LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 2nd DAY OF December, 2008
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

N.S. - Lin International Co., Ltd.: See--
Lin, Nan-Shen 07458256 Cl. 73-146.8.
N.V. Organon: See--
Wan, Min; and Ropp, Phillip 07459425 Cl. 514-2.
Na, Ki-Su: See--
Lee, Sang-Hoon; Leam, Hun-Hyeoung; Lee, Jai-Dong; Kim, Jung-Hwan; You, Young-Sub; Na, Ki-Su; Lee, Woong; Lee, Yong-Sun; and Jang, Won-Jun 07459364 Cl. 438-257.
Nabtesco Corporation: See--
Koizumi, Takashi; and Kamimura, Toshio 07458212 Cl. 60-461.
Nacson, Sabatino; and Gibbons, Duncan, to Smiths Detection Inc. Article scanner 07458283 Cl. 73-863.12.
Nadler, Lee M.: See--
Freeman, Gordon J.; Nadler, Lee M.; and Gray, Gary S. 07459544 Cl. 536-23.5.
Naftali, Ron: See--
Goldberg, Boris; and Naftali, Ron 07460221 Cl. 356-237.4.
Nagae, Masayoshi: See--
Kitamura, Satoshi; and Nagae, Masayoshi 07459857 Cl. 315-78.
Nagahara, Atsushi: See--
Kayahara, Naoki; and Nagahara, Atsushi 07460708 Cl. 382-176.
Nagahashi, Haruki; to Elpida Memory, Inc. Heat radiation device for memory module 07460373 Cl. 361-704.
Nagahashi, Toshinori; and Hyuga, Takashi, to Seiko Epson Corporation Head-top detecting method, head-top detecting system and a head-top detecting program for a human face 07460705 Cl. 382-165.
Nagai, Hiroshi; and Ikeno, Hidenori, to NEC LCD Technologies, Ltd. IPS LCD device having a wider viewing angle 07460198 Cl. 349-117.
Nagai, Hiroyasu; Toki, Masahiro; Misumi, Kenji; and Kotani, Hideto, to Panasonic Corporation Nonvolatile semiconductor memory device and programming or erasing method therefor 07460410 Cl. 365-185.28.
Nagamochi, Katsuya: See--
Kamisuwa, Yoshikatsu; and Nagamochi, Katsuya 07460807 Cl. 399-81.
Nagamura, Mitsutoshi: See--
Kanematsu, Daigoro; Takekoshi, Rie; and Nagamura, Mitsutoshi 07460271 Cl. 358-1.9.
Nagano, Toshihiko: See--
Kawakubo, Takashi; Nagano, Toshihiko; Abe, Kazuhide; and Nishigaki, Michihiko 07459827 Cl. 310-309.
Kawakubo, Takashi; Ohara, Ryoichi; Ono, Tomio; Nagano, Toshihiko; Nishigaki, Michihiko; Yasumoto, Takaaki; Abe, Kazuhide; and Sano, Kenya 07459833 Cl. 310-328.
Nagano, Toshiyuki: See--
Shirakata, Jiro; Nagano, Toshiyuki; and Mori, Hideki 07460809 Cl. 399-92.
Naganuma, Hiroaki; and Kusunoki, Tokuro, to Nisca Corporation Magnet rotor and electromagnetically-driving device using the same, and optical apparatus with light quantity-control device 07459813 Cl. 310-49R.
Nagao, Yuki: See--
Ishikawa, Masanori; Sugita, Jun; Shinohara, Mitsuru; and Nagao, Yuki 07460772 Cl. 396-52.
Nagasako, Shuuya: See--
Yamada, Kenji; Tamura, Masahiro; Suzuki, Nobuyoshi; Saitoh, Hiromoto; Nagasako, Shuuya; Iida, Junichi; Okada, Hiroki; Andoh, Akihito; Kikkawa, Naohiro; and Tokita, Junichi 07458567 Cl. 270-58.07.
Nagasawa, Junichi: See--
Iwano, Kiminori; Komai, Yuji; Suefuji, Kazutaka; Fukui, Koji; Suzuki, Toshitsugu; Nagasawa, Junichi; Sakamoto, Susumu; Hidano, Katsushi; and Komatsu, Kazunari 07458788 Cl. 418-55.5.
Nagase, Toshihiko: See--
Fukuzumi, Yoshiaki; and Nagase, Toshihiko 07459759 Cl. 257-427.
Nagashima, Hiroyuki: See--
Sampe, Atsushi; Kimura, Yoshiyuki; Nagashima, Hiroyuki; Hosokawa, Hiroshi; Murakami, Wakako; and Kuwabara, Nobuo 07460810 Cl. 399-100.
Nagatomo, Hiroaki: See--
Mochizuki, Kouichi; Saito, Kimitaka; and Nagatomo, Hiroaki 07458531 Cl. 239-585.5.
Nagatomo, Takashi; to Sony Corporation Optical disk apparatus 07460442 Cl. 369-30.03.
Nagatsuka, Kazuyoshi; and Tanaka, Nobutomo, to D & M Holdings, Inc. Projector apparatus 07458692 Cl. 353-101.
Nagayama, Kazuo: See--
Irihune, Kazunori; Sasaki, Yasushi; Aoki, Sadayuki; Nagayama, Kazuo; and Ebata, Yuuichi 07458360 Cl. 123-337.
Nagayama, Kohei: See--
Asao, Yasufumi; Mori, Hideo; Nagayama, Kohei; Tanaka, Hironao; and Isobe, Ryuichiro 07460115 Cl. 345-204.
Nagoya, Fujiharu: See--
Koguma, Ichiro; and Nagoya, Fujiharu 07459085 Cl. 210-645.
Nahrwold, Thomas L.: See--
Krisher, James A.; Cooper, Kenneth E.; Nahrwold, Thomas L.; Hunt, Gordon W.; Baxter, Jr., Ralph W.; and Sommer, Randy 07458911 Cl. 475-86.
Nailor, Kristen Elizabeth: See--
Cheung, Mui; Nailor, Kristen Elizabeth; Sammond, Douglas McCord; and Veal, James Marvin 07459455 Cl. 514-252.14.
Naito, Takashi: See--
Yamamoto, Hiroki; Momose, Hideto; Sawai, Yuuichi; and Naito, Takashi 07459194 Cl. 428-64.1.
Najjarine, Abdul: See--
Kielt, Rodney; and Najjarine, Abdul 07458173 Cl. 36-44.
Naka, Hiroyuki: See--
Ohinata, Yusuke; Naka, Hiroyuki; and Sakai, Yuji 07460324 Cl. 360-66.
Naka, Takeshi: See--
Tokumitsu, Atsunori; and Naka, Takeshi 07459895 Cl. 323-316.
Nakadate, Takao: See--
Katou, Hajime; Nakajima, Hikaru; and Nakadate, Takao 07458448 Cl. 188-282.6.
Nakagawa, Goji; to Fujitsu Limited Ring type optical transmission system and optical apparatus connected to same 07460744 Cl. 385-24.
Nakagawa, Jun; to Konica Corporation Image-reading apparatus for reading an image on a document by controlling an index period and a line-thinning rate based on a magnification factor 07460280 Cl. 358-486.
Nakagawa, Mitsuru: See--
Sugimoto, Keiichi; and Nakagawa, Mitsuru 07458823 Cl. 439-76.1.
Nakagawa, Seiichi: See--
Onodera, Ko; Kurimoto, Satoshi; Tozawa, Yoji; and Nakagawa, Seiichi 07458151 Cl. 29-879.
Nakagawa, Takashi; to Fujitsu Limited Printed circuit board and method of manufacturing the same 07458149 Cl. 29-846.
Nakahata, Akinobu: See--
Tanjo, Toru; Nakahata, Akinobu; Fukumoto, Hiroaki; and Yotsuyanagi, Naruya 07460826 Cl. 399-401.
Nakai, Hisao; and Kagamiishi, Yoshifumi, to Ono Pharmaceutical Co., Ltd. Tri-heterocyclic compounds and a pharmaceutical comprising them as an active ingredient 07459459 Cl. 514-267.
Nakajima, Hikaru: See--
Katou, Hajime; Nakajima, Hikaru; and Nakadate, Takao 07458448 Cl. 188-282.6.
Nakajima, Hirofumi; Toyoizumi, Teruhiko; and Yamane, Hideo, to Konica Minolta Business Technologies, Inc. Sheet moisturizing device and image forming apparatus 07460824 Cl. 399-341.
