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back to top | back to index of optical radiation measurements  Figure 7.1 Measurement Uncertainty for NIST Spectral Radiance Calibrations back to top | back to index of optical radiation measurements Spectral Irradiance Lamps (39030C-39051C)Two types of spectral irradiance lamp standards are supplied by NIST. For general applications, tungsten-filament, 1000 W quartz-halogen FEL lamps are calibrated at 31 wavelengths from 250 nm to 2400 nm, or at a reduced set of wavelengths for narrower wavelength ranges. All calibrations are performed at a working distance is 50 cm. For ultraviolet applications, deuterium-arc lamps are calibrated at 21 wavelengths from 200 nm to 400 nm The deuterium lamps are intended primarily for use at wavelengths between 200 nm and 250 nm Although the shape of the spectral distribution of the deuterium lamps is stable over long periods of time, the absolute irradiance varies on the order of 12 % (k = 2). The uncertainty of the absolute irradiance can be reduced by approximately a factor of two by scaling the spectral irradiance of the deuterium lamp to the spectral irradiance of a tungsten-filament quartz-halogen FEL lamp standard over the wavelength range 250 nm to 300 nm, each time the lamp is operated. back to top | back to index of optical radiation measurements Special Tests of Radiometric Sources (39060S) | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Service ID Number | Description of Services | Fee ($) |
|---|---|---|
| 39071C | UV Silicon Photodiodes | 5463 |
| 39072C | Recalibration of UV Silicon Photodiodes | 4299 |
| 39073C | Visible to NIR Silicon Photodiodes | 5555 |
| 39074C | Recalibration of Visible to NIR Silicon Photodiodes | 4299 |
| 39075S | Special Tests of NIR Photodiodes | At Cost |
| 39077C | UV to Near-Infrared Silicon Photodiodes (Hamamatsu S2281) | 6631 |
| 39078C | Recalibration of UV to Near-Infrared Silicon Photodiodes (Hamamatsu S1337-1010BQ or S2281) | 5374 |
| 39080S | Special Tests of Radiometric Detectors | At Cost |
| 39081S | Special Tests of Photodetector Responsivity Spatial Uniformity | At Cost |
| 39090S | Special Tests of IR Detectors | At Cost |
| 39100S | Special Tests of Irradiance Detectors | At Cost |
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This laboratory's quality system is based on the ANSI/NCSL Z540-1-1994 standard and the ISO/IEC Guide 25.
NIST will supply the customer with a UDT Sensors, Inc. model UV100 silicon photodiode characterized in the ultraviolet (UV) spectral region. The UV silicon photodiode includes the measured spectral responsivity [A/W] from 200 nm to 500 nm in 5 nm steps. The 1 cm2 photosensitive area of the photodiodes is underfilled for the measurements with a beam of diameter 1.5 mm. The spectral responsivity is measured at radiant power levels of less than 20 µW. The bandpass of the measurement is 3 nm The spatial uniformity of responsivity over the photosensitive area is also measured at 350 nm
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Recalibration of UV silicon photodiodes previously supplied by NIST under (39071C) is performed by measuring spectral responsivity from 200 nm to 500 nm
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NIST will supply the customer with a Hamamatsu model S2281 (previously a Hamamatsu S1337-1010BQ) windowed silicon photodiode characterized in the visible to near-IR spectral region. The spectral responsivity of the photodiode is measured from 350 nm to 1100 nm in 5 nm steps. The 1 cm2 photosensitive area is underfilled for the measurements with a beam of diameter 1.1 mm. The spectral responsivity is measured at radiant power levels of less than 1 µW. The bandpass of the measurement is 4 nm The spatial uniformity of responsivity over the photosensitive area is also measured at 500 nm
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Recalibration of visible to near-infrared silicon photodiodes previously supplied by NIST under (39073C) is performed by measuring spectral responsivity from 350 nm to 1100 nm The spectral range can be extended to 200 nm for an additional fee (use Test # 39078C).
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Special tests of customer-supplied NIR photodiodes are performed by measuring spectral responsivity from 700 nm to 1800 nm A 1.1 mm diameter beam is centered on and underfills the photosensitive area. The spectral responsivity is measured at radiant power levels of less than 1 µW. The bandpass of the measurement is 4 nm Customers should communicate with Thomas Larason to discuss details before submitting a formal request.
