Liu, Ta-Jo; and Chang, E-Ron 07416608 Cl. 118-411.
Natsume, Gary Shigeru: See--
Scordato, Richard E.; Page, Lou Ann; Costello, Kevin; Schieffer, Sonya; and Natsume, Gary Shigeru 07416704 Cl. 422-100.
Nauber, Andre: See--
Bader, Raoul; Burrel, Luis; Dalitz, Werner; Moehring, Andreas; Kluge, Martin; Nauber, Andre; and Schaaf, Uwe 07415768 Cl. 30-34.2.
Naude, Johannes Jacobus; to Varibox (PTY) Limited Rotor controlled transmission 07416506 Cl. 475-218.
Naughton, Jeffrey F.: See--
Luo, Gang; Naughton, Jeffrey F.; Ellmann, Curt J.; and Watzke, Michael W. 07418706 Cl. 718-103.
Navarro, Julio A.; Hersey, Devin W.; Florian, Michael H.; Osterhues, Gordon D; and Yen, Percy, to Boeing Company, The Compact, low profile electronically scanned antenna 07417598 Cl. 343-853.
Navarro, Santiago: See--
Ruezinsky, Diane M.; Hawkins, Deborah J.; Navarro, Santiago; and Parnell, Laurence D. 07417177 Cl. 800-287.
Naviasky, Eric: See--
Williams, Stephen; Naviasky, Eric; and Evans, William 07417572 Cl. 341-136.
Navitime Japan Co., Ltd.: See--
Ohnishi, Keisuke; Kikuchi, Shin; and Suzuki, Yusuke 07418338 Cl. 701-117.
NBTY, Inc.: See--
Vrablic, Angelica; Schneider, Glenn; and Silverman, Robert 07416750 Cl. 424-736.
NCR Corporation: See--
Benson, Christopher M. 07418413 Cl. 705-27.
Crooks, John F. 07417545 Cl. 340-572.1.
Inderrieden, Michael T. 07416119 Cl. 235-383.
Morrison, James 07416117 Cl. 235-383.
NEC Corporatioin: See--
Sasaki, Tokuhito; and Sano, Masahiko 07417229 Cl. 250-338.1.
NEC Corporation: See--
Aino, Shigeyuki; and Yamazaki, Shigeo 07418626 Cl. 714-12.
Edahiro, Masato; Ito, Yoshiyuki; Sakai, Junji; Minakami, Tetsuya; and Inoue, Hiroaki 07418703 Cl. 718-100.
Hama, Yoshinori 07418102 Cl. 381-71.1.
Iketsu, Yuichi; and Imura, Hironori 07417251 Cl. 257-72.
Kondo, Reishi 07418388 Cl. 704-258.
Minagawa, Hirotaka 07416871 Cl. 435-189.
Nakazawa, Toru 07417956 Cl. 370-252.
Saito, Yoshihiro 07418570 Cl. 711-202.
Sato, Tadashi 07416122 Cl. 235-385.
Shibayama, Atsufumi; Matsushita, Satoshi; Torii, Sunao; and Nishi, Naoki 07418583 Cl. 712-228.
Takano, Nahoko; Hamabe, Kojiro; and Ushirokawa, Akihisa 07417975 Cl. 370-335.
NEC Electronics Corporation: See--
Hayashi, Toshiya; and Tezuka, Tatsurou 07417319 Cl. 257-774.
Izumino, Hitoshi 07417915 Cl. 365-230.05.
Miyamoto, Manabu 07417438 Cl. 324-522.
Mori, Kazuhisa 07417487 Cl. 327-512.
Obiya, Tomochika 07417324 Cl. 257-780.
Ohkubo, Hiroaki; and Nakashiba, Yasutaka 07417277 Cl. 257-312.
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO: See--
Simons, Dirk Gozewinus 07417921 Cl. 367-88.
Neely, Frank: See--
Alvarez-Carrigan, Nayiby; Brown-Skrobot, Susan; Meyers, Ann-Marie Wong; Neely, Frank; Pall, Brian; and Rathore, Osman 07416737 Cl. 424-409.
Nees, Terry S.: See--
Brown, Katherine A.; and Nees, Terry S. 07417550 Cl. 340-572.7.
Negru, Sorin L.: See--
Wu, Jean-Shin; and Negru, Sorin L. 07417491 Cl. 327-536.
Neitz, R. Jeffrey: See--
Tung, Jay S.; Garofalo, Albert W.; Pleiss, Michael A.; Wu, Jing; Wone, David W. G.; Guinn, Ashley C.; Dressen, Darren B.; Neitz, R. Jeffrey; Marugg, Jennifer; and Neitzel, Martin 07417152 Cl. 548-374.1.
Neitzel, Martin: See--
Tung, Jay S.; Garofalo, Albert W.; Pleiss, Michael A.; Wu, Jing; Wone, David W. G.; Guinn, Ashley C.; Dressen, Darren B.; Neitz, R. Jeffrey; Marugg, Jennifer; and Neitzel, Martin 07417152 Cl. 548-374.1.
Nellcor Puritan Bennett Inc.: See--
DeLonzor, Russ; Mannheimer, Paul D.; Fein, Michael E.; and Hannula, Don 07418284 Cl. 600-310.
Nelson, Loren Travis; Delaney, Michael; and Luciano, Jr., Robert Anthony, to Bally Gaming, Inc. Simulated bonus method in finite-pool award system 07416484 Cl. 463-25.
Nelson, Wade: See--
Edwards, Paul; Nelson, Wade; and Berthelot, Greg 07417395 Cl. 318-445.
Nelson, William M.: See--
Zimniewicz, Jeff A.; Raden, Gary P.; Helgeson, Ryan M.; and Nelson, William M. 07418700 Cl. 717-175.
Nemiroff, Daniel: See--
Corrado, Francis R.; and Nemiroff, Daniel 07418548 Cl. 711-114.
Nemoto, Yoshihiko: See--
Umemoto, Mitsuo; Okayama, Yoshio; Tanida, Kazumasa; Terao, Hiroshi; and Nemoto, Yoshihiko 07416963 Cl. 438-461.
