Bibliographic Citation
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Title | Dose-rate and total-dose radiation testing of the Texas Instruments TMS320C30 32-bit floating point digital signal processor. Final report |
Creator/Author | Siy, P.F. ; Carter, J.T. ; D`Addario, L.R. ; Loeber, D.A. |
Publication Date | 1991 Aug 01 |
OSTI Identifier | OSTI ID: 5068756 |
Report Number(s) | AD-A-239767/7/XAB;MTR--1119 |
Other Number(s) | F19628-89-C-0001 |
Resource Type | Technical Report |
Research Org | Mitre Corp., Bedford, MA (United States) |
Subject | 440200 -- Radiation Effects on Instrument Components, Instruments, or Electronic Systems; DIGITAL SYSTEMS-- PHYSICAL RADIATION EFFECTS; DOSE RATES;PERFORMANCE TESTING;RADIATION HARDENING;SPECIFICATIONS;STATISTICS;TEST FACILITIES |
Related Subject | HARDENING;MATHEMATICS;PHYSICAL RADIATION EFFECTS;RADIATION EFFECTS;TESTING |
Description/Abstract | The MITRE Corporation has performed in-flux radiation testing of the Texas Instruments TMS320C30 32-bit floating point digital signal processor in both total dose and dose rate radiation environments.^This test effort has provided data relating to the applicability of the TMS320C30 in systems with total dose and/or dose rate survivability requirements.^In order to accomplish these tests, the MITRE Corporation developed custom hardware and software for in-flux radiation testing.^This paper summarizes the effort by providing an overview of the TMS320C30, MITRE`s test methodology, test facilities, statistical analysis, and full coverage of the test results.^(Author) |
Country of Publication | United States |
Language | English |
Format | Pages: (31 p) |
Availability | NTIS |
System Entry Date | 2001 May 13 |
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