D. F. Williams, K. A. Remley, D. C.
DeGroot, "Nose-to-Nose Response of a 20-GHz Sampling Circuit," 54th ARFTG
Conference Digest, pp. 64-70, Dec. 2-3, 1999.
K. A. Remley, D. F. Williams, and D.
C. DeGroot, "Realistic sampling-circuit model for a Nose to-Nose
simulation," 2000 IEEE MTT-S Int. Microwave Symp. Dig., June 13,
2000.
P. D. Hale, T. S. Clement, K. S.
Coakley, C. M. Wang, D. C. DeGroot, and A. P. Verdoni, "Estimating the
magnitude and phase response of a 50 GHz sampling oscilloscope using the
"Nose-to-Nose" method," 55th ARFTG Conf. Dig., pp. 35-42, June 16,
2000
D. C. DeGroot, P. D. Hale, M. Vanden
Bossche, F. Verbeyst, and J. Verspecht, "Analysis of interconnection
networks and mismatch in the Nose-to-Nose calibration," 55th ARFTG Conf.
Dig., pp. 116-121, June 16, 2000.
[ARFTG Best Poster Paper Award]
J. A. Jargon, K. C. Gupta, and D. C.
DeGroot, "Artificial neural network modeling for improved on-wafer OSLT
calibration standards," Int. J. RF Microwave Computer-Aided Eng., vol. 10,
no. 5, pp. 319-328, Sep., 2000.
J. A. Jargon, P. Kirby, K. C. Gupta,
L. Dunleavy, and T. Weller, "Modeling Load Variations with Artificial
Neural Networks to Improve On-Wafer OSLT Calibrations," 56th ARFTG
Conference Digest, Nov. 30-Dec. 1, 2000.
J. A. Jargon and K. C. Gupta,
"Artificial neural network modeling for improved coaxial
line-reflect-match calibrations," Int. J. RF Microwave Computer-Aided
Eng., vol. 11, no. 1, pp. pp. 33-37, Jan., 2001.
K. A. Remley, D. F. Williams, D. C.
DeGroot, J. Verspecht, and J. Kerley, “Effects of nonlinear diode junction
capacitance on the nose-to-nose calibration,” IEEE Microwave and Wireless
Comp. Lett., vol. 11, pp. 196-198, May 2001.
K. A. Remley, D. C. DeGroot, J. A.
Jargon, and K. C. Gupta, “A method to compare vector nonlinear network
analyzers,” IEEE MTT-S Int. Microwave Symp. Dig., pp. 1667-1670, May
2001.
D. F. Williams and K. A. Remley,
“Analytic sampling-circuit model,” IEEE Trans. Microwave Theory Tech.,
vol. 49, pp. 1013-1019, June 2001.
J. A. Jargon and K. C. Gupta,
"Artificial neural network modeling for improved on-wafer
line-reflect-match calibrations," 31st European Microwave Conference
Proceedings, vol. 2, pp. 229-232, Sep., 2001.
J. A. Jargon, K. C. Gupta, and D. C.
DeGroot, "Applications of artificial neural networks to RF and microwave
measurements," Int. J. RF Microwave Computer-Aided Eng., vol. 12, no. 1,
pp. 3-24, Jan., 2002.
K. A. Remley, "Nose-to-nose
oscilloscope calibration phase error inherent in the sampling circuitry,"
60th ARFTG Conference Digest, pp. 85-97, Washington, D.C., Dec.,
2002.
D. C. DeGroot, J. A. Jargon, and R.
B. Marks, "Multiline TRL Revealed," 60th ARFTG Conference Digest, pp.
131-155, Washington, D.C., Dec., 2002.
J. C. Booth, K. Leong, S. A. Schima,
J. A. Jargon, and D. C. DeGroot, "Design and characterization of a
superconducting nonlinear reference device," 62nd ARFTG Conference Digest,
pp. 61-70, Boulder, CO, Dec., 2003.
