Focused Ion Beam Micromilling And Articles Therefrom

Abstract
An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

IP Status: Available Exclusively

Reference Number: 94

S Number: DOE reference no.(s): 84,994

Patents & Applications:
United States National Patent Number 5773116 Issued on 06/30/1998

Posted: 09-21-2004

Contact
John Mott
Technology Transfer Division
Los Alamos National Laboratory
P.O. Box 1663, MailStop C334
(505) 665-0883
jmott@lanl.gov