'Submicron X-Ray Diffraction and its Applications to Problems in Materials and Environmental Science' N. Tamura; R. Spolenak, B.C. Valek; A. Manceau; M. Meier Chang; R.S. Celestre; A.A. MacDowell; H.A. Padmore and J.R. Patel; Review of Scientific Instruments 73 (2002) 1369-1372.

'Scanning X-ray Microdiffraction with submicron white beam for strain/stress and orientation mapping in thin films' N. Tamura, A.A. MacDowell, R. Spolenak, B.C. Valek, J. C. Bravman, W.L. Brown, R. S. Celestre, H.A. Padmore, B.W. Batterman and J.R. Patel, J. of Synchrotron Radiation 10 (2003) 137-143.

‘Application of the White/Monochromatic X-ray m-Diffraction Technique to the Study of Texture and Triaxial strain at the Submicron Level’ P. Goudeau, N. Tamura, R. Spolenak and H.A. Padmore, Materials Science Forum 490-491 (2005) 672-677. ICRS7 (International Conference on Residual Stresses VII)

‘High Spatial Resolution Stress Measurements using Synchrotron based Scanning X-Ray Microdiffraction with White or Monochromatic beam’ N. Tamura, H.A. Padmore and J.R. Patel, Materials Science & Engineering A 399 (2005) 92-98.

‘Scanning X-Ray Microdiffraction for Materials Science at the Advanced Light Source’ N. Tamura, B.C. Valek, A.A. MacDowell, R.S. Celestre, H.A. Padmore, R. Spolenak, and J.R. Patel, Proceedings of IMECE04, in press (2004)

Stress in Thin films:

Local microstructure and stress in Al(Cu) thin film structures studied by X-ray microdiffraction' B.C. Valek, N. Tamura, R. Spolenak; A.A. MacDowell; R.S. Celestre; H.A. Padmore; J.C. Bravman; B.W. Batterman; J.R. Patel, Mat. Res. Soc. Symp. Proc. 673 (2001) P7.7.1-P7.7.6

'High Resolution Microdiffraction Studies Using Synchrotron Radiation' R. Spolenak; N. Tamura; B.C. Valek; A.A. MacDowell; H.A. Padmore; W.L. Brown; T. Marieb; B.W. Batterman and J.R. Patel, in „ 6^th International Workshop on Stress induced phenomena in metallization", American Institute of Physics Conference Proceedings, July 25-27, 2001 Cornell University, Ithaca, NY, 612 (2002) 217-28.

'High Spatial Resolution Grain Orientation and Strain Mapping in Thin Films using Polychromatic Submicron X-ray Diffraction' N. Tamura, A.A. MacDowell, R.S. Celestre, H.A. Padmore, B.C. Valek, J.C. Bravman, R. Spolenak, W.L. Brown, T. Marieb, H. Fujimoto, B.W. Batterman and J.R. Patel, Appl. Phys. Lett. 80 (2002) 3724-3727.

‘A Comparison of X-Ray Microdiffraction and Coherent Gradient sensing in Measuring Discontinuous Curvatures in Thin Film-Substrate systems’ M.A. Brown, T.-S. Park, A. Rosakis, E. Ustundag, Y. Huang, N. Tamura and B.C. Valek. J. of Applied Mechanics, 73 (5) (2006) 723-729.

‘Residual stress analysis in micro and nano structured materials by X-ray diffraction’ P. Gergaud, P. Goudeau, O. Sicardy, N. Tamura and O. Thomas, International Journal of Materials and Product Technology 26(3-4) (2006) 354-371.

‘Strains, stresses and elastic properties in polycrystalline metallic thin films: in situ deformation combined with x-ray diffraction and simulation experiments’ Goudeau, P., Faurie, D., Girault, B., Renault, P.-O., Le Bourhis, E., Villain, P.,  Badawi, F., Castelnau, O., Brenner, R., Bechade, J.-L., Geandier, G., Tamura, N., Materials Science Forum, 524-525 (2006) 735-740.