J. A. Jargon, D. C. DeGroot, and D.
F. Vecchia, "Repeatability study of commercial harmonic phase standards
measured by a nonlinear vector network analyzer," 62nd ARFTG Conference
Digest, pp. 243-258, Boulder, CO, Dec., 2003. [ARFTG Best Poster Paper Award]
J. A. Jargon, J. D. Splett, D. F. Vecchia, and D. C. DeGroot,
"Modeling Warm-Up Drift in Commercial Harmonic Phase Standards," 2004
Conference on Precision Electromagnetic Measurements Digest, pp. 612-613,
London, ENGLAND, Jul. 2004.
D. C. DeGroot, Y. Rolain, R. Pintelon, and J. Schoukens,
"Corrections for nonlinear vector network analyzer measurements using a
stochastic multi-line/reflect method," 2004 IEEE MTT-S International
Microwave Symposium Digest, pp. 1735-1738, June, 2004.
Y. Rolain, W. Van Moer, and D. DeGroot, "A first step towards
a wave-based 'stochastic' calibration for multi-port vectorial network
analyzers," 63rd ARFTG Conference Digest, pp. 151-156, June,
2004.
Measurements for Design
L. Rouault, B. Verbaere, D. DeGroot, D.
LeGolvan, and R. Marks, "Measurements and models of a power amplifier
suitable for 802.16.1," IEEE 802.16.1p-00, Sep. 13 2000.
J. A. Jargon, K. C. Gupta, D.
Schreurs, K. A. Remley, and D. C. DeGroot, "A method for developing
frequency-domain models for nonlinear circuits based on large-signal
measurements," 58th ARFTG Conference Digest, pp. 35-48, Nov.,
2001.
J. A. Jargon, K. C. Gupta, and D. C.
DeGroot, "Applications of artificial neural networks to RF and microwave
measurements," Int. J. RF Microwave Computer-Aided Engin., vol. 12, no. 1,
pp. 3-24, Jan., 2002.
J. A. Jargon, K. A. Remley, D. C.
DeGroot, and D. Schreurs, "Artifical neural network model for
HEMTs constructed from large-signal time-domain measurements," 59th ARFTG
Conference Digest, pp. 31-36, Jun., 2002.
J. A. Jargon, K. C. Gupta, D.
Schreurs, and D. C. DeGroot, "Developing frequency-domain models for
nonlinear circuits based on large-signal measurements," Proceedings of the
XXVIIth General Assembly of the International Union of Radio Science,
CD-ROM A1.0.6, Maastricht, the Netherlands, Aug., 2002.
J. A. Jargon, D. C. DeGroot, K. C.
Gupta, and A. Cidronali, "Calculating ratios of harmonically related
complex signals with application to nonlinear large-signal scattering
parameters," 60th ARFTG Conference Digest, pp. 113-122, Dec.,
2002.
A. Cidronali, K. C. Gupta, J.
Jargon, K. A. Remley, D. DeGroot, and G. Manes, "Extraction of conversion
marices for P-HEMTs based on vectorial large-signal measurements," 2003
IEEE MTT-S International Microwave Symposium Digest, pp. 777-780,
Philadelphia, PA, June, 2003.
J. Jargon, K. C. Gupta, A.
Cidronali, and D. DeGroot, "Expanding definitions of gain by taking
harmonic content into account," Int. J. RF Microwave Computer-Aided
Engin., vol. 13, no. 5, pp. 357-369, Sep., 2003.
A. Cidronali, G. Loglio, J. A.
Jargon, K. A. Remley, I. Magrini, D. C. DeGroot, D. Schreurs, K. C. Gupta,
and G. Manes, "RF and IF mixer optimum matching impedances extracted by
larg-signal vectorial measurements," Proc. 2003 Europ. GaAs & Other
Compound Semicond. App. Symp., Munich, GERMANY, Oct.,
2003.
J. A. Jargon, K. C. Gupta, and D. C. DeGroot, "Nonlinear
Large-Signal Scattering Parameters: Theory and Applications," 63rd ARFTG
Conference Digest, pp. 157-174, Fort Worth, TX, Jun.
2004.
