| Authors: |
Pratt, J. R., Newell, D. B., Williams, E. R., Smith, D. T., Kramar, J. A. |
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| Title: |
Towards a Traceable Nanoscale Force Standard |
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| Published: |
May 01, 2001 |
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| Abstract: |
The National Institute of Standards and Technology has launched a five-year project to traceably link the International System of Units (SI) to forces between 10-8N and 10-2N. In this paper, we give a background and overview of this project, discuss the electrostatic realization and dissemination of force through a mechanical balance, and provide a brief summary of the Microforce Laboratory being constructed at NIST. |
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| Proceedings: |
Proceedings of the EUSPEN International Conference |
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| Pages: |
4 pp. |
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| Location: |
Turin, Italy |
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| Dates: |
May 27-31, 2001 |
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| Keywords: |
AFM, force, measurement, MEM's, nanoindentation |
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| Research Area: |
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