Nakajima, Ken: See--
Kawanishi, Isao; Okada, Miyuki; Sato, Nobuyuki; and Nakajima, Ken 07460728 Cl. 382-274.
Nakajima, Ryohei: See--
Kitamura, Akihiro; and Nakajima, Ryohei 07459268 Cl. 435-4.
Nakajima, Tsutomu: See--
Yamamoto, Kenji; Ogawa, Masahiko; and Nakajima, Tsutomu 07459213 Cl. 428-447.
Nakamori, Masaharu: See--
Tanabe, Kazuya; Tsutsumizaki, Takashi; and Nakamori, Masaharu 07458343 Cl. 123-41.7.
Nakamura, Akio; to Oki Electric Industry Co., Ltd. Manufacturing method of an acceleration sensing device 07459330 Cl. 438-51.
Nakamura, Akio; to Oki Electric Industry Co., Ltd. Semiconductor package containing multi-layered semiconductor chips 07459777 Cl. 257-686.
Nakamura, Atsushi: See--
Shoji, Mamoru; Nakamura, Atsushi; and Ishida, Takashi 07460464 Cl. 369-275.3.
Nakamura, Daisuke; Fujii, Isao; and Wakui, Ken, to Yamaha Marine Kabushiki Kaisha Outboard drive with speed change mechanism 07458866 Cl. 440-75.
Nakamura, Hiroshi: See--
Genda, Satoshi; and Nakamura, Hiroshi 07459378 Cl. 438-463.
Kawakami, Koichi; and Nakamura, Hiroshi 07460427 Cl. 365-225.
Nakamura, Hiroto; to Advantest Corporation Electronic device testing apparatus 07459902 Cl. 324-158.1.
Nakamura, Jirou; Hayashi, Nobuhiro; and Satou, Masanobu, to Daifuku Co., Ltd. Conveying apparatus with lifting/lowering to-be-conveyed object support table 07458455 Cl. 198-463.3.
Nakamura, Kazuhiro: See--
Tanaka, Hiroshi; Machiya, Kanehiro; Sakaguchi, Hironori; Matsubara, Koji; and Nakamura, Kazuhiro 07461300 Cl. 714-43.
Nakamura, Kazuo: See--
Watari, Koji; Nakamura, Kazuo; Sato, Kimiyasu; Kinemuchi, Yoshiaki; Uchimura, Shoji; Ishiguro, Hirohide; and Morimitsu, Hideki 07459178 Cl. 427-180.
Nakamura, Keiichi: See--
Kobayashi, Yutaka; Nakamura, Keiichi; Noro, Yutaka; Kikuchi, Takahiro; and Ishikawa, Yoshiyuki 07458835 Cl. 439-188.
Nakamura, Kentarou: See--
Nomura, Eiji; and Nakamura, Kentarou 07460459 Cl. 369-112.13.
Nakamura, Kojiro; and Shimada, Tadashi, to Calsonic Kansei Corporation Air conditioning system, vehicular air conditioning system and control method of vehicular air conditioning system 07458226 Cl. 62-228.1.
Nakamura, Masahide; and Ikuma, Ken, to Seiko Epson Corporation Developing device, image forming apparatus having the same, and image forming method 07460802 Cl. 399-45.
Nakamura, Michael L.; to Senario, LLC Electronic toy D0581989 Cl. D21-329.
Nakamura, Mitsuo; to Denso Corporation Signal processing apparatus 07460062 Cl. 342-195.
Nakamura, Naofumi: See--
Yoshizawa, Takahiko; Matsunaga, Noriaki; and Nakamura, Naofumi 07459391 Cl. 438-638.
Nakamura, Shinichi; to Canon Kabushiki Kaisha Field effect type organic transistor and process for production thereof 07459721 Cl. 257-40.
Nakamura, Takehiro: See--
Ishii, Hiroyuki; Imamura, Yoshimasa; Hanaki, Akihito; Nakamura, Takehiro; Tanaka, Shinya; and Usuda, Masafumi 07460474 Cl. 370-230.
Nakamura, Tomonori; to Seiko Epson Corporation Pressure-regulating valve, functional liquid supplying apparatus, imaging apparatus, method of manufacturing electro-optic device, electro-optic device, and electronic apparatus 07458663 Cl. 347-84.
Nakamura, Toshiki; and Ito, Takayuki, to Hoya Corporation Zoom lens system 07460312 Cl. 359-689.
Nakamura, Toshinori: See--
Yoshimine, Takao; Tsutsui, Mototsugu; Sueyoshi, Takahiko; Nakamura, Toshinori; Hanaya, Hiroyuki; and Uchiyama, Nobuyuki 07461018 Cl. 705-27.
Yoshimine, Takao; Tsutsui, Mototsugu; Sueyoshi, Takahiko; Nakamura, Toshinori; Hanaya, Hiroyuki; and Uchiyama, Nobuyuki 07461124 Cl. 709-203.
Nakamura, Yutaka: See--
Imamura, Takahiro; and Nakamura, Yutaka 07459096 Cl. 216-22.
Suzuki, Hiroyuki; Kuroda, Sumio; and Nakamura, Yutaka 07460322 Cl. 360-16.
Nakanishi, Motoi; to Murata Manufacturing Co., Ltd. Radar 07460058 Cl. 342-128.
Nakanishi, Tetsuo: See--
Kashida, Meguru; Miyawaki, Satoru; Nakanishi, Tetsuo; and Aramata, Mikio 07459239 Cl. 429-302.
Nakanishi, Yoshihito: See--
Koike, Tadashi; Mitsunami, Yukiko; Shigeno, Takashi; Andachi, Kazuya; Kato, Hiroyuki; Nakanishi, Yoshihito; and Hachimaru, Izumi D0582043 Cl. D24-165.
Nakano, Hatsumi: See--
Yamamoto, Hiroyasu; Vithanage, Ananda; Shimizu, Takakuni; Fujita, Kaoru; Nakano, Hatsumi; Shiga, Takaaki; Soga, Ryuji; Katono, Masayoshi; Watanabe, Toshiyuki; and Koibuchi, Misako 07461111 Cl. 708-255.
Nakano, Hiroshi; to Sumitomo Wiring Systems, Ltd. Connector 07458848 Cl. 439-570.
Nakao, Koichi; and Kitagawa, Masahiro, to Roland Corporation Electronic pickup D0581971 Cl. D17-22.
Nakao, Shuji: See--
Ishibashi, Takeo; Saito, Takayuki; Itoh, Maya; and Nakao, Shuji 07459265 Cl. 430-311.
Nakao, Tomoaki; to Sharp Kabushiki Kaisha Offset adjusting circuit and operational amplifier circuit 07459966 Cl. 330-9.
Nakaoka, Yasushi: See--
Mukaiyama, Masanori; Hanaoka, Masaaki; Nakaoka, Yasushi; and Hisamatsu, Yutaka 07461138 Cl. 709-219.
Nakashima, Yasuhiro: See--
Morioka, Minoru; Nakashima, Yasuhiro; Higuchi, Takayuki; Takahashi, Mitsuo; Yamamoto, Kenji; Sakai, Etuo; and Daimon, Masaki 07459020 Cl. 106-714.
Nakaso, Mariko: See--
Utsumi, Kuniaki; Yamamoto, Hiroaki; Masuda, Kouichi; Niiho, Tsutomu; Nakaso, Mariko; Tanaka, Kazuo; and Sasai, Hiroyuki 07460829 Cl. 455-13.1.
Nakasugi, Tetsuro; Inanami, Ryoichi; Ota, Takumi; and Koshiba, Takeshi, to Kabushiki Kaisha Toshiba Charged particle beam exposure method of character projection system, charged particle beam exposure device of character projection system, program for use in charged particle beam exposure device, and manufacturing method of semiconductor device 07459705 Cl. 250-492.22.
Nakata, Masahiro; to Hoya Corporation Focus detection system 07460779 Cl. 396-96.
Nakata, Yasuhiro: See--
Kudo, Hayami; Kawaguchi, Masahiko; and Nakata, Yasuhiro 07460000 Cl. 336-200.
Nakaya, Hideo: See--
Kondo, Tetsujiro; Nakaya, Hideo; Yamaguchi, Nobuyuki; and Shinmei, Katsuhisa 07460178 Cl. 348-576.
Nakayama, Hideo: See--
Ueno, Osamu; Funada, Masao; Miura, Masaaki; Hamada, Tsutomu; Kyozuka, Shinya; Takanashi, Osamu; Nakayama, Hideo; Sakurai, Jun; and Sakamoto, Akira 07460749 Cl. 385-33.