Neose Technologies, Inc.: See--
DeFrees, Shawn; Zopf, David A.; Bayer, Robert J.; Bowe, Caryn; Hakes, David James; and Chen, Xi 07416858 Cl. 435-68.1.
Nerzak, Thomas: See--
Küppers, Klaus; Meyer, Meinert; and Nerzak, Thomas 07416622 Cl. 148-581.
Nestler, Gerhard: See--
Weiss, Frank; Oppelt, Reiner; and Nestler, Gerhard 07416443 Cl. 439-578.
Netlogic Microsystems, Inc.: See--
Srinivasan, Varadarajan; Khanna, Sandeep; and Nataraj, Bindiganavale S. 07417881 Cl. 365-45.
Netlogics Microsystems, Inc.: See--
Maheshwari, Dinesh 07417882 Cl. 365-49.
Neto, José Batista Ferreira: See--
Bergmann, Herberto; Krieg, Eric; Malkowski, Jr., Chester; Omoto, Arnaldo Hiroyuki; Pereira, Luis Ricardo Luzardo; and Neto, José Batista Ferreira 07417848 Cl. 361-624.
Network Appliance, Inc.: See--
Bolinger, Don; Lent, Arthur; and Silberman, Jeffrey 07418500 Cl. 709-225.
Lee, Herman; Beaman, Rebecca; and Lent, Arthur F. 07418569 Cl. 711-200.
Lewis, Blake; Patel, Kayuri; and Chen, Ray 07418465 Cl. 707-205.
Neubacher, Werner: See--
Johann, Jürgen; Bissen, Monique; Neubacher, Werner; and Schrotshamer, Christian 07416664 Cl. 210-232.
Neubauer, Robert Anthony: See--
Yu, Jenny Zhaoxia; Frantz, David Mark; Reiter, Leonard James; and Neubauer, Robert Anthony 07416002 Cl. 152-197.
Neudorf, David: See--
Liu, Houyuan; Gillaspie, James D.; Lewis, Coralie Adele; Neudorf, David; and Barnett, Steven 07416711 Cl. 423-140.
Neumann, Matt: See--
Barsun, Stephan; Tam, Kin; Bolich, Bryan; Neumann, Matt; and Miner, Richard Augustus 07417864 Cl. 361-719.
Neunteufl, Klemens: See--
Chmela, Franz; Csato, Janos; Eichlseder, Helmut; Figer, Guenter; Fuchs, Christian; Glensvig, Michael; Herzog, Peter; Kammerdiener, Thomas; Neunteufl, Klemens; Pirker, Gerhard; Sams, Theodor; Weissbaeck, Michael; and Wimmer, Andreas 07415963 Cl. 123-299.
NeuroSearch Sweden AB: See--
Sonesson, Clas; Andersson, deceased, Bengt; Waters, Susanna; Waters, Nicholas; and Tedroff, Joakim 07417043 Cl. 514-247.
Neuveux, Frederic: See--
Kapur, Rohit; Sitchinava, Nodari; Samaranayake, Samitha; Gizdarski, Emil; Neuveux, Frederic; Duggirala, Suryanarayana; and Williams, Thomas W. 07418640 Cl. 714-726.
Newcomb, Mark D.: See--
van de Ligt, Christiaan P. A.; Newcomb, Mark D.; Craig, W. Michael; and Cook, David A. 07418303 Cl. 700-90.
Newisys, Inc.: See--
Zeitler, Carl; Glasco, David Brian; Record, Les; Oehler, Richard R.; Kulpa, William G.; Prasadh, Guru; and Kota, Rajesh 07418517 Cl. 709-238.
Newman, Daniel A.; to Tetra Holding (US), Inc. Filter apparatus with fluid bypass 07416659 Cl. 210-167.27.
Newton, Ernest: See--
Mackin, Stephen; and Newton, Ernest 07416197 Cl. 280-87.041.
NexJen Technologies Ltd.: See--
Kretchmar, Robert J. 07416657 Cl. 210-95.
Ney, Richard: See--
Testud, Jacques; Ney, Richard; and LeBouar, Erwan 07417577 Cl. 342-26R.
Ng, Gavin K F: See--
Campbell, David C.; Gibbons, Louis August; and Ng, Gavin K F 07415777 Cl. 33-755.
Ngai, Tony K.: See--
Hao, Eunice Y. D.; Ngai, Tony K.; Wong, Jennifer; and Ching, Alvin Y. 07417918 Cl. 365-233.12.
NGK Insulators, Ltd.: See--
Matsuda, Hiroto; Nobori, Kazuhiro; Imai, Yasuyoshi; and Kawajiri, Tetsuya 07416793 Cl. 428-701.
Nanataki, Tsutomu; Kitagawa, Mutsumi; and Kashiwaya, Toshikatsu 07417361 Cl. 310-358.
NGK Spark Plug Co., Ltd.: See--
Ieda, Norikazu; and Oi, Yuji 07416649 Cl. 204-401.
Ishikawa, Hideki; Kitanoya, Shoji; Morita, Takeshi; and Ishida, Noboru 07416651 Cl. 204-425.
Okumura, Tatsuya; and Nakamura, Tomohiro 07415877 Cl. 73-431.
Ngo, Van Huynh Portable article support structure 07415932 Cl. 108-44.
Nguyen, Duong Tuan: See--
Dinh, Chon Tam Le; Nguyen, Duong Tuan; and Nguyen, Thi Thanh Hien 07418149 Cl. 382-254.
Nguyen, Duy: See--
Buchmann, Bernd; Fritsch, Martin; Nguyen, Duy; Menzenbach, Bernd; and Boemer, Ulf 07417066 Cl. 514-443.
Nguyen, Hung; and Wichman, Shannon, to VeriSilicon Holdings (Cayman Islands) Co. Ltd. Simultaneously assigning corresponding entry in multiple queues of multi-stage entries for storing condition attributes for validating simultaneously executed conditional execution instruction groups 07418578 Cl. 712-218.
Nguyen, Khai Q.: See--
Wang, Xiaobao; Sung, Chiakang; Nguyen, Khai Q.; and Charagulla, Sanjay K. 07417452 Cl. 326-30.
