| Abstract Title | Author | Beamline | Year |
Abstracts by Spolenak, R.
| A new instrument for submicron x-ray diffraction | A.A. MacDowell, R.S. Celestre, N. Tamura, K. Franck, R. Spolenak, B.C. Valek, H.A. Padmore, C.-H. Chang, J.R. Patel | 7.3.3 | 1999 |
| Combined high voltage SEM and x-ray microdiffraction studies of damascene copper interconnects | B.C. Valek, N. Meier, N. Tamura, R. Spolenak, R.S. Celestre, A.A. MacDowell, H.A. Padmore, J.C. Bravman, J.R. Patel | 7.3.3 | 2000 |
| Experimental assessment of strain gradient plasticity theories | M.M. Barney, G.H. Campbell, J.S. Stolken, R. Spolenak, N. Tamura, R.O. Ritchie | 7.3.3 | 2002 |
| High resolution study of the thermomechanical behavior of Al(0.5wt% Cu) thin films by scanning x-ray microdiffraction (uSXRD) | N. Tamura, B.C. Valek, R. Spolenak, R.S. Celestre, A.A. MacDowell, H.A. Padmore, B.W. Batterman, J.R. Patel | 7.3.3 | 2001 |
| Initial results from the new submicron x-ray diffraction instrument on Beamline 7.3.3 | A.A. MacDowell, N. Tamura, R.S. Celestre, R. Spolenak, B.C. Valek, W.L. Brown, J.C. Bravman, H.A. Padmore, B.W. Batterman, J.R. Patel | 7.3.3 | 1999 |
| Local plasticity in Al(0.5wt% Cu) membranes revealed by scanning x-ray microdiffraction (uSXRD) | R. Spolenak, N. Tamura, B.C. Valek, R.S. Celestre, A.A. MacDowell, H.A. Padmore, W.L. Brown, B.W. Batterman, J.R. Patel | 7.3.3 | 2001 |
| Orientation and stress mapping on Beamline 7.3.3: A new tool to study material properties at submicron scale | N. Tamura, R. Spolenak, B.C. Valek, R.S. Celestre, A.A. MacDowell, H.A. Padmore, J.R. Patel | 7.3.3 | 2000 |
| Plastic deformation at micron-scale in Cu thin films and lines studied by x-ray microdiffraction | R. Spolenak, N. Tamura, B.C. Valek, R.S. Celestre, A.A. MacDowell, H.A. Padmore, J.R. Patel | 7.3.3 | 2000 |