Nakayama, Hirokatsu: See--
Tanaka, Junichi; Nakayama, Hirokatsu; Yasuda, Naru; and Hosokawa, Hayami 07460747 Cl. 385-31.
Nakayama, Hiroyuki: See--
Moriya, Tsuyoshi; and Nakayama, Hiroyuki 07458247 Cl. 73-28.01.
Nakayama, Koji: See--
Inoue, Masafumi; Nakayama, Koji; and Katsuda, Yoshio 07459168 Cl. 424-406.
Nakayama, Makoto; and Kanamaru, Masahiro, to Yazaki Corporation Structure for housing electrical junction box in housing box 07459631 Cl. 174-50.
Nakayama, Naoki; Wen, Duanzhi; Han, Chun-ya; He, Ching; and Yu, Dongyin, to Amgen Inc. Chordin-like molecules and uses thereof 07459291 Cl. 435-69.1.
Nakayama, Shinichi; and Yokohata, Shizuo, to Hitachi, Ltd. Storage subsystem and storage controller 07461245 Cl. 713-1.
Nakayama, Tadayoshi; to Canon Kabushiki Kaisha Data transform processing apparatus and method 07460729 Cl. 382-276.
Nakayama, Tatsuo; Ando, Yuji; Miyamoto, Hironobu; Kuzuhara, Masaaki; Okamoto, Yasuhiro; Inoue, Takashi; and Hataya, Koji, to NEC Corporation Ohmic electrode structure of nitride semiconductor device 07459788 Cl. 257-761.
Nakayama, Tomonari; Ohnishi, Toshinobu; Kubota, Makoto; and Miura, Daisuke, to Canon Kabushiki Kaisha Substrate, conductive substrate, fine structure substrate, organic field effect transistor and manufacturing method thereof 07459338 Cl. 438-99.
Nakayama, Toshinori: See--
Ai, Ryuta; Ito, Yoshikuni; and Nakayama, Toshinori 07460821 Cl. 399-328.
Nakayama, Yasuhiko: See--
Maeda, Shunji; Nakayama, Yasuhiko; Yoshida, Minoru; Kubota, Hitoshi; and Oka, Kenji 07460220 Cl. 356-237.2.
Nakayasu, Hidetoshi; Mizuno, Yasuhiro; and Hongo, Hideyuki, to Takasago International Corporation Process for purifying menthol 07459587 Cl. 568-829.
Nakazima, Kotaro; to Kyokutoh Co., Ltd Tip dresser 07458139 Cl. 29-33R.
Nakazuru, Toshiro; Okutani, Shigeaki; and Morita, Noboru, to Fujitsu Limited Fourier transform apparatus 07461114 Cl. 708-404.
Nalco Company: See--
Keiser, Bruce A.; and Sherman, Laura M. 07459059 Cl. 162-181.6.
Nambiar, Madhu: See--
Douma, John D.; Laidlaw, John F.; and Nambiar, Madhu 07458291 Cl. 74-388PS.
Nandi, Prabir: See--
Ye, deceased, Yiming; Chung, Jen-Yao; Cohn, David; Heath, III, Fenno F.; Jeng, Jun-Jang; Kumaran, Santhosh; Lei, Hui; and Nandi, Prabir 07461125 Cl. 709-204.
Nanjo, Masatoshi; to Disco Corporation Semiconductor device including semiconductor memory element and method for producing same 07459767 Cl. 257-617.
Nanjundaiah, Prabesh Babu: See--
Ghosh, Kalyan; Jain, Praveen; Subramanian, Shankar; Bhandari, Rajesh; and Nanjundaiah, Prabesh Babu 07460527 Cl. 370-360.
Nanjundaswamy, Kirakodu S.: See--
Totir, Dana Alexa; Nanjundaswamy, Kirakodu S.; and Pozin, Michael 07459237 Cl. 429-224.
Nanu, Florin: See--
Corcoran, Peter; Steinberg, Eran; Petrescu, Stefan; Drimbarean, Alexandru; Nanu, Florin; Pososin, Alexei; and Bigioi, Petronel 07460694 Cl. 382-118.
Steinberg, Eran; Corcoran, Peter; Bigioi, Petronel; Pososin, Alexei; Drimbarean, Alexandru; Nanu, Florin; and Petrescu, Stefan 07460695 Cl. 382-118.
Nanya Technology Corp.: See--
Wu, Shun-Ker 07459925 Cl. 324-754.
Naoe, Hitoshi: See--
Fukae, Fumihiro; Naoe, Hitoshi; Sakai, Koji; and Osawa, Shohei 07461318 Cl. 714-749.
Naoi, Yuki; to Konica Minolta Opto, Inc. Optical element and illuminating device 07458704 Cl. 362-330.
Napier, Malcolm N.: See--
Neitzel, Roger S.; Napier, Malcolm N.; and Fern, David G. D0581880 Cl. D13-162.
Naqvi, Noushad: See--
Zinn, Ronald Scotte; Phillips, Catherine M.; Naqvi, Noushad; and Weigele, Ingo W. 07460868 Cl. 455-435.2.
Narendran, Arungundram C.: See--
Rowley, Henry A.; Baluja, Shumeet; and Narendran, Arungundram C. 07460735 Cl. 382-305.
Narimoto, Yukitoshi: See--
Hasebe, Masahiro; and Narimoto, Yukitoshi 07458605 Cl. 280-729.
Nartron Corporation: See--
Boisvert, Mario P.; Perrin, Randall L.; Puska, Marvin E.; and Mitchell, John E. 07459800 Cl. 290-40C.
Nasiri, Steven S.; Seeger, Joseph; Lim, Martin; Flannery, Jr., Anthony Francis; and Castro, Alexander, to Invensense Inc. Method of making an X-Y axis dual-mass tuning fork gyroscope with vertically integrated electronics and wafer-scale hermetic packaging 07458263 Cl. 73-504.12.
Nass, Michael: See--
Nowack, Reinhard; Röhner, Stephan; and Nass, Michael 07458608 Cl. 280-756.
Nast, Jean-Daniel; to Alstom Transport, SA Vehicle adapted to move along a rail 07458323 Cl. 104-282.
Nasu, Hidehisa; Kuroyanagi, Akira; Ichikawa, Masato; and Sahashi, Akira, to Denso Corporation Heated medium supplying method and structure for secondary molding of resin molded component 07459118 Cl. 264-328.16.
Näsvall, Alf; and Byström, Gunnar, to SAAB AB Radar reflector 07460051 Cl. 342-7.
Nataraj, Bindiganavale S.: See--
Iyengar, Vinay; and Nataraj, Bindiganavale S. 07461295 Cl. 714-25.
Natarajan, Chitra: See--
Muthrasanallur, Sridhar; Wilder, Jeff; and Natarajan, Chitra 07461218 Cl. 711-157.
Natco Norway AS: See--
Christiansen, Bjorn; Sveberg, Knut; Hjelkrem, Inge; and Kvamsdal, Dag 07459001 Cl. 55-343.
Nathan, John F.; Tang, Tom Q.; and Ghabra, Riad, to Lear Corporation Seat folding system with radio frequency limited targeted zones for verifying operator presence 07460005 Cl. 340-5.61.
Nathan Leslie Designs, LLC: See--
Leslie, Nathan D0581658 Cl. D3-229.
National Applied Research Laboratories National Center for High-Performance Computing: See--
Huang, Kuen-Yu; Wang, Yao-Tsung; and Chen, Po-Wen 07460770 Cl. 396-25.
National Institute of Advanced Industrial Science and Technology: See--
Watari, Koji; Nakamura, Kazuo; Sato, Kimiyasu; Kinemuchi, Yoshiaki; Uchimura, Shoji; Ishiguro, Hirohide; and Morimitsu, Hideki 07459178 Cl. 427-180.
Yoda, Ikushi; and Sakaue, Katsuhiko 07460686 Cl. 382-103.
National Institute of Agrobiological Sciences: See--
Tamura, Toshiki; Sezutsu, Hideki; Kobayashi, Isao; Kojima, Katsura; Kanda, Toshio; and Uchino, Keiro 07459599 Cl. 800-4.
National Institute of Information and Communications Technology: See--
Tanaka, Hidema; Kaneko, Toshinobu; and Sugio, Nobuyuki 07460665 Cl. 380-1.
National Institute of Information and Communications Technology, Incorporated Administrative Agency: See--
Kasai, Katsuyuki 07460570 Cl. 372-22.