Nguyen, Quang: See--
Sorrentino, Alan; Moskovich, Robert; and Nguyen, Quang 07416081 Cl. 206-362.2.
Nguyen, Thi Thanh Hien: See--
Dinh, Chon Tam Le; Nguyen, Duong Tuan; and Nguyen, Thi Thanh Hien 07418149 Cl. 382-254.
Nhep, Ponharith: See--
Zimmel, Steven C.; Smith, Trevor; and Nhep, Ponharith 07418181 Cl. 385-135.
Nicholls, Gareth John: See--
Carballo, Juan Antonio; Cranford, Jr., Hayden Clavie; Nicholls, Gareth John; Norman, Vernon Roberts; and Schuh, Brian Joel 07418032 Cl. 375-227.
Nichols, Charles E.: See--
Hetrick, William A.; and Nichols, Charles E. 07418550 Cl. 711-114.
Nickel, Dieter: See--
Weber, Henriette; Hoffmann, Sandra; Raehse, Wilfried; Jung, Dieter; Meier, Frank; Block, Christian; Bayersdoerfer, Rolf; Semrau, Markus; Faeser, Karl-Martin; Birnbrich, Paul; and Nickel, Dieter 07417019 Cl. 510-446.
Nickerson, David L. Wall system with masonry external surface and associated method 07415805 Cl. 52-426.
Nicolay, William: See--
Adamson, Hugh P.; Hesse, Scott; and Nicolay, William 07417384 Cl. 315-291.
Nicoli, Andrea: See--
Giovanetti, Roberto; Nicoli, Andrea; Verzini, Massimo; Soriato, Giorgio; and Cotarca, Livius 07417166 Cl. 562-507.
Nidec Sankyo Corporation: See--
Ohta, Keiji 07417822 Cl. 360-85.
Nidek Co., Ltd.: See--
Akita, Junichi; Mizuno, Katsuyasu; and Fujishiro, Akihiro 07416304 Cl. 351-215.
Hanebuchi, Masaaki; and Gono, Mitsuhiro 07416301 Cl. 351-205.
Mizuno, Katsuyasu 07416303 Cl. 351-210.
Nie, Junhong: See--
Jin, Xin; Bugnariu, Calin N.; Islam, M. Khaledul; Shah, Samir R.; Pomeroy, Stephen L.; Bouianovskaia, Reguina; and Nie, Junhong 07418356 Cl. 702-63.
Nie, Xiaochun; Pun, Thomas; Kumar, Roger; and Wu, Hsi-Jung, to Apple Inc. Method of performing rate control for a compression system 07418037 Cl. 375-240.03.
Nielsen, Evan; to Dalsgaard Nielsen ApS Method of determining the risk of ice deposition due to precipitation and apparatus for exercising the method 07418347 Cl. 702-3.
Nielsen, Henning; to Bang & Olufsen A/S Multiple switch selection device 07417199 Cl. 200-5E.
Nielsen, Jesper Pram: See--
Löfquist, Bo; and Nielsen, Jesper Pram 07417203 Cl. 209-576.
Nielsen, Søren; to Siemens Aktiengesellschaft Magnetic inductive flowmeter having a plug-type electrode connection 07415894 Cl. 73-861.52.
Niemeier, Manuela; Poppe, Andreas; Stübbe, Wilfried; Westhoff, Elke; and Fischer, Jens-Dieter, to BASF Coatings AG Coatings, methods for producing the same, and the use thereof 07416781 Cl. 428-323.
Nien, Ya-Fang; Chang, Kuo-An; and Chang, Chi-Hsiang, to ALi Corporation Automatic power conservation method for an optical media device 07418607 Cl. 713-320.
Nies, Craig A.; de Traversay, Jean; Deo, Arati S.; Pathria, Anu K.; and Biafore, Louis S., to Fair Isaac Corporation Webstation: configurable web-based workstation for reason driven data analysis 07418431 Cl. 706-21.
Niewalda, Gregor: See--
Holler, Wolfgang; Niewalda, Gregor; and Ramsauer, Martin 07418081 Cl. 378-98.8.
Nifco Inc.: See--
Araki, Minoru; and Tanaka, Masami 07416063 Cl. 188-296.
Nigrin, Uwe: See--
Knauth, Werner; Nigrin, Uwe; and Vu, Ngoc-Tam 07415920 Cl. 92-171.1.
Nihei, Mizuhisa: See--
Kawabata, Akio; Nihei, Mizuhisa; Horibe, Masahiro; Sato, Shintaro; Kondo, Daiyu; and Awano, Yuji 07417320 Cl. 257-774.
Nihei, Takao: See--
Sumasu, Atsushi; Miyamoto, Shoji; Futagi, Sadaki; Takakusaki, Keiji; and Nihei, Takao 07418242 Cl. 455-70.
Nihon Optical Co., Ltd.: See--
Kataoka, Hideharu; Osamura, Takashi; and Teraoka, Yoshiko 07416077 Cl. 206-5.1.
Nihon University: See--
Nakazato, Katsuyoshi 07416708 Cl. 422-245.1.
Niizeki, Yasushi: See--
Otomo, Naoki; Mizoguchi, Shuri; Niizeki, Yasushi; Maekawara, Minoru; and Miyata, Kyosei 07416074 Cl. 198-810.03.
Nikitin, Alexei V. Method and apparatus for adaptive real-time signal conditioning, processing, analysis, quantification, comparison, and control 07418469 Cl. 708-819.
Nikkel, Chris: See--
Reding, Gary; Beadle, Kent; Nikkel, Chris; Schulze, Mark; Humphries, Walker; Womeldorf, Dave; Clark, David; Cerreta, Scott; Ozkaynak, Carl; and Rodriguez, Julia A. Granada 07418423 Cl. 705-37.
Nikolich, Mikeljon; and Hoover, David, to United States of America as represented by the Secretary of the Army, The Immunogenic compositions including rough phenotype Brucella host strains and complementation DNA fragments 07416878 Cl. 435-252.3.
Nikon Corporation: See--
Binnard, Michael; Ma, Wen-Hou; Ueta, Toshio; Yang, Pai-Hsueh; Teng, Ting-Chien; and Yuan, Bausan 07417714 Cl. 355-72.
