LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 2nd DAY OF December, 2008
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
N.S. - Lin International Co., Ltd.: See--
N.V. Organon: See--
Wan, Min; and Ropp, Phillip
07459425 Cl. 514-2.
Na, Ki-Su: See--
Lee, Sang-Hoon; Leam, Hun-Hyeoung; Lee, Jai-Dong; Kim, Jung-Hwan; You, Young-Sub; Na, Ki-Su; Lee, Woong; Lee, Yong-Sun; and Jang, Won-Jun
07459364 Cl. 438-257.
Nabtesco Corporation: See--
Koizumi, Takashi; and Kamimura, Toshio
07458212 Cl. 60-461.
Nacson, Sabatino; and Gibbons, Duncan, to Smiths Detection Inc. Article scanner
07458283 Cl. 73-863.12.
Nadler, Lee M.: See--
Freeman, Gordon J.; Nadler, Lee M.; and Gray, Gary S.
07459544 Cl. 536-23.5.
Naftali, Ron: See--
Goldberg, Boris; and Naftali, Ron
07460221 Cl. 356-237.4.
Nagae, Masayoshi: See--
Kitamura, Satoshi; and Nagae, Masayoshi
07459857 Cl. 315-78.
Nagahara, Atsushi: See--
Kayahara, Naoki; and Nagahara, Atsushi
07460708 Cl. 382-176.
Nagahashi, Haruki; to Elpida Memory, Inc. Heat radiation device for memory module
07460373 Cl. 361-704.
Nagahashi, Toshinori; and Hyuga, Takashi, to Seiko Epson Corporation Head-top detecting method, head-top detecting system and a head-top detecting program for a human face
07460705 Cl. 382-165.
Nagai, Hiroshi; and Ikeno, Hidenori, to NEC LCD Technologies, Ltd. IPS LCD device having a wider viewing angle
07460198 Cl. 349-117.
Nagai, Hiroyasu; Toki, Masahiro; Misumi, Kenji; and Kotani, Hideto, to Panasonic Corporation Nonvolatile semiconductor memory device and programming or erasing method therefor
07460410 Cl. 365-185.28.
Nagamochi, Katsuya: See--
Kamisuwa, Yoshikatsu; and Nagamochi, Katsuya
07460807 Cl. 399-81.
Nagamura, Mitsutoshi: See--
Kanematsu, Daigoro; Takekoshi, Rie; and Nagamura, Mitsutoshi
07460271 Cl. 358-1.9.
Nagano, Toshihiko: See--
Kawakubo, Takashi; Nagano, Toshihiko; Abe, Kazuhide; and Nishigaki, Michihiko
07459827 Cl. 310-309.
Kawakubo, Takashi; Ohara, Ryoichi; Ono, Tomio; Nagano, Toshihiko; Nishigaki, Michihiko; Yasumoto, Takaaki; Abe, Kazuhide; and Sano, Kenya
07459833 Cl. 310-328.
Nagano, Toshiyuki: See--
Shirakata, Jiro; Nagano, Toshiyuki; and Mori, Hideki
07460809 Cl. 399-92.
Naganuma, Hiroaki; and Kusunoki, Tokuro, to Nisca Corporation Magnet rotor and electromagnetically-driving device using the same, and optical apparatus with light quantity-control device
07459813 Cl. 310-49R.
Nagao, Yuki: See--
Ishikawa, Masanori; Sugita, Jun; Shinohara, Mitsuru; and Nagao, Yuki
07460772 Cl. 396-52.
Nagasako, Shuuya: See--
Yamada, Kenji; Tamura, Masahiro; Suzuki, Nobuyoshi; Saitoh, Hiromoto; Nagasako, Shuuya; Iida, Junichi; Okada, Hiroki; Andoh, Akihito; Kikkawa, Naohiro; and Tokita, Junichi
07458567 Cl. 270-58.07.
Nagasawa, Junichi: See--
Iwano, Kiminori; Komai, Yuji; Suefuji, Kazutaka; Fukui, Koji; Suzuki, Toshitsugu; Nagasawa, Junichi; Sakamoto, Susumu; Hidano, Katsushi; and Komatsu, Kazunari
07458788 Cl. 418-55.5.
Nagase, Toshihiko: See--
Fukuzumi, Yoshiaki; and Nagase, Toshihiko
07459759 Cl. 257-427.
Nagashima, Hiroyuki: See--
Sampe, Atsushi; Kimura, Yoshiyuki; Nagashima, Hiroyuki; Hosokawa, Hiroshi; Murakami, Wakako; and Kuwabara, Nobuo
07460810 Cl. 399-100.
Nagatomo, Hiroaki: See--
Mochizuki, Kouichi; Saito, Kimitaka; and Nagatomo, Hiroaki
07458531 Cl. 239-585.5.
Nagatomo, Takashi; to Sony Corporation Optical disk apparatus
07460442 Cl. 369-30.03.
Nagatsuka, Kazuyoshi; and Tanaka, Nobutomo, to D & M Holdings, Inc. Projector apparatus
07458692 Cl. 353-101.
Nagayama, Kazuo: See--
Irihune, Kazunori; Sasaki, Yasushi; Aoki, Sadayuki; Nagayama, Kazuo; and Ebata, Yuuichi
07458360 Cl. 123-337.
Nagayama, Kohei: See--
Asao, Yasufumi; Mori, Hideo; Nagayama, Kohei; Tanaka, Hironao; and Isobe, Ryuichiro
07460115 Cl. 345-204.
Nagoya, Fujiharu: See--
Koguma, Ichiro; and Nagoya, Fujiharu
07459085 Cl. 210-645.
Nahrwold, Thomas L.: See--
Krisher, James A.; Cooper, Kenneth E.; Nahrwold, Thomas L.; Hunt, Gordon W.; Baxter, Jr., Ralph W.; and Sommer, Randy
07458911 Cl. 475-86.
Nailor, Kristen Elizabeth: See--
Cheung, Mui; Nailor, Kristen Elizabeth; Sammond, Douglas McCord; and Veal, James Marvin
07459455 Cl. 514-252.14.
Naito, Takashi: See--
Yamamoto, Hiroki; Momose, Hideto; Sawai, Yuuichi; and Naito, Takashi
07459194 Cl. 428-64.1.
Najjarine, Abdul: See--
Kielt, Rodney; and Najjarine, Abdul
07458173 Cl. 36-44.
Naka, Hiroyuki: See--
Ohinata, Yusuke; Naka, Hiroyuki; and Sakai, Yuji
07460324 Cl. 360-66.
Naka, Takeshi: See--
Tokumitsu, Atsunori; and Naka, Takeshi
07459895 Cl. 323-316.
Nakadate, Takao: See--
Katou, Hajime; Nakajima, Hikaru; and Nakadate, Takao
07458448 Cl. 188-282.6.
Nakagawa, Goji; to Fujitsu Limited Ring type optical transmission system and optical apparatus connected to same
07460744 Cl. 385-24.
Nakagawa, Jun; to Konica Corporation Image-reading apparatus for reading an image on a document by controlling an index period and a line-thinning rate based on a magnification factor
07460280 Cl. 358-486.
Nakagawa, Mitsuru: See--
Sugimoto, Keiichi; and Nakagawa, Mitsuru
07458823 Cl. 439-76.1.
Nakagawa, Seiichi: See--
Onodera, Ko; Kurimoto, Satoshi; Tozawa, Yoji; and Nakagawa, Seiichi
07458151 Cl. 29-879.
Nakagawa, Takashi; to Fujitsu Limited Printed circuit board and method of manufacturing the same
07458149 Cl. 29-846.
Nakahata, Akinobu: See--
Tanjo, Toru; Nakahata, Akinobu; Fukumoto, Hiroaki; and Yotsuyanagi, Naruya
07460826 Cl. 399-401.
Nakai, Hisao; and Kagamiishi, Yoshifumi, to Ono Pharmaceutical Co., Ltd. Tri-heterocyclic compounds and a pharmaceutical comprising them as an active ingredient