National Research Council of Canada: See--
Faid, Karim; Py, Christophe; and Bensebaa, Farid 07459316 Cl. 436-518.
National Semiconductor Corporation: See--
Ma, Wei; and Bahai, Ahmad 07460024 Cl. 340-693.3.
Potanin, Vladislav; and Potanina, Elena 07459886 Cl. 320-135.
National Tsing Hua University: See--
Yeh, Chuin-Tih 07459000 Cl. 48-198.7.
Natrajan, Anand: See--
Jiang, Qingping; Natrajan, Anand; Sharpe, David; Wong, Wen-Jee; and Law, Say-Jong 07459284 Cl. 435-18.
Natsch, Andreas: See--
Derrer, Samuel; Natsch, Andreas; Traupe, Bernd; and Stang, Melanie 07459581 Cl. 560-155.
Natuzzi, Pasquale; to Natuzzi S.p.A. Sofa D0581691 Cl. D6-381.
Natuzzi S.p.A.: See--
Natuzzi, Pasquale D0581691 Cl. D6-381.
Natzle, Wesley C.: See--
Amos, Ricky S.; Natzle, Wesley C.; Panda, Siddhartha; and Tessier, Brian L. 07459382 Cl. 438-583.
Naumi, Tero: See--
Salo, Juha H.; Vermola, Larri; and Naumi, Tero 07461350 Cl. 715-773.
Naura, David; Moreaux, Christophe; Kari, Ahmed; and Rizzo, Pierre, to STMicroelectronics S.A. Method for checking block erasing of a memory and circuit thereof 07460401 Cl. 365-185.12.
Nautilus Hyosung Inc.: See--
Kang, Dong Gu; and Lee, Jong Ok D0582125 Cl. D99-28.
Navatek, Ltd.: See--
Loui, Steven; and Shimozono, Gary 07459802 Cl. 290-53.
Navero, Diego Barranco; and Romero, Luis Rallo, to Universidad de Córdoba Olive tree named ‘Chiquitita’ PP019511 Cl. PLT-158.
Navratil, Roman: See--
Marik, Karel; Navratil, Roman; and Stluka, Petr 07460915 Cl. 700-31.
Navteq North America, LLC: See--
Herbst, James M.; McGrath, Suzanne M.; and Borak, Jason M. 07460953 Cl. 701-211.
NCR Corporation: See--
Haulk, Kevin W.; and Harkins, Cheryl K. 07461009 Cl. 705-20.
Masterton, Stuart; and Clark, Barrie 07458516 Cl. 235-486.
Neavia: See--
Wilbrod, Jean-Hubert 07460949 Cl. 701-118.
NEC Corporation: See--
Ebata, Koichi; and Takeda, Kenji 07461185 Cl. 710-52.
Furuya, Tomoki 07460879 Cl. 455-522.
Hasegawa, Naoki 07460838 Cl. 455-90.2.
Kanamaru, Keisuke 07461326 Cl. 714-760.
Kobayashi, Takeshi 07460887 Cl. 455-566.
Nakayama, Tatsuo; Ando, Yuji; Miyamoto, Hironobu; Kuzuhara, Masaaki; Okamoto, Yasuhiro; Inoue, Takashi; and Hataya, Koji 07459788 Cl. 257-761.
Oyama, Koichi 07460888 Cl. 455-566.
Tsuchi, Hiroshi; and Iriguchi, Masao 07459967 Cl. 330-9.
NEC Electronics Corporation: See--
Kimura, Katsuji 07459963 Cl. 327-553.
Miyamoto, Manabu 07459883 Cl. 320-116.
Miyamoto, Manabu 07459885 Cl. 320-134.
Shime, Isao 07460444 Cl. 369-44.11.
Yoshino, Akira 07460405 Cl. 365-185.18.
NEC LCD Technologies, Ltd.: See--
Hashimoto, Yoshiaki; Kimura, Shigeru; and Suzuki, Seiji 07460190 Cl. 349-43.
Honbo, Nobuaki 07459865 Cl. 315-291.
Nagai, Hiroshi; and Ikeno, Hidenori 07460198 Cl. 349-117.
NEC Tokin Corporation: See--
Sakata, Koji; Yoshida, Katsuhiro; Hori, Yoshitaka; and Date, Tomohide 07460359 Cl. 361-528.
Nedwed, Timothy J.; to ExxonMobil Upstream Research Company Hydrogyro ship stabilizer and method for stabilizing a vessel 07458329 Cl. 114-122.
Neff, Jennifer A.: See--
Nilsson, Bo; Andersson, Jonas; Caldwell, Karin; Neff, Jennifer A.; and Nilsson-Ekdahl, Kristina 07459169 Cl. 424-422.
Negoro, Masanori; and Hara, Nobuo, to Yamaha Hatsudoki Kabushiki Kaisha Vehicle control unit and vehicle 07458435 Cl. 180-180.
Neidhart, Werner: See--
Gobbi, Luca Claudio; Gubler, Marcel; Neidhart, Werner; and Nettekoven, Matthias Heinrich 07459480 Cl. 514-450.
Neilsen, Timothy; to Slatbox Pty Ltd Box D0581670 Cl. D3-304.
Neitzel, Roger S.; Napier, Malcolm N.; and Fern, David G., to Rain Bird Corporation Wireless extension unit for an irrigation controller D0581880 Cl. D13-162.
Nejad, Mohammad Sarhang: See--
Fujimori, Ichiro; and Nejad, Mohammad Sarhang 07460589 Cl. 375-224.
Nelan, Stuart: See--
Sicking, Charles; Nelan, Stuart; and McLain, William “Bill” H. 07460437 Cl. 367-38.
Nellcor Puritan Bennett LLC: See--
Jafari, Mehdi Matthew 07460959 Cl. 702-24.
Nelson, Erik: See--
Barlet-Gouedard, Véronique; Cambus, Chrystel; Danican, Samuel; Nelson, Erik; and Goffe, Bruno 07459019 Cl. 106-705.
Nemati, Farid: See--
Cho, Hyun-Jin; and Nemati, Farid 07460395 Cl. 365-180.
Neogi, Jayant; and Neogi, Suneeta Apparatus and method for polishing gemstones and the like 07459702 Cl. 250-492.2.
Neogi, Suneeta: See--
Neogi, Jayant; and Neogi, Suneeta 07459702 Cl. 250-492.2.
NEOPOST Technologies: See--
Nlend, Bénédicte; Ray, Dany; and Blanluet, Patrick 07458653 Cl. 347-7.
Nequist, Eric; to Cadence Design Systems, Inc. Method and mechanism for determining shape connectivity 07461359 Cl. 716-1.
Nervegna, Louis J.; to Silicon Laboratories Inc. Programmable resistor array having current leakage control 07461285 Cl. 713-500.
Neste Oil Oyj: See--
Koivusalmi, Eija; and Jakkula, Juha 07459597 Cl. 585-733.
NetApp. Inc.: See--
Mowat, J Eric; Shah, Mehul S.; and Kuo, Szu-wen 07461147 Cl. 709-225.
Netlogic Microsystems, Inc.: See--
Birman, Mark; Srikrishna, Ajay; and Venkatachary, Srinivasan 07461200 Cl. 711-108.
Iyengar, Vinay; and Nataraj, Bindiganavale S. 07461295 Cl. 714-25.
Netta, John L.: See--
Globus, Yevgeniy I.; Jozokos, Mark A.; Netta, John L.; Pruce, George Martin; and Venkataraman, Sundar Kilnagar 07459498 Cl. 524-520.
Nettekoven, Matthias Heinrich: See--
Gobbi, Luca Claudio; Gubler, Marcel; Neidhart, Werner; and Nettekoven, Matthias Heinrich 07459480 Cl. 514-450.
Network Appliance, Inc.: See--
Tan, Cheng-Ping; Phan, Con D.; and Hindi, Faris R. 07461298 Cl. 714-42.
Network Equipment Technologies: See--
Williams, Aaron; and Jayaraman, Prakash 07460536 Cl. 370-392.
Network Solutions, LLC: See--
Lu, Chun-Ming; and Lee, Vincent M. 07461334 Cl. 715-234.
Neubert, Hans: See--
Leslie, James C.; Leslie, II, James C.; Heard, James; Truong, Liem; Josephson, Marvin; and Neubert, Hans 07458617 Cl. 285-390.
NeuCo, Inc.: See--
Lefebvre, W. Curt; and Kohn, Daniel W. 07458342 Cl. 122-379.