‘Thin film substrate systems featuring arbitrary film thickness and misfit strain distributions. Part II: Experimental validation of the non-local stress curvature relations ‘ Brown MA, Rosakis AJ, Feng X, Huang Y, Ustundag E, International Journal Of Solids And Structures 44 (6) (2007) 1755-1767.

Electromigration in Al interconnects:

'Grain Orientation and Strain Measurements in Sub-Micron wide Passivated Individual Aluminum Test Structures' N. Tamura, B. C. Valek, R. Spolenak, A. A. MacDowell, R. S. Celestre, H.A.Padmore, W. L. Brown, T. Marieb, J. C. Bravman, B. W. Batterman and J. R. Patel, Mat. Res. Soc. Symp. Proc., 612 (2001) D.8.8.1 –D8.8.6

'Electromigration-Induced Plastic Deformation in Passivated Metal Lines' B.C. Valek, J.C. Bravman, N. Tamura, A.A. MacDowell, R.S. Celestre, H.A. Padmore, R. Spolenak, W.L. Brown, B.W. Batterman and J.R. Patel, Appl. Phys. Lett. 81 (2002) 4168-4170.

'Quantitative Analysis of Dislocation Arrangements induced by Electromigration in a passivated Al (0.5wt% Cu) Interconnect' R.I. Barabash, G.E. Ice, N. Tamura, B.C. Valek, J.C. Bravman, R. Spolenak and J.R. Patel, J. Appl. Phys. 93 (2003) 5701-5706.

'Spatially Resolved Characterization of Electromigration-Induced plastic deformation in Al (0.5wt% Cu) interconnect' R.I. Barabash, G.E. Ice, N. Tamura, J.R. Patel, B.C. Valek, J.C. Bravman, R. Spolenak, Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures (Ed. D.A. Bonnell, J. Piqueras, A.P. Shreve, F. Zypman, 2-6 december 2002, Boston), Mat. Res. Soc. Symp. Proc. 738 (2003) G.13.1.1-7. pp. 345-50.

'Early Stage of Plastic Deformation in Thin Films Undergoing Electromigration' B. C. Valek, N. Tamura, R. Spolenak, W.A. Caldwell, J.C. Bravman, A.A. MacDowell, R.S. Celestre, H.A. Padmore, B.W. Batterman and J.R. Patel, J. Appl. Phys. 94 (2003) 3757-3761.

'Quantitative Characterization of Dislocation Structure Coupled with Electromigration in a Passivated Al (0.5wt% Cu) Interconnects' R.I. Barabash, N. Tamura, B.C. Valek, R. Spolenak, J.C. Bravman, G.E. Ice and J.R. Patel, 21-25 April 2003, San Francisco, Mat. Res. Soc. Symp. Proc. 766 (2003) 107-114.

‘Quantitative characterization of electromigration-induced plastic deformation in Al(0.5wt%Cu) interconnect’ R.I. Barabash , G.E. Ice, N. Tamura, B.C. Valek, J.C. Bravman, R. Spolenak, and J.R. Patel
Microelectronics Engineering 75 (2004) 24-30.

‘Coupling Between Precipitation and Plastic Deformation During Electromigration in a Passivated Al (0.5wt%Cu) Interconnect’ R.I. Barabash,  G.E. Ice, N. Tamura, B.C. Valek, R. Spolenak, J.C. Bravman, and J.R. Patel Materials, Technology and Reliability for Advanced Interconnects and low-k Dielectrics, MRS Proceedings, 812 (2004) F7.4.1-10. pp 351-60.

‘White beam analysis of coupling between precipitation and plastic deformation during electromigration in a passivated Al(0.5wt.% Cu) interconnect’ R.I. Barabash,  G.E. Ice, N. Tamura, B.C. Valek, J.C. Bravman, J.R. Patel, Metallofizica I Noveishie Tekhnologii 27 (2005) 75-94.