07459459 Cl. 514-267.
Nakajima, Hikaru: See--
Katou, Hajime; Nakajima, Hikaru; and Nakadate, Takao
07458448 Cl. 188-282.6.
Nakajima, Hirofumi; Toyoizumi, Teruhiko; and Yamane, Hideo, to Konica Minolta Business Technologies, Inc. Sheet moisturizing device and image forming apparatus
07460824 Cl. 399-341.
Nakajima, Ken: See--
Kawanishi, Isao; Okada, Miyuki; Sato, Nobuyuki; and Nakajima, Ken
07460728 Cl. 382-274.
Nakajima, Ryohei: See--
Kitamura, Akihiro; and Nakajima, Ryohei
07459268 Cl. 435-4.
Nakajima, Tsutomu: See--
Yamamoto, Kenji; Ogawa, Masahiko; and Nakajima, Tsutomu
07459213 Cl. 428-447.
Nakamori, Masaharu: See--
Tanabe, Kazuya; Tsutsumizaki, Takashi; and Nakamori, Masaharu
07458343 Cl. 123-41.7.
Nakamura, Akio; to Oki Electric Industry Co., Ltd. Manufacturing method of an acceleration sensing device
07459330 Cl. 438-51.
Nakamura, Akio; to Oki Electric Industry Co., Ltd. Semiconductor package containing multi-layered semiconductor chips
07459777 Cl. 257-686.
Nakamura, Atsushi: See--
Shoji, Mamoru; Nakamura, Atsushi; and Ishida, Takashi
07460464 Cl. 369-275.3.
Nakamura, Daisuke; Fujii, Isao; and Wakui, Ken, to Yamaha Marine Kabushiki Kaisha Outboard drive with speed change mechanism
07458866 Cl. 440-75.
Nakamura, Hiroshi: See--
Genda, Satoshi; and Nakamura, Hiroshi
07459378 Cl. 438-463.
Kawakami, Koichi; and Nakamura, Hiroshi
07460427 Cl. 365-225.
Nakamura, Hiroto; to Advantest Corporation Electronic device testing apparatus
07459902 Cl. 324-158.1.
Nakamura, Jirou; Hayashi, Nobuhiro; and Satou, Masanobu, to Daifuku Co., Ltd. Conveying apparatus with lifting/lowering to-be-conveyed object support table
07458455 Cl. 198-463.3.
Nakamura, Kazuhiro: See--
Tanaka, Hiroshi; Machiya, Kanehiro; Sakaguchi, Hironori; Matsubara, Koji; and Nakamura, Kazuhiro
07461300 Cl. 714-43.
Nakamura, Kazuo: See--
Watari, Koji; Nakamura, Kazuo; Sato, Kimiyasu; Kinemuchi, Yoshiaki; Uchimura, Shoji; Ishiguro, Hirohide; and Morimitsu, Hideki
07459178 Cl. 427-180.
Nakamura, Keiichi: See--
Kobayashi, Yutaka; Nakamura, Keiichi; Noro, Yutaka; Kikuchi, Takahiro; and Ishikawa, Yoshiyuki
07458835 Cl. 439-188.
Nakamura, Kentarou: See--
Nomura, Eiji; and Nakamura, Kentarou
07460459 Cl. 369-112.13.
Nakamura, Kojiro; and Shimada, Tadashi, to Calsonic Kansei Corporation Air conditioning system, vehicular air conditioning system and control method of vehicular air conditioning system
07458226 Cl. 62-228.1.
Nakamura, Masahide; and Ikuma, Ken, to Seiko Epson Corporation Developing device, image forming apparatus having the same, and image forming method
07460802 Cl. 399-45.
Nakamura, Michael L.; to Senario, LLC Electronic toy
D0581989 Cl. D21-329.
Nakamura, Mitsuo; to Denso Corporation Signal processing apparatus
07460062 Cl. 342-195.
Nakamura, Naofumi: See--
Yoshizawa, Takahiko; Matsunaga, Noriaki; and Nakamura, Naofumi
07459391 Cl. 438-638.
Nakamura, Shinichi; to Canon Kabushiki Kaisha Field effect type organic transistor and process for production thereof
07459721 Cl. 257-40.
Nakamura, Takehiro: See--
Ishii, Hiroyuki; Imamura, Yoshimasa; Hanaki, Akihito; Nakamura, Takehiro; Tanaka, Shinya; and Usuda, Masafumi
07460474 Cl. 370-230.
Nakamura, Tomonori; to Seiko Epson Corporation Pressure-regulating valve, functional liquid supplying apparatus, imaging apparatus, method of manufacturing electro-optic device, electro-optic device, and electronic apparatus
07458663 Cl. 347-84.
Nakamura, Toshiki; and Ito, Takayuki, to Hoya Corporation Zoom lens system
07460312 Cl. 359-689.
Nakamura, Toshinori: See--
Yoshimine, Takao; Tsutsui, Mototsugu; Sueyoshi, Takahiko; Nakamura, Toshinori; Hanaya, Hiroyuki; and Uchiyama, Nobuyuki
07461018 Cl. 705-27.
Yoshimine, Takao; Tsutsui, Mototsugu; Sueyoshi, Takahiko; Nakamura, Toshinori; Hanaya, Hiroyuki; and Uchiyama, Nobuyuki
07461124 Cl. 709-203.
Nakamura, Yutaka: See--
Imamura, Takahiro; and Nakamura, Yutaka
07459096 Cl. 216-22.
Suzuki, Hiroyuki; Kuroda, Sumio; and Nakamura, Yutaka
07460322 Cl. 360-16.
Nakanishi, Motoi; to Murata Manufacturing Co., Ltd. Radar
07460058 Cl. 342-128.
Nakanishi, Tetsuo: See--
Kashida, Meguru; Miyawaki, Satoru; Nakanishi, Tetsuo; and Aramata, Mikio
07459239 Cl. 429-302.
Nakanishi, Yoshihito: See--
Koike, Tadashi; Mitsunami, Yukiko; Shigeno, Takashi; Andachi, Kazuya; Kato, Hiroyuki; Nakanishi, Yoshihito; and Hachimaru, Izumi
D0582043 Cl. D24-165.
Nakano, Hatsumi: See--
Yamamoto, Hiroyasu; Vithanage, Ananda; Shimizu, Takakuni; Fujita, Kaoru; Nakano, Hatsumi; Shiga, Takaaki; Soga, Ryuji; Katono, Masayoshi; Watanabe, Toshiyuki; and Koibuchi, Misako
07461111 Cl. 708-255.
Nakano, Hiroshi; to Sumitomo Wiring Systems, Ltd. Connector
07458848 Cl. 439-570.
Nakao, Koichi; and Kitagawa, Masahiro, to Roland Corporation Electronic pickup
D0581971 Cl. D17-22.
Nakao, Shuji: See--
Ishibashi, Takeo; Saito, Takayuki; Itoh, Maya; and Nakao, Shuji
07459265 Cl. 430-311.
Nakao, Tomoaki; to Sharp Kabushiki Kaisha Offset adjusting circuit and operational amplifier circuit
07459966 Cl. 330-9.
Nakaoka, Yasushi: See--
Mukaiyama, Masanori; Hanaoka, Masaaki; Nakaoka, Yasushi; and Hisamatsu, Yutaka
07461138 Cl. 709-219.
Nakashima, Yasuhiro: See--
Morioka, Minoru; Nakashima, Yasuhiro; Higuchi, Takayuki; Takahashi, Mitsuo; Yamamoto, Kenji; Sakai, Etuo; and Daimon, Masaki
07459020 Cl. 106-714.
Nakaso, Mariko: See--
Utsumi, Kuniaki; Yamamoto, Hiroaki; Masuda, Kouichi; Niiho, Tsutomu; Nakaso, Mariko; Tanaka, Kazuo; and Sasai, Hiroyuki
07460829 Cl. 455-13.1.
Nakasugi, Tetsuro; Inanami, Ryoichi; Ota, Takumi; and Koshiba, Takeshi, to Kabushiki Kaisha Toshiba Charged particle beam exposure method of character projection system, charged particle beam exposure device of character projection system, program for use in charged particle beam exposure device, and manufacturing method of semiconductor device
