Newell, D. B. Williams, E. R. (QUANTUM ELECTRICAL METROLOGY DIVISION - 817) Kramar, J. A. (PRECISION ENGINEERING DIVISION - 821) Pratt, J. R. (MANUFACTURING METROLOGY DIVISION - 822) Smith, D. T. (CERAMICS DIVISION - 852)
Towards a Traceable Nanoscale Force Standard
Proceedings of the EUSPEN International Conference , May 27-31, 2001 , Turin, Italy - May 01, 2001

The National Institute of Standards and Technology has launched a five-year project to traceably link the International System of Units (SI) to forces between 10^u-8^N and 10^u-2^N. In this paper, we give a background and overview of this project, discuss the electrostatic realization and dissemination of force through a mechanical balance, and provide a brief summary of the Microforce Laboratory being constructed at NIST.
Keywords: AFM , force , measurement , MEM's , nanoindentationJ
Total pages: 4. Availability information updated on .
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