Neurocrine Biosciences, Inc.: See--
Zook, Scott E.; Hettinger, Donald; and DuBois, III, Henry R. 07459458 Cl. 514-259.3.
Neurosearch A/S: See--
Scheel-Krüger, Jørgen; and Blackburn-Munro, Gordon John 07459464 Cl. 514-304.
New Dimensions Research Corporation: See--
Mason, Timothy L. 07458473 Cl. 211-59.3.
New Heritage Ltd.: See--
Min, Wang San D0581813 Cl. D10-38.
New Jersey Institute of Technology: See--
Federici, John Francis; Grebel, Haim; and Altan, Hakan 07459687 Cl. 250-341.8.
Newell, Matthew B.: See--
Bender, Theodore M.; Warder-Gabaldon, Zachary; Newell, Matthew B.; Hausen, Bernard A.; and Knodel, Bryan D. 07458978 Cl. 606-142.
Newell Operating Company: See--
Ricereto, Michael Hart; and Kim, Hyunchul D0581779 Cl. D8-400.
Newman, E. Ray: See--
Eads, Rosalie J.; and Newman, E. Ray D0581999 Cl. D22-147.
Newman, Mark W.; Edwards, W. Keith; Hong, Jason; Izadi, Shahram; Marcelo, Karen J.; Sedivy, Jana Z.; and Smith, Trevor F., to Xerox Corporation Methods, apparatus, and program products for configuring components in networked computing environments 07461172 Cl. 709-246.
Newton, III, Charles P.: See--
Garrow, Gary R.; Newton, III, Charles P.; Weir, Patrick E.; West, II, David P.; and Wetzer, Michael 07461008 Cl. 705-8.
Newton, James R.: See--
Geschiere, Onno; Nicol, Howard; and Newton, James R. 07460681 Cl. 381-324.
Neyman, Igor: See--
Miloslavsky, Alec; Goecke, Jason; Deryugin, Vladimir N.; Torba, Dmitry A.; Neyman, Igor; and Turovsky, Oleg 07460496 Cl. 370-270.
NFT Nanofiltertechnik GmbH: See--
Hofmann, Wilfried 07458416 Cl. 165-121.
Ng, Boon Chew; Tam, Wing Wah; and Lim, Ee Teoh, to Aurigin Technology PTE Ltd. Apparatus and method for filling a ball grid array template 07458499 Cl. 228-246.
Ng, Raymond K.; to Oracle International Corporation Distributed capability-based authorization architecture using roles 07461395 Cl. 726-1.
Ng, Yew Liam; Ang, Kim Siah; Chong, Chee Chung; and Gu, Ming Kun, to CET Technologies PTE Ltd Image processing techniques for a video based traffic monitoring system and methods therefor 07460691 Cl. 382-107.
Ngo, Huey-Jiun: See--
Humphries, Laymon Scott; Ngo, Huey-Jiun; and Puranik, Gagan 07460871 Cl. 455-456.1.
Ngo, Hung C.; Kuang, Jente B.; Warnock, James D.; and Wendel, Dieter F., to International Business Machines Corporation Pulsed local clock buffer (LCB) characterization ring oscillator 07459950 Cl. 327-172.
Ngo, Hung Viet; Swain, Wilfred James; and Daily, Christopher G., to FCI Americas Technology, Inc. Electrical connectors having power contacts with alignment and/or restraining features 07458839 Cl. 439-291.
Nguyen, Bai: See--
Agrawal, Om P.; Sharpe-Geisler, Brad; Lee, Jye-Yuh; and Nguyen, Bai 07459935 Cl. 326-38.
Nguyen-Kim, Son; Hoessel, Peter; and Schunter, Walter, to BASF Aktiengesellschaft Cosmetic agent containing at least one copolymer having N-vinyllactam units 07459148 Cl. 424-70.11.
Nguyen, Son Hoai: See--
Connor, Eric; Charmot, Dominique; Chang, Han Ting; Roger, Florence; Klearner, Gerrit; and Nguyen, Son Hoai 07459502 Cl. 525-374.
Nguyen, Thelinh: See--
Hauenschild, Juergen; and Nguyen, Thelinh 07460790 Cl. 398-192.
Nguyen, Thuan Thien Disposable baby diaper container 07458480 Cl. 220-666.
Nguyen, Ut: See--
Cheung, Francis; Chen, Iue-Shuenn; Nguyen, Ut; Mamidwar, Rajesh; Schoner, Brian; and Simon, Dan 07461282 Cl. 713-400.
Nguyen Van Dau, Frédéric; Cros, Vincent; George, Jean-Marie; Grollier, Julie; Jaffres, Henri; and Petroff, Frédéric, to Thales Control device for reversing the direction of magnetisation without an external magnetic field 07459998 Cl. 335-302.
NHK Spring Co., Ltd.: See--
Iwata, Kazuo; Shimbori, Takeyoshi; Yamada, Koichiro; and Takamura, Noritoshi 07458356 Cl. 123-188.13.
Kazama, Toshio 07459922 Cl. 324-754.
Nice, Harold Lee Van: See--
Emery, Timothy R; Radominski, George; Hanson, Steve P.; Shreeve, Robert W.; Govyadinov, Alexander; Truninger, Martha A.; Ramamoorthi, Sriram; and Nice, Harold Lee Van 07460293 Cl. 359-293.
Nichia Corporation: See--
Hayamura, Mitsuo; and Akamatsu, Shiro 07459718 Cl. 257-12.
Takahashi, Takeshi; Morizaki, Masuhiro; Takeoka, Atsushi; and Tokuno, Junichi 07459238 Cl. 429-231.
Nichol, Claudia D. Quilter's cutting ruler angle guide D0581816 Cl. D10-64.
Nichol, Claudia D. Quilter's cutting ruler angle guide D0581817 Cl. D10-64.
Nicholas, Kenneth J.; to L.D. Kichler Co., The Light fixture D0582091 Cl. D26-88.
Nichols, Tony; and Para, Paul, to Webroot Software, Inc. Method and system for rapid data-fragmentation analysis of a New Technology File System 07461104 Cl. 707-206.
Nichols, Walter A.; Brookman, Donald L.; Grollimund, Gary E.; and Smith, Ulysses, to Philip Morris USA Inc. Aerosol generator for drug formulation 07458373 Cl. 128-203.15.
Nicholson, Robert Bruce: See--
Carr, David John; Jones, Michael John; Key, Andrew; Nicholson, Robert Bruce; Scales, William James; and Whyte, Barry Douglas 07461217 Cl. 711-154.
Nicodemo, Thomas J.: See--
Burns, Ivey; Charanda, Thoram; Nicodemo, Thomas J.; Davis, Richard; and Crowder, Janell 07459075 Cl. 210-150.
Nicol, Howard: See--
Geschiere, Onno; Nicol, Howard; and Newton, James R. 07460681 Cl. 381-324.
Nicolai, Jean; to STMicroelectronics SA Translation look-aside buffer supporting mutually untrusted operating systems 07461232 Cl. 711-207.
Nicolas, Julien J.: See--
Lee, Chong U.; Lam, Katherine S.; Nicolas, Julien J.; and Atrero, Edward 07460667 Cl. 380-205.
Nicoloro, Jennifer: See--
Logiudice, Paul Angelo; Perkins, Jay; and Nicoloro, Jennifer D0581728 Cl. D7-395.
Nidec Corporation: See--
Yonei, Hiroyuki; and Hashimoto, Kunihiko 07460334 Cl. 360-99.08.
Nie, Shuming: See--
Bao, Gang; Nie, Shuming; Nitin, Nitin; and LaConte, Leslie 07459145 Cl. 424-9.32.
Niebauer, Kenneth L.; and Zack, Keith R., to Kennametal Inc. Round cutting insert with chip control feature 07458753 Cl. 407-113.
Niebling, Peter; Heim, Jens; Hofmann, Heinrich; Dlugai, Darius; and Langer, Roland, to Schaeffler KG Seal arrangement with encoder and magnetization head for the encoder 07458727 Cl. 384-448.
Nielsen Media Research, Inc.: See--
Srinivasan, Venugopal 07460684 Cl. 382-100.
Niese, Virgil J.: See--
Hornbach, David W.; and Niese, Virgil J. 07458119 Cl. 5-618.
Nigam, Anurag; and Stiles, David, to Redback Networks Inc. Any size and location of concatenated packet data across SONET frames in a SONET signal 07460554 Cl. 370-442.
Niggemann, legal representative, Karl-Heinz: See--
Steinhilber, deceased, Helmut 07458569 Cl. 271-10.01.