07459705 Cl. 250-492.22.
Nakata, Masahiro; to Hoya Corporation Focus detection system
07460779 Cl. 396-96.
Nakata, Yasuhiro: See--
Kudo, Hayami; Kawaguchi, Masahiko; and Nakata, Yasuhiro
07460000 Cl. 336-200.
Nakaya, Hideo: See--
Kondo, Tetsujiro; Nakaya, Hideo; Yamaguchi, Nobuyuki; and Shinmei, Katsuhisa
07460178 Cl. 348-576.
Nakayama, Hideo: See--
Ueno, Osamu; Funada, Masao; Miura, Masaaki; Hamada, Tsutomu; Kyozuka, Shinya; Takanashi, Osamu; Nakayama, Hideo; Sakurai, Jun; and Sakamoto, Akira
07460749 Cl. 385-33.
Nakayama, Hirokatsu: See--
Tanaka, Junichi; Nakayama, Hirokatsu; Yasuda, Naru; and Hosokawa, Hayami
07460747 Cl. 385-31.
Nakayama, Hiroyuki: See--
Moriya, Tsuyoshi; and Nakayama, Hiroyuki
07458247 Cl. 73-28.01.
Nakayama, Koji: See--
Inoue, Masafumi; Nakayama, Koji; and Katsuda, Yoshio
07459168 Cl. 424-406.
Nakayama, Makoto; and Kanamaru, Masahiro, to Yazaki Corporation Structure for housing electrical junction box in housing box
07459631 Cl. 174-50.
Nakayama, Naoki; Wen, Duanzhi; Han, Chun-ya; He, Ching; and Yu, Dongyin, to Amgen Inc. Chordin-like molecules and uses thereof
07459291 Cl. 435-69.1.
Nakayama, Shinichi; and Yokohata, Shizuo, to Hitachi, Ltd. Storage subsystem and storage controller
07461245 Cl. 713-1.
Nakayama, Tadayoshi; to Canon Kabushiki Kaisha Data transform processing apparatus and method
07460729 Cl. 382-276.
Nakayama, Tatsuo; Ando, Yuji; Miyamoto, Hironobu; Kuzuhara, Masaaki; Okamoto, Yasuhiro; Inoue, Takashi; and Hataya, Koji, to NEC Corporation Ohmic electrode structure of nitride semiconductor device
07459788 Cl. 257-761.
Nakayama, Tomonari; Ohnishi, Toshinobu; Kubota, Makoto; and Miura, Daisuke, to Canon Kabushiki Kaisha Substrate, conductive substrate, fine structure substrate, organic field effect transistor and manufacturing method thereof
07459338 Cl. 438-99.
Nakayama, Toshinori: See--
Ai, Ryuta; Ito, Yoshikuni; and Nakayama, Toshinori
07460821 Cl. 399-328.
Nakayama, Yasuhiko: See--
Maeda, Shunji; Nakayama, Yasuhiko; Yoshida, Minoru; Kubota, Hitoshi; and Oka, Kenji
07460220 Cl. 356-237.2.
Nakayasu, Hidetoshi; Mizuno, Yasuhiro; and Hongo, Hideyuki, to Takasago International Corporation Process for purifying menthol
07459587 Cl. 568-829.
Nakazima, Kotaro; to Kyokutoh Co., Ltd Tip dresser
07458139 Cl. 29-33R.
Nakazuru, Toshiro; Okutani, Shigeaki; and Morita, Noboru, to Fujitsu Limited Fourier transform apparatus
07461114 Cl. 708-404.
Nalco Company: See--
Keiser, Bruce A.; and Sherman, Laura M.
07459059 Cl. 162-181.6.
Nambiar, Madhu: See--
Douma, John D.; Laidlaw, John F.; and Nambiar, Madhu
07458291 Cl. 74-388PS.
Nandi, Prabir: See--
Ye, deceased, Yiming; Chung, Jen-Yao; Cohn, David; Heath, III, Fenno F.; Jeng, Jun-Jang; Kumaran, Santhosh; Lei, Hui; and Nandi, Prabir
07461125 Cl. 709-204.
Nanjo, Masatoshi; to Disco Corporation Semiconductor device including semiconductor memory element and method for producing same
07459767 Cl. 257-617.
Nanjundaiah, Prabesh Babu: See--
Ghosh, Kalyan; Jain, Praveen; Subramanian, Shankar; Bhandari, Rajesh; and Nanjundaiah, Prabesh Babu
07460527 Cl. 370-360.
Nanjundaswamy, Kirakodu S.: See--
Totir, Dana Alexa; Nanjundaswamy, Kirakodu S.; and Pozin, Michael
07459237 Cl. 429-224.
Nanu, Florin: See--
Corcoran, Peter; Steinberg, Eran; Petrescu, Stefan; Drimbarean, Alexandru; Nanu, Florin; Pososin, Alexei; and Bigioi, Petronel
07460694 Cl. 382-118.
Steinberg, Eran; Corcoran, Peter; Bigioi, Petronel; Pososin, Alexei; Drimbarean, Alexandru; Nanu, Florin; and Petrescu, Stefan
07460695 Cl. 382-118.
Nanya Technology Corp.: See--
Naoe, Hitoshi: See--
Fukae, Fumihiro; Naoe, Hitoshi; Sakai, Koji; and Osawa, Shohei
07461318 Cl. 714-749.
Naoi, Yuki; to Konica Minolta Opto, Inc. Optical element and illuminating device
07458704 Cl. 362-330.
Napier, Malcolm N.: See--
Neitzel, Roger S.; Napier, Malcolm N.; and Fern, David G.
D0581880 Cl. D13-162.
Naqvi, Noushad: See--
Zinn, Ronald Scotte; Phillips, Catherine M.; Naqvi, Noushad; and Weigele, Ingo W.
07460868 Cl. 455-435.2.
Narendran, Arungundram C.: See--
Rowley, Henry A.; Baluja, Shumeet; and Narendran, Arungundram C.
07460735 Cl. 382-305.
Narimoto, Yukitoshi: See--
Hasebe, Masahiro; and Narimoto, Yukitoshi
07458605 Cl. 280-729.
Nartron Corporation: See--
Boisvert, Mario P.; Perrin, Randall L.; Puska, Marvin E.; and Mitchell, John E.
07459800 Cl. 290-40C.
Nasiri, Steven S.; Seeger, Joseph; Lim, Martin; Flannery, Jr., Anthony Francis; and Castro, Alexander, to Invensense Inc. Method of making an X-Y axis dual-mass tuning fork gyroscope with vertically integrated electronics and wafer-scale hermetic packaging
07458263 Cl. 73-504.12.
Nass, Michael: See--
Nowack, Reinhard; Röhner, Stephan; and Nass, Michael
07458608 Cl. 280-756.
Nast, Jean-Daniel; to Alstom Transport, SA Vehicle adapted to move along a rail
07458323 Cl. 104-282.
Nasu, Hidehisa; Kuroyanagi, Akira; Ichikawa, Masato; and Sahashi, Akira, to Denso Corporation Heated medium supplying method and structure for secondary molding of resin molded component
07459118 Cl. 264-328.16.
Näsvall, Alf; and Byström, Gunnar, to SAAB AB Radar reflector
07460051 Cl. 342-7.
Nataraj, Bindiganavale S.: See--
Iyengar, Vinay; and Nataraj, Bindiganavale S.