Hoshuyama, Hideo 07418132 Cl. 382-167.
Murakami, Katsuhiko 07417708 Cl. 355-53.
Tsuda, Yutaka 07418153 Cl. 382-266.
Udagawa, Kenji; and Nagahashi, Yoshitomo 07416574 Cl. 55-356.
Niles, Andrew: See--
Riss, Terry L.; Niles, Andrew; and Moravec, Richard A. 07416854 Cl. 435-7.72.
Nilsson, Hakan: See--
Thunwall, Peter; Nilsson, Hakan; and Danielsson, Lennart 07416018 Cl. 165-67.
Nilsson, Malin: See--
Lidgren, Lars; and Nilsson, Malin 07417077 Cl. 523-115.
Nilsson, Tommy: See--
Naslund, Lars Ake; Nilsson, Tommy; Poppi, Luca; Benedetti, Paolo; Eriksson, Anna; and Ferrarini, Filippo 07417239 Cl. 250-492.1.
Ninjouji, Takashi: See--
Manabe, Hiroyuki; Hiraiwa, deceased, Akira; Hayashi, Kouki; Ninjouji, Takashi; and Sugimura, Toshiaki 07418385 Cl. 704-254.
Ninomiya, Takanori: See--
Hamamatsu, Akira; Noguchi, Minori; Ohshima, Yoshimasa; Nishiyama, Hidetoshi; Oka, Kenji; Ninomiya, Takanori; Tanaka, Maki; Watanabe, Kenji; Watanabe, Tetsuya; and Morishige, Yoshio 07417723 Cl. 356-237.2.
Nintendo Co., Ltd.: See--
Smith, Darren C.; Nishizawa, Kenji; McCarten, David J.; Ravanpey, Ramin; and Braun, Russell G. 07417600 Cl. 345-2.1.
Nippa, Satoru; Nakajima, Hiroyoshi; and Atarashi, Kenji, to Sumitomo Chemical Company, Limited Process for producing resin composition using powder of aluminum-containing inorganic compound having specific BET surface area and pore volume and resin composition obtained according to said process 07417087 Cl. 524-437.
Nippon Kayku Kabushiki Kaisha: See--
Fujisawa, Hideyoshi; and Tanaka, Kouichi 07416683 Cl. 252-299.1.
Nippon Oil Corporation: See--
Seki, Takashi; Nakamura, Tooru; and Mazaki, Hitoshi 07416765 Cl. 428-1.1.
Nippon Steel Corporation: See--
Ueda, Kohei; Kanai, Hiroshi; Inoue, Ikuya; and Komatu, Nobukatsu 07416774 Cl. 428-141.
Nipro Corporation: See--
Kai, Toshiya; Katayama, Naohisa; Azuma, Yuko; Yokoe, Junichi; Kida, Yoshinori; Hukutomi, Ippei; Sato, Makoto; Tsuchida, Eishun; Takeoka, Shinji; Komatsu, Teruyuki; Sakai, Hiromi; and So, Keitaro 07417118 Cl. 530-350.
Nirunsuksiri, Wilas: See--
Barbour, Eric; Bing, James Wayne; Cardineau, Guy A.; Cressman, Jr., Robert F.; Gupta, Manju; Hartnett Locke, Mary E.; Hondred, David; Keaschall, Joseph W.; Koziel, Michael G.; Meyer, Terry EuClaire; Moellenbeck, Daniel; Narva, Kenneth Edwin; Nirunsuksiri, Wilas; Ritchie, Steven W.; Rudert, Marjorie L.; Sanders, Craig D.; Shao, Aihua; Stelman, Steven Jeffrey; Stucker, David S.; Tagliani, Laura Ann; and Van Zante, William M. 07417132 Cl. 536-23.1.
Nishi, Hidefumi; to Fujitsu Limited Drawing device and information processing apparatus 07417639 Cl. 345-552.
Nishi, Naoki: See--
Shibayama, Atsufumi; Matsushita, Satoshi; Torii, Sunao; and Nishi, Naoki 07418583 Cl. 712-228.
Nishida, Hiroto; and Hasegawa, Kazunori, to Matsushita Electric Industrial Co., Ltd. Optical pickup device and optical disk record/playback device for reducing the size of the record/playback device 07418723 Cl. 720-662.
Nishida, Katsutoshi: See--
Jo, Manhee; Isobe, Shinichi; Nishida, Katsutoshi; and Okagawa, Takatoshi 07417969 Cl. 370-331.
Nishida, Mitsutaka; Minamishin, Hayato; and Hyodo, Taisuke, to Fujitsu Limited Paper skew correcting device and bill depositing/dispensing apparatus 07416182 Cl. 271-228.
Nishida, Tetsuya: See--
Miyamoto, Makoto; Toda, Tsuyoshi; Ohtake, Masatoshi; Terao, Motoyasu; Ushiyama, Junko; Andoo, Keikichi; Anzai, Yumiko; Hirotsune, Akemi; Nishida, Tetsuya; and Saga, Hideki 07417933 Cl. 369-59.11.
Nishihara, Hidetoshi: See--
Ishida, Tsuyoshi; Takahashi, Yasuhisa; and Nishihara, Hidetoshi 07415756 Cl. 29-598.
Nishihara, Kazunari: See--
Noda, Toshinari; and Nishihara, Kazunari 07417808 Cl. 359-819.
Nishikawa, Koichiro; to Canon Kabushiki Kaisha Optical pickup apparatus including collimator lens with first lens group having negative power and being fixed and second lens group having positive power and being movable 07417938 Cl. 369-112.24.
Nishikawa, Robert M.: See--
Giger, Maryellen L.; Bonta, Ioana; Heimann, Ruth; Nishikawa, Robert M.; and Vyborny, Carl J. 07418123 Cl. 382-132.
Nishikawa, Takashi: See--
Nakamura, Akinari; Ozeki, Masataka; Tanaka, Yoshikazu; and Nishikawa, Takashi 07418315 Cl. 700-296.
Nishikawa, Yasushi: See--
Kaneshiro, Hisayasu; Nishikawa, Yasushi; and Akahori, Kiyokazu 07416695 Cl. 264-494.