Electromigration In Cu interconnects:

'Microtexture and Strain in Electroplated Copper Interconnects' R. Spolenak, D.L. Barr, M.E. Gross, K. Evans-Lutherodt, W.L. Brown, N. Tamura, A.A. MacDowell, R.S. Celestre, H.A.Padmore, J.R. Patel, B.C. Valek, J.C. Bravman, P. Flinn, T. Marieb, R.R. Keller, B.W. Batterman, Mat. Res. Soc. Symp. Proc., 612 (2001) D10.3.1-D.10.3.7

‘Unexpected Mode of Plastic Deformation in Cu Damascene Lines Undergoing Electromigration’ Arief S. Budiman, N. Tamura, B. C. Valek, K. Gadre, J. Maiz, R. Spolenak, W. A. Caldwell, W. D. Nix and J. R. Patel, Materials, Technology and Reliability for Advanced Interconnects and low-k Dielectrics, MRS Proceedings, 812 (2004) F7.3.1-6. pp. 345-50.

‘Crystal Plasticity in Cu Damascene Interconnect Lines Undergoing Electromigration As Revealed by Synchrotron X-Ray Microdiffraction’ A. S. Budiman, N. Tamura , B. C. Valek , K. Gadre , J. Maiz , R. Spolenak , W.D. Nix , J.R. Patel, Applied Physics Letters 88 (2006) 233515-1-3

‘X-Ray microdiffraction as a probe to reveal flux divergences in interconnects’ R. Spolenak, N. Tamura and J.R. Patel, AIP Conference Proceedings, 816 (2006) pp 228-95.

‘Electromigration-induced plastic deformation in Cu damascene interconnect lines as revealed by synchrotron X-ray microdiffraction ‘ Budiman A.S., Tamura N., Valek B.C., Gadre K., Maiz J., Spolenak R., Patel J.R., Nix W.D., Materials Research Society Symposium Proceedings 914 (2006), pp. 295-304.

‘Plasticity-amplified Diffusivity: Dislocation Cores as Fast Diffusion Paths in Cu Interconnects’ A.S. Budiman, C.S. Hau-Riege, P.R. Besser, A. Marathe, Y.-C. Joo, N. Tamura, J.R. Patel, W.D. Nix, 2007 IEEE International Reliability Physics Symposium Proceedings (IEEE Cat. No.07CH37867). IEEE. pp. 6. Piscataway, NJ, USA.

Thin film plasticity:

'Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction' R. Spolenak, W.L. Brown, N. Tamura, A.A. MacDowell, R.S. Celestre, H.A. Padmore, B.C. Valek, J.C. Bravman, T. Marieb, H. Fujimoto, B.W. Batterman, and J.R. Patel, Phys. Rev. Lett. 90 (2003) 096102-1-4.

‘X-ray microdiffraction: Local stress distributions in polycrystalline and epitaxial thin films’
M.A. Phillips, R. Spolenak, N. Tamura, W.L. Brown, A.A. MacDowell, R.S. Celestre, H.A. Padmore, B.W. Batterman, E. Arzt and J.R. Patel, Microelectronics Engineering 75 (2004) 117-126.

‘X-Ray Diffraction as a Probe for Elastic Strain: Micro- and Nanoscale Investigation of Thin Metal Films’ R. Spolenak, in Neutron and X-Ray Scattering as Probes of Multiscale Phenomena, edited by Surita R. Bhatia, Peter G. Khalifah, Darrin J. Pochan, and Paolo G. Radaelli (Mater. Res. Soc. Symp. Proc. 840, Warrendale, PA , 2005), Q3.4.1-Q.4.11

Environmental Science:

'Trace metal fluxes to ferromanganese nodules from the western Baltic Sea as a record for long-term environmental changes' S. Hlawatsch; M. Kersten; C.D. Garbe-Schönberg; F. Lechtenberg; A. Manceau; N. Tamura; D.A. Kulik; J. Harff; and E. Suess, Chemical Geology, 182 (2002) 697-709.