07461295 Cl. 714-25.
Natarajan, Chitra: See--
Muthrasanallur, Sridhar; Wilder, Jeff; and Natarajan, Chitra
07461218 Cl. 711-157.
Natco Norway AS: See--
Christiansen, Bjorn; Sveberg, Knut; Hjelkrem, Inge; and Kvamsdal, Dag
07459001 Cl. 55-343.
Nathan, John F.; Tang, Tom Q.; and Ghabra, Riad, to Lear Corporation Seat folding system with radio frequency limited targeted zones for verifying operator presence
07460005 Cl. 340-5.61.
Nathan Leslie Designs, LLC: See--
National Applied Research Laboratories National Center for High-Performance Computing: See--
Huang, Kuen-Yu; Wang, Yao-Tsung; and Chen, Po-Wen
07460770 Cl. 396-25.
National Institute of Advanced Industrial Science and Technology: See--
Watari, Koji; Nakamura, Kazuo; Sato, Kimiyasu; Kinemuchi, Yoshiaki; Uchimura, Shoji; Ishiguro, Hirohide; and Morimitsu, Hideki
07459178 Cl. 427-180.
Yoda, Ikushi; and Sakaue, Katsuhiko
07460686 Cl. 382-103.
National Institute of Agrobiological Sciences: See--
Tamura, Toshiki; Sezutsu, Hideki; Kobayashi, Isao; Kojima, Katsura; Kanda, Toshio; and Uchino, Keiro
07459599 Cl. 800-4.
National Institute of Information and Communications Technology: See--
Tanaka, Hidema; Kaneko, Toshinobu; and Sugio, Nobuyuki
07460665 Cl. 380-1.
National Institute of Information and Communications Technology, Incorporated Administrative Agency: See--
National Research Council of Canada: See--
Faid, Karim; Py, Christophe; and Bensebaa, Farid
07459316 Cl. 436-518.
National Semiconductor Corporation: See--
Ma, Wei; and Bahai, Ahmad
07460024 Cl. 340-693.3.
Potanin, Vladislav; and Potanina, Elena
07459886 Cl. 320-135.
National Tsing Hua University: See--
Natrajan, Anand: See--
Jiang, Qingping; Natrajan, Anand; Sharpe, David; Wong, Wen-Jee; and Law, Say-Jong
07459284 Cl. 435-18.
Natsch, Andreas: See--
Derrer, Samuel; Natsch, Andreas; Traupe, Bernd; and Stang, Melanie
07459581 Cl. 560-155.
Natuzzi, Pasquale; to Natuzzi S.p.A. Sofa
D0581691 Cl. D6-381.
Natuzzi S.p.A.: See--
Natzle, Wesley C.: See--
Amos, Ricky S.; Natzle, Wesley C.; Panda, Siddhartha; and Tessier, Brian L.
07459382 Cl. 438-583.
Naumi, Tero: See--
Salo, Juha H.; Vermola, Larri; and Naumi, Tero
07461350 Cl. 715-773.
Naura, David; Moreaux, Christophe; Kari, Ahmed; and Rizzo, Pierre, to STMicroelectronics S.A. Method for checking block erasing of a memory and circuit thereof
07460401 Cl. 365-185.12.
Nautilus Hyosung Inc.: See--
Kang, Dong Gu; and Lee, Jong Ok
D0582125 Cl. D99-28.
Navatek, Ltd.: See--
Loui, Steven; and Shimozono, Gary
07459802 Cl. 290-53.
Navero, Diego Barranco; and Romero, Luis Rallo, to Universidad de Córdoba Olive tree named ‘Chiquitita’
PP019511 Cl. PLT-158.
Navratil, Roman: See--
Marik, Karel; Navratil, Roman; and Stluka, Petr
07460915 Cl. 700-31.
Navteq North America, LLC: See--
Herbst, James M.; McGrath, Suzanne M.; and Borak, Jason M.
07460953 Cl. 701-211.
NCR Corporation: See--
Haulk, Kevin W.; and Harkins, Cheryl K.
07461009 Cl. 705-20.
Masterton, Stuart; and Clark, Barrie
07458516 Cl. 235-486.
Neavia: See--
Wilbrod, Jean-Hubert
07460949 Cl. 701-118.
NEC Corporation: See--
Ebata, Koichi; and Takeda, Kenji
07461185 Cl. 710-52.
Kobayashi, Takeshi
07460887 Cl. 455-566.
Nakayama, Tatsuo; Ando, Yuji; Miyamoto, Hironobu; Kuzuhara, Masaaki; Okamoto, Yasuhiro; Inoue, Takashi; and Hataya, Koji
07459788 Cl. 257-761.
Tsuchi, Hiroshi; and Iriguchi, Masao
07459967 Cl. 330-9.
NEC Electronics Corporation: See--
NEC LCD Technologies, Ltd.: See--
Hashimoto, Yoshiaki; Kimura, Shigeru; and Suzuki, Seiji
07460190 Cl. 349-43.
Nagai, Hiroshi; and Ikeno, Hidenori
07460198 Cl. 349-117.
NEC Tokin Corporation: See--
Sakata, Koji; Yoshida, Katsuhiro; Hori, Yoshitaka; and Date, Tomohide
07460359 Cl. 361-528.
Nedwed, Timothy J.; to ExxonMobil Upstream Research Company Hydrogyro ship stabilizer and method for stabilizing a vessel
07458329 Cl. 114-122.
Neff, Jennifer A.: See--
Nilsson, Bo; Andersson, Jonas; Caldwell, Karin; Neff, Jennifer A.; and Nilsson-Ekdahl, Kristina
07459169 Cl. 424-422.
Negoro, Masanori; and Hara, Nobuo, to Yamaha Hatsudoki Kabushiki Kaisha Vehicle control unit and vehicle
07458435 Cl. 180-180.
Neidhart, Werner: See--
Gobbi, Luca Claudio; Gubler, Marcel; Neidhart, Werner; and Nettekoven, Matthias Heinrich
07459480 Cl. 514-450.
Neilsen, Timothy; to Slatbox Pty Ltd Box
D0581670 Cl. D3-304.
Neitzel, Roger S.; Napier, Malcolm N.; and Fern, David G., to Rain Bird Corporation Wireless extension unit for an irrigation controller
D0581880 Cl. D13-162.
Nejad, Mohammad Sarhang: See--
Fujimori, Ichiro; and Nejad, Mohammad Sarhang
07460589 Cl. 375-224.
Nelan, Stuart: See--
Sicking, Charles; Nelan, Stuart; and McLain, William “Bill” H.
07460437 Cl. 367-38.
Nellcor Puritan Bennett LLC: See--
Jafari, Mehdi Matthew
07460959 Cl. 702-24.
Nelson, Erik: See--
Barlet-Gouedard, Véronique; Cambus, Chrystel; Danican, Samuel; Nelson, Erik; and Goffe, Bruno
07459019 Cl. 106-705.
Nemati, Farid: See--
Cho, Hyun-Jin; and Nemati, Farid
07460395 Cl. 365-180.
Neogi, Jayant; and Neogi, Suneeta Apparatus and method for polishing gemstones and the like
07459702 Cl. 250-492.2.
Neogi, Suneeta: See--
Neogi, Jayant; and Neogi, Suneeta
07459702 Cl. 250-492.2.
NEOPOST Technologies: See--
Nlend, Bénédicte; Ray, Dany; and Blanluet, Patrick
07458653 Cl. 347-7.
Nequist, Eric; to Cadence Design Systems, Inc. Method and mechanism for determining shape connectivity
07461359 Cl. 716-1.
Nervegna, Louis J.; to Silicon Laboratories Inc. Programmable resistor array having current leakage control
07461285 Cl. 713-500.
Neste Oil Oyj: See--
Koivusalmi, Eija; and Jakkula, Juha
07459597 Cl. 585-733.
NetApp. Inc.: See--
Mowat, J Eric; Shah, Mehul S.; and Kuo, Szu-wen
07461147 Cl. 709-225.
Netlogic Microsystems, Inc.: See--
Birman, Mark; Srikrishna, Ajay; and Venkatachary, Srinivasan
07461200 Cl. 711-108.
Iyengar, Vinay; and Nataraj, Bindiganavale S.
07461295 Cl. 714-25.
Netta, John L.: See--
Globus, Yevgeniy I.; Jozokos, Mark A.; Netta, John L.; Pruce, George Martin; and Venkataraman, Sundar Kilnagar
07459498 Cl. 524-520.
Nettekoven, Matthias Heinrich: See--
Gobbi, Luca Claudio; Gubler, Marcel; Neidhart, Werner; and Nettekoven, Matthias Heinrich
07459480 Cl. 514-450.
Network Appliance, Inc.: See--
Tan, Cheng-Ping; Phan, Con D.; and Hindi, Faris R.
07461298 Cl. 714-42.
Network Equipment Technologies: See--
Williams, Aaron; and Jayaraman, Prakash
07460536 Cl. 370-392.
Network Solutions, LLC: See--
Lu, Chun-Ming; and Lee, Vincent M.
07461334 Cl. 715-234.
Neubert, Hans: See--
Leslie, James C.; Leslie, II, James C.; Heard, James; Truong, Liem; Josephson, Marvin; and Neubert, Hans
07458617 Cl. 285-390.
NeuCo, Inc.: See--
Lefebvre, W. Curt; and Kohn, Daniel W.