Nishimura, Asuka: See--
Ashikari, Motoyuki; Matsuoka, Makoto; Lin, Shaoyang; Yamamoto, Toshio; Nishimura, Asuka; and Takashi, Tomonori 07417180 Cl. 800-295.
Nishimura, Kazuya: See--
Kawamura, Kazuteru; and Nishimura, Kazuya 07418199 Cl. 396-72.
Nishimura, Manabu; Kuroda, Takahiko; Abe, Shuya; Tanaka, Makoto; Irinoda, Mitsugu; and Hashimoto, Kenichiroh, to Ricoh Company, Ltd. Electrostatic actuator formed by a semiconductor manufacturing process 07416281 Cl. 347-54.
Nishimura, Yoshiteru; and Tanjo, Toru, to Seiko Epson Corporation Image forming apparatus 07418233 Cl. 399-381.
Nishina, Mitsuhiro; Suzuki, Yuji; and Gouda, Hideaki, to Nissan Diesel Motor Co., Ltd. Gear shift control system of hybrid vehicle 07416511 Cl. 477-5.
Nishioka, Takeshi: See--
Matsui, Yukiteru; Hirasawa, Shinichi; Shigeta, Atsushi; Miyano, Kiyotaka; Nishioka, Takeshi; and Yano, Hiroyuki 07416942 Cl. 438-257.
Nishira, Hikaru; and Kawabe, Taketoshi, to Nissan Motor Co., Ltd. Model predictive control apparatus 07418372 Cl. 703-2.
Nishiura, Takayuki: See--
Ishibashi, Keiji; Kaji, Tokiko; Nakahata, Seiji; and Nishiura, Takayuki 07416604 Cl. 117-89.
Nishiyama, Eiji: See--
Enoki, Tatsui; Sagawa, Hiroaki; Tominaga, Takanari; Nishiyama, Eiji; Koyama, Nobuto; Sakai, Takeshi; Yu, Fu-Gong; Ikai, Katsushige; and Kato, Ikunoshin 07417031 Cl. 514-23.
Nishiyama, Hidetoshi: See--
Hamamatsu, Akira; Noguchi, Minori; Ohshima, Yoshimasa; Nishiyama, Hidetoshi; Oka, Kenji; Ninomiya, Takanori; Tanaka, Maki; Watanabe, Kenji; Watanabe, Tetsuya; and Morishige, Yoshio 07417723 Cl. 356-237.2.
Uto, Sachio; Noguchi, Minori; Nishiyama, Hidetoshi; Ohshima, Yoshimasa; Hamamatsu, Akira; Jingu, Takahiro; Nakata, Toshihiko; and Watanabe, Masahiro 07417721 Cl. 356-237.2.
Nishiyama, Nobumasa: See--
Contreras, John; Ikeda, Takashi; Nagano, Yumi; Nishiyama, Nobumasa; Ohsawa, Toyomi; and Suk, Mike 07417209 Cl. 219-606.
Nishiyama, Shigeki; to Kabushiki Kaisha Toshiba Electronic apparatus 07416441 Cl. 439-529.
Nishizawa, Gouichi: See--
Chou, Tsutomu; Nishizawa, Gouichi; Hatakeyama, Masatoshi; and Ishizaka, Chikara 07416613 Cl. 148-103.
Nishizawa, Hirotaka; Higuchi, Akira; Osawa, Kenji; Osako, Junichiro; and Wada, Tamaki, to Renesas Technology Corp. IC card 07416133 Cl. 235-492.
Nishizawa, Kenji: See--
Smith, Darren C.; Nishizawa, Kenji; McCarten, David J.; Ravanpey, Ramin; and Braun, Russell G. 07417600 Cl. 345-2.1.
Nishizawa, Makoto: See--
Koike, Jun; Miyauchi, Takaki; Nishizawa, Makoto; and Muroi, Nobuyuki 07416403 Cl. 425-589.
Nishizawa, Mikio: See--
Matsuzaki, Koichi; Seki, Toshihito; Matsushita, Masanori; Tahashi, Yoshiya; Furukawa, Fukiko; Sugano, Yasushi; Mori, Shigeo; Yamagata, Hideo; Yoshida, Katsunori; Nishizawa, Mikio; Fujisawa, Junichi; and Inoue, deceased, Kyoichi 07417124 Cl. 530-387.1.
Nishu, Keisuke: See--
Kanda, Yuichi; Abe, Takashi; Tanaka, Atsushi; and Nishu, Keisuke 07416763 Cl. 427-402.
Nissan Diesel Motor Co., Ltd.: See--
Nishina, Mitsuhiro; Suzuki, Yuji; and Gouda, Hideaki 07416511 Cl. 477-5.
Nissan Motor Co., Ltd.: See--
Iriyama, Masahiro; and Maekawa, Takuya 07416515 Cl. 477-107.
Matsuki, Yoshitaka; Osada, Naoki; Fujita, Hidehiro; Yuuya, Masahiko; Mitsuhori, Atsushi; Yanai, Tadanori; Katayama, Takatsugu; and Hamane, Shouta 07415955 Cl. 123-179.5.
Nishira, Hikaru; and Kawabe, Taketoshi 07418372 Cl. 703-2.
Sera, Manabu 07417562 Cl. 340-995.13.
Nissan Technical Center North America, Inc.: See--
Tier, Matthew C.; and Thorson, Jason S. 07416232 Cl. 293-117.
Nisshinbo Industries, Inc: See--
Yokoyama, Kozo; and Sakaguchi, Ryoichi 07416476 Cl. 451-58.
Nitta Moore Company: See--
Sawada, Kazunori 07417189 Cl. 174-88R.
Nitto Denko Corporation: See--
Naito, Toshiki; and Yamazaki, Hiroshi 07417316 Cl. 257-750.
Nitz, Larry T.: See--
Holmes, Alan G.; Schmidt, Michael R.; Klemen, Donald; and Nitz, Larry T. 07416501 Cl. 475-5.
Niwa, Motohiro: See--
Kanada, Takayuki; Kataoka, Yasuhiro; and Niwa, Motohiro 07416822 Cl. 430-18.
