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Title Dose-rate and total-dose radiation testing of the Texas Instruments TMS320C30 32-bit floating point digital signal processor. Final report
Creator/Author Siy, P.F. ; Carter, J.T. ; D`Addario, L.R. ; Loeber, D.A.
Publication Date1991 Aug 01
OSTI IdentifierOSTI ID: 5068756
Report Number(s)AD-A-239767/7/XAB;MTR--1119
Other Number(s)F19628-89-C-0001
Resource TypeTechnical Report
Research OrgMitre Corp., Bedford, MA (United States)
Subject440200 -- Radiation Effects on Instrument Components, Instruments, or Electronic Systems; DIGITAL SYSTEMS-- PHYSICAL RADIATION EFFECTS; DOSE RATES;PERFORMANCE TESTING;RADIATION HARDENING;SPECIFICATIONS;STATISTICS;TEST FACILITIES
Related SubjectHARDENING;MATHEMATICS;PHYSICAL RADIATION EFFECTS;RADIATION EFFECTS;TESTING
Description/Abstract The MITRE Corporation has performed in-flux radiation testing of the Texas Instruments TMS320C30 32-bit floating point digital signal processor in both total dose and dose rate radiation environments.^This test effort has provided data relating to the applicability of the TMS320C30 in systems with total dose and/or dose rate survivability requirements.^In order to accomplish these tests, the MITRE Corporation developed custom hardware and software for in-flux radiation testing.^This paper summarizes the effort by providing an overview of the TMS320C30, MITRE`s test methodology, test facilities, statistical analysis, and full coverage of the test results.^(Author)
Country of PublicationUnited States
LanguageEnglish
FormatPages: (31 p)
AvailabilityNTIS
System Entry Date2001 May 13

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