07458342 Cl. 122-379.
Neurocrine Biosciences, Inc.: See--
Zook, Scott E.; Hettinger, Donald; and DuBois, III, Henry R.
07459458 Cl. 514-259.3.
Neurosearch A/S: See--
Scheel-Krüger, Jørgen; and Blackburn-Munro, Gordon John
07459464 Cl. 514-304.
New Dimensions Research Corporation: See--
Mason, Timothy L.
07458473 Cl. 211-59.3.
New Heritage Ltd.: See--
New Jersey Institute of Technology: See--
Federici, John Francis; Grebel, Haim; and Altan, Hakan
07459687 Cl. 250-341.8.
Newell, Matthew B.: See--
Bender, Theodore M.; Warder-Gabaldon, Zachary; Newell, Matthew B.; Hausen, Bernard A.; and Knodel, Bryan D.
07458978 Cl. 606-142.
Newell Operating Company: See--
Ricereto, Michael Hart; and Kim, Hyunchul
D0581779 Cl. D8-400.
Newman, E. Ray: See--
Eads, Rosalie J.; and Newman, E. Ray
D0581999 Cl. D22-147.
Newman, Mark W.; Edwards, W. Keith; Hong, Jason; Izadi, Shahram; Marcelo, Karen J.; Sedivy, Jana Z.; and Smith, Trevor F., to Xerox Corporation Methods, apparatus, and program products for configuring components in networked computing environments
07461172 Cl. 709-246.
Newton, III, Charles P.: See--
Garrow, Gary R.; Newton, III, Charles P.; Weir, Patrick E.; West, II, David P.; and Wetzer, Michael
07461008 Cl. 705-8.
Newton, James R.: See--
Geschiere, Onno; Nicol, Howard; and Newton, James R.
07460681 Cl. 381-324.
Neyman, Igor: See--
Miloslavsky, Alec; Goecke, Jason; Deryugin, Vladimir N.; Torba, Dmitry A.; Neyman, Igor; and Turovsky, Oleg
07460496 Cl. 370-270.
NFT Nanofiltertechnik GmbH: See--
Ng, Boon Chew; Tam, Wing Wah; and Lim, Ee Teoh, to Aurigin Technology PTE Ltd. Apparatus and method for filling a ball grid array template
07458499 Cl. 228-246.
Ng, Raymond K.; to Oracle International Corporation Distributed capability-based authorization architecture using roles
07461395 Cl. 726-1.
Ng, Yew Liam; Ang, Kim Siah; Chong, Chee Chung; and Gu, Ming Kun, to CET Technologies PTE Ltd Image processing techniques for a video based traffic monitoring system and methods therefor
07460691 Cl. 382-107.
Ngo, Huey-Jiun: See--
Humphries, Laymon Scott; Ngo, Huey-Jiun; and Puranik, Gagan
07460871 Cl. 455-456.1.
Ngo, Hung C.; Kuang, Jente B.; Warnock, James D.; and Wendel, Dieter F., to International Business Machines Corporation Pulsed local clock buffer (LCB) characterization ring oscillator
07459950 Cl. 327-172.
Ngo, Hung Viet; Swain, Wilfred James; and Daily, Christopher G., to FCI Americas Technology, Inc. Electrical connectors having power contacts with alignment and/or restraining features
07458839 Cl. 439-291.
Nguyen, Bai: See--
Agrawal, Om P.; Sharpe-Geisler, Brad; Lee, Jye-Yuh; and Nguyen, Bai
07459935 Cl. 326-38.
Nguyen-Kim, Son; Hoessel, Peter; and Schunter, Walter, to BASF Aktiengesellschaft Cosmetic agent containing at least one copolymer having N-vinyllactam units
07459148 Cl. 424-70.11.
Nguyen, Son Hoai: See--
Connor, Eric; Charmot, Dominique; Chang, Han Ting; Roger, Florence; Klearner, Gerrit; and Nguyen, Son Hoai
07459502 Cl. 525-374.
Nguyen, Thelinh: See--
Hauenschild, Juergen; and Nguyen, Thelinh
07460790 Cl. 398-192.
Nguyen, Thuan Thien Disposable baby diaper container
07458480 Cl. 220-666.
Nguyen, Ut: See--
Cheung, Francis; Chen, Iue-Shuenn; Nguyen, Ut; Mamidwar, Rajesh; Schoner, Brian; and Simon, Dan
07461282 Cl. 713-400.
Nguyen Van Dau, Frédéric; Cros, Vincent; George, Jean-Marie; Grollier, Julie; Jaffres, Henri; and Petroff, Frédéric, to Thales Control device for reversing the direction of magnetisation without an external magnetic field
07459998 Cl. 335-302.
NHK Spring Co., Ltd.: See--
Iwata, Kazuo; Shimbori, Takeyoshi; Yamada, Koichiro; and Takamura, Noritoshi
07458356 Cl. 123-188.13.
Nice, Harold Lee Van: See--
Emery, Timothy R; Radominski, George; Hanson, Steve P.; Shreeve, Robert W.; Govyadinov, Alexander; Truninger, Martha A.; Ramamoorthi, Sriram; and Nice, Harold Lee Van
07460293 Cl. 359-293.
Nichia Corporation: See--
Hayamura, Mitsuo; and Akamatsu, Shiro
07459718 Cl. 257-12.
Takahashi, Takeshi; Morizaki, Masuhiro; Takeoka, Atsushi; and Tokuno, Junichi
07459238 Cl. 429-231.
Nichol, Claudia D. Quilter's cutting ruler angle guide
D0581816 Cl. D10-64.
Nichol, Claudia D. Quilter's cutting ruler angle guide
D0581817 Cl. D10-64.
Nicholas, Kenneth J.; to L.D. Kichler Co., The Light fixture
D0582091 Cl. D26-88.
Nichols, Tony; and Para, Paul, to Webroot Software, Inc. Method and system for rapid data-fragmentation analysis of a New Technology File System
07461104 Cl. 707-206.
Nichols, Walter A.; Brookman, Donald L.; Grollimund, Gary E.; and Smith, Ulysses, to Philip Morris USA Inc. Aerosol generator for drug formulation
07458373 Cl. 128-203.15.
Nicholson, Robert Bruce: See--
Carr, David John; Jones, Michael John; Key, Andrew; Nicholson, Robert Bruce; Scales, William James; and Whyte, Barry Douglas
07461217 Cl. 711-154.
Nicodemo, Thomas J.: See--
Burns, Ivey; Charanda, Thoram; Nicodemo, Thomas J.; Davis, Richard; and Crowder, Janell
07459075 Cl. 210-150.
Nicol, Howard: See--
Geschiere, Onno; Nicol, Howard; and Newton, James R.
07460681 Cl. 381-324.
Nicolai, Jean; to STMicroelectronics SA Translation look-aside buffer supporting mutually untrusted operating systems
07461232 Cl. 711-207.
Nicolas, Julien J.: See--
Lee, Chong U.; Lam, Katherine S.; Nicolas, Julien J.; and Atrero, Edward
07460667 Cl. 380-205.
Nicoloro, Jennifer: See--
Logiudice, Paul Angelo; Perkins, Jay; and Nicoloro, Jennifer
D0581728 Cl. D7-395.
Nidec Corporation: See--
Yonei, Hiroyuki; and Hashimoto, Kunihiko
07460334 Cl. 360-99.08.
Nie, Shuming: See--
Bao, Gang; Nie, Shuming; Nitin, Nitin; and LaConte, Leslie
07459145 Cl. 424-9.32.
Niebauer, Kenneth L.; and Zack, Keith R., to Kennametal Inc. Round cutting insert with chip control feature
07458753 Cl. 407-113.
Niebling, Peter; Heim, Jens; Hofmann, Heinrich; Dlugai, Darius; and Langer, Roland, to Schaeffler KG Seal arrangement with encoder and magnetization head for the encoder
07458727 Cl. 384-448.
Nielsen Media Research, Inc.: See--
Srinivasan, Venugopal
07460684 Cl. 382-100.
Niese, Virgil J.: See--
Hornbach, David W.; and Niese, Virgil J.
