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Title: JANTX2N2432A transistor
Author(s): NONE
Abstract: Report evaluates effects of power and temperature overstress on Crystalonics and Texas Instruments devices. Crystalonics devices survived better, as Texas Instruments lot exceeded 50 percent failure at 225 deg C. Failure modes are evaluated.
NASA Center: Marshall Space Flight Center
Publication Date: Aug 1, 1980
Document Source: National Technology Transfer Center (NTTC), Wheeling, WV
No Digital Version Available: Go to Tips On Ordering
Available Data: See also B80-10011 - B80-10020; B80-10022 - B80-10030
Document ID: 19800000021
Accession ID: 80B10021
Publication Information: NASA Tech Briefs, 5, 1, P. 16, ISSN 0145-319X
Report Number: MFS-26255
Keywords: COMPONENT RELIABILITY; SEMICONDUCTOR DEVICES; TRANSISTORS;
Notes: Innovator not given (Special Products Division of DCA Reliability Laboratory)
Accessibility: Unclassified; No Copyright; Unlimited; Publicly available;
Updated/Added to NTRS: 2005-09-30

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