Nigro, Anthony Innocenzo: See--
Dong, Han-Qing; Foreman, Kenneth; Mulvihill, Mark Joseph; Nigro, Anthony Innocenzo; Steinig, Arno G.; Werner, Douglas; and Wilkes, Robin 07459554 Cl. 544-120.
Nihon Kohden Corporation: See--
Mase, Ryuzo; Li, Xiangji; and Imajo, Kaoru 07460905 Cl. 600-544.
Nihon Nohyaku, Co., Ltd.: See--
Furuya, Takashi; Yamaguchi, Minoru; Tohnishi, Masanori; Seo, Akira; Morimoto, Masayuki; Takemoto, Tsuyoshi; and Fujioka, Shinsuke 07459477 Cl. 514-406.
Nihon University: See--
Tsunashima, Hitoshi; Yamada, Ayuta; Kanari, Hozumi; and Arai, Yoshinori 07460700 Cl. 382-131.
Niiho, Tsutomu: See--
Utsumi, Kuniaki; Yamamoto, Hiroaki; Masuda, Kouichi; Niiho, Tsutomu; Nakaso, Mariko; Tanaka, Kazuo; and Sasai, Hiroyuki 07460829 Cl. 455-13.1.
Niimi, Hiroaki; and Laaksonen, Reima Tapani, to Texas Instruments Incorporated Method for forming ultra thin low leakage multi gate devices 07459390 Cl. 438-622.
Niiyama, Satoshi: See--
Tahara, Shinya; Kojima, Seiji; Suwa, Shunichi; Ozeki, Masao; and Niiyama, Satoshi 07459189 Cl. 428-1.3.
Nijhawa, Sandeep: See--
Bour, David; Nijhawa, Sandeep; Smith, Jacob; and Washington, Lori 07459380 Cl. 438-478.
Nikawa, Susumu: See--
Fukuda, Toshinari; Ogino, Manabu; and Nikawa, Susumu 07458518 Cl. 235-492.
NIKE, Inc.: See--
Aveni, Michael A. 07458172 Cl. 36-27.
Molyneux, James D0581826 Cl. D11-2.
Nikitin, Alexandr Vladimirovich: See--
Akishev, Niaz Irekovich; Zakirov, Ildus Muhametgaleevich; and Nikitin, Alexandr Vladimirovich 07458802 Cl. 425-520.
Nikon Corporation: See--
Mizutani, Hideo; and Magome, Nobutaka 07460207 Cl. 355-30.
Nikoonahad, Mehrdad: See--
Bultman, Gary; Levy, Ady; Brown, Kyle A.; Nikoonahad, Mehrdad; Wack, Dan; and Fielden, John 07460981 Cl. 702-155.
Nilsen, Christopher Norman: See--
Greco, Michael N.; Almond, Harold R.; de Garavilla, Lawrence; Hawkins, Michael J.; Humora, Michael J.; Qian, Yun; Walker, Donald Gilmore; Cesco-Cancian, Sergio; Nilsen, Christopher Norman; Patel, Mitul N.; Sorgi, Kirk Leonard; and Powell, Eugene 07459461 Cl. 514-277.
Nilsson, Bo; Andersson, Jonas; Caldwell, Karin; Neff, Jennifer A.; and Nilsson-Ekdahl, Kristina, to Allvivo, Inc. Surface coating comprising bioactive compound 07459169 Cl. 424-422.
Nilsson-Ekdahl, Kristina: See--
Nilsson, Bo; Andersson, Jonas; Caldwell, Karin; Neff, Jennifer A.; and Nilsson-Ekdahl, Kristina 07459169 Cl. 424-422.
Nilsson, Reine: See--
Stromberg, Peter; Nilsson, Reine; Asplund, Roberth; Baversjo, Bo; and Sandstrom, Peter 07460977 Cl. 702-150.
Nimni, Marcel: See--
Hall, Frederick L.; Gordon, Erlinda M.; Beart, Robert W.; and Nimni, Marcel 07459541 Cl. 530-399.
Ning, Gang; to AVX Corporation Neutral electrolyte for a wet electrolytic capacitor 07460356 Cl. 361-507.
Ningbo Wanan Co., Ltd.: See--
Zhang, Feng 07458386 Cl. 137-15.18.
Ninomiya, Yasunori: See--
Totokawa, Masashi; and Ninomiya, Yasunori 07458150 Cl. 29-852.
Nippon Mektron Limited: See--
Zuo, Min; and Lin, Jenq-Tain 07459216 Cl. 428-458.
Nippon Mining & Metals Co., Ltd: See--
Okabe, Takeo; Irumata, Shuichi; Yamakoshi, Yasuhiro; Miyashita, Hirohito; and Suzuki, Ryo 07459036 Cl. 148-421.
Nippon Steel Corporation: See--
Asahi, Hitoshi; and Tsuru, Eiji 07459033 Cl. 148-320.
Nippon Telegraph and Telephone Corporation: See--
Kawai, Shingo; Kawada, Hideo; Yoshimoto, Naoto; Ogawa, Toru; and Iwatsuki, Katsumi 07460572 Cl. 372-29.02.
Nippon Thompson Co., Ltd.: See--
Kuwabara, Hideki 07458720 Cl. 384-15.
Kuwabara, Hideki 07458721 Cl. 384-44.
Nisbet, Stuart A.: See--
Yin, Robert; Fallside, Hamish T.; Burnley, Richard P.; McKay, Nicholas; Rhodes, Martin B.; Grant, Douglas M.; Nisbet, Stuart A.; and Edwards, Gareth D. 07461193 Cl. 710-305.
Nisca Corporation: See--
Naganuma, Hiroaki; and Kusunoki, Tokuro 07459813 Cl. 310-49R.
Nishi, Noriyuki; to Noritsu Koki Co., Ltd. Image processing method and apparatus for red eye correction 07460707 Cl. 382-167.
Nishi, Seiichi: See--
Takahashi, Daisuke; Nishi, Seiichi; and Takahashi, Satoji 07459582 Cl. 562-450.
Nishibori, Shin: See--
Andre, Bartley K.; Coster, Daniel J.; De Iuliis, Daniele; Howarth, Richard P.; Ive, Jonathan P.; Jobs, Steve; Kerr, Duncan Robert; Nishibori, Shin; Rohrbach, Matthew Dean; Satzger, Douglas B.; Seid, Calvin Q.; Stringer, Christopher J.; Whang, Eugene Antony; and Zorkendorfer, Rico D0581922 Cl. D14-341.
Nishida, Masaharu: See--
Isobe, Tetsuya; Takahashi, Katsuaki; and Nishida, Masaharu 07459123 Cl. 422-52.
Nishigaki, Eitaro: See--
Kota, Atsushi; Kondo, Yuji; Kawashima, Shingo; and Nishigaki, Eitaro 07460090 Cl. 345-76.
Nishigaki, Michihiko: See--
Kawakubo, Takashi; Nagano, Toshihiko; Abe, Kazuhide; and Nishigaki, Michihiko 07459827 Cl. 310-309.
Kawakubo, Takashi; Ohara, Ryoichi; Ono, Tomio; Nagano, Toshihiko; Nishigaki, Michihiko; Yasumoto, Takaaki; Abe, Kazuhide; and Sano, Kenya 07459833 Cl. 310-328.
Nishijima, Masaaki; and Fukuda, Takeshi, to Panasonic Corporation Radar apparatus 07460055 Cl. 342-70.
Nishikawa, Tomomasa; and Inagawa, Hiroto, to Hitachi Koki Co., Ltd. Combustion chamber arrangement in combustion type power tool 07458493 Cl. 227-10.
Nishimori, Yasushi; Okunishi, Akira; Tokuyama, Kouzo; and Yokuda, Koji, to Furuno Electric Company, Limited Ultrasonic wave transmitting and receiving system for detecting underwater objects 07460433 Cl. 367-2.
Nishimura, Joji: See--
Tsuchiya, Hitoshi; and Nishimura, Joji 07460199 Cl. 349-123.
Nishimura, Kazuo: See--
Majima, Toshiyuki; and Nishimura, Kazuo 07458505 Cl. 234-98.
Nishimura, Tadaharu; to Denso Corporation Inter-task communications method, program, recording medium, and electronic device 07461380 Cl. 719-314.
Nishimura, Takanori; and Kori, Takayuki, to Sony Corporation Information processing method and apparatus 07461333 Cl. 715-230.