07458119 Cl. 5-618.
Nigam, Anurag; and Stiles, David, to Redback Networks Inc. Any size and location of concatenated packet data across SONET frames in a SONET signal
07460554 Cl. 370-442.
Niggemann, legal representative, Karl-Heinz: See--
Steinhilber, deceased, Helmut
07458569 Cl. 271-10.01.
Nigro, Anthony Innocenzo: See--
Dong, Han-Qing; Foreman, Kenneth; Mulvihill, Mark Joseph; Nigro, Anthony Innocenzo; Steinig, Arno G.; Werner, Douglas; and Wilkes, Robin
07459554 Cl. 544-120.
Nihon Kohden Corporation: See--
Mase, Ryuzo; Li, Xiangji; and Imajo, Kaoru
07460905 Cl. 600-544.
Nihon Nohyaku, Co., Ltd.: See--
Furuya, Takashi; Yamaguchi, Minoru; Tohnishi, Masanori; Seo, Akira; Morimoto, Masayuki; Takemoto, Tsuyoshi; and Fujioka, Shinsuke
07459477 Cl. 514-406.
Nihon University: See--
Tsunashima, Hitoshi; Yamada, Ayuta; Kanari, Hozumi; and Arai, Yoshinori
07460700 Cl. 382-131.
Niiho, Tsutomu: See--
Utsumi, Kuniaki; Yamamoto, Hiroaki; Masuda, Kouichi; Niiho, Tsutomu; Nakaso, Mariko; Tanaka, Kazuo; and Sasai, Hiroyuki
07460829 Cl. 455-13.1.
Niimi, Hiroaki; and Laaksonen, Reima Tapani, to Texas Instruments Incorporated Method for forming ultra thin low leakage multi gate devices
07459390 Cl. 438-622.
Niiyama, Satoshi: See--
Tahara, Shinya; Kojima, Seiji; Suwa, Shunichi; Ozeki, Masao; and Niiyama, Satoshi
07459189 Cl. 428-1.3.
Nijhawa, Sandeep: See--
Bour, David; Nijhawa, Sandeep; Smith, Jacob; and Washington, Lori
07459380 Cl. 438-478.
Nikawa, Susumu: See--
Fukuda, Toshinari; Ogino, Manabu; and Nikawa, Susumu
07458518 Cl. 235-492.
NIKE, Inc.: See--
Nikitin, Alexandr Vladimirovich: See--
Akishev, Niaz Irekovich; Zakirov, Ildus Muhametgaleevich; and Nikitin, Alexandr Vladimirovich
07458802 Cl. 425-520.
Nikon Corporation: See--
Mizutani, Hideo; and Magome, Nobutaka
07460207 Cl. 355-30.
Nikoonahad, Mehrdad: See--
Bultman, Gary; Levy, Ady; Brown, Kyle A.; Nikoonahad, Mehrdad; Wack, Dan; and Fielden, John
07460981 Cl. 702-155.
Nilsen, Christopher Norman: See--
Greco, Michael N.; Almond, Harold R.; de Garavilla, Lawrence; Hawkins, Michael J.; Humora, Michael J.; Qian, Yun; Walker, Donald Gilmore; Cesco-Cancian, Sergio; Nilsen, Christopher Norman; Patel, Mitul N.; Sorgi, Kirk Leonard; and Powell, Eugene
07459461 Cl. 514-277.
Nilsson, Bo; Andersson, Jonas; Caldwell, Karin; Neff, Jennifer A.; and Nilsson-Ekdahl, Kristina, to Allvivo, Inc. Surface coating comprising bioactive compound
07459169 Cl. 424-422.
Nilsson-Ekdahl, Kristina: See--
Nilsson, Bo; Andersson, Jonas; Caldwell, Karin; Neff, Jennifer A.; and Nilsson-Ekdahl, Kristina
07459169 Cl. 424-422.
Nilsson, Reine: See--
Stromberg, Peter; Nilsson, Reine; Asplund, Roberth; Baversjo, Bo; and Sandstrom, Peter
07460977 Cl. 702-150.
Nimni, Marcel: See--
Hall, Frederick L.; Gordon, Erlinda M.; Beart, Robert W.; and Nimni, Marcel
07459541 Cl. 530-399.
Ning, Gang; to AVX Corporation Neutral electrolyte for a wet electrolytic capacitor
07460356 Cl. 361-507.
Ningbo Wanan Co., Ltd.: See--
Ninomiya, Yasunori: See--
Totokawa, Masashi; and Ninomiya, Yasunori
07458150 Cl. 29-852.
Nippon Mektron Limited: See--
Zuo, Min; and Lin, Jenq-Tain
07459216 Cl. 428-458.
Nippon Mining & Metals Co., Ltd: See--
Okabe, Takeo; Irumata, Shuichi; Yamakoshi, Yasuhiro; Miyashita, Hirohito; and Suzuki, Ryo
07459036 Cl. 148-421.
Nippon Steel Corporation: See--
Asahi, Hitoshi; and Tsuru, Eiji
07459033 Cl. 148-320.
Nippon Telegraph and Telephone Corporation: See--
Kawai, Shingo; Kawada, Hideo; Yoshimoto, Naoto; Ogawa, Toru; and Iwatsuki, Katsumi
07460572 Cl. 372-29.02.
Nippon Thompson Co., Ltd.: See--
Nisbet, Stuart A.: See--
Yin, Robert; Fallside, Hamish T.; Burnley, Richard P.; McKay, Nicholas; Rhodes, Martin B.; Grant, Douglas M.; Nisbet, Stuart A.; and Edwards, Gareth D.
07461193 Cl. 710-305.
Nisca Corporation: See--
Naganuma, Hiroaki; and Kusunoki, Tokuro
07459813 Cl. 310-49R.
Nishi, Noriyuki; to Noritsu Koki Co., Ltd. Image processing method and apparatus for red eye correction
07460707 Cl. 382-167.
Nishi, Seiichi: See--
Takahashi, Daisuke; Nishi, Seiichi; and Takahashi, Satoji
07459582 Cl. 562-450.
Nishibori, Shin: See--
Andre, Bartley K.; Coster, Daniel J.; De Iuliis, Daniele; Howarth, Richard P.; Ive, Jonathan P.; Jobs, Steve; Kerr, Duncan Robert; Nishibori, Shin; Rohrbach, Matthew Dean; Satzger, Douglas B.; Seid, Calvin Q.; Stringer, Christopher J.; Whang, Eugene Antony; and Zorkendorfer, Rico
D0581922 Cl. D14-341.
Nishida, Masaharu: See--
Isobe, Tetsuya; Takahashi, Katsuaki; and Nishida, Masaharu
07459123 Cl. 422-52.
Nishigaki, Eitaro: See--
Kota, Atsushi; Kondo, Yuji; Kawashima, Shingo; and Nishigaki, Eitaro
07460090 Cl. 345-76.
Nishigaki, Michihiko: See--
Kawakubo, Takashi; Nagano, Toshihiko; Abe, Kazuhide; and Nishigaki, Michihiko
07459827 Cl. 310-309.
Kawakubo, Takashi; Ohara, Ryoichi; Ono, Tomio; Nagano, Toshihiko; Nishigaki, Michihiko; Yasumoto, Takaaki; Abe, Kazuhide; and Sano, Kenya
07459833 Cl. 310-328.
Nishijima, Masaaki; and Fukuda, Takeshi, to Panasonic Corporation Radar apparatus
07460055 Cl. 342-70.
Nishikawa, Tomomasa; and Inagawa, Hiroto, to Hitachi Koki Co., Ltd. Combustion chamber arrangement in combustion type power tool
07458493 Cl. 227-10.
Nishimori, Yasushi; Okunishi, Akira; Tokuyama, Kouzo; and Yokuda, Koji, to Furuno Electric Company, Limited Ultrasonic wave transmitting and receiving system for detecting underwater objects
07460433 Cl. 367-2.
Nishimura, Joji: See--
Tsuchiya, Hitoshi; and Nishimura, Joji
07460199 Cl. 349-123.
Nishimura, Kazuo: See--
Majima, Toshiyuki; and Nishimura, Kazuo
07458505 Cl. 234-98.
Nishimura, Tadaharu; to Denso Corporation Inter-task communications method, program, recording medium, and electronic device
