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Title: |
JANTX2N2432A transistor
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Author(s): |
NONE
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Abstract: |
Report evaluates effects of power and temperature overstress on Crystalonics and Texas Instruments devices. Crystalonics devices survived better, as Texas Instruments lot exceeded 50 percent failure at 225 deg C. Failure modes are evaluated.
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NASA Center: |
Marshall Space Flight Center
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Publication Date: |
Aug 1, 1980
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Document Source: |
National Technology Transfer Center (NTTC), Wheeling, WV |
No Digital Version Available: |
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Available Data: |
See also B80-10011 - B80-10020; B80-10022 - B80-10030 |
Document ID: |
19800000021
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Accession ID: |
80B10021
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Publication Information: |
NASA Tech Briefs, 5, 1, P. 16, ISSN 0145-319X |
Report Number: |
MFS-26255
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Keywords: |
COMPONENT RELIABILITY; SEMICONDUCTOR DEVICES; TRANSISTORS;
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Notes: |
Innovator not given (Special Products Division of DCA Reliability Laboratory) |
Accessibility: |
Unclassified; No Copyright; Unlimited; Publicly available; |
Updated/Added to NTRS: |
2005-09-30 |
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