X-Sender: zhang@mail.nist.gov Date: Fri, 14 Sep 2001 16:00:58 -0400 To: alan.heckert@nist.gov From: Nien Fan Zhang Subject: Fwd: Customers Web Page Entry for Semiconductor Industry Mime-Version: 1.0 Alan, this is from Will. Thanks. >Date: Fri, 14 Sep 2001 15:52:35 -0400 >From: Will Guthrie >Organization: National Institute of Standards & Technology (NIST) >X-Mailer: Mozilla 4.76 [en] (Win98; U) >X-Accept-Language: en,pdf >To: nien-fan.zhang@nist.gov >Subject: Customers Web Page Entry for Semiconductor Industry > >Nien-Fan, > >Here is the entry for the "Customers" web page for the semiconductor industry: > >International SEMATECH Member Companies and other industries - > >Material on design and analysis of experiments for assessing product >reliability using Bayesian methods is included in the NIST/SEMATECH >Engineering Statistics Internet Handbook available on the World-Wide Web. >These methods often offer more efficient experiment designs than other >statistical methods do, reducing testing time for product reliability >assessments and therefore cutting product costs. > >Cheers, >Will > > >-- > >Will Guthrie >National Institute of Standards & Technology (NIST) >Statistical Engineering Division >100 Bureau Drive, Stop 8980 >Gaithersburg, MD 20899-8980 USA > >Email: will.guthrie@nist.gov >Phone: 301-975-2854 >Fax: 301-990-4127 Nien Fan Zhang Statistical Engineering Division Information Technology Laboratory National Institute of Standards and Technology 100 Bureau Dr, Stop 8980 Gaithersburg, MD 20899-8980 Voice: (301) 975-2842 Fax: (301) 990-4127 Email: zhang@nist.gov