07461380 Cl. 719-314.
Nishimura, Takanori; and Kori, Takayuki, to Sony Corporation Information processing method and apparatus
07461333 Cl. 715-230.
Nishimura, Yukio; Yamahara, Noboru; Yamamoto, Masafumi; Kajita, Toru; Shimokawa, Tsutomu; Ito, Hiroshi; and JSR Corporation, to International Business Machines Corporation RADIATION-SENSITIVE RESIN COMPOSITION
06964840 Cl. 430-270.1.
Nishimuro, Youichi: See--
Suzuki, Takahiro; Machida, Kunio; and Nishimuro, Youichi
07459249 Cl. 430-56.
Nishino, Akifumi; and Inubushi, Yutaka, to Kubota Corporation Working vehicle with a speed maintaining apparatus
07458438 Cl. 180-305.
Nishino, Takeshi: See--
Yokogawa, Naruichi; and Nishino, Takeshi
07460792 Cl. 398-202.
Nishioka, Masahiro: See--
Okada, Hiroki; and Nishioka, Masahiro
07458831 Cl. 439-139.
Nishiura, Masahide: See--
Yoshioka, Hideki; Watanabe, Mutsumi; Yuasa, Mayumi; and Nishiura, Masahide
07460698 Cl. 382-128.
Nishiyama, Kazushige; to Canon Kabushiki Kaisha Image forming apparatus with control of power distribution to heat fixing device
07460801 Cl. 399-44.
Nishizawa, Hirotaka: See--
Aoki, Yoshitaka; Tsutsui, Keiichi; Nishizawa, Hirotaka; and Totsuka, Takashi
07458519 Cl. 235-492.
Nishizawa, Hirotaka; Osawa, Kenji; Osako, Junichiro; Wada, Tamaki; Sugiyama, Michiaki; Totsuka, Takashi; Aoki, Yoshitaka; and Tsutsui, Keiichi, to Renesas Technology Corp. Memory card
D0581932 Cl. D14-436.
Nishizawa, Masahiro: See--
Ishigaki, Toshimasa; Nishizawa, Masahiro; and Takahashi, Fumio
07460189 Cl. 349-42.
Nisiyama, Ryuichi: See--
Kato, Shinya; Kyono, Takayoshi; Nisiyama, Ryuichi; and Takahashi, Jin
07460630 Cl. 375-372.
Nissan Motor Co., Ltd.: See--
Hamada, Takahiro; Kano, Makoto; and Mabuchi, Yutaka
07458585 Cl. 277-442.
Hashimura, Tadayoshi
07458611 Cl. 280-830.
Toyota, Hiromitsu; Konishi, Masaru; Sugimoto, Tomonaga; and Isono, Yoichi
07458650 Cl. 303-151.
Nissen, Povl: See--
Husemoen, Thor; Hansen, Erling Lennart; and Nissen, Povl
07459490 Cl. 523-153.
Nissha Printing Co., Ltd.: See--
Toyooka, Naoto; and Ozawa, Mitsuhiro
07458793 Cl. 425-112.
Nitin, Nitin: See--
Bao, Gang; Nie, Shuming; Nitin, Nitin; and LaConte, Leslie
07459145 Cl. 424-9.32.
Nitinol Development Corporation: See--
Nitre, Thierry: See--
Forgue, Jean-Bernard; Lauvergnat, Jack-Pierre; Loiseau, Henry Louis Paul Nicolas; Monnet, Didier; Nitre, Thierry; and Reghezza, Patrick Jean-Louis
07458769 Cl. 415-119.
Nitta, Makoto: See--
Mikami, Hiroshi; Sano, Takeshi; and Nitta, Makoto
07459570 Cl. 549-236.
Nitto, Kiyoshi; Maruyama, Yutaka; and Tsukimoto, Takayuki, to Canon Kabushiki Kaisha Electro-mechanical energy converter and vibration wave driving
07459832 Cl. 310-323.16.
Niwa, Hiroaki; to Canon Kabushiki Kaisha X-ray image taking device
07460641 Cl. 378-95.
Niwa, Kuniyuki: See--
Kawamura, Makoto; Niwa, Kuniyuki; and Kato, Sutemaro
07459910 Cl. 324-418.
Nixon, Mark; Aneweer, Tom; Burr, Kent; and Eddie, Ron, to Fisher-Rosemount Systems, Inc. Self-configuring communication networks for use with process control systems
07460865 Cl. 455-428.
Nizi, Emanuela: See--
Di Francesco, Maria E.; Gardelli, Cristina; Harper, Steven; Matassa, Victor G.; Murgalia, Ester; Nizi, Emanuela; Pace, Paola; Pacini, Barbara; Petrocchi, Alessia; Poma, Marco; and Summa, Vincenzo
07459452 Cl. 514-235.8.
Nlend, Bénédicte; Ray, Dany; and Blanluet, Patrick, to NEOPOST Technologies Postage meter system having a controlled level of ink
07458653 Cl. 347-7.
NNL Enterprises, Inc.: See--
Noble, III, Robert L: See--
Kesterson, Don F; Owen, Quentin A; Gordon, Glenn L; and Noble, III, Robert L
07460663 Cl. 379-413.03.
Nobuyuki, Tanaka; to Amerinova Properties LLC Pentas plant named ‘DPVG’
PP019544 Cl. PLT-466.
Noda, Tetsuya; Kasai, Ichiro; Endo, Takeshi; and Tanijiri, Yasushi, to Konica Minolta Photo Imaging, Inc. Method for producing an optical device, optical device, image display apparatus, and head-mounted display
07460286 Cl. 359-27.
Noda, Tomonori: See--
Kawauchi, Masao; Noda, Tomonori; Yamamoto, Shuichi; and Kitajima, Nozomu
D0581937 Cl. D14-484.
Nodomi, Akira; to Fujitsu Limited Non-inclusive cache system with simple control operation
07461212 Cl. 711-141.
Noetzel, John G.: See--
Fulks, Gary C.; Poole, Douglas E.; and Noetzel, John G.
07460936 Cl. 701-36.
Noguchi, Masato: See--
Lection, David B.; Masselle, Eric L.; Noguchi, Masato; and Reich, David E.
07461337 Cl. 715-237.
Noguchi, Yasuji: See--
Takeuchi, Masanori; Noguchi, Yasuji; Chiaki, Yutaka; and Oota, Shunji
07460088 Cl. 345-60.
Noguchi, Yasukazu; to Brother Kogyo Kabushiki Kaisha Embroidery sewing machine
07460925 Cl. 700-138.
Noguet, Dominique; and Bouvier des Noes, Mathieu, to Commissariat a l'Energie Atomique Method and device for detection of data transmitted by spectrum spreading
07460582 Cl. 375-147.
Nohata, Yukio: See--
Ono, Takashi; Shinada, Yasuyuki; Kimura, Tatsuo; Nohata, Yukio; and Imai, Takashi
07460256 Cl. 358-1.13.
Nokia Corporation: See--
Koodli, Rajeev; and Flinck, Hannu
07460511 Cl. 370-338.
Lakshmi Narayanan, Ram Gopal
07461259 Cl. 713-176.
Le, Huihua; Wu, Haitao; Jin, Yuehui; Zhang, Dongmei; and Ma, Jian
07460472 Cl. 370-229.
Maalismaa, Juha; and Leinonen, Marko
07460846 Cl. 455-168.1.
Pasanen, Juha; and Anttalainen, Pekka
07460862 Cl. 455-418.
Pekonen, Harri J; and Vesma, Jussi
07460869 Cl. 455-436.
Salo, Juha H.; Vermola, Larri; and Naumi, Tero
07461350 Cl. 715-773.
Tirkkonen, Olav; and Hottinen, Ari
07460609 Cl. 375-267.
Tourunen, Ari; Kalliokulju, Juha; Kallio, Hans; Marjelund, Pekka; and Kohonen, Pekka