'Deciphering Ni sequestration in soil ferromanganese nodules by combining x-ray fluorescence, absorption and diffraction at micrometer scales of resolution' A. Manceau, N. Tamura, M. A. Marcus, A.A. MacDowell, R.S. Celestre, R.E. Sublett, G.S. Sposito, H.A. Padmore, American Mineralogist 87 (2002) 1494-1499.

'Quantitative speciation of heavy metals in soils and sediments by synchrotron X-ray techniques' A. Manceau, M. A. Marcus, and N. Tamura, In Applications of Synchrotron Radiation in Low-Temperature Geochemistry and Environmental Science, (ed. P. A. Fenter, M. L. Rivers, N. C. Sturchio, and S. R. Sutton), Reviews in Mineralogy and Geochemistry, Mineralogical Society of America., Vol 49 (2002) 341-428.

'Molecular-Scale Speciation of Zn and Ni in Soil Ferromanganese Nodules from Loess Soils of the Mississippi Bassin' A. Manceau, N. Tamura, R.S. Celestre, A.A. MacDowell, N. Geoffroy, G. Sposito and H.A. Padmore, Environmental Science and Technology 37 (2003) 75-80.

'Zn speciation in a soil contaminated by the deposition of a dredged sediment by synchrotron x-ray techniques' M.-P. Isaure, A. Manceau, A. Laboudigue, N. Tamura, M.A. Marcus, J. de Physique IV, 107 (2003) 657-660.

'Natural speciation of Zn at the micrometer scale in a clayey soil using X-ray fluorescence, absorption, and diffraction' A. Manceau, M.A. Marcus, N. Tamura, O. Proux, N. Geoffroy and B. Lanson, Geochemica & Cosmochimica Acta 68 (2004) 2467-2483

‘Zinc mobility and speciation in soil covered by contaminated dredged sediment using micrometer-scale and bulk-averaging X-ray fluorescence, absorption and diffraction techniques’ M.-P. Isaure, A.Manceau, N. Geoffroy, A. Laboudigue, N. Tamura, M. A. Marcus, Geochim. and Cosmol. Acta 69 (2005) 1173-1198

‘Natural speciation of Mn, Ni and Zn at a micrometer scale in a clayey paddy soil using X-ray fluorescence, absorption and diffraction’ A. Manceau, C. Tommaseo, S. Rihs, N. Geoffroy, D. Chateigner, M. Schlegel, D. Tisserand, M. A. Marcus, N. Tamura, and Z.-S. Chen, Geochim. and Cosmol. Acta, 69 (2005) 4007-4034.

‘Nanoparticulate oxide minerals in soils and sediments: unique properties and contaminant scavenging mechanisms’ Waychunas, G.A., C.S. Kim, and J.F. Banfield,  Journal of Nanoparticle Research 7(4-5) (2005)409-433.

‘Spectroscopic evidence for Uranium Bearing Precipitates in vadose Zone Sediments at the Hanford 300-area Site’ Y. Arai, M. Marcus, N. Tamura, J.A. Davis and J.M. Zachara, Env. Sci. & Tech., 41 (13) (2007) 4633 -4639.

Electronic packaging:

'Structure and Kinetics of Sn Whisker Growth on Pb-free Solder Finish' W. J. Choi, T. Y Lee, K. N. Tu, N. Tamura, R. S. Celestre, A. A. MacDowell, Y. Y. Bong, L. G. T. T. Sheng, IEEE 52nd Electronic Component & Technology Conference Proceedings (IEEE Catalog number 02CH3734-5, 28-31 May 2002), San Diego, CA (2002) 628-633.