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NIST will supply customers with a Hamamatsu model windowed silicon photodiode characterized in the UV to near-IR spectral region. The spectral responsivity of the photodiode is measured from 200 nm to 1100 nm in 5 nm steps. The 1 cm2 photosensitive area of the photodiode is underfilled for the measurements. The spectral responsivity is measured with a beam of diameter 1.5 mm from 200 nm to 400 nm at radiant power levels of less than 20 µW. The bandpass of the measurement is 3 nm From 405 nm to 1100 nm the spectral responsivity is measured with a beam of diameter 1.1 mm in the 400 nm to 1800 nm spectral region at power levels less than 1 µW. The bandpass of the measurement is 4 nm in this spectral region. The spatial uniformity of responsivity over the photosensitive area is also measured at 500 nm
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Recalibration of silicon photodiodes previously supplied by NIST (under 39077C or 39073C) is performed by measuring spectral responsivity from 200 nm to 1100 nm
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Special tests of radiometric detectors generally used in the ultraviolet, visible, and infrared regions of the spectrum can be performed. Detector characteristics that can be determined in this special test include spectral responsivity and quantum efficiency (electrons per photon). For example, detectors responsivity can be measured between 193 nm and 1800 nm at power levels less than 4.0 µW. The relative expanded uncertainty is dependent on the wavelength and the individual item measured. Since special tests of this type are unique, details of the tests should be discussed with Thomas Larason before submitting a formal request.
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Special tests consisting of measuring the relative changes in responsivity across the photosensitive area (spatial uniformity) can be performed for customer-supplied photodetectors. The uniformity is typically measured at a single wavelength in 0.5 mm spatial increments with a beam diameter of 1.5 mm in the 193 nm to 400 nm spectral region at power levels less than 20 µW, and a beam of diameter 1.1 mm in the 400 nm to 1800 nm spectral region at power levels less than 1 µW. Customers should communicate with Thomas Larason to discuss details before submitting a formal request.
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Special tests of customer-supplied ambient temperature infrared detectors can be performed in the 2 µm to 20 µm wavelength range. Measurements at longer wavelength are possible, and may be provided to customers having special requirements. The special tests include spectral power and irradiance responsivity and spatial response measurements. The standard configuration uses a 1.3 mm diameter monochromatic beam to underfill the active area of the detector with an -/# between -/4 and -/8. The monochromator output beam is chopped (~ 39 Hz) and has a radiant power ranging from 1 µW at a wavelength of 4 µm to ~ 10 nW at 18 µm. The optical bandpass of the measurement is ~ 1 % of the test wavelength. Customers should contact George Eppeldauer to discuss details before submitting a formal request or to get information on extended measurement capability.
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Special tests of irradiance detectors generally used in the ultraviolet, visible, and near-infrared regions of the spectrum can be performed. Irradiance responsivity of detectors can be measured between 193 nm and 1800 nm at power levels less than 200 µW/cm2. The spectral irradiance responsivity of a detector can be determined expressed in the unit amperes·mm2 per watt [A·mm2/W]. The relative expanded uncertainty is dependent on the wavelength and the individual item measured. Since special tests of this type are unique, details of the tests should be discussed with Thomas Larason before submitting a formal request.
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Table 7.2 Detector Measurement Services Uncertainties
| Wavelength [nm] | UV 100 (UV) | S1337 (Visible) | GE (NIR) | InGaAs (NIR) |
|---|---|---|---|---|
| 200 | 3.8 | 3.8 | ||
| 250 | 1.3 | 1.3 | ||