Niyogi, Shanku Shivabrata: See--
Kariv, Shai; Kizer, Geoffrey M.; Kruglick, Emily; Olson, Lance E.; Christensen, Erik B.; Wolf, Kenneth D.; Robsman, Dmitry; and Niyogi, Shanku Shivabrata 07418719 Cl. 719-330.
Kruglick, Emily; Kizer, Geoffrey M.; Kariv, Shai; Olson, Lance E.; Christensen, Erik B.; Wolf, Kenneth D.; Robsman, Dmitry; and Niyogi, Shanku Shivabrata 07418709 Cl. 719-313.
Kruglick, Emily; Kizer, Geoffrey M.; Kariv, Shai; Olson, Lance E.; Christensen, Erik B.; Wolf, Kenneth D.; Robsman, Dmitry; and Niyogi, Shanku Shivabrata 07418712 Cl. 719-314.
Noatak Software LLC: See--
Berg, Mitchell T. 07418522 Cl. 709-250.
Nobel, Gary M; Nakano, Bradley Y.; Wee, Daniel; and Hulan, Gregory T, to Hewlett-Packard Development Company, L.P. Securely transferring user data using first and second communication media 07418101 Cl. 380-243.
Noble, Mark D. Float fishing apparatus 07415792 Cl. 43-42.31.
Nobori, Kazuhiro: See--
Matsuda, Hiroto; Nobori, Kazuhiro; Imai, Yasuyoshi; and Kawajiri, Tetsuya 07416793 Cl. 428-701.
Noda, Junzoh: See--
Aratani, Masanori; Iihara, Yasuhiro; Kudoh, Masaki; Noda, Junzoh; and Shimizu, Masahiro 07417816 Cl. 360-53.
Noda, Kouta: See--
Hirose, Naohiro; Noda, Kouta; Segawa, Hiroshi; En, Honjin; Tsukada, Kiyotaka; Ishida, Naoto; Asano, Kouji; and Shouda, Atsushi 07415761 Cl. 29-852.
Noda, Toshinari; and Nishihara, Kazunari, to Matsushita Electric Industrial Co., Ltd. Lens unit 07417808 Cl. 359-819.
Noel, Matt: See--
Sandoval, John; Noel, Matt; and Wang, Eugene 07417986 Cl. 370-381.
Noeske, Ingo; Weckbecker, Alfons; and Beckmann, Axel, to Terex Demag GmbH Hoisting-cable drive comprising a single bottom-hook block and two winches 07416169 Cl. 254-275.
Nogami, Shingo: See--
Banju, Kazuo; Kudo, Masahiro; Nogami, Shingo; Kogasaka, Takahiro; Morita, Kazuo; and Irie, Masayuki 07417665 Cl. 348-58.
Noguchi, Junichi: See--
Motoyama, Hajime; Kaji, Hajime; Yamada, Naoto; Yamazaki, Yoshitaka; Noguchi, Junichi; Kawakami, Takayuki; Ogawara, Satoshi; Oka, Yushi; and Mori, Akihito 07417660 Cl. 347-252.
Noguchi, Kazunari: See--
Nakamura, Tomoki; Noguchi, Kazunari; and Kaneko, Yoshiyuki 07417365 Cl. 313-495.
Noguchi, Minori: See--
Hamamatsu, Akira; Noguchi, Minori; Ohshima, Yoshimasa; Nishiyama, Hidetoshi; Oka, Kenji; Ninomiya, Takanori; Tanaka, Maki; Watanabe, Kenji; Watanabe, Tetsuya; and Morishige, Yoshio 07417723 Cl. 356-237.2.
Ishimaru, Ichiro; Noguchi, Minori; Moriyama, Ichiro; Tanabe, Yoshikazu; Yatsugake, Yasuo; Kenbou, Yukio; Watanabe, Kenji; and Tsuchiyama, Hirofumi 07417244 Cl. 250-559.46.
Uto, Sachio; Noguchi, Minori; Nishiyama, Hidetoshi; Ohshima, Yoshimasa; Hamamatsu, Akira; Jingu, Takahiro; Nakata, Toshihiko; and Watanabe, Masahiro 07417721 Cl. 356-237.2.
Noguchi, Takashi; Xianyu, Wenxu; and Yin, Huaxiang, to Samsung Electronics Co., Ltd. Organic light emitting display with single crystalline silicon TFT and method of fabricating the same 07416924 Cl. 438-149.
Noji, Nobuharu: See--
Nakasuji, Mamoru; Noji, Nobuharu; Satake, Tohru; Kimba, Toshifumi; Sobukawa, Hirosi; Karimata, Tsutomu; Oowada, Shin; Yoshikawa, Shoji; and Saito, Mutsumi 07417236 Cl. 250-440.11.
Nojiri, Masayoshi: See--
Koide, Teruhiko; Nojiri, Masayoshi; and Muto, Koji 07416149 Cl. 242-374.
Nokia Corporation: See--
Eriksson, Timo; and Hashizume, Kenichi 07418278 Cl. 455-575.1.
Greuet, Jean-Baptiste; Shen, Haoye; Sobczak, Peter; and Khatam, Bahman 07418106 Cl. 381-331.
Juntunen, Esa 07418259 Cl. 455-418.
Kåll, Jan; Muhonen, Ahti; and Mulligan, Michael 07418256 Cl. 455-411.
Koskelainen, Petri; and Vainikainen, Mikko 07418509 Cl. 709-229.
Paatero, Lauri; and Kiiveri, Antti 07418593 Cl. 713-166.
Payrits, Szabolcs 07418485 Cl. 709-220.
Ryynänen, Matti Kullervo 07417620 Cl. 345-156.
Sjöblom, Kai 07417948 Cl. 370-229.
Tolonen, Pertti; and Koli, Kimmo 07417564 Cl. 341-22.
Wright, Antti; Juvonen, Anne; and Kalevo, Ossi 07417673 Cl. 348-240.1.
Nokia Siemens Networks GmbH & Co. KG: See--
Dillinger, Markus; Schindler, Juergen; and Schulz, Egon 07417972 Cl. 370-332.
Nokia Siemens Networks Oy: See--
Eronen, Pasi; Haverinen, Henry; and Nyberg, Kaisa 07418595 Cl. 713-168.