'Synchrotron radiation micro-diffraction study of Sn whiskers on Pb-free surface finish' W.J. Choi, T.Y. Lee, K.N. Tu, N. Tamura, R.S. Celestre, A.A. MacDowell, Y.Y. Bong and L. Nguyen, Acta Materialia 51 (2003) 6253-61.

‘Electromigration-induced microstructure evolution in tin studied by synchrotron X-ray microdiffraction’ Albert T. Wu, K. N. Tu, J. R. Lloyd, N. Tamura, B.C. Valek, C. R. Kao, Appl. Phys. Lett. 85 (2004) 2490-2492.

‘Synchrotron X-ray Micro-Diffraction Analysis on Microstructure Evolution in Sn Under Electromigration’ A. T. Wu, N. Tamura, J. R. Lloyd, C. R. Kao, and K.N. Tu,  MRS 2005 Spring Meeting. Materials, Technology and Reliability of Advanced Interconnects-2005. Symposium (Materials Research Society Proceedings Vol.863). Materials Research Society (2005) pp. 363-7. Warrendale, PA, USA.

‘Mechanism and Prevention of Spontaneous Tin Whisker Growth’ K.N. Tu, J.O. Suh, A. T. Wu, N. Tamura and C.-H. Tung, Materials Transactions, Special issue on “Lead-Free Soldering in Electronics III”, Materials Transactions 46 (11) (2005) 2300-2308.

‘Microstructure evolution of tin under electromigration studied by synchrotron X-Ray micro-diffraction’ A. T. Wu, J.R. Lloyd, N. Tamura and K.-N. Tu, 10th International Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces (IEEE Cat. No. 05TH8808). IEEE. 2005, pp.178-80. Piscataway, NJ, USA. March 16-18,2005, Irvine, CA, Publisher: Institute of Electrical & Electronics Enginee (October 1, 2005) art. no. 1432073, pp. 178-180

‘A Synchrotron Radiation X-Ray Microdiffraction Study on Orientation Relationships between a Cu6Sn5 and Cu Substrate in Solder Joints’ J.O. Suh, K.N. Tu and N. Tamura, JOM 58 (2006) 63-66.

‘Synchrotron radiation based X-ray micro-diffraction study on reliability issues of solder joints in electronic packaging technology’  Suh JO, Nah JW, Tu KN, Tamura N., 2006 Proceedings. 56th Electronic Components & Technology Conference (IEEE Cat. No. 06CH37766C). IEEE. 2006, pp. 4. Piscataway, NJ, USA. ,art. no. 1645924, pp. 1924-1927.

‘Preferred orientation relationship between Cu6Sn5 scallop-type grains and Cu substrate in reactions between molten Sn-based solders and Cu’ J.O. Suh, K.-N. Tu and N. Tamura, Journal of Applied Physics, 102 (2007) 063511-1-7

‘Dramatic morphological change of scallop-type Cu6Sn5 formed on (001) single crystal copper in reaction between molten SnPb solder and Cu’ J. O. Suh,  K. N. Tu and N. Tamura, Applied Physics Letters 91 (2007) 051907

Thin film delamination:

'Residual stress mapping by micro X-ray diffraction: Application to the study of thin film buckling' P. Goudeau, P. Villain, N. Tamura, R.S. Celestre and H.A. Padmore J.Phys IV France 12 (2002) 409-415.

'Macro Stress Mapping on Thin Film Buckling' P. Goudeau, P. Villain, P.-O. Renault, N. Tamura, R.S. Celestre, and H.A. Padmore Materials Science Forum, 404-407 (2002) 709-714.

'Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films' P. Goudeau, P. Villain, N. Tamura and H.A. Padmore, Appl. Phys. Lett. 83 (2003) 51-53.

'Elastic Properties of Supported Polycrystalline Thin Films and Multilayers : an X-ray Diffraction Study' P. Goudeau, P. Villain, N. Tamura, P.-O. Renault, K.F. Badawi and H. A. Padmore, Thermec’ 2003, Materials Science Forum 426-432 (2003) 3409-3414.