| 300 | 1.3 | 1.3 | ||
| 350 | 1.8 | 1.8 | ||
| 400 | 1.5 | 1.5 | ||
| 450 | 0.38 | 0.24 | ||
| 500 | 0.38 | 0.22 | ||
| 550 | 0.20 | |||
| 600 | 0.20 | |||
| 650 | 0.20 | |||
| 700 | 0.20 | 0.46 | 0.38 | |
| 750 | 0.22 | 0.42 | 0.36 | |
| 800 | 0.22 | 0.68 | 0.54 | |
| 850 | 0.22 | 0.44 | 0.44 | |
| 900 | 0.22 | 0.50 | 0.40 | |
| 950 | 2.6 | 1.2 | 1.3 | |
| 1000 | 1.7 | 0.9 | 0.9 | |
| 1050 | 2.7 | 0.9 | 0.9 | |
| 1100 | 4.2 | 0.52 | 0.50 | |
| 1150 | 0.8 | 0.8 | ||
| 1200 | 1.4 | 1.5 | ||
| 1250 | 0.9 | 0.9 | ||
| 1300 | 0.9 | 0.9 | ||
| 1350 | 0.9 | 0.9 | ||
| 1400 | 1.2 | 1.2 | ||
| 1450 | 0.9 | 0.9 | ||
| 1500 | 1.0 | 1.0 | ||
| 1550 | 1.1 | 1.1 | ||
| 1600 | 1.4 | 1.3 | ||
| 1650 | 1.1 | 1.0 | ||
| 1700 | 1.7 | 2.2 | ||
| 1750 | 2.6 | 2.7 | ||
| 1800 | 3.4 | 4.2 |
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Table 7.3. NIST Spectroradiometric Detector Measurement Services
| Service ID No. | Item of Test | Range | Relative Expanded Uncertainty (k = 2) |
|---|---|---|---|
| 39071C | UV Silicon Photodiodes (UDT UV 100) | 200 nm to 500 nm | 0.4 % to 3.8 % |
| 39072C | Retest of UV Silicon Photodiodes | 200 nm to 500 nm | 0.4 % to 3.8 % |
| 39073C | Visible to NIR Silicon Photodiodes (Hamamatsu S2281) | 350 nm to 1100 nm | 0.2 % to 4.2 % |
| 39074C | Retest of Visible to NIR Silicon Photodiodes (Hamamatsu S1337-1010BQ or S2281) | 350 nm to 1100 nm | 0.2 % to 4.2 % |
| 39075S | Special Tests of NIR Photodiodes | 700 nm to 1800 nm | 0.4 % to 4 % * |
| 39077C | Ultraviolet to Near-Infrared Silicon Photodiodes (Hamamatsu S2281) | 200 nm to 1100 nm | 0.2 % to 4.2 % |
| 39078C | Retest of Ultraviolet to Near-Infrared Silicon Photodiodes (Hamamatsu S2281) | 200 nm to 1100 nm | 0.2 % to 4.2 % |
| 39080S | Special Tests of Radiometric Detectors | 193 nm to 1800 nm | 0.2 % to 5 % * |
| 39081S | Special Tests of Photodetector Responsivity Spatial Uniformity | 193 nm to 1800 nm | 0.0024 % to 0.05 % * |
| 39090S | Special Tests of IR Detectors | 2 µm to 5.4 µm 5.4 µm to 20 µm | ~1.5 % to ~5 % |
| 39100S | Special Tests of Irradiance Detectors | 193 nm to 1800 nm | 4 % to 13 % * |
* Depends on photodetector and signal level.
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The new ultraviolet responsivity scale based on cryogenic radiometry at Synchroton Ultraviolet Radiation Facility III , P. S. Shaw, T. C. Larason, R. Gupta, S. W. Brown, R. E. Vest, and K. R. Lykke, Review of Scientific Instruments, 72, (5), (May 2001).
Opto-Mechanical and Electric Design of a Tunnel-Trap Si Radiometer , G. Eppeldauer and D. Lynch, J. Res. Natl. Inst. Stand. Technol. 105(6), 813-828 (2000).
Improved Near-Infrared Spectral Responsivity Scale , P. S. Shaw, T. C. Larason, R. Gupta, S. W. Brown and K. R. Lykke, J. Res. Natl. Inst. Stand. Technol. 105(5), 689 (2000).
NIST Measurement Services: Spectroradiometric Detector Measurements: Ultraviolet, Visible, and Near-Infrared Detectors for Spectral Power, T. C. Larason, J. M. Houston, Natl. Inst. Stand. Technol. (US), Spec. Publ. 250-41, (2008).
NIST Measurement Services: Spectroradiometric Detector Measurements: Part III - Infrared Detectors , A. L. Migdall and G. Eppeldauer, Natl. Inst. Stand. Technol. (US), Spec. Publ. 250-42, (1998).
National Institute of Standards and Technology high-accuracy cryogenic radiometer , T. R. Gentile, J. M. Houston, J. E. Hardis, C. L. Cromer, and A. C. Parr, Appl. Opt. 35, 1056-1068 (1996).
Realization of a scale of absolute spectral response using the National Institute of Standards and Technology high-accuracy cryogenic radiometer , T. R. Gentile, J. M. Houston, and C. L. Cromer, Appl. Opt. 35, 4392-4403 (1996).
A National Measurement System for Radiometry, Photometry, and Pyrometry Based upon Absolute Detectors , A. C. Parr, Natl. Inst. Stand. Technol. (US), Tech. Note 1421 (1996).
Developing Quality System Documentation Based on ANSI/NCSL Z540-1-1994 - The Optical Technology Division's Effort, S. S. Bruce and T. C. Larason, Natl. Inst. Stand. Technol. (US), Internal Report 5866 (1996).
High Accuracy Measurement of Aperture Area Relative to a Standard Known Aperture , J. B. Fowler and G. Dezsi, J. Res. Natl. Inst. Stand. Technol. 100(3), 277-283, (1995).
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