Noma, Takashi; Kobayashi, Toyoko; Motoi, Taiko; Takase, Hiromitsu; Miura, Naoko; and Kobayashi, Shin, to Canon Kabushiki Kaisha Glass substrate processing method and material removal process using x-ray fluorescence 07416462 Cl. 445-2.
Noma, Takashi; and Takemura, Hiroshi, to Murata Manufacturing Co., Ltd. Ripple converter 07417413 Cl. 323-285.
Nomura, Fumihiko: See--
Miyoshi, Keisuke; Tomonou, Kazunori; Murayama, Takeshi; Nomura, Fumihiko; Utsumi, Hiroyuki; Hiura, Tetsuo; and Yamamoto, Katsuhiko 07415909 Cl. 74-560.
Nomura, Ryoji: See--
Takasu, Takako; Seo, Satoshi; and Nomura, Ryoji 07416465 Cl. 445-24.
Nomura, Tohru; Shimoide, Yoshihiro; Shiraishi, Yoshihiko; Kamimura, Rikiya; and Kasugai, Hiroshi, to Denso Corporation Thick film circuit board, method of producing the same and integrated circuit device 07417318 Cl. 257-774.
Nomura, Yujiro: See--
Kawada, Kunihiro; Nomura, Yujiro; and Ikuma, Ken 07417651 Cl. 347-116.
Nonaka, Manabu; and Dohki, Yohzoh, to Ricoh Company, Ltd. Method and apparatus for image forming 07418235 Cl. 399-401.
Nonnenmacher, Klaus; and Rohrbach, Guido, to Anseros Klaus Nonnenmacher GmbH Deozonating device with integrated heat exchanger 07416713 Cl. 423-219.
Noor, Halim Md: See--
Chou, Chih-Hsiang; Reddy, Janardhana; Tam, Wee Sin; Lai, Poh Yoke; Noor, Halim Md; and Ow, Sin Ming 07417978 Cl. 370-352.
Norair, John P.: See--
Lerch, John W.; Girvin, Joshua M.; and Norair, John P. 07417541 Cl. 340-539.31.
Nordby, David: See--
Johnson, Noel R.; Titel, Luke A.; Cable, Nicholas; Holl, Wendell J.; Endres, Donald J.; Nordby, David; and Mikelsons, Andi J. 07416479 Cl. 452-51.
Noritake Co., Limited: See--
Ooshima, Hidenori; Sato, Fuyutoshi; and Kubota, Shunichi 07416685 Cl. 252-301.4F.
Norman, Vernon R.: See--
Schmatz, Martin; Cranford, Hayden C.; and Norman, Vernon R. 07418069 Cl. 375-355.
Norman, Vernon Roberts: See--
Carballo, Juan Antonio; Cranford, Jr., Hayden Clavie; Nicholls, Gareth John; Norman, Vernon Roberts; and Schuh, Brian Joel 07418032 Cl. 375-227.
Norris, Derek J.: See--
Fink, Brian E.; Gavai, Ashvinikumar V.; Vite, Gregory D.; Han, Wen-Ching; Misra, Raj N.; Xiao, Hai-Yun; Norris, Derek J.; and Tokarski, John S. 07417040 Cl. 514-183.
Norris, James R.: See--
Braun, John F.; Rojas, John W.; Norris, James R.; Coffy, Jean-Hiram; Parkos, Arthur; Leung, Alan; and Leung, Wendy Chui Fen 07417773 Cl. 358-403.
Norris, Larry: See--
Downes, Stuart D.; Liang, Jin; and Norris, Larry 07416106 Cl. 228-180.21.
Nortel Networks Limited: See--
Bontu, Chandra 07418212 Cl. 398-202.
Chavali, Srikanth 07418519 Cl. 709-242.
Edwards, Keith Russell 07418269 Cl. 455-522.
Rabie, Sameh; Magd, Osama Aboul; Abdullah, Bashar; and Barka, Baghdad 07417995 Cl. 370-401.
Sylvain, Dany 07418091 Cl. 379-215.01.
North, Angus John: See--
Silverbrook, Kia; and North, Angus John 07416284 Cl. 347-54.
North, David D.; to Siemens Power Generation, Inc. Multidirectionally compliant fastening system 07416362 Cl. 403-30.
Northcott, Malcolm J.; and Graves, J. Elon, to AOptix Technologies, Inc. Iris imaging using reflection from the eye 07418115 Cl. 382-117.
Northrop Grumman Corporation: See--
Ax, Jr., George R.; and Sherman, Neil Z. 07417210 Cl. 250-201.1.
Goutzoulis, Akis; Goodell, John B.; and Willis, Gervase J. 07416352 Cl. 385-89.
Jacobson, Rena Y.; Gupta, Tapan K.; Fisher, III, John S.; and Curbean, Andrea 07416630 Cl. 156-253.
Northstar Industries, Inc.: See--
Haustein, Mark; and Schaecher, Ryan 07416075 Cl. 198-812.
NorthTech Workholding: See--
Luschei, Shawn; Hastert, Spencer; Winard, Tim; and Wang, Peter 07415766 Cl. 29-894.3.
Norton, Philip: See--
Bell, David R.; and Norton, Philip 07418342 Cl. 701-213.
Nose, Atsushi; Aoyama, Koji; Kurata, Tohru; and Wada, Kimitaka, to Sony Corporation Image processing method, image processing apparatus and image pickup apparatus and display apparatus suitable for the application of image processing method 07418155 Cl. 382-275.
Nouma, Toshiyuki: See--
Fujihara, Toyoki; Takeda, Kazuhisa; Kitao, Hideki; Ikemachi, Takaaki; Nouma, Toshiyuki; and Nakanishi, Naoya 07416813 Cl. 429-231.1.
Nova R&D, Inc.: See--
Tümer, Tümay O.; and Visser, Gerard 07417472 Cl. 327-70.
Novartis AG: See--
Murray, Lesley J; and Young, Judy C 07416887 Cl. 435-325.
