Definition of Bad Channel and Random Bad Pipeline Capacitor
	-----------------------------------------------------------	


        Pedestals, noise, and gain are measured for each pipeline capacitor
        in the pipeline. For each chip, pedestal Pmed is determined as median
        pedestal over all pipeline capacitors in the chip. Pmed is required
        to be between 20 and 40 ADC counts for the initialization settings
        and clock speed used in the burn-in system. The difference between
        the capacitor pedestal and Pmed is calculated for each capacitor.
        This absolute value of this residual difference must be less than
        4 ADC counts, otherwise this capacitor is marked as "bad". A similar
        procedure is performed for the gain: Gmed must be between 160 and 
        350 ADC counts / 1 V Vcal. Gain residuals must be less than
        20 ADC counts / 1 V Vcal. The RMS noise in each pipeline capacitor
        must not exceed 3 ADC counts.

        Bad pipeline capacitors are combined into bad channels, bad cell IDs,
        and "random" bad capacitors as follows: if more than 50% of
        capacitors in a channel/cell-ID are bad, this channel/cell-ID is bad.
        If a bad capacitor does not belong to any bad channel or cell-ID,
        this is a "random" bad capacitor.