Nishimura, Yukio; Yamahara, Noboru; Yamamoto, Masafumi; Kajita, Toru; Shimokawa, Tsutomu; Ito, Hiroshi; and JSR Corporation, to International Business Machines Corporation RADIATION-SENSITIVE RESIN COMPOSITION 06964840 Cl. 430-270.1.
Nishimuro, Youichi: See--
Suzuki, Takahiro; Machida, Kunio; and Nishimuro, Youichi 07459249 Cl. 430-56.
Nishino, Akifumi; and Inubushi, Yutaka, to Kubota Corporation Working vehicle with a speed maintaining apparatus 07458438 Cl. 180-305.
Nishino, Takeshi: See--
Yokogawa, Naruichi; and Nishino, Takeshi 07460792 Cl. 398-202.
Nishioka, Masahiro: See--
Okada, Hiroki; and Nishioka, Masahiro 07458831 Cl. 439-139.
Nishiura, Masahide: See--
Yoshioka, Hideki; Watanabe, Mutsumi; Yuasa, Mayumi; and Nishiura, Masahide 07460698 Cl. 382-128.
Nishiyama, Kazushige; to Canon Kabushiki Kaisha Image forming apparatus with control of power distribution to heat fixing device 07460801 Cl. 399-44.
Nishizawa, Hirotaka: See--
Aoki, Yoshitaka; Tsutsui, Keiichi; Nishizawa, Hirotaka; and Totsuka, Takashi 07458519 Cl. 235-492.
Nishizawa, Hirotaka; Osawa, Kenji; Osako, Junichiro; Wada, Tamaki; Sugiyama, Michiaki; Totsuka, Takashi; Aoki, Yoshitaka; and Tsutsui, Keiichi, to Renesas Technology Corp. Memory card D0581932 Cl. D14-436.
Nishizawa, Masahiro: See--
Ishigaki, Toshimasa; Nishizawa, Masahiro; and Takahashi, Fumio 07460189 Cl. 349-42.
Nisiyama, Ryuichi: See--
Kato, Shinya; Kyono, Takayoshi; Nisiyama, Ryuichi; and Takahashi, Jin 07460630 Cl. 375-372.
Nissan Motor Co., Ltd.: See--
Hamada, Takahiro; Kano, Makoto; and Mabuchi, Yutaka 07458585 Cl. 277-442.
Hashimura, Tadayoshi 07458611 Cl. 280-830.
Shima, Takashi 07460946 Cl. 701-96.
Toyota, Hiromitsu; Konishi, Masaru; Sugimoto, Tomonaga; and Isono, Yoichi 07458650 Cl. 303-151.
Nissen, Povl: See--
Husemoen, Thor; Hansen, Erling Lennart; and Nissen, Povl 07459490 Cl. 523-153.
Nissha Printing Co., Ltd.: See--
Toyooka, Naoto; and Ozawa, Mitsuhiro 07458793 Cl. 425-112.
Nitin, Nitin: See--
Bao, Gang; Nie, Shuming; Nitin, Nitin; and LaConte, Leslie 07459145 Cl. 424-9.32.
Nitinol Development Corporation: See--
Meretei, Attila 07458930 Cl. 600-30.
Nitre, Thierry: See--
Forgue, Jean-Bernard; Lauvergnat, Jack-Pierre; Loiseau, Henry Louis Paul Nicolas; Monnet, Didier; Nitre, Thierry; and Reghezza, Patrick Jean-Louis 07458769 Cl. 415-119.
Nitta, Makoto: See--
Mikami, Hiroshi; Sano, Takeshi; and Nitta, Makoto 07459570 Cl. 549-236.
Nitto, Kiyoshi; Maruyama, Yutaka; and Tsukimoto, Takayuki, to Canon Kabushiki Kaisha Electro-mechanical energy converter and vibration wave driving 07459832 Cl. 310-323.16.
Niwa, Hiroaki; to Canon Kabushiki Kaisha X-ray image taking device 07460641 Cl. 378-95.
Niwa, Kuniyuki: See--
Kawamura, Makoto; Niwa, Kuniyuki; and Kato, Sutemaro 07459910 Cl. 324-418.
Nixon, Mark; Aneweer, Tom; Burr, Kent; and Eddie, Ron, to Fisher-Rosemount Systems, Inc. Self-configuring communication networks for use with process control systems 07460865 Cl. 455-428.
Nizi, Emanuela: See--
Di Francesco, Maria E.; Gardelli, Cristina; Harper, Steven; Matassa, Victor G.; Murgalia, Ester; Nizi, Emanuela; Pace, Paola; Pacini, Barbara; Petrocchi, Alessia; Poma, Marco; and Summa, Vincenzo 07459452 Cl. 514-235.8.
Nlend, Bénédicte; Ray, Dany; and Blanluet, Patrick, to NEOPOST Technologies Postage meter system having a controlled level of ink 07458653 Cl. 347-7.
NNL Enterprises, Inc.: See--
Lee, John D0581638 Cl. D2-919.
Noble, III, Robert L: See--
Kesterson, Don F; Owen, Quentin A; Gordon, Glenn L; and Noble, III, Robert L 07460663 Cl. 379-413.03.
Nobuyuki, Tanaka; to Amerinova Properties LLC Pentas plant named ‘DPVG’ PP019544 Cl. PLT-466.
Noda, Tetsuya; Kasai, Ichiro; Endo, Takeshi; and Tanijiri, Yasushi, to Konica Minolta Photo Imaging, Inc. Method for producing an optical device, optical device, image display apparatus, and head-mounted display 07460286 Cl. 359-27.
Noda, Tomonori: See--
Kawauchi, Masao; Noda, Tomonori; Yamamoto, Shuichi; and Kitajima, Nozomu D0581937 Cl. D14-484.
Nodomi, Akira; to Fujitsu Limited Non-inclusive cache system with simple control operation 07461212 Cl. 711-141.
Noetzel, John G.: See--
Fulks, Gary C.; Poole, Douglas E.; and Noetzel, John G. 07460936 Cl. 701-36.
Noguchi, Masato: See--
Lection, David B.; Masselle, Eric L.; Noguchi, Masato; and Reich, David E. 07461337 Cl. 715-237.
Noguchi, Yasuji: See--
Takeuchi, Masanori; Noguchi, Yasuji; Chiaki, Yutaka; and Oota, Shunji 07460088 Cl. 345-60.
Noguchi, Yasukazu; to Brother Kogyo Kabushiki Kaisha Embroidery sewing machine 07460925 Cl. 700-138.
Noguet, Dominique; and Bouvier des Noes, Mathieu, to Commissariat a l'Energie Atomique Method and device for detection of data transmitted by spectrum spreading 07460582 Cl. 375-147.
Nohata, Yukio: See--
Ono, Takashi; Shinada, Yasuyuki; Kimura, Tatsuo; Nohata, Yukio; and Imai, Takashi 07460256 Cl. 358-1.13.
Nokia Corporation: See--
Aarras, Mikko 07460893 Cl. 455-575.3.
Alfthan, Niilo D0581918 Cl. D14-247.
Koodli, Rajeev; and Flinck, Hannu 07460511 Cl. 370-338.
Lakshmi Narayanan, Ram Gopal 07461259 Cl. 713-176.
Le, Huihua; Wu, Haitao; Jin, Yuehui; Zhang, Dongmei; and Ma, Jian 07460472 Cl. 370-229.
Maalismaa, Juha; and Leinonen, Marko 07460846 Cl. 455-168.1.
Magnusson, Birgir D0581785 Cl. D9-433.
Mattila, Mika D0581784 Cl. D9-433.
O'Donoghue, Niall 07461246 Cl. 713-2.
Pasanen, Juha; and Anttalainen, Pekka 07460862 Cl. 455-418.
Pekonen, Harri J; and Vesma, Jussi 07460869 Cl. 455-436.
Salo, Juha H.; Vermola, Larri; and Naumi, Tero 07461350 Cl. 715-773.
Tirkkonen, Olav; and Hottinen, Ari 07460609 Cl. 375-267.
Tourunen, Ari; Kalliokulju, Juha; Kallio, Hans; Marjelund, Pekka; and Kohonen, Pekka 07460475 Cl. 370-230.1.
Zhang, Hong; Jiang, Luliang; and Zhang, Dajiang 07461248 Cl. 713-155.
Nokia Siemens Networks GmbH & Co. KG: See--
Eder, Christian; Peisl, Wolfgang; and Rapp, Lutz 07460784 Cl. 398-26.