07460475 Cl. 370-230.1.
Zhang, Hong; Jiang, Luliang; and Zhang, Dajiang
07461248 Cl. 713-155.
Nokia Siemens Networks GmbH & Co. KG: See--
Eder, Christian; Peisl, Wolfgang; and Rapp, Lutz
07460784 Cl. 398-26.
Nokia Siemens Networks Oy: See--
Hätönen, Kimmo; Kumpulainen, Pekka; and Vehviläinen, Pekko
07461037 Cl. 706-18.
Nold, III, Raymond V.; Zazovsky, Alexander F.; Ervin, Steve; Del Campo, Christopher S.; and Briquet, Stephane, to Schlumberger Technology Corporation Apparatus and method for formation evaluation
07458419 Cl. 166-100.
Noma, Kenji; to Fujitsu Limited Magnetic film composed of a first alloy film including iron and platinum or iron and palladium
07459221 Cl. 428-812.
Nomaru, Keiji; to Disco Corporation Laser beam processing machine
07459655 Cl. 219-121.78.
Nomura, Eiji; and Nakamura, Kentarou, to Konica Minolta Opto, Inc. Optical pickup apparatus, objective optical element and optical information recording and/or reproducing apparatus
07460459 Cl. 369-112.13.
Nomura, Taichiroh: See--
Fukushima, Toshiaki; Matsui, Yohichi; and Nomura, Taichiroh
07461182 Cl. 710-33.
Nonaka, Nobuyuki: See--
Koyama, Toshimi; Nonaka, Nobuyuki; and Migita, Jituo
07460079 Cl. 343-788.
Nordberg, Peter: See--
Lilljequist, Lars; Lindkvist, Maria; Nordberg, Peter; Pettersson, Ursula; and Sebhatu, Tesfai
07459463 Cl. 514-300.
Nordman, Eric S.; Ozawa, Miho; Kojima, Masaya; Inaba, Ryoji; Kodama, Yoshitaka; and Yamazaki, Motohiro, to Applied Biosystems Inc. Multi-capillary electrophoresis apparatus
07459068 Cl. 204-451.
Nordmann, Bernhard: See--
Habisreitinger, Uwe; and Nordmann, Bernhard
07459051 Cl. 156-230.
Nordson Corporation: See--
Prieto, Vincent A.; and Kosovich, Deborah
07458524 Cl. 239-71.
Noritsu Koki Co., Ltd.: See--
Noritz Corporation: See--
Takeda, Nobuhiro; Asakura, Hiroshi; Tsutsumi, Akira; Kimura, Kazuhiro; Kameyama, Shuji; Amada, Keiichi; and Matsunaga, Hironao
07458340 Cl. 122-31.1.
Noriyoshi Sakabe: See--
Norman, Christopher J.; and Heidmann, Kurt R., to Steelcase Inc. Back construction with flexible lumbar
07458637 Cl. 297-284.4.
Norman, Daniel P.: See--
Griffith, Gregory Clyde; Guidotti, Richard Allen; Saitta, David A.; and Norman, Daniel P.
07460854 Cl. 455-410.
Norman, Mark H.: See--
Hamilton, Gregory S.; Norman, Mark H.; and Wu, Yong-Qian
07459473 Cl. 514-380.
Norman, Robert D.: See--
Harari, Eliyahou; Norman, Robert D.; and Mehrotra, Sanjay
07460399 Cl. 365-185.04.
Noro, Junichi: See--
Takisawa, Hisashi; Aizawa, Toshiaki; Noro, Junichi; and Kato, Takao
D0581910 Cl. D14-230.
Noro, Yutaka: See--
Kobayashi, Yutaka; Nakamura, Keiichi; Noro, Yutaka; Kikuchi, Takahiro; and Ishikawa, Yoshiyuki
07458835 Cl. 439-188.
Norris, James A.; and Hessel, Clifford, to Harris Corporation System and method for obtaining accurate symbol rate and carrier phase, frequency, and timing acquisition for minimum shift keyed waveform
07460618 Cl. 375-336.
Nortel Networks Limited: See--
Chowdhury, Kuntal; Abtahi, Yasaman; Wang, Chung-Ching; and Vasudevan, Mini
07460515 Cl. 370-349.
Rasimas, Jennifer G.; Jackson, Stephen S.; and Black, Ottis K.
07461165 Cl. 709-238.
North Carolina State University: See--
Klaenhammer, Todd R.; Altermann, Eric; Barrangou, Rodolphe; Russell, W. Michael; and Duong, Tri
07459289 Cl. 435-69.1.
Northrop Grumman Corporation: See--
Kennedy, Chandler James
07460566 Cl. 372-10.
Notley, Scott V.: See--
Cosendai, Gregoire; Zilberman, Ytizhak; Kuschner, Doug; Ripley, Anne Marie; Turk, Ruth; Burridge, Jane; Notley, Scott V.; Davis, Ross; Hansen, Morten; Mandell, Lee Jay; Schulman, Joseph H.; Dell, Robert Dan; and Gord, John C.
07460911 Cl. 607-48.
Novak, David Gene: See--
Testin, William John; and Novak, David Gene
07459939 Cl. 326-86.
Novartis AG: See--
Sedrani, Richard; and Quesniaux Ryffel, Valerie
RE040596 Cl. 530-405.
Novatek Microelectronics Corp.: See--
Yen, Chih-Jen; and Hsieh, Chih-Yuan
07459943 Cl. 327-91.
NovAtel, Inc.: See--
Kunysz, Waldemar; and Fenton, Patrick C.
07460615 Cl. 375-316.
Novelis Inc.: See--
Marcotte, Jacques; and Slusarenko, Yuhil
07459896 Cl. 324-71.4.
Novolen Technology Holdings, C.V.: See--
Gebhart, Hermann; Huber, Karl; Boss, Christiane; and Langhauser, Franz
07459506 Cl. 526-64.
Nowack, Reinhard; Röhner, Stephan; and Nass, Michael, to Ise Innovative Systems Europe GmbH Vehicle rollover protection system with a roll bar, whose top piece is rounded in U-shape
07458608 Cl. 280-756.
Nozawa, Ryoichi: See--
Ozawa, Tokuro; Kanda, Eiji; and Nozawa, Ryoichi
07460093 Cl. 345-76.
NSCore Inc.: See--
Kikuchi, Takashi
07460400 Cl. 365-185.05.
NTT DoCoMo, Inc.: See--
Ishii, Hiroyuki; Imamura, Yoshimasa; Hanaki, Akihito; Nakamura, Takehiro; Tanaka, Shinya; and Usuda, Masafumi
07460474 Cl. 370-230.
Nucci, Nathaniel V.: See--
Sower, Stacia; Nucci, Nathaniel V.; and Silver, Matthew R.
07459310 Cl. 435-325.
Nunes, Brendon Fire fighting apparatus-simulating lighting fixture
D0582092 Cl. D26-94.
Nünlist, Walter: See--
Grahle, Peter; Haldemann, Peter; Nünlist, Walter; Rhyn, Heinz; Friesen, Albert; and Russ, Stanislaus
07458792 Cl. 418-179.
Nuriel, Ifat: See--
Spear, Gail Andrea; Factor, Michael E.; Matosevich, Rivka Mayraz; Fienblit, Shachar; Rahav, Sheli; Bartfai, Robert Francis; Tzafrir, Dalit; and Nuriel, Ifat
07461100 Cl. 707-204.
Nvidia Corporation: See--
Hakura, Ziyad S.; Langendorf, Brian Keith; Pescador, Stefano A.; Danilak, Radoslav; and Simeral, Brad W.
07461211 Cl. 711-137.
Young, Wayne D.; and Ogrinc, Michael A.
07460175 Cl. 348-554.
NXP B.V.: See--
Da Silva, Patrick; and Souef, Laurent
07459928 Cl. 326-16.
Ludikhuize, Adrianus Willem; Van Der Pol, Jacob Antonius; and Grover, Raymond J.
07459750 Cl. 257-334.
Wunnicke, Olaf; Loebl, Hans P.; Klee, Mareike K.; and Milsom, Robert F.
07459990 Cl. 333-133.
Nyren, Pål; Ronaghi, Mostafa; and Tallsjö, Annika, to Biotage AB Method of sequencing DNA
07459311 Cl. 436-6.
Nys, Guy: See--
Venema, Jakob; Berger, Claudia; Löken, Christiane; Deleersnijder, Willy; and Nys, Guy
07459279 Cl. 435-7.2.
Venema, Jakob; Berger, Claudia; Löken, Christiane; Deleersnijder, Willy; and Nys, Guy
07459292 Cl. 435-69.1.