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Title Bayesian model for determining the optimal test stress for a single test unit
Creator/Author Martz, H.F. Jr. ; Waterman, M.S.
Publication Date1978 May 01
OSTI IdentifierOSTI ID: 5853562
Other Number(s)CODEN: TCMTA
Resource TypeJournal Article
Resource RelationTechnometrics ; Vol/Issue: 20:2
Research OrgLos Alamos Scientific Lab., NM
Subject420500 -- Engineering-- Materials Testing; ;MECHANICAL TESTS-- MATHEMATICAL MODELS;NONDESTRUCTIVE TESTING-- MATHEMATICAL MODELS;STRESS ANALYSIS-- MATHEMATICAL MODELS; FAILURES;OPTIMIZATION;PROBABILITY
Related SubjectMATERIALS TESTING;TESTING
Description/Abstract Consider the case of a single test unit which must be tested at some level of test stress.^Suppose that the test stress level is free to be determined, and that only the survival or nonsurvival of the unit is observed.^It is assumed that the unit is designed to withstand a known and specified design stress level.^A Bayesian model is developed for determining the required level of test stress which maximizes the expected probability of survival at the design stress level.^Engineering experience from similar past tests on similar units is used to fit the model.^A practical application illustrates the method.^The sensitivity of the procedure to changes in the parameters used in fitting the model is also examined.
Country of PublicationUnited States
LanguageEnglish
FormatPages: 179-185
System Entry Date2001 May 13

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