X-Sender: zhang@mail.nist.gov Date: Thu, 06 Sep 2001 16:45:14 -0400 To: alan.heckert@nist.gov From: Nien Fan Zhang Subject: Fwd: Bayesian metrology for next year Mime-Version: 1.0 Alan, this belongs to the future projects. Thanks. >Date: Thu, 6 Sep 2001 16:31:33 -0400 (EDT) >From: Hung-kung Liu >Reply-To: Hung-kung Liu >Subject: Bayesian metrology for next year >To: zhang@nist.gov >X-Mailer: dtmail 1.3.0 @(#)CDE Version 1.4.2 SunOS 5.8 sun4u sparc > >Nien Fan, > >Here is our proposal for next year. > >Hung-kung > >----------------------------------------------------------------- >Performance Comparison of Solutions to Combining Results >from Multiple Methods > >Hung-kung Liu & Nien Fan Zhang > >The problem of determining a consensus mean and its >uncertainty from the results of multiple measurement >methods or laboratories is an important NIST problem. >Many solutions, both Bayesian and non-Bayesian, to this >problem have been proposed over the years, including >those developed by SED. However, objective performance >comparisons of the proposed solutions have not been >studied. In this work, we will examine desirable >criteria for comparison, and use them to compare the >existing solutions. Nien Fan Zhang Statistical Engineering Division Information Technology Laboratory National Institute of Standards and Technology 100 Bureau Dr, Stop 8980 Gaithersburg, MD 20899-8980 Voice: (301) 975-2842 Fax: (301) 990-4127 Email: zhang@nist.gov