M. Camprini, A. Cidronali, C. Accillaro, I. Magrini, G.
Loglio, G. Collodi, J. A. Jargon, and G. Manes, "Identification of a
Strongly Nonlinear Device Compact Model Based on Large Signal
Measurements," Proc. 2004 Europ. GaAs & Other Compound Semicond. App.
Symp., Amsterdam, the NETHERLANDS, Oct. 2004.
Passive Intermodulation
Measurements
J. A. Jargon, D. C. DeGroot, and K.
L. Reed, "NIST Passive Intermodulation Measurement Comparison for Wireless
Base Station Equipment," 52nd ARFTG Conference Digest, pp. 128-139, Dec.
3-4, 1998.
J. A. Jargon and D. C. DeGroot,
"Comparison of Passive Intermodulation Measurements for the U.S. Wireless
Industry," NIST Tech. Note 1515, Oct. 1999.
J. A. Jargon and D. C. DeGroot,
"NIST unveils status of PIM testing," Microwaves & RF, Jan.
2000.
J. A. Jargon, "Measurement
Comparison of a Low-Intermodulation Termination for the U.S. Wireless
Industry," NIST Tech. Note 1521, Jul. 2001.
Time-Domain Network
Analysis
R. B. Marks, L. A. Hayden, J. A.
Jargon, and F. Williams, "Time domain network analysis using the multiline
TRL calibration," 44th ARFTG Conference Digest, pp. 47-55, Dec. 1-2,
1994.
R. B. Marks, D. C. DeGroot, and J.
A. Jargon, "High-speed interconnection characterization using time domain
network analysis," Advancing Microelectronics, vol. 22, no. 6, pp. 35-39,
Nov./Dec., 1995.
D. C. DeGroot and R. B. Marks,
"Optimizing time-domain network analysis," 46th ARFTG Conference Digest,
pp. 19-28, Nov. 30-Dec. 1, 1995.
J. A. Jargon and M. D. Janezic,
"Measuring complex permittivity and permeability using time domain network
analysis," 1996 IEEE MTT-S Int. Microwave Symp. Dig., pp. 1407-1410, June
17-21, 1996.
D. C. DeGroot and J. A. Jargon,
"Long term stability in a calibrated time-domain network analyzer,"
presented at Measurement Science Conference, Pasadena, Calif., Feb. 5-6,
1998.
D. DeGroot and J. Jargon, "Taking rf
and microwave device measurements with a digital sampling oscilloscope,"
Instrumentation Newsletter, vol. 9, no. 4, pp. T1-T2, Winter,
1997/1998.
D. C. DeGroot, Time-Domain Network
Analysis Bibliography, Oct. 19, 1998.
D. C. DeGroot and D. F. Williams,
"National Institute of Standards and Technology programs in electrical
measurements for electronic interconnections," IEEE 7th Topical Meeting on
Electrical Performance of Electronic Packaging, pp. 45-49, Oct. 26-28,
1998.
Related Publications
M. D. Janezic, and J. A. Jargon,
"Complex permittivity determination from propagation constant
measurements," IEEE Microwave Guided Wave Lett., vol. 9, no. 2, pp. 76-68,
Feb., 1999.
V. Milanovic, M. Ozgur, D. C.
DeGroot, J. A. Jargon, M. Gaitan, M. E. Zaghloul, "Characterization of
broad-band transmission for coplanar waveguides on CMOS silicon
substrates," IEEE Trans. Microwave Theory Tech., vol. 46, no. 5, pp.
632-640, May 1999.
T. Silva, P. Kabos, D. DeGroot, L.
Webb, and M. Even, "Design and performance of an inductive current probe
integrated into the trace suspension assembly," Digest Intermag 2000, p.
HP-04, Apr. 9-13, 2000.
A. B. Kos, T. J. Silva, P. Kabos, M.
R. Pufall, D. C. DeGroot, L. Webb, and M. Even, "Design and performance of
an inductive current probe for integration into the trace suspension
assembly," IEEE Trans. Mag., vol. 38, no. 1, pp. 50-54, Jan.,
2002.