Nokia Siemens Networks Oy: See--
Hätönen, Kimmo; Kumpulainen, Pekka; and Vehviläinen, Pekko 07461037 Cl. 706-18.
Nold, III, Raymond V.; Zazovsky, Alexander F.; Ervin, Steve; Del Campo, Christopher S.; and Briquet, Stephane, to Schlumberger Technology Corporation Apparatus and method for formation evaluation 07458419 Cl. 166-100.
Noma, Kenji; to Fujitsu Limited Magnetic film composed of a first alloy film including iron and platinum or iron and palladium 07459221 Cl. 428-812.
Nomaru, Keiji; to Disco Corporation Laser beam processing machine 07459655 Cl. 219-121.78.
Nomura, Eiji; and Nakamura, Kentarou, to Konica Minolta Opto, Inc. Optical pickup apparatus, objective optical element and optical information recording and/or reproducing apparatus 07460459 Cl. 369-112.13.
Nomura, Taichiroh: See--
Fukushima, Toshiaki; Matsui, Yohichi; and Nomura, Taichiroh 07461182 Cl. 710-33.
Nonaka, Nobuyuki: See--
Koyama, Toshimi; Nonaka, Nobuyuki; and Migita, Jituo 07460079 Cl. 343-788.
Nordberg, Peter: See--
Lilljequist, Lars; Lindkvist, Maria; Nordberg, Peter; Pettersson, Ursula; and Sebhatu, Tesfai 07459463 Cl. 514-300.
Nordman, Eric S.; Ozawa, Miho; Kojima, Masaya; Inaba, Ryoji; Kodama, Yoshitaka; and Yamazaki, Motohiro, to Applied Biosystems Inc. Multi-capillary electrophoresis apparatus 07459068 Cl. 204-451.
Nordmann, Bernhard: See--
Habisreitinger, Uwe; and Nordmann, Bernhard 07459051 Cl. 156-230.
Nordson Corporation: See--
Prieto, Vincent A.; and Kosovich, Deborah 07458524 Cl. 239-71.
Noritsu Koki Co., Ltd.: See--
Nishi, Noriyuki 07460707 Cl. 382-167.
Noritz Corporation: See--
Takeda, Nobuhiro; Asakura, Hiroshi; Tsutsumi, Akira; Kimura, Kazuhiro; Kameyama, Shuji; Amada, Keiichi; and Matsunaga, Hironao 07458340 Cl. 122-31.1.
Noriyoshi Sakabe: See--
Sakabe, Noriyoshi 07460644 Cl. 378-119.
Norman, Christopher J.; and Heidmann, Kurt R., to Steelcase Inc. Back construction with flexible lumbar 07458637 Cl. 297-284.4.
Norman, Daniel P.: See--
Griffith, Gregory Clyde; Guidotti, Richard Allen; Saitta, David A.; and Norman, Daniel P. 07460854 Cl. 455-410.
Norman, Mark H.: See--
Hamilton, Gregory S.; Norman, Mark H.; and Wu, Yong-Qian 07459473 Cl. 514-380.
Norman, Robert D.: See--
Harari, Eliyahou; Norman, Robert D.; and Mehrotra, Sanjay 07460399 Cl. 365-185.04.
Noro, Junichi: See--
Takisawa, Hisashi; Aizawa, Toshiaki; Noro, Junichi; and Kato, Takao D0581910 Cl. D14-230.
Noro, Yutaka: See--
Kobayashi, Yutaka; Nakamura, Keiichi; Noro, Yutaka; Kikuchi, Takahiro; and Ishikawa, Yoshiyuki 07458835 Cl. 439-188.
Norris, James A.; and Hessel, Clifford, to Harris Corporation System and method for obtaining accurate symbol rate and carrier phase, frequency, and timing acquisition for minimum shift keyed waveform 07460618 Cl. 375-336.
Nortel Networks Limited: See--
Chowdhury, Kuntal; Abtahi, Yasaman; Wang, Chung-Ching; and Vasudevan, Mini 07460515 Cl. 370-349.
Rasimas, Jennifer G.; Jackson, Stephen S.; and Black, Ottis K. 07461165 Cl. 709-238.
North Carolina State University: See--
Klaenhammer, Todd R.; Altermann, Eric; Barrangou, Rodolphe; Russell, W. Michael; and Duong, Tri 07459289 Cl. 435-69.1.
Northrop Grumman Corporation: See--
Kennedy, Chandler James 07460566 Cl. 372-10.
Upton, Eric L. 07460084 Cl. 343-909.
Notley, Scott V.: See--
Cosendai, Gregoire; Zilberman, Ytizhak; Kuschner, Doug; Ripley, Anne Marie; Turk, Ruth; Burridge, Jane; Notley, Scott V.; Davis, Ross; Hansen, Morten; Mandell, Lee Jay; Schulman, Joseph H.; Dell, Robert Dan; and Gord, John C. 07460911 Cl. 607-48.
Novak, David Gene: See--
Testin, William John; and Novak, David Gene 07459939 Cl. 326-86.
Novartis AG: See--
Sedrani, Richard; and Quesniaux Ryffel, Valerie RE040596 Cl. 530-405.
Novatek Microelectronics Corp.: See--
Yen, Chih-Jen; and Hsieh, Chih-Yuan 07459943 Cl. 327-91.
NovAtel, Inc.: See--
Kunysz, Waldemar; and Fenton, Patrick C. 07460615 Cl. 375-316.
Novelis Inc.: See--
Marcotte, Jacques; and Slusarenko, Yuhil 07459896 Cl. 324-71.4.
Novolen Technology Holdings, C.V.: See--
Gebhart, Hermann; Huber, Karl; Boss, Christiane; and Langhauser, Franz 07459506 Cl. 526-64.
Nowack, Reinhard; Röhner, Stephan; and Nass, Michael, to Ise Innovative Systems Europe GmbH Vehicle rollover protection system with a roll bar, whose top piece is rounded in U-shape 07458608 Cl. 280-756.
Nozawa, Ryoichi: See--
Ozawa, Tokuro; Kanda, Eiji; and Nozawa, Ryoichi 07460093 Cl. 345-76.
NSCore Inc.: See--
Kikuchi, Takashi 07460400 Cl. 365-185.05.
NTT DoCoMo, Inc.: See--
Ishii, Hiroyuki; Imamura, Yoshimasa; Hanaki, Akihito; Nakamura, Takehiro; Tanaka, Shinya; and Usuda, Masafumi 07460474 Cl. 370-230.
Nucci, Nathaniel V.: See--
Sower, Stacia; Nucci, Nathaniel V.; and Silver, Matthew R. 07459310 Cl. 435-325.
Nunes, Brendon Fire fighting apparatus-simulating lighting fixture D0582092 Cl. D26-94.
Nünlist, Walter: See--
Grahle, Peter; Haldemann, Peter; Nünlist, Walter; Rhyn, Heinz; Friesen, Albert; and Russ, Stanislaus 07458792 Cl. 418-179.
Nuriel, Ifat: See--
Spear, Gail Andrea; Factor, Michael E.; Matosevich, Rivka Mayraz; Fienblit, Shachar; Rahav, Sheli; Bartfai, Robert Francis; Tzafrir, Dalit; and Nuriel, Ifat 07461100 Cl. 707-204.
Nvidia Corporation: See--
Hakura, Ziyad S.; Langendorf, Brian Keith; Pescador, Stefano A.; Danilak, Radoslav; and Simeral, Brad W. 07461211 Cl. 711-137.
Young, Wayne D.; and Ogrinc, Michael A. 07460175 Cl. 348-554.
NXP B.V.: See--
Brandl, Roland 07460345 Cl. 361-56.
Da Silva, Patrick; and Souef, Laurent 07459928 Cl. 326-16.
Ludikhuize, Adrianus Willem; Van Der Pol, Jacob Antonius; and Grover, Raymond J. 07459750 Cl. 257-334.
Wunnicke, Olaf; Loebl, Hans P.; Klee, Mareike K.; and Milsom, Robert F. 07459990 Cl. 333-133.
Nyren, Pål; Ronaghi, Mostafa; and Tallsjö, Annika, to Biotage AB Method of sequencing DNA 07459311 Cl. 436-6.
Nys, Guy: See--
Venema, Jakob; Berger, Claudia; Löken, Christiane; Deleersnijder, Willy; and Nys, Guy 07459279 Cl. 435-7.2.
Venema, Jakob; Berger, Claudia; Löken, Christiane; Deleersnijder, Willy; and Nys, Guy 07459292 Cl. 435-69.1.