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F. E. Nicodemus, J. C. Richmond, J. J. Hsia, I. W. Ginsber, and T. Limperis, "Geometrical Considerations and Nomenclature for Reflectance," (5.33 MB) , NBS Monograph 160, U. S. Dept. of Commerce (1977).
P. Y. Barnes, E. A. Early, and A. C. Parr, "NIST Measurement Services: Spectral Reflectance," (14.7 MB) ,
NIST Special Publication
250-48, U. S. Dept. of Commerce (1998).
Publications with an * are included in the appendicies section of this document. * J. E. Proctor and P. Y. Barnes, " NIST High Accuracy Reference Reflectometer-Spectrophotometer," (97.4 KB) , J. Res. Natl. Inst.
Stand. Technol. 101, 619-627 (1996).
J. J. Hsia, "Optical Radiation Measurements: The Translucent Blurring Effect - Method of Evaluation and Estimation," NBS Tech. Note 594-12, U. S. Dept. of Commerce (1976). * W. H. Venable, Jr., J. J. Hsia, and V. R. Weidner, "Establishing a Scale of Directional-Hemispherical Reflectance Factor I: The Van den Akker Method," (3.48 MB) , J. Res. Natl. Bur. Stand. 82, 29-55 (1977).
* V. R. Weidner and J. J. Hsia, "Reflection Properties of Pressed Polytetrafluoroethylene Powder," (882 KB) , J. Opt. Soc. Am. 71,
856-861 (1981).
* P. Y. Barnes and J. J. Hsia, "45°/0° Reflectance Factors of Pressed Polytetrafluoroethylene (PTFE) Powder," (1.79 MB) , NIST Tech.
Note 1413, U. S. Dept. of Commerce (1995).
K. L. Eckerle, J. J. Hsia, K. D. Mielenz, and V. R. Weidner, "NBS Measurement Services: Regular Spectral Transmittance," NBS Special Publication 250-6, U. S. Dept. of Commerce (1987). K. S. Gibson and M. A. Belknap, "Permanence of Glass Standards of Spectral Transmittance," J. Res. Natl. Bur. Stand. 44, 463-473 (1950). H. J. Keegan, J. C. Schleter, and M. A. Belknap, "Recalibration of the NBS Glass Standards of Spectral Transmittance," J. Res. Natl. Bur. Stand. 67A, 577-584 (1963). K. D. Mielenz, "Physical Parameters in High-Accuracy Spectrophotometry," NBS Special Publication 378, 81-93 (1973). K. L. Eckerle, E. Sutter, G. H. C. Freeman, G. Andor, and L. Fillinger, "International Intercomparison of Regular Transmittance Scales," Metrologia 27, 33-38 (1990). K. L. Eckerle, J. Bastie, J. Zwinkels, V. Saprintsky, and A. Ulyanov, "Compliance in Comparison of Regular Transmittance Scales of Four National Standardizing Laboratories," Color Res. Appl. 18, 35-40 (1993). S. G. Kaplan, L. M. Hanssen, E. A. Early, M. E. Nadal, and D. Allen, "Comparison of Near-Infrared Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers," Metrologia 39, 157-164 (2002). H. J. Keegan, J. C. Schleter, and V. R. Weidner, "Ultraviolet Wavelength Standard for Spectrophotometry," J. Opt. Soc. Am. 51, 1470 (1961). W. H. Venable and K. L. Eckerle, "Standard Reference Materials: Didymium Glass Filters for Calibrating the Wavelength Scale of Spectrophotometers - SRM 2009, 2010, 2013, and 2014," NBS Special Publication 260-66, U. S. Dept. of Commerce (1979). * V. R. Weidner, P. Y. Barnes, and K. L. Eckerle, "A Wavelength Standard for the Near Infrared Based on the Reflectance of Rare-Earth Oxides," (1.42 MB) , J. Res. Natl. Bur. Stand. 91, 243-253 (1986).
E. A. Early, T. R. O'Brian, R. D. Saunders, and A. C. Parr, "Standard Reference Materials: Film Step Tablet Standards of Diffuse Visual Transmission Density - SRM 1001 and SRM 1008," NIST Special Publication 260-135, U. S. Dept. of Commerce (1998). E. A. Early, C. L. Cromer, X. Xiong, D. J. Dummer, T. R. O'Brian, and A. C. Parr, "NIST Reference Densitometer for Visual Diffuse Transmission Density", J. Imag. Sci. and Technol. 43, 388-397 (1999). E. Buhr, D. Bergmann, E. A. Early, and T. R. O'Brian, "Intercomparison of Visual Diffuse Transmission Density," J. Imag. Sci. and Technol. 44, 156-159 (2000).
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