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  • Author > Leon, R. [x]

  • Sort results by: NASA Center | Date Added to NTRS | Publication Year
    There are a total of 26 record(s) matching your query.
    Sorted by: Date Added To NTRS in Descending order

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    Interactions, Interdiffusion and Segregation in Quantum Dot Ensembles

    Author(s): Leon, R.
    Abstract: Statistically non-interacting quantum dot ensembles can be achieved by raising surface energies during growth.
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 2000
    Added to NTRS: 2006-12-25
    Document ID: 20060032474

    Transmission Electron Microscopy Study of InGaAs/GaAs Structural Evolution Near the Stranski-Krastanow Transformation

    Author(s): Leon, R.; Wellman, J.; George, T.
    Abstract: No Abstract Available
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 1999
    Added to NTRS: 2006-12-25
    Document ID: 20060034140

    Electrical and structural investigation of the effects of via-conductor geometry in the electromigration of AL:CU

    Author(s): Leon, R.; Vu, D.; Johnson, A. S.; Ruiz, R.; Okuno, J.; Uribe, J.; Hather, G.; Lloyd, . R.
    Abstract: Electromigration experiments, their results at different densities.
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 2001
    Added to NTRS: 2006-12-25
    Document ID: 20060042457

    Effects of Humidity on Non-Hermetically Packaged III-V Structures and Devices

    Author(s): Leon, R.; Martin, S.; Lee, T.; Okuno, J.; Ruiz, R.; Gauldin, R.; Gaidis, M.; Smith, R.
    Abstract: High humidity and temperature test (known as 85/85 tests) were performed on various III-V devices and structures to determine environmental effects in non-hermetically packaged GaAs membrane mixer diodes.
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 1999
    Added to NTRS: 2006-12-25
    Document ID: 20060040938

    Ensemble Interactions in Strained Semiconductor Quantum Dot

    Author(s): Leon, R.; Marcinkevicius, S.; Liao, X.; Zou, J.; Cockayne, D.; Fafard, S.
    Abstract: Large variations in InGaAs quantum dot concentrations were obtained with simultaneous growths on vicinal GaAs[001] substrates with different surface step densities.
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 1999
    Added to NTRS: 2006-12-25
    Document ID: 20060040918

    Proton Induced Optical Degradation in InGaAs/GaAs Quantum Confined Structures

    Author(s): Leon, R.; Swift, G.; Magness, B.; Taylor, W.; Tang, Y.; Wang, K.; Dowd, P.; Zhang, Y.
    Abstract: No Abstract Available
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 1999
    Added to NTRS: 2006-12-25
    Document ID: 20060040937

    Dislocation-induced Charges in Quantum Dots: Step Alignment and Radiative Emission

    Author(s): Leon, R.; Okuno, J.; Lawton, R.; Stevens-Kalceff, M.; Phillips, M.; Zou, J.; Cockayne, D.; Lobo, C.
    Abstract: A transition between two types of step alignment was observed in a multilayered InGaAs/GaAs quantum-dot (QD) structure. A change to larger QD sizes in smaller concentrations occurred after formation of a dislocation array.
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 1999
    Added to NTRS: 2006-12-25
    Document ID: 20060040634

    Interdiffusion, Segregation, Ensemble Interactions, and Radiation Induced Effects in InGaAs/GaAs Quantum Dots

    Author(s): Leon, R.
    Abstract: No Abstract Available
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 2000
    Added to NTRS: 2006-12-25
    Document ID: 20060032407

    Defect states in red emitting InAlAs quantum dots

    Author(s): Leon, R.; Ibanez, J.; Marcinkevicius, S.; Siegert, J.; Paskova, T.; Monemar, B.; Chaparro, S.; Navarro, C.; Johnson, S. R.; Zhang, Y. H.
    Abstract: No Abstract Available
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 2002
    Added to NTRS: 2006-12-25
    Document ID: 20060030976

    Effects of via-conductor geometry in the electromigration failure of Al:Cu wires

    Author(s): Leon, R.; Vu, D.; Johnson, A. S.; Ruiz, R.; Okuno, J.; Uribe, J.; Hather, G.; Lloyd, J. R.
    Abstract: Electromigration (EM) experiments conducted using two types of via/plug to conductor alignment indicate a geometrical dependence of electromigration failure in Al:Cu conductors. The resistance vs time curves show ...
    NASA Center: Jet Propulsion Laboratory
    Publication Year: 2001
    Added to NTRS: 2006-12-25
    Document ID: 20060031511

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