Energy Citations Database

Bibliographic Citation

 
Document
For copies of Journal Articles, please contact the Publisher or your local public or university library and refer to the information in the Resource Relation field.
For copies of other documents, please see the Availability, Publisher, Research Organization, Resource Relation and/or Author (affiliation information) fields and/or Document Availability.
DOI http://dx.doi.org/10.1063/1.119975
Title Self-texturing of nitrogenated amorphous carbon thin films for electron field emission
Creator/Author Silva, S.R. [Department of Electronic and Electrical Engineering, University of Surrey, Guildford, Surrey GU2 5XH (United Kingdom)] ; Amaratunga, G.A. [Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool L69 3BX (United Kingdom)] ; Barnes, J.R. [Department of Engineering, University of Cambridge, Trumpington Street, Cambridge CB2 1PZ (United Kingdom)]
Publication Date1997 Sep 01
OSTI IdentifierOSTI ID: 542127
Other Number(s)APPLAB; ISSN 0003-6951
Resource TypeJournal Article
Resource RelationApplied Physics Letters ; VOL. 71 ; ISSUE: 11 ; PBD: Sep 1997
Subject36 MATERIALS SCIENCE ;66 PHYSICS ; CARBON; ELECTRON EMISSION; HYDROGEN; NITROGEN; STOICHIOMETRY; CURRENT DENSITY; FIELD EMISSION; AMORPHOUS STATE; NITROGEN ADDITIONS; TEXTURE; THIN FILMS; CATHODES; CHEMICAL VAPOR DEPOSITION
Description/Abstract The electron field-emission process for nitrogenated amorphous carbon (a-C:H:N) thin films deposited using a magnetically confined hydrocarbon plasma is examined. The morphology of the films obtained using an atomic force microscope is compared to the field-emission properties. Beyond a chemical composition of 14 at.{percent} nitrogen, the mirror smooth a-C:H:N films become self-texturing, and multiple{open_quotes}domelike{close_quotes} cathodes of nanometer scale are observed. The dimensions of these{open_quotes}domelike{close_quotes} cathodes varies with time, and after a 15 min deposition have dimensions of approximately 50 nm base diameter and 20 nm in height. When the electronic field emission of these textured films (N content 15 at.{percent}) are measured, there is an enhancement in the emitted current density of{approximately}2 orders of magnitude at an electric field of 20V/{mu}m, in comparison to the untextured films with a nitrogen content of 11 at.{percent}.{copyright}{ital 1997 American Institute of Physics.}
Country of PublicationUnited States
LanguageEnglish
Formatpp. 1477-1479 ; PL:
System Entry Date2001 May 05

Top