Novartis Vaccines and Diagnostics, Inc.: See--
Fraser, Claire; Galeotti, Cesira; Grandi, Guido; Hickey, Erin; Masignani, Vega; Mora, Marirosa; Petersen, Jeremy; Pizza, Mariagrazia; Rappuoli, Rino; Ratti, Giulio; Scarlato, Vincenzo; Scarselli, Maria; Tettelin, Herve; and Venter, J. Craig 07417114 Cl. 530-350.
Novatek Microelectronics Corp.: See--
Yen, Chih-Jen; and Cheng, Chiu-Hung 07417415 Cl. 323-316.
Novellus Systems, Inc.: See--
Liu, Xinye; Collins, Joshua; and Ashtiani, Kaihan A. 07416989 Cl. 438-706.
Uzoh, Cyprian E.; Basol, Bulent M.; Wang, Hung-Ming; and Talieh, Homayoun 07416975 Cl. 438-652.
Novik, Lev: See--
Sanghvi, Ashvinkumar J.; Hance, Howard M.; Novik, Lev; and Kagalwala, Raxit A. 07418489 Cl. 709-223.
Novo Nordisk Healthcare A/G: See--
Persson, Egon; and Olsen, Ole Hvilsted 07416861 Cl. 435-69.1.
Novo Nordisk HelathCare A/G: See--
Persson, Egon; and Olsen, Ole Hvilsted 07416860 Cl. 435-69.1.
Nowak, Edward J.: See--
Anderson, Brent A.; Clark, Jr., William F.; and Nowak, Edward J. 07416941 Cl. 438-257.
Nowak, Edward Zbygniew: See--
Brown, Malcolm David; Mulroy, Louise; and Nowak, Edward Zbygniew 07416543 Cl. 604-332.
Nozaki, Koji; and Kozawa, Miwa, to Fujitsu Limited Resist pattern-improving material and a method for preparing a resist pattern by using the same 07416837 Cl. 430-314.
Nozawa, Toshihide: See--
Watanabe, Masahito; Miyajima, Toru; Mihara, Shinichi; Miyauchi, Yuji; Nozawa, Toshihide; and Goto, Hisashi 07417684 Cl. 348-363.
Nozawa, Yutaka: See--
Mabuchi, Tomoki; Nozawa, Yutaka; and Asai, Eiji 07416052 Cl. 181-272.
Nozoe, Mari: See--
Shinada, Hiroyuki; Nozoe, Mari; Yoda, Haruo; Ando, Kimiaki; Kuroda, Katsuhiro; Kaneko, Yutaka; Tanaka, Maki; Maeda, Shunji; Kubota, Hitoshi; Sugimoto, Aritoshi; Sugiyama, Katsuya; Takafuji, Atsuko; Yajima, Yusuke; Tooyama, Hiroshi; Ino, Tadao; Hiroi, Takashi; Yoshimura, Kazushi; and Usami, Yasutsugu 07417444 Cl. 324-751.
Nozu, Ryutaro: See--
Higashi, Yoji; and Nozu, Ryutaro 07417845 Cl. 361-502.
NPL Associates: See--
Luo, Nie; and Miley, George 07417356 Cl. 310-301.
NSK Ltd.: See--
Ohata, Toshihisa; and Ishiguro, Hiroshi 07416343 Cl. 384-484.
Shoda, Akihiro; and Yamada, Yasuhisa 07416216 Cl. 280-775.
Takemura, Hiromichi; and Sato, Masanao 07416346 Cl. 384-564.
Yamada, Yasuhisa 07416199 Cl. 280-93.502.
NTT DoCoMo, Inc.: See--
Chen, Lan; Kayama, Hidetoshi; and Umeda, Narumi 07417963 Cl. 370-311.
Jeong, Moo Ryong; Watanabe, Fujio; and Kawahara, Toshiro 07417971 Cl. 370-331.
Jo, Manhee; Isobe, Shinichi; Nishida, Katsutoshi; and Okagawa, Takatoshi 07417969 Cl. 370-331.
Maeda, Koji; Fukumoto, Satoru; and Yoshino, Hitoshi 07418248 Cl. 455-203.
Manabe, Hiroyuki; Hiraiwa, deceased, Akira; Hayashi, Kouki; Ninjouji, Takashi; and Sugimura, Toshiaki 07418385 Cl. 704-254.
Suzuki, Yasunori; Mizuta, Shinji; and Yamao, Yasushi 07418056 Cl. 375-296.
Nuovo, Frank; and Hutchison, Mark, to Vertu Limited Casing for portable communication device 07418282 Cl. 455-575.8.
Nutech 03, Inc.: See--
van Leeuwen, Johannes; Jennings, Michael D.; Mueller, Richard A.; and Robinson, Jack H. 07416660 Cl. 210-192.
Nuutinen, Esa: See--
Itkonen, Ismo; Korhonen, Tapio; Laukkanen, Risto; Nuutinen, Esa; Pitkänen, Juha; Rasimus, Heikki; Rasimus, Seppo; Silvennoinen, Timo; and Ulvinen, Veli 07415814 Cl. 53-465.
NVIDIA Corporation: See--
Donham, Christopher D. S.; and Montrym, John S. 07417637 Cl. 345-506.
Holmer, Bruce 07418606 Cl. 713-320.
Lindholm, John E.; and Coon, Brett W. 07418576 Cl. 712-214.
Reed, David G. 07418537 Cl. 710-310.
NXP B.V.: See--
Halberstadt, Johan Christiaan 07417876 Cl. 363-21.12.
Hendriks, Antonius Maria Petrus Johannes; Guelen, Josephus Franciscus Antonius Maria; and Dormans, Guido Jozef Maria 07416939 Cl. 438-257.
Ponomarev, Youri 07416957 Cl. 438-455.
Ungermann, Jörn; Fuhrmann, Peter; and Zinke, Manfred 07418650 Cl. 714-798.
Wendt, Matthias 07417421 Cl. 324-207.25.
Nyberg, Kaisa: See--
Eronen, Pasi; Haverinen, Henry; and Nyberg, Kaisa 07418595 Cl. 713-168.
Nyman, William; Bourget, Randy; Linnersten, Staffan; and White, Donald H., to Donaldsom Company, Inc. Filter assemblies and systems for intake air for fuel cells 07416580 Cl. 95-90.