‘Evidence of plastic damage in thin films around buckling structures’ C. Coupeau, P. Goudeau, L. Belliard, M. George, N. Tamura, F. Cleymand, J. Colin, B. Perrin, and J. Grilhé. Thin Solid Films 469-470 (2004) 221-226.

‘Strain mapping on gold thin film buckling and silicon blistering’ P. Goudeau, N. Tamura, G. Parry, J. Colin, C. Coupeau, F. Cleymand, H. Padmore, Thin Films-Stresses and Mechanical Properties XI. Symposium (Materials Research Society Symposium Proceedings Vol.875). Materials Research Society (2005) pp. 263-8.

Superconductivity:

'Microstructure and Pinning Properties of Hexagonal-disc shaped Single Crystalline MgB₂' C.U. Jung, J.Y. Kim, P. Chowdhury, K.H.P. Kim, S-.I. Lee, D. S. Koh, N. Tamura, W.A. Caldwell, and J.R. Patel, Phys. Rev. B 66 (2002) 1845191-1845195.

Ferroelectric, Ferromagnetic and MultiFerroic Materials:

'Direct Measurement of Triaxial Strain Fields around Ferroelectric Domains Using X-Ray Microdiffraction' R. C. Rogan, N. Tamura, G. A. Swift and E. Üstündag, Nature Materials 2 (2003) 379-381.

‘Multiscale Study of Internal Stress and Texture in Ferroelectrics’ E. Ustundag, R.C. Rogan, M.R. Daymond, N. Tamura, L. Margulies, and H. Poulsen, ICRS7 Materials Science Forum 490-491 (2005) p28

‘Two-dimensional mapping of triaxial strain fields in a multiferroic BiFeO3 thin film using scanning x-ray microdiffraction’  Chung W. Bark, Kyung C. Cho, Yang M. Koo, Nobumichi Tamura, Sangwoo Ryu, and Hyun M. Jang , Appl. Phys. Lett. 90 (2007)102904.

Fuel-Cell Materials:

'Twinning in La_0.95Sr_0.05Ga_0.9Mg_0.1O_2.92 crystals studied by white beam (Laue) X-Ray Microdiffraction' D.Savytskii, D. Trots, L.Vasylechko, N.Tamura and M.Berkowski, J. Appl. Cryst. 36 (2003) 1197-1203.

Microelectromechanical Systems (MEMS):

'Correlation between X-ray micro-diffraction and a developed analytical model to measure residual stresses in suspended structures in MEMS' S. Rigo, P. Goudeau, J.-M. Desmarres, T. Masri, J.-A. Petit, P. Schmidt Microelectronics Reliability 43 (2003) 1963-1968.

‘Cartographie par diffraction des rayons X à l’échelle du micromètre des contraintes intragranulaires et des orientations cristallines d’un film d’or déposé sur une micro-poutre en silicium’
‘Micro scanning X-ray diffraction of residual stresses and grain orientation
in a gold thin film deposited on a poly silicon micro cantilever’
P. Goudeau, S. Rigo, T. Masri, J.-A. Petit, J.-M. Desmarres, N. Tamura, Materiaux & Techniques, No 3-4 (2004) 1-5. (SIRPE Editeur).

‘X-ray diffraction characterization of suspended structures for MEMS applications’ P. Goudeau, N. Tamura, B. Lavelle, S. Rigo, T. Masri, A. Bosseboeuf, T. Sarnet, J.-A. Petit, J.-M. Desmarres. Thin Films-Stresses and Mechanical Properties XI. Symposium (Materials Research Society Symposium Proceedings Vol.875). Materials Research Society (2005) pp. 121-6.

Deformation of Polycrystalline Materials:

‘In-situ Synchrotron X-Ray Microdiffraction Study of Lattice Rotation in Polycrystalline Materials during Uniaxial Deformations’ H.D. Joo, K.H. Kim, C.W. Bark, Y.M. Koo, and N. Tamura, AIP Conf. Proc. 705 (2004) 1094-1097. May 12, 2004. LBNL-55904
Synchrotron Radiation Instrumentation: 8th International Conference, Ed. T. Warwick et al., AIP, San Francisco CA, August 25-29, 2004

‘Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation using a Synchrotron X-ray Source’ H.D. Joo, J.S. Kim, C.W. Bark, J.Y. Kim, Y.M. Koo, N. Tamura, Materials Science Forum 475-479 (2005) 4149-4152.

‘White beam microdiffraction experiments for the determination of the local plastic behaviour of polycrystals’ Castelnau, O., Goudeau, P., Geandier, G., Tamura, N., Béchade, J.-L., Bornert, M., Caldemaison, D., Materials Science Forum, 524-525 (2006) 103-108.

‘In-situ white beam microdiffraction study of the deformation behavior in polycrystalline magnesium alloy during uniaxial loading’ P. A. Lynch, A. W. Stevenson, D. Liang, D. Parry, S. Wilkins, I. C. Madsen, C. Bettles and N. Tamura, G. Geandier, AIP Conf. Proc.  (2007) 1751

‘X-Ray Microdiffraction Characterization of Deformation Heterogeneities in BCC Crystals’ K.R. Magid, E.T. Lilleodden, N. Tamura, J.N. Florando, D.H. Lassila, M.M. Leblanc, R.I. Barabash, J.W. Morris Jr., in Neutron and X-Ray Scattering as Probes of Multiscale Phenomena, edited by Surita R. Bhatia, Peter G. Khalifah, Darrin J. Pochan, and Paolo G. Radaelli (Mater. Res. Soc. Symp. Proc. 840, Warrendale, PA , 2005), Q7.2.1-Q7.2.6

‘Hierarchical Characterization of Deformation Heterogeneities in BCC crystals’ K.R. Magid, E.T. Lilleodden, N. Tamura, J. Florando, D. Lassila, R.I. Barabash, J.W. Morris, in Dislocations, Plasticity, Damage and Metal Forming: Material Response and Multiscale Modeling, edited by Akhtar S. Khan and Amir R. Khoei, (Plasticity 2005 Proceedings, Kauai, HI, 2005) pp.631-633.

‘Micro scanning X-ray diffraction study of Gallo-Roman Terra Sigillata ceramics’ P. Sciau, P. Goudeau, N. Tamura and E. Dooryhee, Applied Physics A-Materials Science & Processing 83 (2) (2006) 219-224.

‘Influence of Taoism on the Invention of the Purple Pigment Used on the Qin Terracotta Warriors’ Z. Liu, A. Mehta, N. Tamura, D. Pickard , B. Rong, T. Zhou, and P. Pianetta, J. of Archeological Science 34 (11) (Nov. 2007) 1878-1883.

'Application of white beam X-ray microdiffraction for the study of mineralogical speciation in ancient Egyptian pigments’ P. A. Lynch, N. Tamura, D. Lau, I. Madsen, D. Liang, M. Strohschnieder, A. W. Stevenson and S. Wilkins, J. Applied Crystallography 40 (2007) 1089-1096.

‘Understanding the Deformation and Fracture of Nitinol Endovascular Stents Using In Situ Synchrotron X-Ray Microdiffraction’ A. Mehta, Xiao-Yan Gong, V. Imbeni, A. R. Pelton, and R.O. Ritchie, Advanced Materials 19 (2007) 1183–1186

‘Evolution of crack-tip transformation zones in superelastic Nitinol subjected to in situ fatigue: A fracture mechanics and synchrotron X-ray microdiffraction analysis’ S.W. Robertson, A. Mehta, A.R. Pelton, R.O. Ritchie, Acta Materialia 55 (18)  (2007) 6198-6207.

'